Abstract: The present invention relates to optical tellurite glasses for optical waveguide amplifiers and oscillators, and process for producing them. The object was to provide, with a high yield, optical tellurite glasses for oscillators and optical waveguide amplifiers in planar and fiber form which have good melting and processing properties and a high crystallization stability and a low water content. This is achieved by a special glass composition (mol %): 1 TeO2:  65-78 ZnO:   2-23 PbO:   1-23 (where total ZnO + PbO   15-25) Nb2O5: 0.5-12 La2O3 and/or other rare earth oxides: 0.2-8  (where total Nb2O5 + La2O3  0.7-16) Metal halides: 0.

Abstract: The support that bears and positions the head in a head holding apparatus is further supported by a heat-compensating member, so that when the support is expanded by the heat source of the head holding apparatus, the heat-compensating member expands in the direction opposite to the direction of expansion of the support. Moreover, supplying of heat to the support and heat-compensating member is further alleviated by insulating said heat source with an insulating material. The amount of displacement of the recording element per unit of time with exposure to heat is controlled by the above-mentioned structure and effects.

Abstract: An imaging device includes a Gray Code generator and an array of pixels. Each pixel includes a complimentary metal oxide semiconductor (“CMOS”) sensor, a comparator and random access memory (e.g., ferroelectric random access memory). The Gray Code generator is started at the beginning of capture mode and begins providing a sequence of code words. Within each pixel, an output of a CMOS sensor is compared to a threshold, and a code word in the sequence is stored in random access memory when the sensor output crosses the threshold. Thus, the random access memory of each pixel stores a code word that represents the intensity of light detected by its associated CMOS sensor.

Abstract: The present disclosure relates to a method and apparatus for determining the electrical continuity of an element of an electrical component, for example, a pin of a printed circuit assembly. The method comprises the steps of supplying an electrical stimulus to the element of the electrical component, positioning a sensor adjacent the element of the electrical component, the sensor having multiple axes along which the sensor is responsive to magnetic fields, receiving magnetic field signals created by the element of the electrical component with the sensor, producing electrical signals indicative of the magnetic field strength sensed by the sensor in multiple directions that correspond to the multiple axes, and comparing the electrical signals with predetermined limits associated with the element being tested. In a preferred arrangement, the sensor is provided with three axes which are oriented in orthogonal directions such that the magnetic signals from the element can be detected in three dimensional space.

Abstract: A method and system for reducing electromagnetic interference (EMI) that escapes a chassis for housing electro-optic components. The chassis includes a plurality of optical modules that each has a slot with a first dimension and a second dimension through which EMI can escape. An optical array is disposed in the slot. The optical array has a plurality of optical elements. At least one strip of conducting material is positioned between two optical elements at predetermined intervals as measured along the first dimension. The strip has a first end and a second end and is configured to extend substantially the second dimension. At least one of the first end or the second end is coupled to a ground potential. The strips effectively reduce the amount of EMI that escapes from the slot.

Abstract: In one method embodiment, the present invention recites forming an opening in a substrate during a damascene process. The present embodiment then recites forming a dielectric region having two curvilinear surfaces opposite one another at least partially within the opening during the damascene process. The surfaces are curvilinear with respect to a horizontal cross-section. The present embodiment then recites forming a first copper region having a curvilinear surface proximate one of the surfaces of the dielectric region during the damascene process. The present embodiment then recites forming a second copper region having a curvilinear surface proximate a second surface of the dielectric region during the damascene process. In so doing, the dielectric region forms a dielectric barrier between the first copper region and the second copper region such that the vertical cylindrical MIM capacitor is formed.

Abstract: A signal generation unit (10, 20) for providing digital test signals for a device under test—DUT—(40) comprises a signal generator (10) for generating a digital test signal with defined timing. A controllable delay unit (20) receives and delays the digital test signal by a controllable variable time delay, whereby a control unit (35) controls the time delay of the delay unit (20) in order to induce a defined jitter function as well as a defined jitter spectrum to the digital test signal.

