Patents Represented by Attorney, Agent or Law Firm Stanton C. Braden
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Patent number: 8311120Abstract: This disclosure describes techniques for coding mode selection. In particular, an encoding device determines whether or not to code a block of pixels in a coding mode currently being considered for selection using information associated with at least one other coding mode with a different block partition. In one aspect, the encoding device uses information associated with at lest one coding mode that has block partitions that are sub-partitions of the block partitions of the coding mode currently being considered for selection. Additionally, the encoding device may use information associated with another coding mode that has the same block partitions as the coding mode currently being considered for selection or information associated with the coding mode currently being considered for selection.Type: GrantFiled: August 31, 2007Date of Patent: November 13, 2012Assignee: Qualcomm IncorporatedInventor: Vinod Kaushik
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Patent number: 8239766Abstract: This disclosure is directed to techniques for encoding and decoding transitional effects, i.e., visual video effects that are used to transition from a current scene of a multimedia sequence. According to the disclosed techniques, an encoding device detects a transitional effect associated with a multimedia sequence during the encoding of the multimedia sequence, and transmits information as part of an encoded multimedia sequence to identify the transitional effect associated with the encoded multimedia sequence to a decoder. The information may comprise metadata that can be used by the decoder to simulate or re-create the transitional effect. The decoder simulates a transitional effect in response to the information.Type: GrantFiled: August 9, 2006Date of Patent: August 7, 2012Assignee: QUALCOMM IncorporatedInventors: Tao Tian, Fang Shi, Vijayalakshmi R. Raveendran
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Patent number: 8064880Abstract: A general global gateway (GGG) uses shared secret data to authenticate between a CDMA network and a GSM network such that a mobile station having a subscription in a GSM network can roam into a CDMA network and be authenticated to use the CDMA network without having a complete ANSI-41 subscription. The goal of authenticating a GSM subscriber in an ANSI-41 network using GSM authentication credentials is achieved by substituting encryption key Kc as SSD-A in the standard ANSI-41 computation of AUTHR using a CAVE algorithm.Type: GrantFiled: December 14, 2004Date of Patent: November 22, 2011Assignee: QUALCOMM IncorporatedInventors: Nikhil Jain, Bruce Collins
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Patent number: 8009551Abstract: The subject invention selects a starting sub-carrier frequency group for a pilot staggering sequence to facilitate in mitigating the possibility of pilot signal collisions. In one embodiment, a randomized starting sub-carrier frequency group of the pilot is utilized in a first orthogonal frequency division multiplexing (OFDM) symbol of a frame. In another embodiment, a starting pilot sub-carrier frequency group number is determined by utilizing a random number generator such as, for example, a Pseudo-Noise (PN) sequence generator, seeded by a network identification (ID) number. In this manner, the starting sub-carrier frequency group is specific to that particular network. The subject invention also provides a more scalable system through the trading of system bandwidth for coverage.Type: GrantFiled: December 22, 2004Date of Patent: August 30, 2011Assignee: QUALCOMM IncorporatedInventor: Michael Mao Wang
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Patent number: 7995460Abstract: A control interface protocol governs communications in a satellite telephone system. The satellite telephone system comprises a radio antenna unit (RAU) and a plurality of desksets connected to the RAU. An interface bus connects the desksets to the RAU. The RAU and the desksets communicate with each other by packets. Each packet comprises a start of header (SOH) byte, an address number (ADDR) byte, a command (CMD) byte, an argument (ARG) and a block check character (BCC). The ADDR byte comprises a source and a destination address of the packet. All packets, except negative acknowledgment (NAK) packets from the desksets, are acknowledged by the RAU. The packets originating from the desksets are tagged with an address of the desksets. A packet to a specific deskset includes a destination address. A packet originating from the RAU to all desksets includes a first default address. A packet originating from the RAU to a deskset that does not have an address includes a second default address.Type: GrantFiled: April 20, 2004Date of Patent: August 9, 2011Assignee: QUALCOMM IncorporatedInventors: Clement B. Edgar, III, R. Nicholson Gibson
