Patents Assigned to BYK-Gardner GmbH
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Patent number: 11060966Abstract: The invention relates to a docking station 2 for a surface measuring apparatus 1, more particularly an optical surface measuring apparatus. The docking station has a reference measuring surface 4 which can be brought into a covered state in which it is covered from the environment of the docking station 2 and an uncovered state in which it is not covered from the environment of the docking station 2. When the surface measuring apparatus 1 is in the docking station 2 and the reference measuring surface 4 is in the uncovered state, the surface measuring apparatus 1 can perform a reference measurement of the reference measuring surface 4 and can calibrate the surface measuring apparatus 1 using the reference measurement. In contrast, when the reference measuring surface 4 is in the covered state, it is not exposed to the environment of the docking station 2 and is therefore protected from, for example, dust, light, moisture or mechanical impacts.Type: GrantFiled: June 15, 2018Date of Patent: July 13, 2021Assignee: BYK-GARDNER GMBHInventor: Peter Schwarz
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Patent number: 9726597Abstract: The invention relates to an apparatus for the investigation of surface properties with a housing, a light source which directs light through an opening in the housing onto a surface to be investigated, with a first detector device which is arranged inside at a first pre-set angle with respect to the light beam radiated onto the surface by the light source, with a second detector device which is arranged at a second pre-set angle with respect to the light beam radiated onto the surface by the light source and with a third detector device which is arranged inside the housing at a third pre-set angle with respect to the light beam radiated onto the surface by the light source.Type: GrantFiled: March 12, 2015Date of Patent: August 8, 2017Assignee: BYK-GARDNER GMBHInventors: Uwe Sperling, Peter Schwarz
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Patent number: 9581546Abstract: Radiation is irradiated by an irradiation device at a pre-set angle of incidence with respect to the surface onto the surface to be investigated, and the radiation scattered and/or reflected by this surface arrives at a radiation detector device arranged at a pre-set detection angle with respect to the surface and having an image-recording unit which records black-and-white images, wherein this radiation detector device permits a spatially resolved detection of the radiation reaching it. The irradiation device directs radiation in a first wavelength range onto the surface and the image-recording unit records a first spatially resolved image of this radiation scattered and/or reflected from the surface and the irradiation device directs radiation in a second wavelength range onto the surface and the image-recording unit records a second spatially resolved image of this radiation scattered and/or reflected from the surface.Type: GrantFiled: June 29, 2012Date of Patent: February 28, 2017Assignee: BYK-GARDNER GMBHInventors: Peter Schwarz, Uwe Sperling
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Patent number: 9506860Abstract: An apparatus for the calibration of optical measuring instruments with a carrier includes a calibration body having a glass body which has at least one scattering element, wherein the scattering element is completely surrounded by the glass body, and wherein a degree of transmission of the scattering element and of the glass body differ from one another.Type: GrantFiled: July 21, 2016Date of Patent: November 29, 2016Assignee: BYK-GARDNER GMBHInventor: Severin Wimmer
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Patent number: 9417184Abstract: An apparatus for the calibration of optical measuring instruments with a carrier includes a calibration body having a glass body which has at least one scattering element, wherein the scattering element is completely surrounded by the glass body, and wherein a degree of transmission of the scattering element and of the glass body differ from one another.Type: GrantFiled: January 23, 2015Date of Patent: August 16, 2016Assignee: BYK-GARDNER GMBHInventor: Severin Wimmer
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Patent number: 9404858Abstract: A method is provided for the quantitative determination of surface properties, wherein a spatially resolved image of a surface to be analyzed, which contains a large number of measured values, is recorded. In a first method step, the measured values are analyzed in order to determine those surface areas which have a specific physical property. A result value of this physical property is then determined, wherein this result value is characteristic of the values of the physical property of all those surface areas of the image determined by analyzing the image. In addition to the result value, a further value (B) characteristic of the surface is determined and this characteristic value is displayed together with the result value (I).Type: GrantFiled: March 21, 2008Date of Patent: August 2, 2016Assignee: BYK-GARDNER GMBHInventors: Peter Schwarz, Konrad Lex
