Patents Assigned to Applied Precision, LLC
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Patent number: 7608840Abstract: A system and method employing photokinetic techniques in cell biology imaging applications are disclosed. Systems and methods of acquiring image data of an object may comprise: selectively inducing photoactivation of material at a site on the object; performing an optical axis integration scan; simultaneously executing a time delay integration scan sequence; and processing acquired image data in accordance with one or more desired analyses. Various methodologies and applications may include, inter alia, selective photobleaching of a site on the object, diffusion rate, velocity, and wave-front propagation analyses, multi-dimensional analyses of dispersion characteristics, biomolecular binding in cellular organelles, and photoactivation assisted systematic image segmentation for the study of cellular components.Type: GrantFiled: August 4, 2008Date of Patent: October 27, 2009Assignee: Applied Precision, LLCInventors: Paul C. Goodwin, Carl S. Brown, Steven A. Reese
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Publication number: 20090026386Abstract: A system and method employing photokinetic techniques in cell biology imaging applications are disclosed. Systems and methods of acquiring image data of an object may comprise: selectively inducing photoactivation of material at a site on the object; performing an optical axis integration scan; simultaneously executing a time delay integration scan sequence; and processing acquired image data in accordance with one or more desired analyses. Various methodologies and applications may include, inter alia, selective photobleaching of a site on the object, diffusion rate, velocity, and wave-front propagation analyses, multi-dimensional analyses of dispersion characteristics, biomolecular binding in cellular organelles, and photoactivation assisted systematic image segmentation for the study of cellular components.Type: ApplicationFiled: August 4, 2008Publication date: January 29, 2009Applicant: Applied Precision, LLCInventors: Paul C. Goodwin, Carl S. Brown, Steven A. Reese
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Publication number: 20090028413Abstract: A system and method employing photokinetic techniques in cell biology imaging applications are disclosed. Systems and methods of acquiring image data of an object may comprise: selectively inducing photoactivation of material at a site on the object; performing an optical axis integration scan; simultaneously executing a time delay integration scan sequence; and processing acquired image data in accordance with one or more desired analyses. Various methodologies and applications may include, inter alia, selective photobleaching of a site on the object, diffusion rate, velocity, and wave-front propagation analyses, multi-dimensional analyses of dispersion characteristics, biomolecular binding in cellular organelles, and photoactivation assisted systematic image segmentation for the study of cellular components.Type: ApplicationFiled: August 4, 2008Publication date: January 29, 2009Applicant: Applied Precision, LLCInventors: Paul C. Goodwin, Carl S. Brown, Steven A. Reese
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Publication number: 20080245953Abstract: An image acquisition system and method employing multi-axis integration (MAI) may incorporate both optical axis integration (OAI) and time-delay integration (TDI) techniques. Disclosed MAI systems and methods may integrate image data in the z direction as the data are acquired, projecting the image data prior to deconvolution. Lateral translation of the image plane during the scan in the z direction may allow large areas to be imaged in a single scan sequence.Type: ApplicationFiled: December 31, 2007Publication date: October 9, 2008Applicant: Applied Precision, LLCInventors: Steven A. REESE, Carl S. BROWN, Paul C. GOODWIN
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Patent number: 7408176Abstract: A system and method employing photokinetic techniques in cell biology imaging applications are disclosed. Systems and methods of acquiring image data of an object may comprise: selectively inducing photoactivation of material at a site on the object; performing an optical axis integration scan; simultaneously executing a time delay integration scan sequence; and processing acquired image data in accordance with one or more desired analyses. Various methodologies and applications may include, inter alia, selective photobleaching of a site on the object, diffusion rate, velocity, and wave-front propagation analyses, multi-dimensional analyses of dispersion characteristics, biomolecular binding in cellular organelles, and photoactivation assisted systematic image segmentation for the study of cellular components.Type: GrantFiled: June 18, 2004Date of Patent: August 5, 2008Assignee: Applied Precision, LLCInventors: Paul C. Goodwin, Carl S. Brown, Steven A. Reese
