Patents Assigned to Agilent Technologies
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Publication number: 20030082936Abstract: An evaluation device and method for DUT boards and probe cards which increase the reproducibility of the measured values and decrease the abrasion of pads in evaluation tests. A connection box is provided with contact pins, mounting mechanisms used to mount the DUT boards, and a plurality of connectors which feed signals from the contact pins to the outside.Type: ApplicationFiled: October 24, 2002Publication date: May 1, 2003Applicant: Agilent Technologies, Inc.Inventors: Akihiko Goto, Yuko Iwasaki, Tsuyoshi Tanaka, Koji Tokuno
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Publication number: 20030081755Abstract: A data processing apparatus is coupled to receive call data records from a telephone network (4), for example an SS7 network. The apparatus (1) receives data records of different types having different formats. For each different type of data record, the apparatus (1) has a library (9, 10, 11 ) of type-specific functions associated with the particular type of data record. The apparatus (1) also has a set (8) of common functions available which contains functions that can be utilized for all types of data records, and for managing the system. Instructions are received by the apparatus (1), which indicate which type or types of data records are to be received and which functions are to be carried out on the data records. The apparatus (1) then creates a function list of the particular functions that are to be carried out before executing the particular functions on the received data records and then storing the processed records in a database (12, 13, 14).Type: ApplicationFiled: November 1, 2001Publication date: May 1, 2003Applicant: Agilent Technologies, Inc.Inventors: John William Forsyth Macartney, Richard Beattie, Neil John McKenzie, Alistair Kenneth Clement Scott
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Publication number: 20030081912Abstract: This invention relates to a device and method for alignment of an optical fiber (6) with the output facet of a laser diode (3) which are to be co-located on a mount (4), to obtain a substantially optimum coupling efficiency. The invention is particularly applicable to assemblies to be used for submarine use.Type: ApplicationFiled: September 11, 2002Publication date: May 1, 2003Applicant: Agilent Technologies, Inc.Inventor: Goncalo Agra Amorim
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Publication number: 20030080885Abstract: A method and low cost apparatus to accurately determine the gain, offset, and/or skew calibration values of each A/D converter in a few steps for an interleaving A/D converter. The calibration method includes: applying sine waves to the input as a calibration signal during calibration, A/D converting of the sine wave by a plurality of A/D conversion means in a predetermined order and storing the converted data in a data storage memory, and determining the gain, offset, and/or skew calibration values by using sine curve fitting on a sequence of converted data for each of the plurality of A/D conversion means.Type: ApplicationFiled: October 24, 2002Publication date: May 1, 2003Applicant: Agilent Technologies, Inc.Inventor: Mamoru Tamba
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Publication number: 20030082080Abstract: What is described in this case is a laboratory microchip having microspray means whose direction of spray can be altered. The microchip has a substrate 40 which has a channel structure provided on one side 41 thereof. On the other side (in the region of an edge of the substrate in the present case), there is a microspray tip 42. Substrate 40 is designed to be deformable particularly in a region 43, in which case the deformability may be achieved either by thinning the substrate material locally in this region 43 or by means of a linear perforation extending approximately perpendicularly to the plane of the paper. Alternatively, the deformability may be obtained by selecting a suitable material for the entire substrate. A microchip which has been bent in the manner indicated is shown in the bottom part of FIG. 3. The bending of the substrate which is shown has turned the direction of spray 44 of microspray tip 42 through 90°. The bending of the substrate may be permanent or reversible in this case.Type: ApplicationFiled: November 8, 2002Publication date: May 1, 2003Applicant: Agilent Technologies, Inc.Inventors: Hans-Peter Zimmermann, Gerhard Ple
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Publication number: 20030081641Abstract: An optical device comprising a photonic band gap element operative such that the refractive index can be varied through application of an electrical signal. This enables the manufacture of tuneable lasers, optical add/drop multiplexers and tuneable optical wavelength converters.Type: ApplicationFiled: September 17, 2002Publication date: May 1, 2003Applicant: Agilent Technologies, Inc.Inventors: Christopher Anthony Park, Richard Mark Ash, Andrew Thomas Harker, Paul Marshall Charles
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Patent number: 6554622Abstract: A transceiver module is adapted to be plugged into a port cage within a host system. The transceiver module includes transceiver electronics and a connector attached to the transceiver electronics. The transceiver electronics are sized to fit within the port cage. The connector includes a module portion and a connector jack attached to the module portion. The module portion is sized to fit along with the transceiver electronics within the port cage. The connector jack is sized with dimensions too big to fit within the port cage. The connector jack remains out of the port cage when the transceiver module is placed within the port cage. The connector jack occupies an area larger than an opening of the port cage.Type: GrantFiled: August 7, 2002Date of Patent: April 29, 2003Assignee: Agilent Technologies, Inc.Inventors: Andy Engel, Janet L. Yun, Kendra Gallup
