Abstract: An automated test equipment (ATE) system comprises a system controller communicatively coupled to a tester processor, where the system controller is operable to transmit instructions to the tester processor, and where the tester processor is operable to generate commands and data from the instructions for coordinating testing of a plurality of devices under test (DUTs). The apparatus also comprises an FPGA programmed to support a first protocol communicatively coupled to the tester processor comprising at least one hardware accelerator circuit operable to internally generate commands and data transparently from the tester processor for testing a DUT of the plurality of DUTs. Further, the apparatus comprises a bus adapter comprising a protocol converter module operable to convert signals associated with the first protocol received from the FPGA to signals associated with a second protocol prior to transmitting the signals to the DUT, wherein the DUT communicates using the second protocol.

Abstract: A method for testing using an automated test equipment (ATE) comprises transmitting instructions for executing tests on a device under test (DUT) from a tester processor to a queue communicatively coupled with the tester processor and a Field Programmable Gate Array (FPGA), wherein the tester processor is configured to determine a hardware acceleration mode from a plurality of hardware acceleration modes for executing tests on the DUT. Further, the hardware acceleration mode is configured to distribute functionality for generating commands and data between the tester processor and the FPGA, wherein in at least one hardware acceleration mode the tester processor is configured to generate commands for testing the DUT and the FPGA is configured to generate data for testing the DUT. The method also comprises accessing the instructions in the queue, translating the instructions into commands associated with testing the DUT and transmitting the commands to the DUT.

Abstract: Provided is a measurement apparatus including a signal source configured to output a binary digital signal configuring a multi-tone waveform, a waveform acquisition unit configured to acquire an analog signal waveform generated in response to application of the digital signal to a device under test, and a computation unit configured to calculate a frequency characteristic of the device under test from the waveform acquired by the waveform acquisition unit, in which the signal source is configured to repeatedly output a signal upconverted by multiplying a pseudo-random binary sequence (PRBS) signal by a repeating rectangular wave with a reference frequency and a reference duty ratio.

Abstract: An electronic circuit for converting a signal between digital and analog in a burst mode, including a processor configured to utilize a synchronizing clock signal, a converter configured to convert a signal data between digital and analog using a converter clock signal, a phase comparator configured to determine a phase relationship between the synchronizing clock signal and the converter clock signal, and a digital signal processor coupled to the phase comparator and configured to receive an information about the phase relationship, wherein the digital signal processor is configured to apply a delay to the signal data being exchanged between the processor and. The synchronizing clock signal and the converter clock signal have a predetermined frequency relationship.

Abstract: An optical comb measuring apparatus that measures an irradiation target having multiple types of measuring targets, includes: an interference signal acquiring section; and a frequency spectrum measuring section. The interference signal acquiring section acquires an interference signal between a post-irradiation signal comb obtained by irradiating the irradiation target with a pre-irradiation signal comb and a local comb set to be different from a repetition frequency of the pre-irradiation signal comb by a predetermined differential frequency. The frequency spectrum measuring section measures a frequency spectrum of a result of acquisition by the interference signal acquiring section. Either one or both of the post-irradiation signal comb and the local comb provided to the interference signal acquiring section have only components within a plurality of required bands including all of predetermined frequencies.

Abstract: Frequency ranges may be converted by an apparatus including a converter configured to shift an original frequency range of an input data signal to a target frequency range, an input band selective filter bank configured to route the input data signal through a bandpass filter of a selected subrange within the target frequency range, the input selective filter bank including a plurality of bandpass filters, each bandpass filter having a corresponding subrange within the target frequency range.

Abstract: A test site includes: at least one test module that tests a device under test; and a waveform data acquisition module that converts an electrical signal relating to the DUT into a digital signal with a predetermined sampling rate so as to acquire waveform data in the form of a digital signal sequence. The higher-level controller controls the at least one test module and the waveform data acquisition module, and collects the waveform data acquired by the waveform data acquisition module in a form associated with the operation state of the at least one test module.

Abstract: A protective circuit that protects a semiconductor switch includes a group of terminals consisting of either one or more input terminals and two or more output terminals, or one or more output terminals and two or more input terminals, a first resistive circuit, connected to one of the terminals, comprising a resistor having a first temperature coefficient of resistance; and a second resistive circuit, connected to another one of the terminals, comprising a resistor having a second temperature coefficient of resistance different in temperature characteristics from the first temperature coefficient of resistance. The protective circuit is electrically connected to a control terminal of the semiconductor switch, and shuts off a passing current of the semiconductor switch when a temperature of the semiconductor switch is equal to or higher than a current shut-off temperature.

Abstract: An electronic component testing apparatus for testing a device under test (DUT) includes: a socket unit that is electrically connected to the DUT; a first wiring board that includes a board opening; and a tester that includes a test head in which the first wiring board is mounted. The socket unit includes a first socket that faces a first main surface of the DUT and is electrically connected to the DUT and the first wiring board. The second socket that is exposed from the first wiring board through the board opening, contacts a second main surface of the DUT on a side opposite to the first main surface, and includes: a base that contacts the second main surface; and a test antenna unit that is electrically connected to the tester and faces a device antenna unit of the DUT.

