Patents Assigned to Agilent Technologies
  • Wavelength tunable laser with dispersive element
    Patent number: 7242698
    Abstract: A laser being tunable in wavelength includes a first reflecting unit and a second reflecting unit, both reflecting units being arranged to at least partially reflect an incident beam of electromagnetic radiation towards each other, an optical path of said beam of electromagnetic radiation within said cavity, which is defined in length by said first and second reflecting unit, a dispersive device, which is arranged, such that a portion of said optical path of said beam of electromagnetic radiation traverses through said dispersive device, wherein said dispersive device comprises a dispersive characteristic representing a functional dependence of an optical path length of said portion with respect to wavelength of said electromagnetic radiation, wherein said optical path length increases with an increasing wavelength of said electromagnetic radiation.
    Type: Grant
    Filed: August 28, 2002
    Date of Patent: July 10, 2007
    Assignee: Agilent Technologies, Inc.
    Inventors: Jochen Schwarz, Wolf Steffens, Ulrich Kallmann, Bernd Nebendahl, Emmerich Mueller
  • System for measuring FET characteristics
    Patent number: 7242200
    Abstract: An FET-characteristic measuring system applies a pulse output from a pulse generator to the gate of an FET in order to measure drain current flowing through the FET. The pulse has a voltage based on a set voltage. The measuring system includes a divider for dividing the pulse output from the pulse generator into a first pulse applied to the gate of the FET and a second pulse for voltage measurement; a voltage measuring device for measuring a voltage of the second pulse; and a set-voltage adjusting device for determining, based on the voltage of the second pulse, a target set voltage for the pulse generator to apply a pulse having a desired gate application voltage to the FET and for adjusting the set voltage to the target set voltage so that a voltage of the first pulse is equal to the desired gate application voltage.
    Type: Grant
    Filed: April 27, 2006
    Date of Patent: July 10, 2007
    Assignee: Agilent Technologies, Inc.
    Inventor: Yasushi Okawa
  • Probe retention kit, and system and method for probing a pattern of points on a printed circuit board
    Patent number: 7242203
    Abstract: A probe retention kit may include a plurality of probe retention devices, each having: (i) a base; (ii) a retention mechanism, coupled to the base, for mechanically coupling a probe substrate with the plurality of probe retention devices; and (iii) solder legs to be inserted into a printed circuit board, the solder legs having opposite ends that extend through the base and provide an alignment mechanism for receiving the probe substrate. Alternative probe retention devices, and systems and methods using same, are also disclosed.
    Type: Grant
    Filed: August 13, 2004
    Date of Patent: July 10, 2007
    Assignee: Agilent Technologies, Inc.
    Inventors: Brock J. LaMeres, Brent Holcombe, Kenneth Johnson
  • Sequential coordination of test execution and dynamic data
    Patent number: 7243268
    Abstract: An apparatus having: an agent; and a first test session servlet running on the agent, receiving a test description in a predetermined format from a caller, threading a first test session that invokes the agent to run the at least one subtest. The test description has at least one predefined subtest, dynamic data, and predefined test parameters. The first test session servlet receives test results from the first test session, and sends the subtest results from the at least one subtest and the dynamic data back to the caller.
    Type: Grant
    Filed: December 17, 2003
    Date of Patent: July 10, 2007
    Assignee: Agilent Technologies, Inc.
    Inventor: David Bingham
  • System and method for using mobile collectors for accessing a wireless sensor network
    Patent number: 7242294
    Abstract: A system and method are provided that use mobile collectors for accessing a wireless sensor network. In certain embodiments, one or more mobile collectors having mobility that is unpredictable to a wireless sensor network are deployed for use in accessing the wireless sensor network. Thus, rather than relying on an access technique having certainty designed therein with regard to the access of a wireless sensor network, certain embodiments utilize an access technique that relies on statistical probability for accessing the wireless sensor network. For instance, by deploying a plurality of mobile collectors that are operable for accessing a wireless sensor network, a statistical probability exists that at some point (or at various points in time) at least one of the mobile collectors will travel within range of the wireless sensor network to enable access thereof.
    Type: Grant
    Filed: September 17, 2003
    Date of Patent: July 10, 2007
    Assignee: Agilent Technologies, Inc
    Inventors: Jogesh Warrior, John C. Eidson, Jeff Burch, Jerry Liu
  • Electronic instrument system with multiple-configuration instrument modules
    Patent number: 7242590
    Abstract: An electronic instrument system uses a “DualPlay” concept comprising first and second mutually-exclusive modes of operation. The system includes an instrument module having first and second communications channels, each for linking the instrument module to one or more processors. The first communications channel comprises a first connector attached to the instrument module for mating to a backplane connector electrically connected to traces. The system operates in the first mode when the instrument module communicates through the first communications channel. Additionally, the system operates in the second mode when the instrument module communicates through the second communications channel, the first connector is disengaged from the backplane connector and the electronic instrument is not communicating through the first communications channel.
    Type: Grant
    Filed: March 15, 2006
    Date of Patent: July 10, 2007
    Assignee: Agilent Technologies, Inc.
