Patents Represented by Law Firm Townsend, Snider & Banta
  • Patent number: 5198500
    Abstract: Disclosed is an improved process of the post-emulsion method capable of forming crosslinked resin particles which do not have fusion bonds between particles and which have good storage stability and good redispersibility in an aqueous medium. The process comprises (a) dispersing in an aqueous medium a resinous component comprising (I) a base resin having a glass transition temperature (Tg) of 0.degree. C. or less and a polymerizable double bond, (II) a monomer which, when polymerized, provides a resin of which Tg is 20.degree. C. higher than that of said base resin, or a resin of which Tg is 20.degree. C. higher than that of the base resin, and (III) a polyvinyl compound; (b) crosslinking inside the dispersed resin particles and; (c) removing the aqueous medium therefrom.
    Type: Grant
    Filed: January 15, 1991
    Date of Patent: March 30, 1993
    Assignee: Nippon Paint Co., Ltd.
    Inventors: Hisaichi Muramoto, Yusuke Ninomiya, Keizou Ishii, Shinichi Ishikura
  • Patent number: 5198315
    Abstract: A zinc alkaline cell is formed by using an anode active material which contains a non-amalgamated zinc alloy powder having a bulk specific gravity ranging from approximately 2.90 to 3.50 (grams per cm.sup.3) and containing a predetermined amount of indium coated on a surface of the non-amalgamated zinc alloy powder containing a predetermined amount of lead or a predetermined amount of a mixture of lead with bismuth or aluminum as a zinc alloy powder component, other than unavoidable impurities. The zinc alkaline cell can achieve corrosive resistance and discharge performance as a cell and it is comparable with cells formed by using amalgamated zinc alloy powder which has been practically employed.
    Type: Grant
    Filed: August 21, 1991
    Date of Patent: March 30, 1993
    Assignees: Sanyo-Ekuseru Kabushikigaisha, Toho-Aen Kabushikigaisha, Sanyo-Denki Kabushikigaisha
    Inventors: Kinya Tada, Masaaki Kurimura, Mutsumi Yano, Eiichiro Mieno, Wataru Sekiguchi, Junzo Nakagawa, Takanori Akazawa
  • Patent number: 5191032
    Abstract: A heterofunctional macromer represented by the formula: ##STR1## in which R.sub.1 is H or C.sub.1 -C.sub.4 alkyl; R.sub.2 is a (poly) lactone or (poly) ether chain;X.sub.1 is --COO--, --COOCH.sub.2 CH.sub.2 OCO--, --CONHCOO--, --COOCH.sub.2 CH.sub.2 NH--COO-- or ##STR2## X.sub.2 is --O--, --COO-- or --OCO--NH--R.sub.3 --NHCOO-- group; R.sub.3 is C.sub.1 -C.sub.6 alkylene, aromatic or alicyclic group;A is --CH.sub.2 --, --C(CH.sub.3).sub.2 -- or ##STR3## group; and reactive polymers derived from said macromer.
    Type: Grant
    Filed: November 22, 1991
    Date of Patent: March 2, 1993
    Assignee: Nippon Paint Co., Ltd.
    Inventors: Mitsuo Yamada, Kei Aoki
  • Patent number: 5183783
    Abstract: Single crystal silicon islands in a dielectric-separation substrate are separated completely and finished in a uniform thickness by preparatorily denuding a single crystal silicon substrate of a warpage suffered to occur therein.This dielectric-separation substrate is produced by a method which comprises forming a thermal oxide film on a single crystal silicon substrate having grooves incised in advance therein, then forming an irreversibly thermally shrinkable film on the rear surface of said single crystal silicon substrate prior to depositing a polycrystalline silicon thereon, then depositing a polycrystalline silicon on said single crystal silicon substrate, and thereafter grinding said single crystal silicon substrate in conjunction with said irreversibly thermally shrinkable film.
    Type: Grant
    Filed: December 23, 1991
    Date of Patent: February 2, 1993
    Assignee: Shin-Etsu Handotai Co., Ltd
    Inventors: Yutaka Ohta, Konomu Ohki, Masatake Katayama
  • Patent number: 5157877
    Abstract: A backing pad be used in a holding jig for holding a semiconductor wafer in the step of mirror polishing comprises a hydrophobic foam, possessed rigidity such that the difference between the thickness T.sub.1, thereof under a load of 300 gf/cm.sup.2 and the thickness, T.sub.2, thereof under a load of 1,800 gf/cm.sup.2 (T.sub.1 -T.sub.2) is in the range of from 1 to 100 .mu.m, and has holes formed therein in a diameter in the range of 10 to 30 .mu.m through the wafer-holding surface thereof.The polishing of a semiconductor is effected by a method which comprises preparing a finished backing pad by the precision surface machining operation, setting the semiconductor wafer on a wafer holding jig having a template containing at least one wafer-positioning hole fixed on a carrier plate in such a manner that the backing pad enters the positioning hole, and polishing the semiconductor wafer.
    Type: Grant
    Filed: February 26, 1992
    Date of Patent: October 27, 1992
    Assignee: Shin-Etsu Handotai Co., Ltd.
    Inventor: Hiromasa Hashimoto