Abstract: A method and apparatus for retrofitting semiconductor chip performance analysis tools with full-chip thermal analysis capabilities is provided. One embodiment of a novel method for performing performance analysis of a semiconductor chip design includes receiving at least one input calculated in accordance with an actual (e.g., purposefully calculated rather than assumed or estimated) temperature of a semiconductor device and/or an interconnects in the semiconductor ship design. This input is then used to assess at least one temperature-dependent performance parameter of the semiconductor chip design.

Abstract: A method and apparatus for sorting articles to a delivery point sequence includes at least one article sorter adapted to sort articles and a conveying system operable to arrange and convey containers of articles sorted in a first sort pass to an induct of the article sorter for a second sort pass or process of the articles. The system or method automatically sorts and conveys trays containing sorted articles from a discharge of at least one sorting assembly to an induct of the at least one sorting assembly. The conveying assembly may have a generally continuous conveying track and is operable to automatically provide the trays to the induct of the at least one sorting assembly in a sequenced manner.

Abstract: A movable arm assembly for a circuit breaker includes a unitary structure having two blade portions being connected by a bend location. The bend location forms a gapless surface region. A contact is connected to the unitary structure wherein the gapless surface region and a contact surface of the contact are connected to form a joint therebetween. A method for forming a movable arm assembly includes forming a blank from a conductive sheet, the blank including a unitary structure having two blade portions, bending the blade portion at a bend location to form a gapless surface region at the bend location and joining a contact to the unitary structure on the gapless surface region at the bend location to form a movable arm assembly.

Abstract: For application to analog, mixed-signal, and custom digital circuits, a system and method to do: global statistical optimization (GSO), global statistical characterization (GSC), global statistical design (GSD), and block-specific design. GSO can perform global yield optimization on hundreds of variables, with no simplifying assumptions. GSC can capture and display mappings from design variables to performance, across the whole design space. GSC can handle hundreds of design variables in a reasonable time frame, e.g., in less than a day, for a reasonable number of simulations, e.g., less than 100,000. GSC can capture design variable interactions and other possible nonlinearities, explicitly capture uncertainties, and intuitively display them. GSD can support the user's exploration of design-to-performance mappings with fast feedback, thoroughly capturing design variable interactions in the whole space, and allow for more efficiently created, more optimal designs.

Abstract: An apparatus including a controller, a workpiece transport in communication with the controller having a movable portion and a transport path, and a multi-dimensional position measurement device including at least one field generating platen attached to the movable portion and at least one sensor group positioned along the transport path and in communication with the controller, the field generating platen is configured for position measurement and propelling the movable portion, each sensor in the at least one sensor group is configured to provide but one output signal along a single axis corresponding to a sensed field generated by the at least one field generating platen and the controller is configured calculate a multi-dimensional position of the movable portion based on the but one output signal of at least one of the sensors in the at least one sensor group, the multi-dimensional position including a planar position and a gap measurement.

Abstract: A method and apparatus for full-chip thermal analysis of semiconductor chip designs is provided. One embodiment of a novel method for performing thermal analysis of a semiconductor chip design comprises receiving at least one input relating to a semiconductor chip design to be analyzed. The input is then processed to produce a three-dimensional thermal model of the semiconductor chip design. In another embodiment, thermal analysis of the semiconductor chip design is performed by calculating power dissipated by transistors and interconnects included in the semiconductor chip design and distributing power dissipated by the interconnects.

Abstract: A system, method, and device for monitoring an AC induction motor are disclosed. The exemplary system provides the architecture of an intelligent motor controller. On one hand, the controller has self-commission and adaptive tuning capability and can provide smooth start and stop for motor driven systems. On the other hand, the controller can provide fault detection, power metering, and history data logging, to ensure motor operates under optimal conditions. The exemplary system may have one or more sensors for monitoring characteristics of the AC induction motor and producing one or more inputs from the characteristics.

Abstract: A system and method for simulating a stress or failure in a network of a plurality of simulated networked program logic controllers includes simulating a plurality of networked program logic controllers in a network, the networked program logic controllers each having network information defining a node, the network information being selected from a type of program logic controller, an I/O connected to the program logic controller and a type of connection for the program logic controller; providing an interface in communication with each of the networked program logic controllers for simulating a network error; and activating the interface for inducing one of a stress or failure in the network.

Abstract: The present invention relates generally to a switchgear apparatus. More particularly, the invention encompasses a circuit breaker compartment arc flash venting system for a switchgear apparatus. The present invention also relates to enclosures for switchgear, panel boards, circuit breakers, and more particularly to an enclosure for low voltage switchgear and switchboard assemblies. The enclosure can be a walk-in type enclosure or a non-walk-in type enclosure. This invention further provides a method and apparatus for channeling plasma (hot arc gasses) that are generated from an arc. The circuit breaker compartment arc flash venting system is an integral part of an arc resistant switchgear assembly. The arc flash venting system works in conjunction with the bus insulation and ventilation systems in the switchgear apparatus to channel hot arc gasses (plasma) from a breaker compartment in the event of an internal arcing fault in the breaker compartment.

