Abstract: An apparatus for scanning a biometric device includes a camera that scans the biometric device to generate images, and a computer that extracts data from the images. The computer measures three-dimensional locations of at least three different positions on a surface of the biometric device, determines a virtual approximation plane or a curved surface with respect to the surface of the biometric device based on the measured three-dimensional locations, determines imaging locations of two or more panels disposed on the biometric device based on the virtual approximation plane or the curved surface, obtains individual images of the two or more panels by scanning the biometric device based on the determined imaging locations, and extracts overall data of the biometric device from the individual images of the two or more panels.

Abstract: Variable orientation illumination-pattern rotators (“IPRs”) that can be incorporated into structured illumination microscopy instruments to rapidly rotate an interference pattern are disclosed. An IPR includes a rotation selector and at least one mirror cluster. The rotation selector directs beams of light into each one of the mirror clusters for a brief period of time. Each mirror cluster imparts a particular predetermined angle of rotation on the beams. As a result, the beams output from the IPR are rotated through each of the rotation angles imparted by each of the mirror clusters. The rotation selector enables the IPR to rotate the beams through each predetermined rotation angle on the order of 5 milliseconds or faster.

Abstract: Irradiance control systems (“ICSs”) that control the irradiance of a beam of light are disclosed. ICSs include in a beam translator and a beam launch. The beam translator translates the beam substantially perpendicular to the propagating direction of the beam with a desired displacement so that the beam launch can remove a portion of the translated beam and the beam can be output with a desired irradiance. The beam launch attenuates the irradiance of the beam based on the amount by which the beam is translated. ISCs can be incorporated into fluorescent microscopy instruments to provide high-speed, fine-tune control over the irradiance of excitation beams.

Abstract: Illumination phase controls that provide precise and fast phase control of structured illumination patterns used in structure illumination microscopy are described. A coherent light source is used to generate a beam of coherent light that is split into at least three coherent beams of light. In one aspect, an illumination phase control is composed of at least one pair of rotatable windows to apply at least one phase shift to at least one of the beams. An objective lens is to receive the beams and focus the at least three beams to form an interference pattern. The phase control can be used to change the position of the interference pattern by changing the at least one phase shift applied to the at least one beam.

Abstract: Systems and methods for executing super-resolution microscopy of a specimen with most of the image processing performed in a camera of a fluorescence microscopy instrument are described. In one aspect, the camera includes one or more processors to execute machine-readable instructions that control excitation light output from a multi-channel light source, control capture of intermediate images of the specimen, and perform image processing of the intermediate images to produce a final super-resolution image of the specimen.

Abstract: Various light-scanning systems that can be used to perform rapid point-by-point illumination of a focal plane within a specimen are disclosed. The light-scanning systems can be incorporated in confocal microscopy instruments to create an excitation beam pivot axis that lies within an aperture at the back plate of an objective lens. The light-scanning systems receive a beam of excitation light from a light source and direct the excitation beam to pass through the pivot point in the aperture of the back plate of the objective lens while continuously scanning the focused excitation beam across a focal plane.

Abstract: A structured-illumination module included in a 3D-structured-illumination-based fluorescence microscope, the structured-illumination module comprising: a structured-illumination-module frame; a beam-alignment module including a central tilt mirror coupled to an underside of a top horizontal plate of the structured-illumination-module frame; a set of directional mirrors, one of which receives, at a given point in time, input, polarized, coherent light reflected from the central tilt mirror; three sets of beam splitters, on three arms of the structured-illumination-module frame, the each splits an incident illumination beam, reflected to the set of beam splitters from a directional mirror of the set of directional mirrors, into a coherent beam triplet; and a phase-shift module that receives a beam triplet, at a given point in time, generated by one of the sets of beam splitters and reflected from the beam-alignment module and that introduces a desired relative phase relationship among the beams of the beam trip

Abstract: The current application is directed to autofocus subsystems within optical instruments that continuously monitor the focus of the optical instruments and adjust distances within the optical instrument along the optical axis in order to maintain a precise and stable optical-instrument focus at a particular point or surface on, within, or near a sample. Certain autofocus implementations operate asynchronously with respect to operation of other components and subsystems of the optical instrument in which they are embedded. The described autofocus subsystems employ multiple calibration curves to precisely adjust the z-position of an optical instrument.

Abstract: This disclosure is directed to optical microscope calibration devices that can be used with optical microscopes to adjust the microscope imaging parameters so that images of samples can be obtained below the diffraction limit. The microscope calibration devices include at least one calibration target. Each calibration target includes a number of features with dimensions below the diffraction limit of a microscope objective. Separate color component diffraction limited images of one of the calibration targets are obtained for a particular magnification. The color component images can be combined and image processed to obtain a focused and non-distorted image of the calibration target. The parameters used to obtain the focused and non-distorted image of the calibration target can be used to obtain focused and non-distorted images of a sample for the same magnification by using the same parameters.