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Patent number: 8928886Abstract: An apparatus for determining optical properties of materials including a first measuring device having a first radiation device which directs radiation onto the material under a first specified angle of radiation and a first radiation detection device which is located under a first angle of reception with respect to the material, and a second measuring device which includes a second radiation device which directs radiation onto the material under a second specified angle of radiation and a second radiation detection device which is located at a second angle of reception with respect to the material and allows a locally resolved evaluation of the radiation incident thereon and emits at least one second characteristic signal which is characteristic of the radiation incident on the second radiation detection device.Type: GrantFiled: October 7, 2009Date of Patent: January 6, 2015Assignee: BYK-Gardner GmbHInventor: Konrad Lex
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Patent number: 8867043Abstract: A method of determining optical properties of textured surfaces by irradiation of the surface to be investigated. At least part of the radiation irradiated onto the surface and reflected by the latter is detected by a detector device which permits a location-resolved evaluation of the radiation striking it. A first characteristic value from the radiation detected, characteristic of a texture of the surface is detected. A second characteristic value from the radiation detected, characteristic of a further optical property of the surface is detected. And, a result value is determined on the basis of the first characteristic value and the second characteristic value.Type: GrantFiled: July 12, 2010Date of Patent: October 21, 2014Assignee: BYK-Gardner GmbHInventors: Peter Schwarz, Uwe Sperling
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Patent number: 8749791Abstract: An apparatus for measuring optical properties of transparent materials with a first illumination device which illuminates the material to be investigated along a pre-set illumination path with a pre-set radiation, with a radiation recording space which records radiation passed on by the material to be investigated. The radiation recording space is arranged so that radiation emitted by the first illumination device first strikes the material and then at least for a time an inner wall of the radiation recording space. A radiation detector device is arranged to record radiation reflected and/or scattered essentially only from the inner wall. A second illumination device suitable for emitting modulated radiation also illuminates the inner wall.Type: GrantFiled: August 9, 2012Date of Patent: June 10, 2014Assignee: BYK-Gardner GmbHInventors: Severin Wimmer, Peter Schwarz
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Patent number: 8355141Abstract: A method for optical investigation of textured surfaces involves the steps of irradiation of radiation onto the surface to be investigated; reception of an image from at least part of the radiation irradiated onto the surface and reflected by the surface; location-resolved evaluation of the image recorded and determination of at least one value K which is characteristic of this image. A parameter G which is characteristic of the surface is determined while using the characteristic value K and while using at least one further property E known beforehand or determined of the surface.Type: GrantFiled: July 9, 2010Date of Patent: January 15, 2013Assignee: BYK-Gardner GmbHInventors: Peter Schwarz, Uwe Sperling
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Patent number: 8260004Abstract: The present disclosure relates to a method for the quantitative determination of surface properties, wherein a spatially resolved image of a surface to be analysed, which contains a large number of measured values, is recorded. In a first method step, the measured values are analysed in order to determine those surface areas which have a specific physical property. A result value of this physical property is then determined, wherein this result value is characteristic of the values of the physical property of all those surface areas of the image determined by analyzing the image. According to the disclosure, the result value is displayed against the size of the determined surface areas.Type: GrantFiled: March 21, 2008Date of Patent: September 4, 2012Assignee: BYK-Gardner GmbHInventor: Konrad Lex
