Patents Assigned to Agilent Technologies
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Patent number: 6646256Abstract: Apparatus and methods are disclosed for an ion source that comprises a flow-through ultraviolet lamp for photoionization. One embodiment of the apparatus comprises a tubular outer element and a tubular inner element. The inner element is disposed within the outer element to provide a space between the inner and outer elements. The inner element is open at its ends to provide a pathway through that element. A gas discharge between the elements produces ultraviolet radiation, which transmits through the wall of the inner element into the region within the inner element and ionizes molecules that flow through the region. The ion source can be employed in conjunction with a mass analyzer for mass spectrometry. In the method for ionizing molecules in an ion source, vaporized molecules are flowed through the region within the inner element, the region being surrounded by UV radiation. The radiation ionizes vaporized molecules in the surrounded region.Type: GrantFiled: December 18, 2001Date of Patent: November 11, 2003Assignee: Agilent Technologies, Inc.Inventors: Darrell L. Gourley, Steven M. Fischer
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Patent number: 6646726Abstract: An optical measuring device for measuring in a fiber optic network, comprises a measuring unit for performing the measurement in the fiber optic network, a processing unit for processing the measuring results from the measuring unit, and a display for visualizing the processed measuring results. The processing unit further receives imaging signals provided by an imaging unit and processes such imaging signals to be displayed by the display.Type: GrantFiled: March 8, 2002Date of Patent: November 11, 2003Assignee: Agilent Technologies, IncInventors: Josef Beller, Peter Schweiger
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Patent number: 6646436Abstract: The support that bears and positions the head in a head holding apparatus is further supported by a heat-compensating member, so that when the support is expanded by the heat source of the head holding apparatus, the heat-compensating member expands in the direction opposite to the direction of expansion of the support. Moreover, supplying of heat to the support and heat-compensating member is further alleviated by insulating said heat source with an insulating material. The amount of displacement of the recording element per unit of time with exposure to heat is controlled by the above-mentioned structure and effects.Type: GrantFiled: April 15, 2002Date of Patent: November 11, 2003Assignee: Agilent Technologies, Inc.Inventors: Takahisa Mihara, Toshiki Kita
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Patent number: 6646740Abstract: An optical filter for generating a filter output signal from a filter input signal, the filter output signal consisting of light from the filter input signal in a predetermined bandwidth. The filter includes a grating, a first optical assembly and an optical signal path. A portion of the input signal traverses the optical signal path such that it is diffracted from the grating to form a first intermediate beam that is input to the first optical assembly, which generates a second intermediate beam therefrom. The second intermediate beam is directed back to the grating and is diffracted by the grating, a portion of the diffracted second intermediate beam forming a portion of the filter output signal. The second intermediate beam is the inverted image of the first intermediate beam, and hence, the second reflection from the grating compensates for the time dispersion introduced by the first reflection from the grating.Type: GrantFiled: September 19, 2001Date of Patent: November 11, 2003Assignee: Agilent Technologies, Inc.Inventors: David M. Braun, Paul Emerson Bussard, Roger L. Jungerman, Benjamin S. Wheeler
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Patent number: 6643607Abstract: A channel plan and a corresponding test plan are implemented in connection with a plurality of nodes that communicate signals. The channel plan enables a monitoring system to conduct automatic periodic test plans, comprising tests, on the nodes, based upon data specified in the channel plan. Each test plan prescribes measurement of at least one signal parameter, pertaining to one or more nodes and/or one or more channels communicated across the nodes. The monitoring system includes a spectrum analyzer, a switch enabling the spectrum analyzer to interface with the nodes, and a controller. The controller causes periodic automatic testing of the signal characteristics of the nodes based upon the test plan and a smart scanning algorithm.Type: GrantFiled: November 30, 1999Date of Patent: November 4, 2003Assignee: Agilent Technologies, Inc.Inventors: Craig Chamberlain, Eric N. Flink, Bill Morgan
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Patent number: 6642956Abstract: The invention relates to a digital camera and the methods for using a digital camera. The digital camera includes a programmable processor that provides for flexible operation of the digital camera. The programmable processor also provides the digital camera manufacturer the capability of economically configuring the digital camera as desired. The programmable processor also provides the digital camera user with on demand specialized imaging modes such as the capture mode and the cineview mode.Type: GrantFiled: May 29, 1998Date of Patent: November 4, 2003Assignee: Agilent Technologies, Inc.Inventor: Mohammad A. Safai