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Patent number: 7330588Abstract: Expression profiling using DNA microarrays is an important new method for analyzing cellular physiology. In “spotted” microarrays, fluorescently labeled cDNA from experimental and control cells is hybridized to arrayed target DNA and the arrays imaged at two or more wavelengths. Statistical analysis is performed on microarray images and show that non-additive background, high intensity fluctuations across spots, and fabrication artifacts interfere with the accurate determination of intensity information. The probability density distributions generated by pixel-by-pixel analysis of images can be used to measure the precision with which spot intensities are determined. Simple weighting schemes based on these probability distributions are effective in improving significantly the quality of microarray data as it accumulates in a multi-experiment database. Error estimates from image-based metrics should be one component in an explicitly probabilistic scheme for the analysis of DNA microarray data.Type: GrantFiled: September 23, 2004Date of Patent: February 12, 2008Assignee: Applied Precision, LLCInventors: Carl S. Brown, Paul C. Goodwin
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Publication number: 20070290331Abstract: A system and method of cooling a CCD camera may employ a composite material housing design that allows the cold side of a TEC to be mounted relatively close to the CCD and the hot side of the TEC to be isolated from the housing cavity in which the CCD resides. An efficient heat transfer path may facilitate cooling the CCD to a predetermined or selected operating temperature and isolate the CCD from the heat loads generated by operation the TEC.Type: ApplicationFiled: August 30, 2007Publication date: December 20, 2007Applicant: APPLIED PRECISION, LLCInventor: STEVEN QUARRE
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Publication number: 20070269103Abstract: A stereoscopic three-dimensional optical metrology system and method accurately measure the location of physical features on a test article in a manner that is fast and robust to surface contour discontinuities. Disclosed embodiments may image a test article from two or more perspectives through a substantially transparent fiducial plate bearing a fiducial marking; camera viewing angles and apparent relative distances between a feature on a test article and one or more fiducials may enable accurate calculation of feature position.Type: ApplicationFiled: May 21, 2007Publication date: November 22, 2007Applicant: APPLIED PRECISION, LLCInventors: DONALD SNOW, John Strom, Raymond Kraft
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Patent number: 7283253Abstract: An image acquisition system and method employing multi-axis integration (MAI) may incorporate both optical axis integration (OAI) and time-delay integration (TDI) techniques. Disclosed MAI systems and methods may integrate image data in the z direction as the data are acquired, projecting the image data prior to deconvolution. Lateral translation of the image plane during the scan in the z direction may allow large areas to be imaged in a single scan sequence.Type: GrantFiled: March 13, 2003Date of Patent: October 16, 2007Assignee: Applied Precision, LLCInventors: Steven A. Reese, Carl S. Brown, Paul C. Goodwin
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Patent number: 7278268Abstract: A system and method of cooling a CCD camera may employ a composite material housing design that allows the cold side of a TEC to be mounted relatively close to the CCD and the hot side of the TEC to be isolated from the housing cavity in which the CCD resides. An efficient heat transfer path may facilitate cooling the CCD to a predetermined or selected operating temperature and isolate the CCD from the heat loads generated by operation the TEC.Type: GrantFiled: December 3, 2003Date of Patent: October 9, 2007Assignee: Applied Precision, LLCInventor: Steven C. Quarre
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Publication number: 20070201760Abstract: A plurality of panels are assembled into a single image. Each of the panels may have different intensities throughout the panel, as well as non-uniformities between panels. The panels are modified using flat-field calibration, panel flattening, and panel connecting techniques. These techniques correct for non-uniformities and provide a cleaner, single image.Type: ApplicationFiled: April 26, 2007Publication date: August 30, 2007Applicant: Applied Precision, LLCInventor: Carl Brown
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Publication number: 20070177417Abstract: Systems and methods according to aspects of the present invention are described. The systems and methods enable charging, soaking, and measuring of capacitors to be conducted quickly. Charging and soaking typically occurs in parallel and certain embodiments facilitate the measuring of capacitor leakage by sequentially disconnecting each capacitor and measuring the time for voltage on the capacitor to reach a predetermined threshold. Further, all capacitors can be disconnected from a charging source simultaneously and voltages can be measured for each capacitor simultaneously. Monitoring can be periodic in nature. Substantial time savings in the calculation device of leakage values and parameters can be attained.Type: ApplicationFiled: January 29, 2007Publication date: August 2, 2007Applicant: Applied Precision, LLCInventors: Charles Corulli, Gregory Olmstead, Donald Snow