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Patent number: 7839831Abstract: Methods and apparatus for time tracking using assistance from TDM pilots in a communication network. In an aspect, a method is provided for time tracking in a device operating on a communication network, wherein the device performs a time tracking algorithm. The method includes determining a delay spread, and modifying at least one parameter used by the time tracking algorithm based on the delay spread. In another aspect, an apparatus is provided for time tracking in a device operating on a communication network, wherein the device performs a time tracking algorithm. The apparatus includes computation logic for determining a delay spread, and control logic for modifying at least one parameter used by the time tracking algorithm based on the delay spread.Type: GrantFiled: January 7, 2008Date of Patent: November 23, 2010Assignee: QUALCOMM IncorporatedInventors: Bojan Vrcelj, Ashok Mantravadi, Krishna Kiran Mukkavilli, Raghuraman Krishnamoorthi
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Patent number: 6346821Abstract: A method is provided for nondestructive measurement of minority carrier diffusion (Lp) length and accordingly minority carrier lifetime (Óp) in a semiconductor device. The method includes the steps of: reverse biasing a semiconductor device under test, scanning a focused beam of radiant energy along a length of the semiconductor device, detecting current induced in the DUT by the beam as it passes point-by-point along a length of the DUT, detecting current induced in the semiconductor device by the beam as it passes point-by-point along the scanned length of the semiconductor device to generate a signal waveform (Isignal), and determining from the Isignal waveform minority carrier diffusion length (Lp) and/or minority carrier lifetime (Óp) in the semiconductor device.Type: GrantFiled: March 11, 1999Date of Patent: February 12, 2002Assignee: Infineon Technologies AGInventor: Helmut Baumgart
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Patent number: 6331459Abstract: A method of forming a dynamic random access memory cell in a semiconductor substrate. The cell has a transistor in an active area of the semiconductor substrate electrically coupled to a storage capacitor through a buried strap or coupling region. The method includes forming an electrode for the capacitor in a lower portion of a trench in the semiconductor substrate. A sacrificial material is formed on the sidewall portion of the trench, such sacrificial material extending from the surface of the semiconductor substrate into the substrate beneath the surface of the semiconductor substrate. The active area for the transistor is delineated and includes forming a covering material over the surface of the semiconductor substrate with a portion of the sacrificial material being projecting through the covering material to expose such portion of the sacrificial material.Type: GrantFiled: February 18, 1999Date of Patent: December 18, 2001Assignee: Infineon Technologies AGInventor: Ulrike Gruening
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Patent number: 6329271Abstract: A short channel insulated gate field effect transistor has within the semiconductor body that houses the transistor a buried layer of the same conductivity type as the body but of higher impurity concentration. The buried layer is below the channel region and essentially extends only the distance between the drain and source regions of the transistor. The process to form the device provides high concentration in the region under the gate to suppress lateral depletion region expansion, while keeping a gradual junction in the vertical direction.Type: GrantFiled: June 6, 2000Date of Patent: December 11, 2001Assignees: Infineon Technologies AG, International Business Machines CorporationInventors: Hiroyuki Akatsu, Yujun Li, Jochen Beintner
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Patent number: 6327170Abstract: An integrated circuit comprising first and second bitline pairs 410 and 420 is described. The bitline paths of a bitline pair are on different bitline levels. The bitline paths of the first and second bitline pairs which are on different bitline levels are adjacent to each other. The first bitline pair comprises m vertical-horizontal twists 440, where m is a whole number≧1, and the second bitline pair comprises n vertical-horizontal twists 460 and 461, where n is a whole number≠m. The vertical-horizontal twists transform coupling noise into common mode noise.Type: GrantFiled: September 28, 1999Date of Patent: December 4, 2001Assignee: Infineon Technologies AGInventors: Gerhard Mueller, Ulrike Gruening