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Patent number: 6556938Abstract: A preferred system for facilitating automated test equipment functionality within integrated circuits includes automated test equipment (ATE) configured to electrically interconnect with an integrated circuit and to provide at least one signal to the integrated circuit. A first parametric test circuit, internal to the integrated circuit, also is provided. The first parametric test circuit is adapted to electrically communicate with the automated test equipment so that, in response to receiving a signal from the automated test equipment, the first parametric test circuit measures at least one parameter of a first pad of the integrated circuit.Type: GrantFiled: August 29, 2000Date of Patent: April 29, 2003Assignee: Agilent Technologies, Inc.Inventors: John G. Rohrbaugh, Jeffrey R. Rearick, Shad R. Shepston
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Patent number: 6556454Abstract: The present disclosure relates to a contact arrangement. The contact arrangement comprises a plurality of contacts formed along a line in a staggered configuration. The staggered configuration arranges the contacts so as to be diagonally spaced from each other along the line such that the contacts have an effective spacing along the line that is smaller than the actual spacing of the contacts.Type: GrantFiled: October 31, 2000Date of Patent: April 29, 2003Assignee: Agilent Technologies, Inc.Inventors: Gerald John D'Amato, Guy Humphrey, Michael Jason Welch
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Patent number: 6556050Abstract: A window detector circuit for high frequency applications includes a differential amplifier that has two inputs which receive a differential voltage signal. A bias network, having a balancing node, connected between the two inputs. An output transistor, electrically biased by the balancing node, connected between power and ground. In operation, when the differential voltage signal is below a voltage threshold, the differential amplifier is turned off and current flows through the output transistor. When the differential voltage signal is at or exceed the voltage threshold, the differential amplifier turns on.Type: GrantFiled: December 11, 2000Date of Patent: April 29, 2003Assignee: Agilent Technologies, Inc.Inventor: Stefano G. Therisod
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Patent number: 6555440Abstract: A method of fabricating a diode device, such as a PIN diode, includes forming top and bottom regions of opposite conductivity types and includes anisotropically etching into the top surface to form a pit having side walls that converge with approach to the bottom surface. However, the pit does not extend to the bottom surface. In the PIN diode embodiment, the pit terminates within an intrinsic region that separates a bottom surface diffusion region from a diffusion region along the walls of the anisotropically etched pit. The anisotropic etching approach provides a degree of self regulation with regard to the geometries of the pit. A process flow of steps is described, which allows thicker and larger diameter wafers to be used in the formation of an array of such diode device.Type: GrantFiled: June 5, 2000Date of Patent: April 29, 2003Assignee: Agilent Technologies, Inc.Inventor: Frank Sigming Geefay
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Publication number: 20030076491Abstract: A method of manufacturing a flow cell with a cell housing (11) having a bore for the passage of sample, and with an inner layer of a totally reflecting polymer material (17) for guiding radiation through the bore for the analysis of the sample, comprises the steps of a) providing a tube (10) of said polymer material in the bore (30) of the cell housing (11), and b) applying a force on the walls of said tube (10) from the interior of the tube for pressing the walls of the tube against the cell housing (11). The force may be applied by any suitable means, for example by drawing a mandrel (15) through the interior of the tube, or by using pressurized gas or liquid. The resulting flow cell has a smooth inner surface with improved optical properties.Type: ApplicationFiled: August 12, 2002Publication date: April 24, 2003Applicant: Agilent Technologies, Inc.Inventors: Jochen Mueller, Beno Mueller
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Publication number: 20030076124Abstract: Disclosed is an interface (300) for providing an electrical contact between a test equipment (25, 30) and an application equipment (10, 20). The interface (300) is adapted for receiving a plurality of individual segments (320i), whereby at least one of the segments (320i) comprises at least one electrical path (120, 130) for providing the electrical contact. At least one of the segments (320i) might be electrically isolated with respect to the interface (300) and/or other segments (320i), and can, have a ground condition substantially independent of the ground condition of the interface (300) and/or other segments (320i).Type: ApplicationFiled: September 23, 2002Publication date: April 24, 2003Applicant: Agilent Technologies, Inc.Inventor: Jochen Zaiser