Abstract: Oblique-illumination systems integrated with fluorescence microscopes and methods of using oblique illumination in fluorescence microscopy are disclosed. An oblique-illumination system is attached to a fluorescence microscope objective. The oblique-illumination system can be used to illuminate from any desired direction the surface of an object located at a fixed known offset away from a sample solution containing fluorescently tagged targets. Oblique illumination is used to illuminate features of the surface while epi-illumination is used to create fluorescent light emitted from the tagged targets. The combination of oblique illumination of the surface and epi-illumination of the targets enables capture of images of the surface features and the fluorescent targets so that the locations of the targets in the sample can be determined based on the locations of the surface features.

Abstract: A system and method of image processing employ mathematical deconvolution to estimate the magnitude and location of a target object within an image. Both the nature of internal reflections and the convolution process by which each internal reflection contributes to blurring of the acquired image data may be measured and modeled. In accordance with mathematical deconvolution techniques, the combined effects of these internal reflections may be reduced to the extent that respective contributions of the target object and each individual reflection may be distinguished and quantified.

Abstract: Embodiments of the present invention are directed to autofocus subsystems within optical instruments that continuously monitor the focus of the optical instruments and adjust distances within the optical instrument along the optical axis in order to maintain a precise and stable optical-instrument focus at a particular point or surface on, within, or near a sample. Certain embodiments of the present invention operate asynchronously with respect to operation of other components and subsystems of the optical instrument in which they are embedded.

Abstract: Embodiments of the present invention are directed to autofocus subsystems within optical instruments that continuously monitor the focus of the optical instruments and adjust distances within the optical instrument along the optical axis in order to maintain a precise and stable optical-instrument focus at a particular point or surface on, within, or near a sample. Certain embodiments of the present invention operate asynchronously with respect to operation of other components and subsystems of the optical instrument in which they are embedded.

Abstract: Methods and apparatus are described for delivering index-matching immersion liquid in high numerical-aperture optical microscopy and lithography. An array of immersion liquid droplets is delivered to a specimen substrate or specimen substrate cover by an immersion liquid printing apparatus. An immersion liquid reservoir provides immersion liquid to the printer by a precision pump. The printer delivers immersion liquid to the substrate or substrate cover in arrays of immersion liquid droplets of defined volumes and array patterns. The volumes and patterns of array droplets delivered to the substrate or substrate cover are optimized to maintain adequate immersion liquid between the substrate or substrate cover and an immersion objective while avoiding the formation of air bubbles in the immersion liquid and the accumulation of excess volumes of immersion liquid.

Abstract: A substrate includes; a fiducial mark disposed on the substrate, an area on the substrate on which a probe material is configured to be immobilized, the area being separated from the fiducial mark, and a probe immobilization compound disposed on the area on the substrate on which the probe material is configured to be immobilized, wherein the fiducial mark has a structure which reflects irradiated light at a greater intensity than an intensity of reflected irradiated light form the area on the substrate not corresponding to the fiducial mark.

Abstract: Embodiments of the present invention are directed to imaging technologies, and, in particular, to an imaging system that detects relatively weak signals, over time, and that uses the detected signals to determine the positions of signal emitters. Particular embodiments of the present invention are directed to methods and systems for imaging fluorophore-labeled samples in order to produce images of the sample at resolutions significantly greater than the diffraction-limited resolution associated with optical microscopy. Embodiments of the present invention employ overlapping-emitter-image disambiguation to allow data to be collected from densely arranged emitters, which significantly decreases the data-collection time for producing intermediate images as well as the number of intermediate images needed to computationally construct high-resolution final images. Additional embodiments of the present invention employ hierarchical image-processing techniques to further resolve and interpret disambiguated images.

Abstract: Embodiments of the present invention are directed to imaging technologies, and, in particular, to an imaging system that detects relatively weak signals, over time, and that uses the detected signals to determine the positions of signal emitters. Particular embodiments of the present invention are directed to methods and systems for imaging fluorophore-labeled samples in order to produce images of the sample at resolutions significantly greater than the diffraction-limited resolution associated with optical microscopy. Embodiments of the present invention employ overlapping-emitter-image disambiguation to allow data to be collected from densely arranged emitters, which significantly decreases the data-collection time for producing intermediate images as well as the number of intermediate images needed to computationally construct high-resolution final images. Additional embodiments of the present invention employ hierarchical image-processing techniques to further resolve and interpret disambiguated images.

Abstract: Correction elements that can be incorporated in objective-based TIRF microscopy instruments to correct for chromatic aberrations are described. A correction element can be placed between a multiple wavelength excitation beam source and the microscope objective lens. In one aspect, the thickness of the correction element is defined to compensate for different axial positions of the focal points associated with each excitation wavelengths traveling along the outer edge of lenses comprising a microscope objective lens. In another aspect, the correction element can be angled and/or configured so that the different wavelengths of multiple wavelength excitation light are shifted to adjust the angle of incidence for each wavelength at the specimen/substrate interface.

Abstract: Various superimposing beam controls that can superimpose beams of light with different optical properties are described. In one aspect, a beam control receives a beam of light and outputs one or more beams. Each beam is output in a different polarization state and with different optical properties. Superimposing beam controls can be incorporated in fluorescence microscopy instruments to split a beam of excitation light into one or more beams of excitation light. Each beam of excitation light has a different polarization and is output with different optical properties so that each excitation beam can be used to execute a different microscopy technique.

Abstract: A new optical substrate design allows a target to be illuminated with minimal illumination of undesired surfaces within the image collection ray path.