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Patent number: 6640882Abstract: A removably mounted fan for an active heat sink, and the mounting of that combination to a part to be cooled, is obtained by: (1) The use a fan that engages and registers itself upon and against a top peripheral surface surrounding a cavity where the fan is to be located; (2) Holding the fan in place with one or more resilient mounting clips that span the distance from the top of the fan and an opposing outside bottom surface of the active heat sink; and, (3) Providing the resilient mounting clips with outward projecting mounting tabs that are flexible and resilient and that have mounting holes through which the resilient mounting clips (and the active heat sink they grip) can be attached to an assembly carrying the part to be cooled, such that the bottom of the active heat sink is in good thermal contact with that part.Type: GrantFiled: July 31, 2001Date of Patent: November 4, 2003Assignee: Agilent Technologies, Inc.Inventors: James Glenn Dowdy, Guy Diemunsch, Guy R Wagner
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Patent number: 6643027Abstract: The split-beam optical thickness gauge (OTG) measures the height difference of two adjacent surfaces. Low-coherence light is generated by the low-coherence light source. The split-beam probe head receives the low-coherence light and splits the incoming low-coherence light into a primary beam and walk-off beam. The primary beam shines upon a first surface and is reflected back up into the split-beam probe head. The walk-off beam shines upon a second surface and is reflected back up into the split-beam probe head. Spatial separation between the primary beam and the walk-off beam ensures that each beam shines substantially on only one of the surfaces. An incorporated polarizer assures that the primary and walk-off beams interfere. The reflected light returns to the autocorrelator and is detected so that distance measurements can be determined based upon a change in the path difference between the reflected primary beam and the walk-off beam.Type: GrantFiled: August 14, 2001Date of Patent: November 4, 2003Assignee: Agilent Technologies, Inc.Inventors: William Gong, Richard Tella, Glenn Rankin
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Patent number: 6643597Abstract: A method and system for calibrating a test system and a vector network analyzer use models of unknown calibration standards for a standards-based calibration. The models are selected for the unknown standards and performance data for each different calibration standard of the set are measured by the test system. The performance data is used to optimize the models by adjusting element values of constituent elements of the models. The optimized models are used to calibrate the test system such that the test system corrects for any imperfections in performance measurements taken of a device under test measured by the calibrated test system. The present invention further can correct for affects of a test fixture in device under test measurements. The method can also determine calibration coefficients for unknown calibration standards by extracting the calibration coefficients from the optimized models.Type: GrantFiled: August 24, 2001Date of Patent: November 4, 2003Assignee: Agilent Technologies, Inc.Inventor: Joel Dunsmore
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Patent number: 6642516Abstract: Mass spectometer system and method of use are disclosed. Briefly described, one embodiment of the mass spectrometry system, among others, includes a radio frequency multipole assembly, an inner structure, and a laser diode array system. The inner structure has an outside, an inside, and an opening. The inner structure substantially surrounds the radio frequency multipole assembly. The laser diode array system is disposed on the outside of the inner structure adjacent the side opening such that laser radiation emitted from the laser diode array system travels through the side opening.Type: GrantFiled: December 18, 2002Date of Patent: November 4, 2003Assignee: Agilent Technologies, Inc.Inventors: Stuart C Hansen, Christian A. Le Cocq, Gangqiang Li, Scott W Corzine
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Patent number: 6642498Abstract: The present invention is directed to a micromirror optical multiplexer for directing light to an array of sensors. The micromirror optical multiplexer directs light from one or more sources onto multiple, coplanar sensors for the purpose of exciting fluorescence. The micromirror optical multiplexer includes at least one light source and a micromirror array having a top face and up to four side faces. Pivotable mirrors of the micromirror array are arranged in a multiple row, multiple column format on the top face. In addition, each of the side faces of the micromirror array has at least one row of pivotable mirrors. By pivoting one side face mirror and one top face mirror, a light source entering at one corner of the micromirror array can be directed to exit near normal incidence anywhere on the bottom of the device.Type: GrantFiled: November 21, 2001Date of Patent: November 4, 2003Assignee: Agilent Technologies, Inc.Inventors: Edward Verdonk, David A. King, Richard D. Pering, Richard J. Pittaro, Shahida Rana, Frederick A. Stawitcke
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Publication number: 20030203683Abstract: The present invention provides a probe card comprising a substrate and an external connection terminal located on substrate, wherein external connection terminal 1 is separated from a body of substrate by conductors attached to the substrate, whereby the waiting time due to dielectric absorption can be constantly shortened, and the steady-state leakage current can be stably reduced, thereby enhancing the accuracy of measuring microcurrents and determining microcurrent fluctuations for semiconductor wafer testing devices.Type: ApplicationFiled: March 31, 2003Publication date: October 30, 2003Applicant: AGILENT TECHNOLOGIES, INC.Inventor: Yukoh Iwasaki
