Patents Assigned to Applied Precision, LLC
  • Patent number: 7608840
    Abstract: A system and method employing photokinetic techniques in cell biology imaging applications are disclosed. Systems and methods of acquiring image data of an object may comprise: selectively inducing photoactivation of material at a site on the object; performing an optical axis integration scan; simultaneously executing a time delay integration scan sequence; and processing acquired image data in accordance with one or more desired analyses. Various methodologies and applications may include, inter alia, selective photobleaching of a site on the object, diffusion rate, velocity, and wave-front propagation analyses, multi-dimensional analyses of dispersion characteristics, biomolecular binding in cellular organelles, and photoactivation assisted systematic image segmentation for the study of cellular components.
    Type: Grant
    Filed: August 4, 2008
    Date of Patent: October 27, 2009
    Assignee: Applied Precision, LLC
    Inventors: Paul C. Goodwin, Carl S. Brown, Steven A. Reese
  • Publication number: 20090026386
    Abstract: A system and method employing photokinetic techniques in cell biology imaging applications are disclosed. Systems and methods of acquiring image data of an object may comprise: selectively inducing photoactivation of material at a site on the object; performing an optical axis integration scan; simultaneously executing a time delay integration scan sequence; and processing acquired image data in accordance with one or more desired analyses. Various methodologies and applications may include, inter alia, selective photobleaching of a site on the object, diffusion rate, velocity, and wave-front propagation analyses, multi-dimensional analyses of dispersion characteristics, biomolecular binding in cellular organelles, and photoactivation assisted systematic image segmentation for the study of cellular components.
    Type: Application
    Filed: August 4, 2008
    Publication date: January 29, 2009
    Applicant: Applied Precision, LLC
    Inventors: Paul C. Goodwin, Carl S. Brown, Steven A. Reese
  • Publication number: 20090028413
    Abstract: A system and method employing photokinetic techniques in cell biology imaging applications are disclosed. Systems and methods of acquiring image data of an object may comprise: selectively inducing photoactivation of material at a site on the object; performing an optical axis integration scan; simultaneously executing a time delay integration scan sequence; and processing acquired image data in accordance with one or more desired analyses. Various methodologies and applications may include, inter alia, selective photobleaching of a site on the object, diffusion rate, velocity, and wave-front propagation analyses, multi-dimensional analyses of dispersion characteristics, biomolecular binding in cellular organelles, and photoactivation assisted systematic image segmentation for the study of cellular components.
    Type: Application
    Filed: August 4, 2008
    Publication date: January 29, 2009
    Applicant: Applied Precision, LLC
    Inventors: Paul C. Goodwin, Carl S. Brown, Steven A. Reese
  • Publication number: 20080245953
    Abstract: An image acquisition system and method employing multi-axis integration (MAI) may incorporate both optical axis integration (OAI) and time-delay integration (TDI) techniques. Disclosed MAI systems and methods may integrate image data in the z direction as the data are acquired, projecting the image data prior to deconvolution. Lateral translation of the image plane during the scan in the z direction may allow large areas to be imaged in a single scan sequence.
    Type: Application
    Filed: December 31, 2007
    Publication date: October 9, 2008
    Applicant: Applied Precision, LLC
    Inventors: Steven A. REESE, Carl S. BROWN, Paul C. GOODWIN
  • Patent number: 7408176
    Abstract: A system and method employing photokinetic techniques in cell biology imaging applications are disclosed. Systems and methods of acquiring image data of an object may comprise: selectively inducing photoactivation of material at a site on the object; performing an optical axis integration scan; simultaneously executing a time delay integration scan sequence; and processing acquired image data in accordance with one or more desired analyses. Various methodologies and applications may include, inter alia, selective photobleaching of a site on the object, diffusion rate, velocity, and wave-front propagation analyses, multi-dimensional analyses of dispersion characteristics, biomolecular binding in cellular organelles, and photoactivation assisted systematic image segmentation for the study of cellular components.