Abstract: For each channel in a parallel channel optical array, a diffractive optical arrangement (DOA) includes an input region that is configured to pass a first portion of an input beam to an output region for data transmissions and to diffract and direct a second portion to a detection region for monitoring. The input region includes the diffractive features of a computer generated hologram (CGH) or a grating for diffracting. Alternatively, the input region is coupled to the CGH or grating. Moreover, the DOA includes at least one reflective region for redirecting the second portion. In one embodiment, the DOA includes a separate active surface for each channel of the array. Alternatively, the DOA has a singular active surface that is positioned to interact with all the channels. Optical power output from the second portion is monitored to generate feedback signals for adjusting the input current to each laser. Additionally, optical power output from sensed temperature is monitored to generate feedback signals.

Abstract: A beam splitter has a support frame made of silicon that has a membrane inside made of silicon. The membrane has in particular openings with bridges formed between them. On the side of membrane facing the incident beam is an aluminum coating to increase the reflectability or degree of reflection of the membrane. An incident beam bundle contacts the beam splitter at angle of incidence &phgr;. A portion of the incident beam is reflected off the bridges, and the remaining portion of the beam freely passes through the openings. The beam is correspondingly divided into a reflective portion and transmitted portion.

Abstract: A method and system for enhancing the efficiency of the completion of host-initiated I/O operations within a fiber channel node. The host computer component of the fiber channel node does not allocate the memory buffer for the FCP response frame received by the FC node at the completion of an I/O operation. Instead, the interface controller of the FC node processes FCP response frames in order to determine whether or not an I/O operation successfully completes. In the common case that the I/O operation successfully completes, the interface controller writes the FCP exchange ID corresponding to the I/O operation to a special location in memory which serves to invoke logic functions implemented in an ASIC that de-allocate host memory resources allocated for the I/O operation.

Abstract: Unfavorable interactions of ferroelectric dielectric layers with silicon, intermetallic dielectrics, and other materials in metal-oxide semiconductor devices have discouraged the use of ferroelectric memory devices. This invention provides a zirconium titanate barrier layer with high insulating and low leakage characteristics. The barrier layer is not reactive with silicon or other materials used in metal-ferroelectric-semiconductor devices. These thermally stable layers should facilitate the integration of ferroelectric materials into memory and other semiconductor devices.

Abstract: A mass spectrometer system analyzes a sample with the aid an associated computer system or processor which utilizes a relatively small compound deconvolution data library. The deconvolution library has a specific predefined order. The specific order of the compounds in the library is established based on predetermined knowledge of the sample being tested by the mass spectrometer. A deconvolution technique utilized by the computer system automates a deconvolution technique that would be utilized by an experienced process chemist for a similar sample and associated fragmentation or cracking pattern. The deconvolution technique steps through the deconvolution library's order of compounds and compares each compound's stored spectral data with the sample's spectrum. If it is determined that a compound's spectrum is found in the sample's spectrum, then at least one complete peak associated with the found compound's spectrum is removed from the sample's spectrum.

Abstract: The present invention provides independent CDR (clock and data recovery) functions on N number of high speed parallel channels, yet only requiring one capacitor. This enables multiple independent CDR channels to be integrated onto one IC with a minimum overhead component of one capacitor. In one embodiment, the present invention provides a multiple channel clock and data recovery system which includes N phase lock loop circuits for receiving in parallel N data channels, each of the N phase lock loop circuits including a digital phase detector and a dual-input VCO in which one VCO input is an analog input for setting the center frequency of the VCO and the other VCO input is a digital input from the respective phase detector for toggling the center frequency and wherein each phase detector compares the phase of the respective incoming data channel with that of the respective VCO output.

Abstract: A method and structure of the present invention provides alignment between a first optical alignment component and a second optical alignment component. The first optical alignment component includes at least one positioning aperture and at least one alignment element partially positioned within the positioning aperture. The second component includes at least one alignment channel configured to receive at least a portion of the alignment element providing alignment between the first and second optical alignment components. In one embodiment, the alignment component is a sphere. In one embodiment, the positioning aperture is a square V-shaped aperture.