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Patent number: 6324125Abstract: A semiconductor circuit is provided including circuitry for producing a pulse. A plurality, n, of delay elements are provided each enabled and disabled in parallel by the pulse. Each delay element is adapted to transmit the pulse from an input to an output, with the pulse reaching the respective outputs at different times. A plurality, n−1, of detectors is provided each having an input coupled to an input of a corresponding delay element. Each detector is adapted to set a state of its output to a predetermined state, from a plurality of states, in response to receiving a portion of the pulse. The outputs of the detectors are coupled to output pins of the semiconductor circuit. A tester is provided that is adapted to couple to the semiconductor output pins and detect the state of the detector outputs.Type: GrantFiled: March 30, 1999Date of Patent: November 27, 2001Assignee: Infineon Technologies AGInventors: Gerd Frankowsky, Hartmud Terletzki
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Patent number: 6323535Abstract: A fuse for semiconductor devices, in accordance with the present invention, includes a cathode including a first dopant type, and an anode including a second dopant type where the second dopant type is opposite the first dopant type. A fuse link connects the cathode and the anode and includes the second dopant type. The fuse link and the cathode form a junction therebetween, and the junction is configured to be reverse biased relative to a cathode potential and an anode potential. A conductive layer is formed across the junction such that current flowing at the junction is diverted into the conductive layer to enhance material migration to program the fuse.Type: GrantFiled: June 16, 2000Date of Patent: November 27, 2001Assignees: Infineon Technologies North America Corp., International Business Machines CorporationInventors: Sundar K. Iyer, Peter Smeys, Chandrasekhar Narayan, Subramanian Iyer, Axel Brintzinger
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Patent number: 6320803Abstract: There is provided method and apparatus for improving and making more effective the testing of very large scale integrated (VLSI) devices such as a synchronous random access memory (SDRAM), along with improving their performance and their yield in production. The method includes the steps of providing a VLSI device with switching circuitry which permits respective arrays or banks of the device to be tested alone or simultaneously with separate sequences of test mode signals to identify defects, interactions and unwanted limitations in the overall performance of the device; using the information thus obtained to modify the test mode signals and where indicated the design of the device; iterating the previous steps to optimize a test methodology for the device; and using the optimized test methodology during burn-in of production devices. Logic circuitry is added to a VLSI device to facilitate the improved testing capability.Type: GrantFiled: March 23, 2000Date of Patent: November 20, 2001Assignees: Infineon Technologies AC, Kabushiki Kaisha Toshiba, International Business Machines CorporationInventors: Martin Gall, Wayne Ellis, Shinji Miyamoto, Masahiro Yoshihara
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Patent number: 6319787Abstract: A trench capacitor having a substrate with a trench extending therein with a nested, e.g., concentric, conductive regions disposed within the trench. A dielectric material is disposed within the substrate. The dielectric material has portions thereof disposed between the concentric conductive regions to dielectrically electrically separate one of the conductive regions from another one of the conductive regions. The dielectrically separated conductive regions provide a pair of electrodes for the capacitor. Selected ones of the concentric conductive regions are electrically connected to provide one of the electrodes for the capacitor. The substrate has a conductive region therein and one of the concentric conductive regions providing one of the electrodes is electrically connected to the conductive region in the substrate. One of the concentric conductive regions is electrically connected to a conductive region in the substrate through a bottom portion of the trench.Type: GrantFiled: June 30, 1998Date of Patent: November 20, 2001Assignee: Siemens AktiengesellschaftInventors: Gerhard Enders, Matthias Ilg, Dietrich Widmann
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Patent number: 6319788Abstract: A method for fabricating a trench capacitor wherein the trench in the substrate. The walls of the trench are lined with a semiconductor material having a substantially uniform thickness over sidewalls of the trench, such trench being void of the material in an inner region of the trench. A dielectric collar is formed in an upper portion of the trench above the semiconductor material. The semiconductor material is removed from the bottom portion of the trench. A node dielectric is formed that lines the collar and trench sidewalls at the bottom portion of the trench. The trench is filed with a doped semiconductor material, such doped semiconductor material providing an electrode of the trench capacitor. The trench is forming includes forming the trench with a diameter of the lower portion of the trench effectively at least equal to about the upper portion of the trench.Type: GrantFiled: December 14, 1999Date of Patent: November 20, 2001Assignees: Infineon Technologies North America Corp., International Business Machines CorporationInventors: Ulrike Gruening, Martin Schrems, Carl J. Radens
