Abstract: A device for determining the properties of reflective bodies has at least one illuminator that emits light onto a measurement surface, at least one detector for recording the light reflected from the measurement surface, the at least one detector includes a plurality of light-sensitive sensors. Substantially each sensor issues a measurement value characteristic of the light received by each respective sensor. Also included is at least one memory, having at least one first predefined threshold, at least one controller for the measurement sequence which includes at least one processor, whereby a measurement sequence is controllable such that a measurement value of a sensor is allocated to a first surface type when same exceeds the first threshold, wherein at least two sensors are respectively associated with different locations to be measured on the measurement surface, and wherein the controller is configured to issue at least one surface characteristic statistical parameter.

Abstract: The present invention relates to a device and a method for determining the quality of surface. An illuminating light source radiates light at a predetermined angle onto the measurement surface. An optical detecting device receives the light reflected from said measurement surface and converts same into an electrical measurement signal. A processor controls the measurement sequence and evaluates the measurement results, which are emitted via an output device. The illuminating light source comprises at least one light-emitting diode. The light emitted comprises at least blue, green and red spectral components in the visible range of the spectrum. A filter is provided in the path of radiation between the light source and the photosensor.

Abstract: The present invention relates to a device and a method for determining the properties of surfaces having at least one first radiation means for collimated irradiation of a measurement surface to be examined and at least one second radiation means for non-collimated irradiation of said measurement surface wherein the space above said measurement surface has substantially radiation-absorbing properties.

Abstract: The present invention relates to a device and a procedure for the quality control of in particular finished surfaces wherein the device comprises at least one illuminating means having at least one light source, its light directed at a predetermined angle to the measurement surface. A plurality of at least three measuring means is provided, whereby each of said measuring means is directed at a different predetermined angle to the measurement surface and receives a portion of the light reflected from said measurement surface. Each measuring means comprises at least one photosensor which emits an electrical measurement signal which is characteristic of the light received by said measuring means. A control and evaluation means having at least one processor means and one memory means controls the measurement sequence, evaluates the measurement results and derives therefrom a parameter which characterizes the surface. An output means serves for the outputting of parameters or measurement results.

Abstract: The present invention relates to a device for a quantified determination of the quality of structured surfaces comprising a first optical device that emits light at a predetermined angle onto the surface to be measured and a second optical device having at least one photo sensor which receives the light reflected by the measurement surface. The optical device are configured such that the reflected light is influenced by the structure of the measurement surface and the reflected light is evaluated by an evaluator, which is provided for controlling the measurement sequence and which comprises a processor and a controller where at least one structural variable is derived therefrom which is characteristic of at least one structural-contingent property of the surface.

Abstract: Procedure for taking a reference measurement employing an optical device which comprises the following: an illuminating means having a source of radiation, its light being directed at a predetermined angle to a surface to be measured; a first optical measuring means which is aligned at a predetermined angle to said measurement surface and which receives a portion of the light reflected from said measurement surface and which comprises a photo sensor which emits a measurement signal characteristic of said reflected light; a second optical measuring means which is aligned at a predetermined angle to said measurement surface and which receives a portion of the light reflected from said measurement surface and which comprises a photo sensor which emits an electrical measurement signal characteristic of said reflected light; a control and evaluation means having a processor and memory means for controlling the measurement sequence and evaluating the measurement results which are then output via an output means.

Abstract: The invention relates to a process and a device for determining the properties of reflective and especially heterogeneous reflective bodies having at least one illuminating means which emits light onto a measurement surface, at least one detecting means for recording the light reflected from said measurement surface, wherein said detecting means comprises a plurality of light-sensitive sensor means and whereby a measurement value may issue from substantially each of said sensor means which is characteristic of the light received by each respective sensor means. A first predefined threshold is provided in a memory means. A controlling means serves to control the measurement sequence and comprises a processing means. Said controlling means directs the measurement sequence such that a measurement value of a sensor means is allotted to a first surface type when same exceeds said first threshold.

Abstract: A fiber optic light guide for a measurement or illumination system is described, in which an inside space left free in a fiber optic light guide unit is bounded laterally by a closed wall formed by the fiber optic light guide unit.

Abstract: A device for measuring the visual characteristics of surfaces comprises a light source the light of which is directed onto the measurement surface under a predetermined angle, and a measurement means which measures the light reflected from said measurement surface, said measurement means comprising at least three photo sensors which are arranged such that they measure the intensity of the reflected light in sections which correspond to a different reflection angle. The photo sensors form an integrated device, a common substrate being provided on which the light sensitive sources are arranged in essentially one plane and detect the amount of incident light essentially independently of each other, said light sensitive layers being designed such that they detect the amount of light reflected in a predetermined angle range each.

Abstract: The proposed method of temperature compensation for opto-electronic devices, more specifically opto-electronic semiconductor devices, involves operation of the device under predetermined constant conditions, where a first temperature dependent characteristic value is measured which is then compared with a comparison value determined under identical constant conditions but at a different temperature. A correction function is derived from the relationship between the characteristic value and the comparison value and used to correct the measured value obtained from the semiconductor device so as to compensate for the effect of temperature.

Abstract: A device and process for measuring and analyzing spectral radiation within a desired wavelength range. A number of radiation sources are provided, in combination with a sensor for detecting radiation within the desired wavelength range. The radiation sources are selected to have spectral characteristics that are linearly independent from one another, but overlap so that, in combination, the radiation sources generate radiation over the entire desired wavelength range. Alternatively, a single radiation source generating radiation over the entire desired wavelength range is provided in combination with a plurality of sensors that have spectral sensing characteristics that are linearly independent from one another, but overlap so that, in combination, the sensors sense radiation over the entire desired wavelength range.

Abstract: In a method and a device for optically characterizing a goniochromatic surface, for example a metallic painting surface, only a fixed measuring angle setting is used according to the invention.

Abstract: The invention provides a device for measuring characteristic quantities of an at least partially transparent sample, comprising: an illumination component including a light source (1) which emits light in a predetermined wavelength range and which is arranged such within this illumination component that the light substantially propagates along a predetermined optical axis, a sample reception space provided between this illumination component and a measuring component and arranged such with respect to this optical axis that the light which emerges from the light source first passes a sample located within that sample reception space and then enters this measuring means, a measuring component including a substantially closed measuring space having an opening through which this optical axis extends and through which the light enters after having passed the sample, and which also includes a photodetector component (2) being sensitive at least within this predetermined wavelength range, including at least two dete

Abstract: An apparatus and method for measuring the gloss of a surface with a light source projecting light in the direction of the surface and a light-sensitive sensor receiving the light reflected from the surface and converting it into an electrical signal value. A memory storing a program for calculating the characteristic gloss value, a computer for calculating a characteristic gloss value from the electrical signal value, and a display for visually displaying the calculated characteristic gloss value are provided. Five or more reference value pairs are stored in the memory, each pair consisting of a reference characteristic gloss value and a corresponding reference electrical signal value measured by the apparatus on the basis of the reference surface. The measured electrical signal value is compared with the reference signal values and at least the next higher and the next lower value for interpolating the measured gloss.