Abstract: A self-aligning, quick-release connector for testing a circuit board connector or for otherwise making a permanent or semi-permanent connection to the circuit board connector. A probe block having at least one contact therein, and a guide sleeve. The guide sleeve has a chamber formed therein for receiving the probe block. The probe block is movable between a retracted position and an extended position within the interior chamber formed in the guide sleeve. In operation, the contact is recessed within the guide sleeve when the probe block is in the retracted position. When the probe block is moved into the extended position, the contact makes a connection with the circuit board connector, which may be electrically connected to a signaling device. Preferably, the invention also includes an alignment sleeve for fitting about and aligning with the circuit board connector.

Abstract: A wavemeter for determining a wavelength of an incident optical beam (2), comprises four optical components (34), each being arranged in the incident optical beam (2) or in a part of it, providing a path with a respective effective optical length, and generating a respective optical beam (38) with a respective optical power depending on the wavelength of said incident optical beam (2). Said optical powers oscillate periodically with increasing wavelength, and a phase shift of approximately pi/2 is provided between two respective pairs of the four optical components (34). Respective power detectors (6) are provided, each detecting a respective one of the optical powers (40). A wavelength allocator is provided for allocating a wavelength to the incident optical beam (2) based on the wavelength dependencies of the detected first, second, third, and fourth optical powers.

Abstract: An integrated tunable laser structure comprising a substrate made of semiconductor material, the substrate (1; FIG. 2) comprising a first (2), a second (3), and a third (4) section. The first section (2) provides a low-selective interferometric filtering together with an amplification of a light wave resonating in the laser structure. The second section (3) provides continuous fine-tuning and phase adjustment of the light wave, and the third section (4) provides a wavelength selective reflection of the light wave. Each section allows current injection, wherein a current into the first section (2) causes a wavelength shift of the low-selective interferometric filtering, a current into the second section (3) causes a wavelength shift of resonator modes, and a current into the third section (4) causes a wavelength shift of the wavelength selective reflection.

Abstract: An optical switch uses composite mirrors having individually addressable pivotable micromirrors on one side and a fixed mirror arrangement on another side. Preferably, separate composite mirrors are used in each reflection of an optical beam from an input to an output, with at least one fixed mirror and at least two pivotable mirrors defining the optical path. The function of the first pivotable mirror along the path is to select a target output, while the purpose of the second pivotable mirror is to achieve a low loss coupling to the target output. By combining the fixed mirrors with the micromirror arrays into a single structure, the spacing between adjacent arrays of inputs and the spacing between adjacent arrays of outputs can be reduced. Thus, using the composite mirrors increases the maximum number of optical inputs and outputs for beams having fixed waists.

Abstract: An optical communication channel switch includes an aberration corrected spectrometer adapted for receiving plural channels of communication in a one dimensional array of sites where each site corresponds to a source, and a channel selector for selectively switching channels. After receiving the plural channels, the aberration corrected spectrometer provides the channels in a two dimensional array in which channels are distributed in rows (or columns) of similar frequency and different sources and in columns (or rows) of differing frequency and common sources. The channel selector selectively switches channels among sites in the two dimensional array and provides a single dimensional reconfigured array of frequency separated channels that is combined into the two dimensional array. Another aberration corrected spectrometer receives the selectively switched two dimensional array and combines the channels into a single dimensional array of sites having one or more frequency separated channels.

Abstract: A channel plan with a corresponding test plan are implemented in connection with a plurality of nodes that communicate signals. The channel plan has one or more predefined specifications for each of one or more signal channels on each of the nodes. The channel plan enables a monitoring system to, among other things, conduct automatic periodic test plans, comprising tests, on the nodes, based upon the predefined data specified in the channel plan. Each test plan prescribes measurement of at least one signal parameter, pertaining to one or more nodes as a whole and/or to one or more channels contained within the nodes. The monitoring system includes a spectrum analyzer, a switch enabling the spectrum analyzer to interface with the nodes, and a controller controlling the switch and the spectrum analyzer. The controller is configured to enable creation of and display the channel plan and test plan, based upon user inputs.