Patents Assigned to Applied Precision, Inc.
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Patent number: 8848051Abstract: An apparatus for scanning a biometric device includes a camera that scans the biometric device to generate images, and a computer that extracts data from the images. The computer measures three-dimensional locations of at least three different positions on a surface of the biometric device, determines a virtual approximation plane or a curved surface with respect to the surface of the biometric device based on the measured three-dimensional locations, determines imaging locations of two or more panels disposed on the biometric device based on the virtual approximation plane or the curved surface, obtains individual images of the two or more panels by scanning the biometric device based on the determined imaging locations, and extracts overall data of the biometric device from the individual images of the two or more panels.Type: GrantFiled: February 11, 2010Date of Patent: September 30, 2014Assignees: Samsung Electronics, Co., Ltd., Applied Precision, Inc.Inventors: Kyu-sang Lee, Carl S. Brown, Kyla Teplitz, Steve Goodson
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Publication number: 20130335798Abstract: Irradiance control systems (“ICSs”) that control the irradiance of a beam of light are disclosed. ICSs include in a beam translator and a beam launch. The beam translator translates the beam substantially perpendicular to the propagating direction of the beam with a desired displacement so that the beam launch can remove a portion of the translated beam and the beam can be output with a desired irradiance. The beam launch attenuates the irradiance of the beam based on the amount by which the beam is translated. ISCs can be incorporated into fluorescent microscopy instruments to provide high-speed, fine-tune control over the irradiance of excitation beams.Type: ApplicationFiled: January 16, 2012Publication date: December 19, 2013Applicant: Applied Precision, Inc.Inventor: Jeremy R. Cooper
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Publication number: 20130335819Abstract: Illumination phase controls that provide precise and fast phase control of structured illumination patterns used in structure illumination microscopy are described. A coherent light source is used to generate a beam of coherent light that is split into at least three coherent beams of light. In one aspect, an illumination phase control is composed of at least one pair of rotatable windows to apply at least one phase shift to at least one of the beams. An objective lens is to receive the beams and focus the at least three beams to form an interference pattern. The phase control can be used to change the position of the interference pattern by changing the at least one phase shift applied to the at least one beam.Type: ApplicationFiled: February 29, 2012Publication date: December 19, 2013Applicant: Applied Precision, IncInventor: Jeremy R. Cooper
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Publication number: 20130300853Abstract: Systems and methods for executing super-resolution microscopy of a specimen with most of the image processing performed in a camera of a fluorescence microscopy instrument are described. In one aspect, the camera includes one or more processors to execute machine-readable instructions that control excitation light output from a multi-channel light source, control capture of intermediate images of the specimen, and perform image processing of the intermediate images to produce a final super-resolution image of the specimen.Type: ApplicationFiled: January 11, 2012Publication date: November 14, 2013Applicant: Applied Precision, Inc.Inventor: Paul C. Goodwin
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Publication number: 20130286456Abstract: Various light-scanning systems that can be used to perform rapid point-by-point illumination of a focal plane within a specimen are disclosed. The light-scanning systems can be incorporated in confocal microscopy instruments to create an excitation beam pivot axis that lies within an aperture at the back plate of an objective lens. The light-scanning systems receive a beam of excitation light from a light source and direct the excitation beam to pass through the pivot point in the aperture of the back plate of the objective lens while continuously scanning the focused excitation beam across a focal plane.Type: ApplicationFiled: December 29, 2011Publication date: October 31, 2013Applicant: Applied Precision Inc.Inventor: Jeremy R. Cooper
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Patent number: 8570650Abstract: A structured-illumination module included in a 3D-structured-illumination-based fluorescence microscope, the structured-illumination module comprising: a structured-illumination-module frame; a beam-alignment module including a central tilt mirror coupled to an underside of a top horizontal plate of the structured-illumination-module frame; a set of directional mirrors, one of which receives, at a given point in time, input, polarized, coherent light reflected from the central tilt mirror; three sets of beam splitters, on three arms of the structured-illumination-module frame, the each splits an incident illumination beam, reflected to the set of beam splitters from a directional mirror of the set of directional mirrors, into a coherent beam triplet; and a phase-shift module that receives a beam triplet, at a given point in time, generated by one of the sets of beam splitters and reflected from the beam-alignment module and that introduces a desired relative phase relationship among the beams of the beam tripType: GrantFiled: December 9, 2010Date of Patent: October 29, 2013Assignee: Applied Precision, Inc.Inventors: William M. Dougherty, Steven Charles Quarre