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Patent number: 6313663Abstract: A bidirectional full swing voltage repeater implemented on a signal line of an integrated circuit, which includes a first enable node for providing a first enable signal and a second enable node for providing a second enable signal. There is included a first full-swing unidirectional repeater circuit coupled between a first portion of the signal line and a second portion of the signal line. The first full-swing unidirectional repeater is configured to pass a first full swing signal from the first portion of the signal line to the second portion of the signal line when the first enable signal is enabled. The second full-swing unidirectional repeater circuit is coupled between the first portion of the signal line and the second portion of the signal line.Type: GrantFiled: January 27, 2000Date of Patent: November 6, 2001Assignees: Infineon Technologies AG, International Business Machines CorporationInventors: Gerhard Mueller, David R. Hanson
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Patent number: 6310375Abstract: The present invention provides a trench capacitor, particularly for use in a semiconductor memory cell (100), having an isolation collar (168) with a trench (108) formed in a substrate (101); said isolation collar (168) formed in the upper region of said trench (108); an optional buried plate (165) in said substrate region surrounding said lower region of said trench (180) as a first capacitor plate; a dielectric layer (164) for lining said lower region of said trench (108) and said isolation collar (168) as capacitor dielectric; and a conductive second fill material (161) filled in said trench (108) as a second capacitor plate; wherein said diameter of said lower region of said trench (108) is at least equal to said diameter of said upper region of said trench (108). Moreover, the invention provides a corresponding manufacturing method.Type: GrantFiled: June 15, 1998Date of Patent: October 30, 2001Assignee: Siemens AktiengesellschaftInventor: Martin Schrems
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Generator scheme and circuit for overcoming resistive voltage drop on power supply circuits on chips
Patent number: 6310511Abstract: Apparatus is used to dynamically control the power output of generators of a generator system on a chip to load circuits on the chip. A power bus is directed along at least one “spine” section on the chip which may intersect with at least one “arm” section on the chip for supplying power from the generators, which are coupled to the power bus in the “spine” section thereof, to circuits on the chip. The power bus has a feedback lead from each end which is remote from the generators for providing a continuous measurement of a voltage drop occurring at each remote end. At least one detector circuit is located at a predetermined point adjacent the generators of the chip for comparing a voltage from the generators measured at the predetermined point with the concurrent voltage drop measured at an associated remote end.Type: GrantFiled: June 16, 2000Date of Patent: October 30, 2001Assignee: Infineon Technologies AGInventor: Oliver Weinfurtner -
Patent number: 6307768Abstract: A semiconductor device includes a plurality of bitlines arranged in an array, the plurality of bitlines being grouped in pairs and at least some of the bitlines include a twist. A twist region is disposed along the plurality of bitlines wherein the twist region occupies layout area designated for the twists. An equalizer element is disposed in the twist region for equalizing a pair of bitlines.Type: GrantFiled: December 28, 2000Date of Patent: October 23, 2001Assignee: Infineon Technologies Richmond, LPInventor: Ulrich Zimmermann
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Patent number: 6307397Abstract: A method in an integrated circuit for implementing a reduced voltage repeater circuit on a signal line having thereon reduced voltage signals. The reduced voltage signals has a voltage level that is below VDD. The reduced voltage repeater circuit is configured to be coupled to the signal line and having an input node coupled to a first portion of the signal line for receiving a first reduced voltage signal and an output node coupled to a second portion of the signal line for outputting a second reduced voltage signal. The method includes coupling the input node to the first portion of the signal line. The input node is coupled to an input stage of the reduced voltage repeater circuit. The input stage is configured to receive the first reduced voltage signal on the signal line. The input stage is also coupled to a level shifter stage that is arranged to output a set of level shifter stage control signals responsive to the first reduced voltage signal.Type: GrantFiled: January 27, 2000Date of Patent: October 23, 2001Assignee: InfineonTechnologies AGInventors: Gerhard Mueller, David R. Hanson