Abstract: There is provided a maintenance apparatus including: an acquisition unit configured to acquire a plurality of test results, for each of a plurality of jigs, in a case where a plurality of devices under measurement, which are different from each other, are sequentially tested via the plurality of jigs; a calculation unit configured to calculate a variation in test results, for each jig, by using the plurality of test results; and a determination unit configured to determine maintenance timing of the jig based on the variation in the test results.

Abstract: Embodiments of the present invention provide systems and methods for multidimensional parts average testing for testing devices and analyzing testing results to detect outliers according to embodiments of the present invention. The testing can include calculating multivariate (e.g., bivariate) statistics using delta measurements of like devices, a ratio of measurements, or principal component analysis that identifies eigenvectors and eigenvalues to define meta parameters, for example. Raw test result data can be converted to residual space and robust regression can be performed to prevent outlier results from influencing regression, thereby reducing overkill advantageously.

Abstract: A burn-in board includes: a board; a socket mounted on the board; a connector attached to the board; a wiring system that is disposed in the board and that connects the socket and the connector; and a compensation circuit that connects to the wiring system and that compensates a frequency characteristic of a signal transmitted through the wiring system.

Abstract: An optical ultrasonic wave measuring apparatus includes an ultrasonic pulse output section, a light pulse output section, a reflected wave measuring section, an optoacoustic wave measuring section, an exceeding time point acquiring section, and a measurement result shifting section. The reflected wave measuring section measures, in correspondence to time, a reflected wave as a result of reflection of the ultrasonic pulse at a measuring target, which may be a skin surface. The optoacoustic wave measuring section measures, in correspondence to time, an optoacoustic wave generated by the light pulse at the measuring target. The exceeding time point acquiring section acquires an exceeding time point at which a measurement result of the reflected wave exceeds a predetermined threshold value. The measurement result shifting section shifts a measurement result of the optoacoustic wave by a first shift time toward the time point of output of the light pulse.

Abstract: A magnetic field measuring apparatus for measuring a to-be-measured magnetic field includes a magnetic impedance element with an impedance change rate that changes depending on the to-be-measured magnetic field, a drive signal providing section and a measurement range setting section. The drive signal providing section provides a drive signal to the magnetic impedance element. A measurement range setting section sets a measurement range in which the to-be-measured magnetic field can be measured. A relationship between the to-be-measured magnetic field and the impedance change rate is arranged to change depending on a frequency of the drive signal. The measurement range setting section is arranged to set the measurement range by setting the frequency.

Abstract: A signal vector derivation apparatus receives measurement results from a plurality of sensors that receive signals each represented by a vector having a predetermined direction and measure triaxial components orthogonal to each other and derives the direction of the vector. The measurement results from the sensors are each proportional to a sum of the triaxial components of the vector multiplied, respectively, by first coefficients. The signal vector derivation apparatus includes a spectrum deriving section and a direction deriving section. The spectrum deriving section derives a spectrum obtained based on the measurement results from the sensors and a sum of the first coefficients multiplied, respectively, by second coefficients, the spectrum having local maximum values within voxels in which signal sources that output the respective signals exist. The direction deriving section derives the direction of the vector based on the second coefficients used to obtain the spectrum.

Abstract: An automated test equipment for testing one or more devices under test, comprises at least one port processing unit, comprising a high-speed-input-output interface, HSIO, for connecting with at least one of the devices under test, a memory for storing data received by the port processing unit from one or more connected devices under test, and a streaming error detection block, configured to detect a command error in the received data, wherein the port processing unit is configured to, in response to detection of the command error, limit the storing in the memory of data following, in the received data, after the command which is detected to be erroneous. A method and computer program for automated testing of one or more devices under test are also described.

Abstract: An embodiment is an automated test equipment (ATE) for testing a device under test (DUT) which is connected to the ATE via a load board. The ATE comprises a stimulus module, a measurement module, a loopback, a first switch, a second switch, and a load board interface. The load board interface comprises a first radio frequency port and a second radio frequency port. The first and second radio frequency ports are configured to be coupled to the respective ports of the load board. The first switch is configured to couple the first radio frequency port to the stimulus module in a first switching state of the first switch and the second switch is configured to couple the second radio frequency port to the measurement module in a first switching state of the second switch.

Abstract: A test carrier carried in a state of accommodating a device under test (DUT) includes: a carrier body that holds the DUT; a lid member that covers the DUT and is attached to the carrier body; and an identifier for identifying an individual of the test carrier.

Abstract: Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, an enhanced auxiliary interface test system comprises a load board, testing electronics, controller, and memory mapped interface. The load board is configured to couple with a plurality of devices under test (DUTs). The testing electronics is configured to test the plurality of DUTs, wherein the testing electronics are coupled to the load board. The controller is configured to direct testing of the DUTs, wherein the controller is coupled to the testing electronics. The memory mapped interface is configured to implement multiple paths to access a central processing unit (CPU) on the controller and enable testing of multiple DUTs in parallel.

Abstract: An automated test equipment for testing one or more DUTs comprises a test head and a DUT interface. The DUT interface comprises a plurality of blocks of spring-loaded pins, for example groups or fields of spring-loaded pins. For example, the DUT interface is configured for establishing an electronic signal path between the test head and a DUT board or load board, which holds the DUT or which provides a connection to the DUT. The automated test equipment is configured to allow for a variation of a distance between at least two blocks of spring-loaded pins.