    Type: Grant
    Filed: June 18, 2004
    Date of Patent: August 5, 2008
    Assignee: Applied Precision, LLC
    Inventors: Paul C. Goodwin, Carl S. Brown, Steven A. Reese
  • Patent number: 7330588
    Abstract: Expression profiling using DNA microarrays is an important new method for analyzing cellular physiology. In “spotted” microarrays, fluorescently labeled cDNA from experimental and control cells is hybridized to arrayed target DNA and the arrays imaged at two or more wavelengths. Statistical analysis is performed on microarray images and show that non-additive background, high intensity fluctuations across spots, and fabrication artifacts interfere with the accurate determination of intensity information. The probability density distributions generated by pixel-by-pixel analysis of images can be used to measure the precision with which spot intensities are determined. Simple weighting schemes based on these probability distributions are effective in improving significantly the quality of microarray data as it accumulates in a multi-experiment database. Error estimates from image-based metrics should be one component in an explicitly probabilistic scheme for the analysis of DNA microarray data.
    Type: Grant
    Filed: September 23, 2004
    Date of Patent: February 12, 2008
    Assignee: Applied Precision, LLC
    Inventors: Carl S. Brown, Paul C. Goodwin
  • Publication number: 20070290331
    Abstract: A system and method of cooling a CCD camera may employ a composite material housing design that allows the cold side of a TEC to be mounted relatively close to the CCD and the hot side of the TEC to be isolated from the housing cavity in which the CCD resides. An efficient heat transfer path may facilitate cooling the CCD to a predetermined or selected operating temperature and isolate the CCD from the heat loads generated by operation the TEC.
    Type: Application
    Filed: August 30, 2007
    Publication date: December 20, 2007
    Applicant: APPLIED PRECISION, LLC
    Inventor: STEVEN QUARRE
  • Publication number: 20070269103
    Abstract: A stereoscopic three-dimensional optical metrology system and method accurately measure the location of physical features on a test article in a manner that is fast and robust to surface contour discontinuities. Disclosed embodiments may image a test article from two or more perspectives through a substantially transparent fiducial plate bearing a fiducial marking; camera viewing angles and apparent relative distances between a feature on a test article and one or more fiducials may enable accurate calculation of feature position.
    Type: Application
    Filed: May 21, 2007
    Publication date: November 22, 2007
    Applicant: APPLIED PRECISION, LLC
    Inventors: DONALD SNOW, John Strom, Raymond Kraft
  • Patent number: 7283253
    Abstract: An image acquisition system and method employing multi-axis integration (MAI) may incorporate both optical axis integration (OAI) and time-delay integration (TDI) techniques. Disclosed MAI systems and methods may integrate image data in the z direction as the data are acquired, projecting the image data prior to deconvolution. Lateral translation of the image plane during the scan in the z direction may allow large areas to be imaged in a single scan sequence.
    Type: Grant
    Filed: March 13, 2003
    Date of Patent: October 16, 2007
    Assignee: Applied Precision, LLC
    Inventors: Steven A. Reese, Carl S. Brown, Paul C. Goodwin
  • Patent number: 7278268
    Abstract: A system and method of cooling a CCD camera may employ a composite material housing design that allows the cold side of a TEC to be mounted relatively close to the CCD and the hot side of the TEC to be isolated from the housing cavity in which the CCD resides. An efficient heat transfer path may facilitate cooling the CCD to a predetermined or selected operating temperature and isolate the CCD from the heat loads generated by operation the TEC.
    Type: Grant
    Filed: December 3, 2003
    Date of Patent: October 9, 2007
    Assignee: Applied Precision, LLC
    Inventor: Steven C. Quarre
  • Publication number: 20070201760
    Abstract: A plurality of panels are assembled into a single image. Each of the panels may have different intensities throughout the panel, as well as non-uniformities between panels. The panels are modified using flat-field calibration, panel flattening, and panel connecting techniques. These techniques correct for non-uniformities and provide a cleaner, single image.
    Type: Application
    Filed: April 26, 2007
    Publication date: August 30, 2007
    Applicant: Applied Precision, LLC
    Inventor: Carl Brown
  • Publication number: 20070177417
    Abstract: Systems and methods according to aspects of the present invention are described. The systems and methods enable charging, soaking, and measuring of capacitors to be conducted quickly. Charging and soaking typically occurs in parallel and certain embodiments facilitate the measuring of capacitor leakage by sequentially disconnecting each capacitor and measuring the time for voltage on the capacitor to reach a predetermined threshold. Further, all capacitors can be disconnected from a charging source simultaneously and voltages can be measured for each capacitor simultaneously. Monitoring can be periodic in nature. Substantial time savings in the calculation device of leakage values and parameters can be attained.
