Abstract: An improved heat spreader having a specified structure suitable for commonly used in semiconductor packages regardless of pad sizes of the packages is disclosed. The heat spreader has a pad evenly provided with a plurality of first indentations. A plurality of outward broadening openings radially extend from the pad. A plurality of second indentations are provided on a leadframe facing surface of the heat spreader at the outside of the openings, so that the second indentations surround the openings. A plurality of small coupling sections radially extend on the edge of the heat spreader at every 90.degree. angle. The small coupling sections have their downward extending projections at their distal ends. A plurality of large coupling sections diagonally extend on the edge of the heat spreader. Each of the large coupling sections has a plurality of outward extending projections.

Abstract: Method and device for molding integrated circuit packages using dambarless lead frames are disclosed. The mold dies and the lead frame have means for preventing resin leakage out of the mold dies during the package molding step. The leakage preventing means may comprise a tape put on the leads, an enlarged area sections provided on each lead and notches formed on each lead. The leakage preventing means may comprise projections formed on a lead pressing frame of one of the mold dies. In another embodiment, an auxiliary lead frame, which has a plurality of rectangular openings and will be fixed to a bottom mold die, is used as the resin leakage preventing means. When using the auxiliary lead frame, the dambarless lead frame is laid on the auxiliary lead frame and clamped by a top mold die. The enlarged area sections may be formed on the inner leads exclusively or on both the inner and outer leads.

Abstract: According to the invention, an electronic device mounted on a substrate is encapsulated using a standard two-piece mold. A novel degating region is formed on a surface of the substrate to allow removal of excess encapsulant formed on the surface during molding without damaging the remainder of the device. The material of the degating region that contacts the encapsulant forms a weak bond with the encapsulant, relative to the bond formed between the encapsulant and the substrate, so that the encapsulant can be peeled away from the degating region without damaging the substrate or other portion of the device. The degating region is provided without introducing additional steps into the process for forming the device. The presence of the degating region eliminates the necessity of using a three-piece or modified two-piece mold to achieve top gating in order to degate without damaging the device. In one embodiment, the degating region is made of gold.

Abstract: A highly integrated semiconductor package having a light and compact construction and heat dissipating means suitable to effectively dissipate heat generated from the package during the operation of the package is disclosed. The semiconductor package has a lower heat sink for dissipating heat generated from a semiconductor chip of the package. The package also has a tape attached to the top of a plurality of inner leads of the package. The inner leads are attached to the top surface of the lower heat sink. The package further has a heat dissipating means for dissipating heat generated from the inner leads. The heat dissipating means has a heat bar attached to the tape. An upper heat sink may be integrated with the heat bar so as to form the heat dissipating means.

Abstract: There is disclosed a copper oxide-filled polymer die attach adhesive composition for semiconductor package The copper oxide-filled polymer die attach adhesive composition for semiconductor package is made of an adhesion resin mixture and an inorganic filler, wherein the inorganic filler includes copper oxide selected from a group consisting of CuO, Cu.sub.2 O and the mixture thereof in an amount of approximately 0.1 to approximately 90% by weight. Optionally, silver may be contained in the composition. It is capable of maintaining electric conductivity under severe temperature cycle as well as providing bonding strength enough to prevent package crack and delamination.