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Patent number: 7231081Abstract: A stereoscopic three-dimensional optical metrology system and method accurately measure the location of physical features on a test article in a manner that is fast and robust to surface contour discontinuities. Disclosed embodiments may image a test article from two or more perspectives through a substantially transparent fiducial plate bearing a fiducial marking; camera viewing angles and apparent relative distances between a feature on a test article and one or more fiducials may enable accurate calculation of feature position.Type: GrantFiled: December 18, 2002Date of Patent: June 12, 2007Assignee: Applied Precision, LLCInventors: Donald B. Snow, Raymond H. Kraft, John T. Strom
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Patent number: 7228003Abstract: A plurality of panels are assembled into a single image. Each of the panels may have different intensities throughout the panel, as well as non-uniformities between panels. The panels are modified using flat-field calibration, panel flattening, and panel connecting techniques. These techniques correct for non-uniformities and provide a cleaner, single image.Type: GrantFiled: June 18, 2004Date of Patent: June 5, 2007Assignee: Applied Precision, LLCInventor: Carl S. Brown
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Publication number: 20070103181Abstract: A system and method of mitigating the effects of component deflections in a probe card analyzer system may implement three-dimensional comparative optical metrology techniques to model deflection characteristics. An exemplary system and method combine non-bussed electrical planarity measurements with fast optical planarity measurements to produce “effectively loaded” planarity measurements.Type: ApplicationFiled: December 12, 2006Publication date: May 10, 2007Applicant: Applied Precision, LLCInventor: JOHN STROM
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Publication number: 20070091427Abstract: A system and method of generating and acquiring phase contrast microscope images while minimizing interference with the intensity and optical quality of other microscopy modalities employing polarization and attenuation strategies for phase microscopy applications. A plane polarizing objective phase ring may be used in conjunction with a phase microscopy apparatus. Attenuated light may be controlled such that transparency may be selectively provided with respect to light in a predetermined plane. Illumination outside of the predetermined plane may be selected for phase microscopy applications. Accordingly, a polarizing objective phase ring effective for enabling polarized phase microscopy may reduce interfere with normal usage of the microscope for other applications such as, for example, fluorescence microscopy.Type: ApplicationFiled: October 25, 2006Publication date: April 26, 2007Applicant: Applied Precision, LLCInventor: Paul Goodwin
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Patent number: 7170307Abstract: A system and method of mitigating the effects of component deflections in a probe card analyzer system may implement three-dimensional comparative optical metrology techniques to model deflection characteristics. An exemplary system and method combine non-bussed electrical planarity measurements with fast optical planarity measurements to produce “effectively loaded” planarity measurements.Type: GrantFiled: March 12, 2004Date of Patent: January 30, 2007Assignee: Applied Precision, LLCInventor: John T. Strom
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Patent number: 7141801Abstract: A system and method of providing illumination for a cell imaging system delivering modulated light for illumination of a sample. Modulation of illumination intensity may be effectuated by pulsing the output of a light source, for example, or by selectively interrupting light provided by the source. Such modulated illumination may have particular utility in applications where reducing the number of electrons in a super-excited state may minimize the rate of photobleaching and photodamage in the molecules being studied.Type: GrantFiled: December 19, 2003Date of Patent: November 28, 2006Assignee: Applied Precision, LLCInventor: Paul C. Goodwin
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Publication number: 20060244438Abstract: By examining scrub mark properties (such as position and size) directly, the performance of a wafer probing process may be evaluated. Scrub mark images are captured, image data measured, and detailed information about the process is extracted through analysis. The information may then be used to troubleshoot, improve, and monitor the probing process.Type: ApplicationFiled: June 29, 2006Publication date: November 2, 2006Applicant: Applied Precision, LLCInventor: John Strom
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Patent number: 7102368Abstract: By examining scrub mark properties (such as position and size) directly, the performance of a wafer probing process may be evaluated. Scrub mark images are captured, image data measured, and detailed information about the process is extracted through analysis. The information may then be used to troubleshoot, improve, and monitor the probing process.Type: GrantFiled: February 27, 2004Date of Patent: September 5, 2006Assignee: Applied Precision, LLCInventor: John T. Strom