Abstract: For application to analog, mixed-signal, and custom digital circuits, a system and method to begin with a complex problem description that encompasses many variables from statistical manufacturing, the circuit's environment, and the circuit's design parameters, but then apply techniques to prune the scope of the problem to make it manageable for manual design and more efficient automated design, and finally use that pruned problem for more efficient and effective design.

Abstract: A system for braking a motor. The system includes at least one resistor and a contactor connected to the at least one resistor and a motor. The system further includes a variable frequency drive electrically connected to the motor, wherein the variable frequency drive comprises a controller operably connected to the contactor, wherein at least a portion of the contactor closes connecting the at least one resistor to the motor in response to a command from the controller. The variable frequency drive is configured such that motor flux levels may be maintained at a relatively high level as motor torque current is reduced, resulting in a consistently high motor flux level as the motor speed decreases.

Abstract: A multi-pole handle lock having a base plate and movable locking plate assembly that is adapted to mount on to at least two circuit breakers. A handle restrictor plate is mounted on the base plate for translational movement while maintaining the circuit breaker handles in the same position as each other. The handle restrictor plate allows each handle to independently move to the tripped position, while allowing the restricted circuit breakers to operate as a logical group. The low profile of the plates, allows visual inspection of the handle ends to determine their tie status.

Abstract: Certain exemplary embodiments can comprise a method for controlling a machine. The method can comprise a plurality of activities that can comprise determining a profile of a surface responsive to a scan of the surface. The method can comprise identifying a predetermined profile from a plurality of predetermined profiles, the identified predetermined profile a closest match of the plurality of predetermined profiles to the profile of the surface. The method can comprise determining a machine procedure based upon the identified predetermined profile. The method can comprise automatically executing the preferred machine procedure via a machine.

Abstract: A substrate transport apparatus comprising a drive section, an upper arm, a first forearm, and a second forearm. The upper arm is rotatably connected to the drive section at a first end of the upper arm. The upper arm is rotatably connected to the drive section for rotating the upper arm about an axis of rotation of the drive section. The first forearm is pivotably connected to the upper arm for pivoting relative to the upper arm. The first forearm has a first end effector depending therefrom. The second forearm is pivotably connected to the upper arm for pivoting relative to the upper arm. The second forearm has a second end effector depending therefrom.

Abstract: A system for optically detecting an electrical arc in a power supply. The system includes a light pipe, a photodetector optically coupled to the light pipe, and a signal processor connected to the photodetector.

Abstract: Certain exemplary embodiments can provide a system, which can comprise a lug coupler that comprises a set of bus bars. Each of the set of bus bars can be adapted to be releasably attached to a corresponding terminal of a set of terminals of a circuit breaker. The system can comprise a set of studs adapted to engage a corresponding set of apertures defined by an end connector of one of a set of electrical leads adapted to be electrically coupled to the lug coupler.

Abstract: A method for acquiring data regarding operation of a mail processing system includes the steps of configuring a diagnostic module as a mail piece, inserting the diagnostic module into a stream of mail being processed by the mail processing system, and collecting data with the diagnostic module as it travels through the mail processing machine.

Abstract: A basepan assembly for hook-on attachment onto a metering device is provided including a basepan support having at least two insert latches disposed at a first end and a side flange disposed at a second opposite end. A basepan body is provided being insertable onto said basepan support and including an inside wall configured to be attachable to a barrier of the metering device, as well as an outside wall, a bus stab chamber, and a hold-down insert configured to be attachable to the basepan body, the hold-down insert further having a side barrier. A top load stab having a first end affixable to the hold-down insert is provided and a bottom load stab insertable within said bus stab chamber is provided.

Abstract: An electrical probe assembly includes a first probe housing pivotally connected to a base structure and receiving a first probe therein. The first probe is configured to interface with a first contact of an electrical component. A second probe housing is pivotally connected to the base structure and receives a second probe therein. The second probe is configured to interface with a second contact of the electrical component wherein the first and second contacts have a spatial relationship therebetween. An adjustment mechanism is connected to the first and second housing and configured to independently adjust an amount of rotation of the each of the housings to accommodate the spatial relationship.

Abstract: A circuit breaker includes a housing forming an opening. A push switch is connected to a test circuit to enable testing of the test circuit in accordance with closing the push switch. A flexible membrane is formed in the opening and configured to form a seal between the housing and the flexible membrane. The flexible membrane is located in an operative relationship with the push switch such that pushing the flexible membrane results in a displacement of the push switch.