Patents Assigned to Advantest
  • Multi-port analysis apparatus and method and calibration method thereof
    Patent number: 7359814
    Abstract: A multi-port device analysis apparatus is capable of analyzing a multi-port device having three or more with improved efficiency and accuracy.
    Type: Grant
    Filed: February 7, 2000
    Date of Patent: April 15, 2008
    Assignee: Advantest
    Inventors: Yoshikazu Nakayama, Hirotaka Wagata, Minoru Iida