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Patent number: 8558154Abstract: The current application is directed to autofocus subsystems within optical instruments that continuously monitor the focus of the optical instruments and adjust distances within the optical instrument along the optical axis in order to maintain a precise and stable optical-instrument focus at a particular point or surface on, within, or near a sample. Certain autofocus implementations operate asynchronously with respect to operation of other components and subsystems of the optical instrument in which they are embedded. The described autofocus subsystems employ multiple calibration curves to precisely adjust the z-position of an optical instrument.Type: GrantFiled: August 30, 2011Date of Patent: October 15, 2013Assignee: Applied Precision, Inc.Inventors: Jeremy Cooper, Paul Goodwin, Stephen G. Goodson
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Patent number: 8478069Abstract: A system and method of image processing employ mathematical deconvolution to estimate the magnitude and location of a target object within an image. Both the nature of internal reflections and the convolution process by which each internal reflection contributes to blurring of the acquired image data may be measured and modeled. In accordance with mathematical deconvolution techniques, the combined effects of these internal reflections may be reduced to the extent that respective contributions of the target object and each individual reflection may be distinguished and quantified.Type: GrantFiled: October 13, 2011Date of Patent: July 2, 2013Assignee: Applied Precision, Inc.Inventor: Carl S. Brown
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Patent number: 8362409Abstract: Embodiments of the present invention are directed to autofocus subsystems within optical instruments that continuously monitor the focus of the optical instruments and adjust distances within the optical instrument along the optical axis in order to maintain a precise and stable optical-instrument focus at a particular point or surface on, within, or near a sample. Certain embodiments of the present invention operate asynchronously with respect to operation of other components and subsystems of the optical instrument in which they are embedded.Type: GrantFiled: April 22, 2010Date of Patent: January 29, 2013Assignee: Applied Precision, Inc.Inventors: Jeremy R. Cooper, Paul Goodwin
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Patent number: 8333932Abstract: A substrate includes; a fiducial mark disposed on the substrate, an area on the substrate on which a probe material is configured to be immobilized, the area being separated from the fiducial mark, and a probe immobilization compound disposed on the area on the substrate on which the probe material is configured to be immobilized, wherein the fiducial mark has a structure which reflects irradiated light at a greater intensity than an intensity of reflected irradiated light form the area on the substrate not corresponding to the fiducial mark.Type: GrantFiled: February 11, 2010Date of Patent: December 18, 2012Assignees: Samsung Electronics Co., Ltd., Applied Precision, Inc.Inventors: Kyu-sang Lee, Seong-ho Cho, Carl S. Brown, Kyla Teplitz
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Patent number: 8237786Abstract: Embodiments of the present invention are directed to imaging technologies, and, in particular, to an imaging system that detects relatively weak signals, over time, and that uses the detected signals to determine the positions of signal emitters. Particular embodiments of the present invention are directed to methods and systems for imaging fluorophore-labeled samples in order to produce images of the sample at resolutions significantly greater than the diffraction-limited resolution associated with optical microscopy. Embodiments of the present invention employ overlapping-emitter-image disambiguation to allow data to be collected from densely arranged emitters, which significantly decreases the data-collection time for producing intermediate images as well as the number of intermediate images needed to computationally construct high-resolution final images. Additional embodiments of the present invention employ hierarchical image-processing techniques to further resolve and interpret disambiguated images.Type: GrantFiled: March 31, 2010Date of Patent: August 7, 2012Assignee: Applied Precision, Inc.Inventors: Gaudenz Danuser, Paul C. Goodwin
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Patent number: 8115150Abstract: A new optical substrate design allows a target to be illuminated with minimal illumination of undesired surfaces within the image collection ray path.Type: GrantFiled: December 30, 2008Date of Patent: February 14, 2012Assignee: Applied Precision, Inc.Inventors: Carl S. Brown, Steven A. Reese
