Abstract: A magnetic field measuring apparatus for measuring a to-be-measured magnetic field includes a magnetic impedance element with an impedance change rate that changes depending on the to-be-measured magnetic field, a drive signal providing section and a measurement range setting section. The drive signal providing section provides a drive signal to the magnetic impedance element. A measurement range setting section sets a measurement range in which the to-be-measured magnetic field can be measured. A relationship between the to-be-measured magnetic field and the impedance change rate is arranged to change depending on a frequency of the drive signal. The measurement range setting section is arranged to set the measurement range by setting the frequency.

Abstract: A signal vector derivation apparatus receives measurement results from a plurality of sensors that receive signals each represented by a vector having a predetermined direction and measure triaxial components orthogonal to each other and derives the direction of the vector. The measurement results from the sensors are each proportional to a sum of the triaxial components of the vector multiplied, respectively, by first coefficients. The signal vector derivation apparatus includes a spectrum deriving section and a direction deriving section. The spectrum deriving section derives a spectrum obtained based on the measurement results from the sensors and a sum of the first coefficients multiplied, respectively, by second coefficients, the spectrum having local maximum values within voxels in which signal sources that output the respective signals exist. The direction deriving section derives the direction of the vector based on the second coefficients used to obtain the spectrum.

Abstract: An embodiment is an automated test equipment (ATE) for testing a device under test (DUT) which is connected to the ATE via a load board. The ATE comprises a stimulus module, a measurement module, a loopback, a first switch, a second switch, and a load board interface. The load board interface comprises a first radio frequency port and a second radio frequency port. The first and second radio frequency ports are configured to be coupled to the respective ports of the load board. The first switch is configured to couple the first radio frequency port to the stimulus module in a first switching state of the first switch and the second switch is configured to couple the second radio frequency port to the measurement module in a first switching state of the second switch.

Abstract: An automated test equipment for testing one or more devices under test, comprises at least one port processing unit, comprising a high-speed-input-output interface, HSIO, for connecting with at least one of the devices under test, a memory for storing data received by the port processing unit from one or more connected devices under test, and a streaming error detection block, configured to detect a command error in the received data, wherein the port processing unit is configured to, in response to detection of the command error, limit the storing in the memory of data following, in the received data, after the command which is detected to be erroneous. A method and computer program for automated testing of one or more devices under test are also described.

Abstract: A test carrier carried in a state of accommodating a device under test (DUT) includes: a carrier body that holds the DUT; a lid member that covers the DUT and is attached to the carrier body; and an identifier for identifying an individual of the test carrier.

Abstract: An automated test equipment for testing one or more DUTs comprises a test head and a DUT interface. The DUT interface comprises a plurality of blocks of spring-loaded pins, for example groups or fields of spring-loaded pins. For example, the DUT interface is configured for establishing an electronic signal path between the test head and a DUT board or load board, which holds the DUT or which provides a connection to the DUT. The automated test equipment is configured to allow for a variation of a distance between at least two blocks of spring-loaded pins.

Abstract: An automated test equipment for testing one or more DUTs comprises a test head and a DUT interface. The DUT interface comprises a plurality of blocks of spring-loaded pins, for example groups or fields of spring-loaded pins. For example, the DUT interface is configured for establishing an electronic signal path between the test head and a DUT board or load board, which holds the DUT or which provides a connection to the DUT. The automated test equipment is configured to allow for a variation of a distance between at least two blocks of spring-loaded pins.

Abstract: Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, an enhanced auxiliary interface test system comprises a load board, testing electronics, controller, and memory mapped interface. The load board is configured to couple with a plurality of devices under test (DUTs). The testing electronics is configured to test the plurality of DUTs, wherein the testing electronics are coupled to the load board. The controller is configured to direct testing of the DUTs, wherein the controller is coupled to the testing electronics. The memory mapped interface is configured to implement multiple paths to access a central processing unit (CPU) on the controller and enable testing of multiple DUTs in parallel.

Abstract: A measurement result receiving apparatus receives measurement results transmitted from a plurality of measuring devices, the measurement results obtained by conducting a measurement at a predetermined sampling interval according to a reference clock of each measuring device. The measurement result receiving apparatus includes a receiving section that receives the measurement results from the plurality of measuring devices; and a sampling interval converting section that converts the measurement results into measurement values associated with a common sampling interval.

Abstract: An electronic component testing apparatus for testing a device under test (DUT) includes: a socket unit that is electrically connected to the DUT; a first wiring board that includes a board opening; and a tester that includes a test head in which the first wiring board is mounted. The socket unit includes a first socket that faces a first main surface of the DUT and is electrically connected to the DUT and the first wiring board. The second socket that is exposed from the first wiring board through the board opening, contacts a second main surface of the DUT on a side opposite to the first main surface, and includes: a base that contacts the second main surface; and a test antenna unit that is electrically connected to the tester and faces a device antenna unit of the DUT.