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Publication number: 20030077051Abstract: The present invention provides an improved method for aligning optical components in an optical assembly. The method comprises the steps of pre-aligning the optical fibre to the optical device, measuring a coupling efficiency of the optical fiber to the optical device, applying energy to a support means, said energy being sufficient to enable the support means to become ductile, and applying a force to the support means in a direction which increases the coupling efficiency.Type: ApplicationFiled: September 6, 2002Publication date: April 24, 2003Applicant: Agilent Technologies, Inc.Inventor: Simon Meadowcroft
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Publication number: 20030076135Abstract: In order to reduce harmonic distortion, a track and hold circuit comprising a MOS transistor switch, a hold capacitor, and a voltage stabilizer for biasing bulk potential of the MOS transistor switch at a certain voltage is disclosed.Type: ApplicationFiled: October 25, 2002Publication date: April 24, 2003Applicant: AGILENT TECHNOLOGIES, INC.Inventor: Hisao Kakitani
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Publication number: 20030076936Abstract: In a signalling network employing the SS7 signalling protocol, it is known to use masks to mine CDR stores in order to obtain data for analysis in respect of a particular customer of a communications network associated with the signalling network. However, the use of masks to mine the CDRs can result in the retrieval of unwanted CDRs or the omission of relevant CDRs. The present invention therefore provides a call monitoring apparatus that receives a CDR and accesses a reference database, comprising a list of customers and respective telephone numbers, in order to identify an association between the CDR and a given customer. Consequently, speed and efficiency of analysis of CDRs is increased.Type: ApplicationFiled: September 25, 2002Publication date: April 24, 2003Applicant: Agilent Technologies, Inc.Inventors: Peter Holloway Locke, John William Forsyth MacArtney, Richard Beattie, Alan Gardner
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Publication number: 20030076503Abstract: A wavemeter (30) comprises a first wavelength determination unit (40) having a substantially periodic wavelength dependency and being adapted for providing a reference wavelength dependency (100) over a reference wavelength range. A second wavelength determination unit (50) has a substantially periodic wavelength dependency and is adapted for providing a second wavelength dependency (140) over a second wavelength range (120). An evaluation unit (60) compares the second wavelength dependency (140) with the reference wavelength dependency (100) for adjusting (160) the second wavelength dependency (140) in wavelength.Type: ApplicationFiled: May 14, 2002Publication date: April 24, 2003Applicant: Agilent Technologies, Inc.Inventor: Thomas Jensen
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Publication number: 20030076115Abstract: To enable the measurer to easily verify the parameter correction conditions, the correction conditions for the parameters measurable by the measurement device are concurrently displayed on the screen of the measurement device related to the ports used in the parameter measurement. The rows and columns are the receive ports and send ports. The symbol F and the symbol R indicate the type of calibration method applied to the parameters measured by the ports specified in the matrix.Type: ApplicationFiled: October 18, 2002Publication date: April 24, 2003Applicant: Agilent Technologies, Inc.Inventor: Takashi Yamasaki
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Publication number: 20030077846Abstract: The arrangement includes first (3) and second (4) patterns such as photolithographic patterns of electrically conductive indicia provided on respective first (1a) and second (2a) surfaces of the components (1, 2) to be positioned. The patterns (3, 4) are adapted for relative movement in sliding contact relationship along the positioning axis (x). The patterns of electrically conductive indicia (3, 4) define electrically conductive pads at least one of which reaches the condition of being either open or closed when the surfaces (1a, 2a) on which the patterns (3, 4) are provided reach a given position along the positioning axis (x). Sensing is preferably effected by means of an amperometer.Type: ApplicationFiled: August 6, 2002Publication date: April 24, 2003Applicant: Agilent Technologies, Inc.Inventors: Libero Zucchelli, Luigi Gastaldi
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Patent number: 6552745Abstract: An imaging apparatus and a method of capturing and storing an image in digital form within a photosensitive area of the apparatus include integrating an array of memory cells within each pixel of the photosensitive area. Preferably, the memory cells are dual port memory cells, such that write operations can be performed in a parallel manner while reading operations are performed in a serial manner. In the preferred embodiment, each array contains a sufficient number of memory cells to store two digital words representing a photo signal and a reference signal. A comparator within each pixel operating in unison with a counter and a ramp generator captures the photo signal and the reference signal in digital form. The design of the imaging apparatus allows each pixel in the photosensitive area to capture and store the signals in a parallel manner.Type: GrantFiled: April 8, 1998Date of Patent: April 22, 2003Assignee: Agilent Technologies, Inc.Inventor: Frederick A. Perner