Abstract: Horizontal and vertical deflection windings in a deflection yoke coil assembly of a CRT (cathode ray tube) having stroke written or raster scan displays are driven by x and y analog deflection signals, respectively. Each of the x and y analog deflection signals are converted to x and y digital signals, respectively, sampled to provide x, y sample sets which are coupled to a digital x correction signal memory and a digital y correction signal memory, respectively. Geometric corrections are stored in the memories for each of a predetermined number of x, y signal set values which correspond, respectively, to a number of point locations over the CRT screen. The x and y corrections that are addressed from the memories are supplied to MDACs (multiplying digital to analog converters) and then to analog delay line filters which supply the x, y analog correction signals for summing with the x, y analog deflection signals, respectively.

Abstract: A structure for an electrical interconnection suitable for a semiconductor integrated circuit is made by a process utilizing selective tungsten deposition at low pressure to form an intermediate conductive layer without significantly ablating nearby insulating material.

Abstract: A semiconductor device contains first and second semiconductive regions (43 and 78) and first, second, and third semiconductive zones (59/61, 79, and 71) of opposite conductivity type to the regions. The first zone adjoins an insulating layer (45/46/47/48/63) along an upper surface of the first region. The second region extends to the upper surface through a window in the insulating layer. The second zone adjoins the second region below the window and is spaced apart from the third zone which extends to the upper surface. The zones and insulating layer upwardly and laterally enclose the second region. A first segment (59) of the first zone is continuous with the third zone and at least partly adjoins the lateral edge of the insulating layer located apart from the window.

Abstract: A bipolar gate has an output transistor (Q5) that switches in response to the voltage at an emitter of a drive transistor (Q2 or Q10). An active pull-off circuit (14) discharges the base of the output transistor (Q5) when it turns off. The discharge path is provided through a pull-off transistor (Q7) whose collector is coupled to the base of the output transistor. The switching of the pull-off transistor is regulated with a control circuit containing a trigger circuit and a bias circuit. The trigger circuit is coupled between the bias circuit and a collector of the drive transistor. A "kicker" circuit formed with an input transistor (QC1) and a voltage reference (18) speeds up the switching of the drive transistor.

Abstract: A bipolar input circuit for regulating the current/voltage level at the base of a switching transistor (QA) provides a capacitively-controlled discharge path from the base through a discharge transistor (QC) when an input signal (V.sub.I) makes certain voltage transitions. The base of the switching transistor responds to the voltage at an emitter (E1) of an input transistor (QB) which has another emitter (E2) coupled to the base of the discharge transistor. Its base is further coupled to a capacitor (C) which controls the discharge path.

Abstract: A bipolar signal translator contains a pair of transistors (Q1 and Q2) arranged as a current mirror with their emitters coupled to a voltage supply (V.sub.EE) by way of a pair of impedance elements (R4 and R5) that improve stability. Their collectors are coupled through another pair of impedance elements (R1 and R2) to an input transistor (Q4 or Q5) and to a device circuit (D1 and D2, D3 and D4, or Q4). The collector of one of the current-mirror transistors (Q2) is coupled to the base of an output transistor (Q3) whose collector is preferably coupled through an output impedance element (R3) to a current-control transistor (Q6) that improves power utilization.

Abstract: A device for testing continuity and current leakage at leads of an electronic circuit such as an integrated circuit has a contact structure (16) having test terminals (T1-T28) for contacting the leads. A first and a second of the leads are power supply leads respectively contactable with a first and a second of the test terminals (T14 and T28 or T26). Continuity/leakage detection is done with one or more corresponding detection circuits (D1-D28). Each detection circuit has a channel along which both continuity and leakage are tested. A supply switching circuit (26) appropriately switches voltages between values suitable for continuity testing and values suitable for leakage testing.

Abstract: A differential amplifier operable between a pair of supply voltages that define a rail-to-rail supply range contains a pair of differential portions (20 and 22) that together provide representative signal amplification across the supply range, although neither differential portion individually does so. A current control (24) regulates operating currents (I.sub.N and I.sub.p) for the differential portions in such a way that the amplifier transconductance can be controlled in a desired manner as the common-mode part (V.sub.CM) of the amplifier input signal (V.sub.I+ and V.sub.I-) varies across the supply range. The transconductance is typically controlled to be largely constant. A summing circuit (26) selectively combines internal currents (I.sub.A, I.sub.B, I.sub.C, and I.sub.D) from the differential portions to generate at least one output signal (I.sub.O+ and I.sub.O-) representative of the input signal.

Abstract: A bipolar impedance buffer contains an input transistor (Q1) whose emitter is coupled to that of a like-polarity intermediate transistor (QN). Its collector is coupled to the base of a like-polarity output transistor (QO), while its base is coupled to the collector of an opposite-polarity transistor (QP). A resistor (RN) coupled between the base and collector of the intermediate transistor significantly reduces the output settling time.

Abstract: A differential amplifier circuit contains a pair of complementary input portions (3, 5 and 4, 6). The input portions amplify a common differential input signal to produce corresponding amplified differential signals which are supplied to a summing section that operates as a modulated current mirror to produce an output signal representative of the input signal. The summing section contains a pair of like-polarity first and second amplifiers (13 and 14) and a pair of like-polarity third and fourth amplifiers (19 and 20) complementary to the other amplifiers. A pair of impedance elements (11 and 12) are coupled between a first voltage supply (ground reference) and the third and fourth amplifiers. A pair of current sources, typically impedance elements (8 and 9), are coupled between a second voltage supply (+B) and the first and second amplifiers.