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Patent number: 6639801Abstract: A printed circuit board is formed with a heat transfer region and at least one via in thermal communication with the region that transfers heat to the at least one region. A chassis is placed in thermal contact with the region so as to receive and dissipate heat from the region. A heat generating component is mounted on the printed circuit board so as to be in thermal communication with the at least one via. Thus, the heat generated by the component is transferred by the via to the region and subsequently dissipated by the chassis via convection.Type: GrantFiled: August 10, 2001Date of Patent: October 28, 2003Assignee: Agilent Technologies, Inc.Inventor: Rene Miner
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Patent number: 6639796Abstract: A fastenerless clip attaches a system component to the inside of a chassis of a computer system. The clip is detachably mountable and includes a clip body with a resilient portion to provide a compressive force that securely holds the system component in position against a face of the chassis. The fastenerless clip is useful in attaching rotary cooling fans to a lateral face of a computer system chassis.Type: GrantFiled: January 24, 2002Date of Patent: October 28, 2003Assignee: Agilent Technologies, Inc.Inventor: James Edward Cannon
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Patent number: 6639417Abstract: A semiconductor parametric testing apparatus includes designating a die and module on each wafer at which a test should be paused and pausing a test at the preselected die and module on each wafer.Type: GrantFiled: June 26, 2001Date of Patent: October 28, 2003Assignee: Agilent Technologies, Inc.Inventor: Takayuki Takao
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Patent number: 6637905Abstract: An apparatus is directed to providing backlighting utilizing luminescent impregnated material. The apparatus includes a radiation source providing a first radiation and a filter layer optically coupled to the radiation source including a luminescent material designed to absorb the first radiation, and emit one or more radiations. The apparatus further includes a light guide optically coupled to the filter layer and designed to receive the emitted radiation and reflect at least a portion of the emitted radiation. The apparatus additionally includes a display layer optically coupled to the light guide and designed to receive the reflected radiation. The system provides means for providing a first radiation, means for absorbing the first radiation, means for emitting one or more radiations based on the absorbed first radiation, means for receiving the emitted radiation, means for reflecting the emitted radiation, and means for receiving the reflected emitted radiation.Type: GrantFiled: September 26, 2002Date of Patent: October 28, 2003Assignee: Agilent Technologies, Inc.Inventors: Kee Yean Ng, Wen Ya Ou
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Patent number: 6638641Abstract: A joining process and friction welded structure is disclosed, including a first member with a conoid recess, and a second member with a second conoid tip that is friction welded to the recess in the first member. One, or both, of the conoids may be a non-spheroid, such as a paraboloid. In addition, the conoid recess may have a vertex angle that is greater than a vertex angle of the conoid tip.Type: GrantFiled: October 10, 2001Date of Patent: October 28, 2003Assignee: Agilent Technologies, Inc.Inventor: Andrew Douglas Delano
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Patent number: 6639397Abstract: An electronic circuit for automatic test equipment for testing a device under test includes two lines for connecting the circuit with a device under test. Two comparators are provided, one input of each of the comparators being connected to different ones of the two lines. A further comparator is provided, the two inputs of the further comparator being connected to different ones of the two lines. Each of the two lines is terminated. Switching elements are provided which are connected between the two lines. The switching elements enable the circuit to be used in different modes, in particular with a single-ended termination and with a differential termination.Type: GrantFiled: October 31, 2001Date of Patent: October 28, 2003Assignee: Agilent Technologies, Inc.Inventors: Bernhard Roth, Henriette Ossoinig
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Patent number: 6639216Abstract: A method and apparatus are disclosed wherein a plurality of electric fields and of orthogonal spray configurations of vaporized analyte are so combined as to enhance the efficiency of analyte detection and mass analysis. The invention provides reduced noise and increased signal sensitivity in both API electrospray and APCI operating modes.Type: GrantFiled: October 7, 2002Date of Patent: October 28, 2003Assignee: Agilent Technologies, Inc.Inventors: James A. Apffel, Jr., Mark H. Werlich, James L. Bertsch, Paul C. Goodley, Kent D. Henry
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Patent number: 6637263Abstract: The invention relates to a flow divider and a process for dividing a fluid flow into a number of fluid flows, in particular in analytical and/or preparative fluid measurement technology and/or in micro-fluid systems. The flow divider exhibits at least one working sensor, which is assigned to one of the fluid flows and which comprises a control unit for regulating the pressure of one of the fluid flows and/or for regulating one of the fluid flows. The control unit is coupled to the at least one working sensor and to an actuator for changing the fluid flow. At least a number of working sensors corresponding to the number of divided fluid flows is provided, whereby respectively at least one of the working sensors is assigned to one of the fluid flows and whereby the working sensors enable recording of the respective fluid flow. According to the process of the present invention the control unit regulates the fluid flows such that the ratio between at least two of the fluid flows remains substantially constant.Type: GrantFiled: December 7, 2001Date of Patent: October 28, 2003Assignee: Agilent Technologies, Inc.Inventors: Hans-Peter Zimmermann, Claus Lueth