    Type: Application
    Filed: January 29, 2007
    Publication date: August 2, 2007
    Applicant: Applied Precision, LLC
    Inventors: Charles Corulli, Gregory Olmstead, Donald Snow
  • Patent number: 7231081
    Abstract: A stereoscopic three-dimensional optical metrology system and method accurately measure the location of physical features on a test article in a manner that is fast and robust to surface contour discontinuities. Disclosed embodiments may image a test article from two or more perspectives through a substantially transparent fiducial plate bearing a fiducial marking; camera viewing angles and apparent relative distances between a feature on a test article and one or more fiducials may enable accurate calculation of feature position.
    Type: Grant
    Filed: December 18, 2002
    Date of Patent: June 12, 2007
    Assignee: Applied Precision, LLC
    Inventors: Donald B. Snow, Raymond H. Kraft, John T. Strom
  • Patent number: 7228003
    Abstract: A plurality of panels are assembled into a single image. Each of the panels may have different intensities throughout the panel, as well as non-uniformities between panels. The panels are modified using flat-field calibration, panel flattening, and panel connecting techniques. These techniques correct for non-uniformities and provide a cleaner, single image.
    Type: Grant
    Filed: June 18, 2004
    Date of Patent: June 5, 2007
    Assignee: Applied Precision, LLC
    Inventor: Carl S. Brown
  • Publication number: 20070103181
    Abstract: A system and method of mitigating the effects of component deflections in a probe card analyzer system may implement three-dimensional comparative optical metrology techniques to model deflection characteristics. An exemplary system and method combine non-bussed electrical planarity measurements with fast optical planarity measurements to produce “effectively loaded” planarity measurements.
    Type: Application
    Filed: December 12, 2006
    Publication date: May 10, 2007
    Applicant: Applied Precision, LLC
    Inventor: JOHN STROM
  • Publication number: 20070091427
    Abstract: A system and method of generating and acquiring phase contrast microscope images while minimizing interference with the intensity and optical quality of other microscopy modalities employing polarization and attenuation strategies for phase microscopy applications. A plane polarizing objective phase ring may be used in conjunction with a phase microscopy apparatus. Attenuated light may be controlled such that transparency may be selectively provided with respect to light in a predetermined plane. Illumination outside of the predetermined plane may be selected for phase microscopy applications. Accordingly, a polarizing objective phase ring effective for enabling polarized phase microscopy may reduce interfere with normal usage of the microscope for other applications such as, for example, fluorescence microscopy.
    Type: Application
    Filed: October 25, 2006
    Publication date: April 26, 2007
    Applicant: Applied Precision, LLC
    Inventor: Paul Goodwin
  • Patent number: 7170307
    Abstract: A system and method of mitigating the effects of component deflections in a probe card analyzer system may implement three-dimensional comparative optical metrology techniques to model deflection characteristics. An exemplary system and method combine non-bussed electrical planarity measurements with fast optical planarity measurements to produce “effectively loaded” planarity measurements.
    Type: Grant
    Filed: March 12, 2004
    Date of Patent: January 30, 2007
    Assignee: Applied Precision, LLC
    Inventor: John T. Strom
  • Patent number: 7141801
    Abstract: A system and method of providing illumination for a cell imaging system delivering modulated light for illumination of a sample. Modulation of illumination intensity may be effectuated by pulsing the output of a light source, for example, or by selectively interrupting light provided by the source. Such modulated illumination may have particular utility in applications where reducing the number of electrons in a super-excited state may minimize the rate of photobleaching and photodamage in the molecules being studied.
    Type: Grant
    Filed: December 19, 2003
    Date of Patent: November 28, 2006
    Assignee: Applied Precision, LLC
    Inventor: Paul C. Goodwin
  • Publication number: 20060244438
    Abstract: By examining scrub mark properties (such as position and size) directly, the performance of a wafer probing process may be evaluated. Scrub mark images are captured, image data measured, and detailed information about the process is extracted through analysis. The information may then be used to troubleshoot, improve, and monitor the probing process.
    Type: Application
    Filed: June 29, 2006
    Publication date: November 2, 2006
    Applicant: Applied Precision, LLC
    Inventor: John Strom
  • Patent number: 7102368
    Abstract: By examining scrub mark properties (such as position and size) directly, the performance of a wafer probing process may be evaluated. Scrub mark images are captured, image data measured, and detailed information about the process is extracted through analysis. The information may then be used to troubleshoot, improve, and monitor the probing process.
    Type: Grant
    Filed: February 27, 2004
    Date of Patent: September 5, 2006
    Assignee: Applied Precision, LLC
    Inventor: John T. Strom