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Patent number: 8041146Abstract: A system and method of image processing employ mathematical deconvolution to estimate the magnitude and location of a target object within an image. Both the nature of internal reflections and the convolution process by which each internal reflection contributes to blurring of the acquired image data may be measured and modeled. In accordance with mathematical deconvolution techniques, the combined effects of these internal reflections may be reduced to the extend that respective contributions of the target object and each individual reflection may be distinguished and quantified.Type: GrantFiled: January 13, 2010Date of Patent: October 18, 2011Assignee: Applied Precision, IncInventor: Carl S. Brown
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Patent number: 7770402Abstract: A system and method of cooling a CCD camera may employ a composite material housing design that allows the cold side of a TEC to be mounted relatively close to the CCD and the hot side of the TEC to be isolated from the housing cavity in which the CCD resides. An efficient heat transfer path may facilitate cooling the CCD to a predetermined or selected operating temperature and isolate the CCD from the heat loads generated by operation the TEC.Type: GrantFiled: August 30, 2007Date of Patent: August 10, 2010Assignee: Applied Precision, Inc.Inventor: Steven C. Quarre
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Patent number: 7705323Abstract: A microscope stage with a flexural axis may exhibit predictable flexure characteristics and limited cross-coupling translations. Z motion of a Z plate proximate to a Z actuator may be substantially linear, while a distal side of the Z plate may be allowed to rotate about a hinge axis associated with a flexural component.Type: GrantFiled: April 7, 2006Date of Patent: April 27, 2010Assignee: Applied Precision, Inc.Inventors: Steven C. Quarre, John Malcolm
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Patent number: 7683345Abstract: A system and method employing photokinetic techniques in cell biology imaging applications are disclosed. Systems and methods of acquiring image data of an object may comprise: selectively inducing photoactivation of material at a site on the object; performing an optical axis integration scan; simultaneously executing a time delay integration scan sequence; and processing acquired image data in accordance with one or more desired analyses. Various methodologies and applications may include, inter alia, selective photobleaching of a site on the object, diffusion rate, velocity, and wave-front propagation analyses, multi-dimensional analyses of dispersion characteristics, biomolecular binding in cellular organelles, and photoactivation assisted systematic image segmentation for the study of cellular components.Type: GrantFiled: August 4, 2008Date of Patent: March 23, 2010Assignee: Applied Precision, Inc.Inventors: Paul C. Goodwin, Carl S. Brown, Steven A. Reese
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Publication number: 20090206238Abstract: A new optical substrate design allows a target to be illuminated with minimal illumination of undesired surfaces within the image collection ray path.Type: ApplicationFiled: December 30, 2008Publication date: August 20, 2009Applicant: Applied Precision, Inc. Delaware corporationInventors: Carl S. Brown, Steven A. Reese
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Publication number: 20090097110Abstract: A system and method of generating and acquiring phase contrast microscope images while minimizing interference with the intensity and optical quality of other microscopy modalities employing polarization and attenuation strategies for phase microscopy applications. A plane polarizing objective phase ring may be used in conjunction with a phase microscopy apparatus. Attenuated light may be controlled such that transparency may be selectively provided with respect to light in a predetermined plane. Illumination outside of the predetermined plane may be selected for phase microscopy applications. Accordingly, a polarizing objective phase ring effective for enabling polarized phase microscopy may reduce interfere with normal usage of the microscope for other applications such as, for example, fluorescence microscopy.Type: ApplicationFiled: December 16, 2008Publication date: April 16, 2009Applicant: Applied Precision, Inc.Inventor: PAUL C. GOODWIN
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Patent number: 6414477Abstract: A method for quantitatively determining probe card errors relying on merging data sets from a probe card analysis machine and a scrub mark analysis machine. Minimizing error values related to the data sets provides an indication of probe card/probe machine combination tolerance.Type: GrantFiled: June 7, 1999Date of Patent: July 2, 2002Assignee: Applied Precision, Inc.Inventor: John Strom
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Patent number: 5899437Abstract: A cam actuated valve method and apparatus utilize an electronically controlled stepper motor driving a cam. A diaphragm type low flow, high accuracy diaphragm valve is positioned off axis with respect to the cam. A transmission translates linear motion of the cam to the valve diaphragm. High accuracy is maintained because the transmission is preloaded by pressure within the valve and the valve diaphragm.Type: GrantFiled: December 12, 1997Date of Patent: May 4, 1999Assignee: Applied Precision, Inc.Inventor: Steven C. Quarre