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Patent number: 8102530Abstract: A colour measuring unit (1) comprising a radiation device (2) which emits light onto a surface (9) to be examined, wherein the radiation device (2) comprises at least one semiconductor-based light source (6), and a radiation detector device (12) which receives at least a portion of the light scattered by the surface and outputs a signal characteristic of this light, wherein the radiation detector device (12) allows a spectral analysis of the light impinging thereon. According to the invention, the colour measuring unit comprises at least one sensor device (10) which determines at least one electrical parameter of the light source (6), and also a processor device (14) which outputs from this measured parameter at least one value characteristic of the light emitted by the radiation device (2).Type: GrantFiled: November 7, 2008Date of Patent: January 24, 2012Assignee: BYK-Gardner GmbHInventors: Uwe Sperling, Peter Schwarz
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Patent number: 7973932Abstract: The invention relates to an apparatus for determining optical surface properties of workpieces, comprising a housing, in the interior of which there is provided a carrier on which the workpiece be arranged, and comprising a radiation device which directs radiation onto the workpiece in a predefined emission direction (E). According to the invention, the housing has in at least one wall an observation opening, through which a region of the workpiece illuminated by the radiation device can be observed in a predefined observation direction (B).Type: GrantFiled: March 9, 2009Date of Patent: July 5, 2011Assignee: BYK-Gardner GmbHInventor: Konrad Lex
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Patent number: 7944562Abstract: The invention relates to a portable device (1) for the determination of surface properties with a measurement apparatus (10) which directly determines locally the topography of a surface (8) under investigation and issues at least one measured value that is characteristic of this local topography, and with a processor apparatus which, taking account of a multiplicity of initial measured values, issues at least one result value characteristic of the global topography of the surface.Type: GrantFiled: August 8, 2007Date of Patent: May 17, 2011Assignee: BYK-Gardner GmbHInventor: Peter Schwarz
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Patent number: 7834991Abstract: An apparatus for determining surface properties, comprises at least a first radiation device which emits radiation onto a surface to be analyzed, at least a first radiation detector device which receives at least part of the radiation emitted by the at least one radiation device and then scattered or reflected by the surface and outputs at least a first measurement signal which is characteristic of the reflected or scattered radiation, and at least a further radiation detector device which receives at least part of the radiation emitted by the at least one radiation device and then scattered or reflected by a surface and outputs at least a second measurement signal which is characteristic of the reflected or scattered radiation.Type: GrantFiled: July 6, 2007Date of Patent: November 16, 2010Assignee: BYK Gardner GmbHInventors: Peter Schwarz, Konrad Lex
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Patent number: 7741629Abstract: An apparatus (1) for analysing surface properties, comprising a first radiation device (4) which emits radiation directly onto a surface (9) to be analyzed, a first illumination device (6, 7) for indirectly illuminating the surface (9) to be analyzed, a first radiation detector device (8) which receives at least part of the radiation thrown back from the surface (9) to be analyzed and outputs at least one signal which is characteristic of this part of the radiation. According to the invention, a radiation scattering device (10, 11) is provided which is at least partially illuminated by the first illumination device (6, 7) and which transmits scattered radiation onto the surface (9) to be analyzed.Type: GrantFiled: September 21, 2007Date of Patent: June 22, 2010Assignee: BYK-Gardner GmbHInventors: Peter Schwarz, Uwe Sperling
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Patent number: D755651Type: GrantFiled: October 2, 2014Date of Patent: May 10, 2016Assignee: BYK-Gardner GMBHInventors: Heinrich Henssler, Martin Schultheiss
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Patent number: D846415Type: GrantFiled: December 5, 2017Date of Patent: April 23, 2019Assignee: BYK-GARDNER GMBHInventors: Heinrich Henssler, Martin Schultheiss, Karin Patricia Anger-Marx
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Patent number: D846416Type: GrantFiled: December 5, 2017Date of Patent: April 23, 2019Assignee: BYK-GARDNER GMBHInventors: Heinrich Henssler, Martin Schultheiss, Karin Patricia Anger-Marx
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Patent number: D846417Type: GrantFiled: December 6, 2017Date of Patent: April 23, 2019Assignee: BYK-GARDNER GMBHInventors: Heinrich Henssler, Martin Schultheiss, Karin Patricia Anger-Marx