Abstract: A signal translator for converting an input voltage (V.sub.I) into an output voltage (V.sub.O) at a different level contains a primary element stack (10) and a similarly-configured image element stack (12), both coupled between the sources of a potentially first variable supply voltage (V.sub.CC) and a normally constant second supply voltage (V.sub.EE). A reference voltage (V.sub.R) is supplied to both a primary-stack transistor (Q2) which provides the output voltage and an image-stack transistor (Q4) which provides a feedback signal (V.sub.F). A feedback circuit (14) formed with an amplifier (16) and a shifting circuit (18) response to the feedback signal to supply the reference voltage at such a value as to compensate the output voltage for changes in the first supply relative to the second supply voltage is particularly useful for CTL-to-TTL logic.

Abstract: A bipolar differential amplifying circuit contains a pair of input transistors (3 and 4) for receiving a differential input signal, a pair of differentially-configured first and second transistor circuits (5 and 6) coupled to the input transistors, and a subtracting circuit (11 and 12) for comparing the sum of the currents through first collectors (5C.sub.1 and 6C.sub.1) of the transistor circuits with the current through a second collector (6C.sub.2) of the second transistor circuit to generate an output signal representative of the input signal. A PN diode (13) is coupled to a second collector (5C.sub.2) of the first transistor circuit. The voltages at the collectors are very close, thereby yielding a high common-mode rejection ratio for the input signal.

Abstract: A structure for an electrical interconnection suitable for a semiconductor integrated circuit is made by a process utilizing selective tungsten deposition at low pressure to form an intermediate conductive layer without significantly ablating nearby insulating material.

Abstract: A TTL circuit having a pair of current sources (R2/V.sub.CC and R2/V.sub.CC) and a pair of transistors (Q1 and Q2) arranged in a standard TTL input/inverting configuration has hysteresis at the input signal (V.sub.X) for providing noise protection. A hysteresis circuit (10) suitably containing another current source (R3/V.sub.CC) coupled to the base of the inverting transistor (Q2) and a rectifier (12) coupled between the collector of the inverting transistor and the current source (R1/V.sub.CC) coupled to the base of the input transistor (Q1) provides the hysteresis at the circuit switching points.

Abstract: A layer of a conductive material consisting of aluminum alone or in combination with a small percentage of copper and/or silicon is formed on a semiconductor surface in a two-step deposition process in such a manner as to largely avoid serious continuity defects in the layer.

Abstract: A bipolar voltage translator contains a pair of differentially coupled transistors (Q1 and Q2) for converting an input voltage (V.sub.IN) supplied to one (Q1) of the pair into an output voltage (V.sub.OUT) taken between the other (Q2) and a first resistor (R9). A further transistor (Q4) coupled through a second resistor (R12) to a V.sub.EE supply provides current for the differential pair. A voltage reference circuit (10) containing at least three serially coupled diodes (S5, J3, and J4) with a resistive voltage divider (R13 and R14) across an intermediate one (J3) of the diodes provides the current-source transistor with a reference voltage (V.sub.REF2) that equals V.sub.EE +(1+.alpha.)V.sub.BE where .alpha. is 0.2-3.0. The ratio of the first resistor to the second is desirably .beta./.alpha. where .beta.is the output voltage swing divided by V.sub.BE. If .beta. is 1 and the transistors are NPN devices, the output voltage level is suitable for current tree logic.

Abstract: A film of titanitum-tungsten nitride is used to provide the dual function of a fuse link between a semiconductive device and an interconnect line in a memory array and of a barrier metal between another metal and a semiconductor region.

Abstract: A cathode ray tube has discrete x-ray absorbing means integrally associated with the face region thereof to beneficially attenuate the x-radiation emanating peripherally and forwardly therefrom. Attached to the tube face is a closed frame-like resilient gasket impregnated with x-ray absorbing material. Superposed thereon is a cover plate of x-ray absorbing glass. This is adhered to the tube face by a layer of substantially transparent adhesive confined within the gasket.

Abstract: A method of manufacturing a semiconductor device having two juxtaposed regions (12, 16) of opposite conductivity types which adjoin a surface and which together constitute a p-n junction (9) which is preferably perpendicular to the surface and the doping concentration of which decreases towards the surface. According to the invention n-type and p-type buried layers (2, 6) are provided beside each other on a semiconductor substrate (1) and on said layers a high-ohmic epitaxial layer (7) is grown. By heating, the dopants diffuse from the buried layers through the whole thickness of the epitaxial layer and into the substrate. With suitably chosen donor and acceptor atoms (for example boron and phosphorus in silicon) n and p-type regions (12, 16) are formed in the epitaxial layer and form a p-n junction (9) perpendicular to the surface by compensation of the lateral diffusions from the buried layers.

Abstract: A read resettable memory circuit contains a flip-flop circuit (10) consisting of a flip-flop (FF) and an edge-triggered control circuit (CC) and a fall-through latch (16). The control circuit sets the flip-flop in response to a selected edge transition in a first clock (.0..sub.1) when an appropriate external logical set signal (S) is received and resets the flip-flop in response to a selected edge transition in a second clock (.0..sub.2) when an appropriate feedback logical reset signal (R) is received. The latch provides the reset signal at a value corresponding to the current logic state of the flip-flop during each period running from the selected edge transition of the second clock to its opposite edge transition and at a value corresponding to the logic state of the flip-flop that exists just before each opposite edge transition of the second clock during each remaining following period.