Abstract: An ultrasonic measurement apparatus includes a lens, an ultrasonic measuring section, an ultrasonic determining section, and a lens moving section. The lens receives an ultrasonic wave output from a measuring target. The ultrasonic measuring section measures the ultrasonic wave received by the lens in relation to time. The ultrasonic determining section determines whether or not the ultrasonic wave is included in a result of measurement by the ultrasonic measuring section at an elapsed time point when the time required for the ultrasonic wave to travel a focal distance of the lens has elapsed after the ultrasonic wave is output from the measuring target. The lens moving section moves the lens such that it is determined that the ultrasonic wave is included in the result of measurement by the ultrasonic measuring section.

Abstract: Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a test system configuration adapter includes a tester side socket, a break out pin, and a device under test (DUT) side slot. The tester side socket is configured to couple with a test equipment socket. The break out pin is configured to couple with the supplemental equipment. The DUT side slot is configured to couple with the tester side socket, the break out pin, and a DUT. The test system configuration adapter is configured to enable communication between test equipment coupled to the test equipment socket and supplemental equipment coupled to the breakout pin while the DUT remains coupled to the DUT side slot. The breakout pin and tester side socket can be selectively coupled to the DUT side slot.

Abstract: An automated test equipment (ATE) apparatus comprising a tester processor operable to generate commands and data for coordinating testing of a plurality of devices under test (DUTs). The ATE further comprises a field programmable gate array (FPGA) communicatively coupled to the tester processor, wherein the FPGA comprises routing logic operable to route signals associated with the commands and data in the FPGA based on a type of the device under test (DUT). Further, the ATE comprises a connector module communicatively coupled to the FPGA comprising a socket to which the DUT connects and further comprising circuitry for routing the signals to a set of pins on the DUT, wherein the set of pins are associated with a first type of DUT. The circuitry can support multiple different DUT types having a common form factor but different pinout assignments.

Abstract: An electronic component handling apparatus pressing the DUT against a socket electrically connected to a tester, includes: a first receiver that receives, from the tester, a first signal indicating a detection value of a temperature detection circuit; a calculator that calculates a temperature of the DUT based on the first signal; a calibrator that calibrates the calculated temperature; a second receiver that receives, from the tester, a second signal that causes the calibrator to start a first calibration; and a temperature adjuster that adjusts the temperature of the DUT. The second receiver receives the second signal before the tester turns on the DUT, once the second signal is received, the calibrator calculates a first calibrated temperature by executing the first calibration with respect to the calculated temperature, and the temperature adjuster adjusts the temperature of the DUT based on the first calibrated temperature.

Abstract: A signal/noise determination apparatus includes a plurality of sensors, a determination model recording section, and a signal/noise determining section. The plurality of sensors measure a signal and a noise. The determination model recording section records a determination model used to determine whether components of results of measurement by the sensors expected with hypothetical signal information and hypothetical noise information are from a signal source or a noise source. The determination model is generated by machine learning with the measurement results, the hypothetical signal information, and the hypothetical noise information as training data. The signal/noise determining section determines whether components of the measurement results are from the signal source or the noise source based on the measurement results and the determination model.

Abstract: A transformer arrangement comprises a primary winding and a secondary winding, which are magnetically coupled. The transformer arrangement also comprises a compensating arrangement, which is circuited to provide a link between a terminal of the primary winding and a terminal of the secondary winding. The compensating arrangement is configured such that a change of a magnetic flux through the primary winding and the secondary winding induces a voltage in the compensating arrangement. The compensating arrangement comprises at least one coupling capacitor configured to block a DC current and to pass a current caused by the induced voltage. The compensating arrangement is configured to at least partially compensate a current that is caused by an inter-winding capacitance between the primary winding and the secondary winding using the current caused by the induced voltage.

Abstract: A heater drive controlling apparatus for an electronic component testing apparatus includes a breaker disposed between a power source and heaters, and a controller that controls electric currents supplied from the power source to the heaters in order according to a first priority set for the heaters such that a sum of the supplied electric currents is within a rated current of the breaker. The electronic component testing apparatus includes a test chamber, a thermal-stress applying chamber, and a thermal-stress removing chamber each of which includes the heaters.

Abstract: A method of testing a device comprises receiving signals from a device under test (DUT) and computing an eye diagram using the signals received from the DUT. The method also comprises comparing an eye height and an eye width of the eye diagram to a predetermined values of a threshold eye height and a threshold eye width. Further, responsive to a determination of the eye height and the eye width exceeding the predetermined values of the threshold eye height and the threshold eye width, flagging the DUT as passing.

Abstract: The test apparatus tests a wafer under test on which devices under test each including magnetoresistive memory or a magnetic sensor are formed. In a test process, the wafer under test is mounted on a stage. A test probe card is configured such that it can make probe contact with the wafer under test in the test process. A wafer connection HiFix is arranged between the test probe card and a test head. A magnetic field application apparatus is provided to the wafer connection HiFix. In the test process, the magnetic field application apparatus applies a magnetic field BEX to the wafer under test.

Abstract: A laser beam output apparatus includes a pulsed laser output section, an optical path determining section, a wavelength changing section, and a multiplexer. The pulsed laser output section outputs a laser beam having a predetermined wavelength as first pulses. The optical path determining section receives the first pulses and determines one among a plurality of optical paths for each of the first pulses for output. The wavelength changing section receives light beams traveling, respectively, through the plurality of optical paths and changes the light beams to have their respective different wavelengths for output. The multiplexer multiplexes outputs from the wavelength changing section.