    Inventors: Boon Leong Yeap, Shiew Foe Foo, Cheo Bong Lim, Eng Su Tay
  • Method for using internal semiconductor junctions to aid in non-contact testing
    Patent number: 7242198
    Abstract: Capacitive leadframe testing techniques are improved through knowledge of characteristics of semiconductor junctions specific to nodes of device under test (DUT) that are connected to nodes under test of the DUT.
    Type: Grant
    Filed: June 29, 2006
    Date of Patent: July 10, 2007
    Assignee: Agilent Technologies, Inc.
    Inventors: Myron J. Schneider, Eddie Williamson
  • PTFE stud for ultrahigh-value resistor and method therefor
    Patent number: 7238890
    Abstract: A PTFE stud for an ultrahigh-value resistor includes a first portion to be mounted on a substrate and a second portion attached to the first portion so as to not be in contact with the surface of the substrate. The first portion is formed of insulating material and the second portion has a mounting hole that penetrates the second portion so as to be parallel to the surface of the substrate. The mounting hole is adapted such that the lead of the ultrahigh-value resistor is inserted thereinto. The ultrahigh-value resistor can be mounted without soldering.
    Type: Grant
    Filed: June 21, 2005
    Date of Patent: July 3, 2007
    Assignee: Agilent Technologies, Inc.
    Inventors: Syunsuke Shiobara, Chikao Matsuda
  • Derivatizing organometallic halides
    Patent number: 7238824
    Abstract: Methods, compounds, and kits are provided for derivatizing organometallic halide compounds. The methods include reacting an organometallic halide with a reagent to produce an analyte having desired properties. In a preferred form, the analyte has properties that render it more susceptible to chemical analysis in relation to its respective organometallic halide. The compounds include the analyte product of the derivatization reaction. The kits include a reagent and, preferably, some or all of the tools that may be used to perform the derivatization reaction.
    Type: Grant
    Filed: June 7, 2004
    Date of Patent: July 3, 2007
    Assignee: Agilent Technologies, Inc.
    Inventor: Nelson Robert Holcomb
  • Integrated calibration source and analog-to-digital converter
    Patent number: 7239256
    Abstract: An integrated calibration source and analog-to-digital converter are referenced to an analog ground. The calibration source provides a comb spectrum established by a sequence of bits that are repeatedly played back.
    Type: Grant
    Filed: February 1, 2006
    Date of Patent: July 3, 2007
    Assignee: Agilent Technologies, Inc.
    Inventor: Robin A Bordow
  • Methods and apparatus for characterizing polynucleotides
    Patent number: 7238485
    Abstract: Systems and methods for analysis of polymers, e.g., polynucleotides, are provided. The systems are capable of analyzing a polymer at a specified rate. One such analysis system includes a structure having a nanopore aperture and a molecular motor, e.g., a polymerase, adjacent the nanopore aperture.
    Type: Grant
    Filed: March 23, 2005
    Date of Patent: July 3, 2007
    Assignees: President and Fellows of Harvard College, Regents of the University of California, Agilent Technologies, Inc.
    Inventors: Mark Akeson, Daniel Branton, David W. Deamer, Jeffrey R. Sampson
  • Compositions, methods, systems, and kits for affinity purification
    Publication number: 20070148721
    Abstract: The invention provides a method of separating proteins and peptides of a sample comprising contacting the sample with a Pd coordination compound. The Pd coordination compound binds to sulfur and/or nitrogen groups and thus is useful for purifying biomolecules comprising cysteine, methionine, histidine amino acids or derivatized amino acids/residues comprising sulfur or nitrogen groups which bind to coordination sites on the Pd coordination compounds. The invention also relates to methods, systems and kits for using the Pd coordination compound.
    Type: Application
    Filed: December 28, 2005
    Publication date: June 28, 2007
    Applicant: Agilent Technologies, Inc.
    Inventors: Gordon Nicol, Barry Boyes
  • Methods for designing and tuning one or more packaged integrated circuits
    Patent number: 7234232
    Abstract: A method for producing and tuning a packaged integrated circuit a) incorporates into a packaged integrated circuit design, at least one tunable circuit feature; b) fabricates a packaged integrated circuit in accordance with said packaged integrated circuit design; c) identifies a trimming point on the tunable circuit feature of said packaged integrated circuit, using an x-ray inspection system; d) relates coordinates of the trimming point to coordinates of a visible reference marker; e) utilizes the relationship between the visible reference marker and the trimming point to position a cutting tool over the trimming point; and f) utilizes the cutting tool to make one or more cuts into the packaged integrated circuit, until the tunable circuit feature has been acceptably modified at the trimming point.
    Type: Grant
    Filed: December 16, 2005
    Date of Patent: June 26, 2007
    Assignee: Agilent Technologies, Inc.
    Inventors: Albert An-Bon Yeh, Regina Nora Pabilonia, Robert William Kressin, Wei Liu
  • Re-calculating S-parameter error terms after modification of a calibrated port
    Patent number: 7235982
    Abstract: A two-port S-parameter calibration between a first port and a second port of a test system having a multi-port vector network analyzer is performed to provide a first S-parameter calibration of the test system. A transfer device is connected between the first and second ports of the test system. A port of the test system is changed to provide a second state of the test system, and a plurality of ratioed un-corrected parameters of the transfer device are measured with the test system in the second state. A second S-parameter calibration of the test system in the second state is determined using the ratioed un-corrected parameters and S-parameter data.
    Type: Grant
    Filed: March 31, 2006
    Date of Patent: June 26, 2007
    Assignee: Agilent Technologies, Inc.
    Inventor: Robert E. Shoulders
  • Instrument enclosure apparatus
    Patent number: 7236353
    Abstract: An instrument enclosure apparatus has a housing with a sidewall and a pair of retaining posts disposed within the housing and adjacent the sidewall, the retaining posts in combination with the sidewall defining a pair of opposing channels for slidably receiving a complementarily shaped insert part. Vents may be disposed along the sidewall of the housing, and the insert part assists in providing adaptable air flow management design.
    Type: Grant
    Filed: April 10, 2006
    Date of Patent: June 26, 2007
    Assignee: Agilent Technologies, Inc.
    Inventors: Ronald Davidson, David Ravie
  • Method of manufacturing an electromagnetic relay
    Patent number: 7234233
    Abstract: The present invention relates to an electrical relay in which a solid slug is moved within a channel and used to make or break an electrical connection. The solid slug is moved by electromagnets. In the preferred embodiment, the slug is wetted by a conducting liquid, such as liquid metal, that also adheres to wettable contact pads within the channel to provide a latching mechanism. The relay is amenable to manufacture by micro-machiningtechniques.
    Type: Grant
    Filed: December 16, 2004
    Date of Patent: June 26, 2007
    Assignee: Agilent Technologies, Inc.
    Inventors: Arthur Fong, Marvin Glenn Wong
  • Contact spring and socket combination for high bandwidth probe tips
    Patent number: 7231704
    Abstract: A high-bandwidth electrical test probe having a probe contact spring of reduced size and characteristic capacitance is presented. The probe includes a contact spring connected at one end to the input port of a probe circuit. The opposite end of the contact spring enters the a probe socket and a predetermined angle of entry. The probe socket has a bore formed therein which is arranged at a non-zero angle relative to the angle of entry of the contact spring into said probe socket bore, thereby guaranteeing electrical contact with the bore. The design allows the use of a very small contact spring, on the order of tens of mils, thereby reducing the parasitic capacitance of the spring and allowing much higher bandwidths than heretofore achievable.
    Type: Grant
    Filed: May 18, 2005
    Date of Patent: June 19, 2007
    Assignee: Agilent Technologies, Inc.
    Inventor: James Edward Cannon
  • Nonlinear filtering for events in SPR sensing
    Patent number: 7230714
    Abstract: A nonlinear filtering system determines the duration of a designated event in an SPR sensorgram, selects a filter length based on the determined duration of the designated event in the SPR sensorgram, and applies a nonlinear filter, having the selected filter length to the SPR sensorgram, to establish an output signal.
    Type: Grant
    Filed: October 22, 2004
    Date of Patent: June 12, 2007
    Assignee: Agilent Technologies, Inc.
    Inventors: Lee A. Barford, Gregory D. VanWiggeren
  • Method and apparatus to coordinate groups of heterogeneous measurements
    Patent number: 7231555
    Abstract: A Network Troubleshooting Center NTC that performs orchestrated tests composed of heterogeneous measurements. The system within the NTC includes architecture to manage tests in accordance with requirements imposed by data provided. The NTC includes the operations of defining the test to be performed, configuring the settings according to the protocols used to provide data, locking specific resources dedicated to the particular test being performed, and running the tests on heterogeneous measurements in an orchestrated manner to provide a spectrum of results so that troubleshooting of the heterogeneous results can be performed at any desired level and summarized together.
    Type: Grant
    Filed: August 22, 2002
    Date of Patent: June 12, 2007
    Assignee: Agilent Technologies, Inc.
    Inventors: David L. Barnard, Robert H. Kroboth
  • Precise x-ray inspection system utilizing multiple linear sensors
    Patent number: 7231013
    Abstract: An x-ray inspection is provided featuring a single x-ray source and a planar array of linear sensors aligned in parallel. An article to be inspected is moved between the x-ray source and the linear sensors in a series of passes parallel to the array of linear sensors and substantially perpendicular to the long axes of the linear sensors. Alternately, the x-ray source and the sensors are moved as a unit relative to a stationary article. As a result, a transmission image of the article is captured for each of the linear sensors. These transmission images are then combined mathematically to generate a layer image for each separate conceptual layer of the article. In some embodiments, these layer images may then be interpreted in order to determine the quality of the article.
    Type: Grant
    Filed: March 21, 2003
    Date of Patent: June 12, 2007
    Assignee: Agilent Technologies, Inc.
    Inventor: Gerald L Meyer