Abstract: Some embodiments provide a method and system for identifying error markers for patterns within a design layout that do not meet the manufacturing constraints. Some embodiments extend a region from the error marked region to extract a pattern for decomposition analysis. Some embodiments compare the extracted pattern to known patterns stored in a library, which also stores at least one previously computed decomposition solution for each known pattern. For an extracted pattern existing within the library, some embodiments retrieve the previously computed decomposition solution from the library. For an extracted pattern that does not exist within the library, some embodiments use one or more simulations to determine a decomposition solution for the extracted pattern. The resulting decomposition solution replaces the extracted pattern within the design layout producing a variant of the original layout that contains the decomposed solution for the pattern.

Abstract: Overloaded regions in the routing space of a physical network are resolved via a routing procedure composed of a topological routing phase and a geometric routing phase. The overloads are resolved in the topological routing phase where the constraints of routing are less prohibitive. Multiple topological transformations directed toward resolving the overloads are executed in the topological routing phase prior to a geometric arrangement being realized. The topological transformations may be applied concurrently by way of a multi-threaded embodiment of the invention.

Abstract: A system and method for determining the criticality of each timing pin in a circuit design are disclosed. The criticality of a timing pin is the probability that the timing pin is on the path with the worst slack in the circuit design. According to the methodology, the slack for each timing pin is calculated, wherein each slack is a function of a process random variable. Then, the criticality of each timing pin is determined as the probability of the timing pin having the minimum slack among the slacks in an independent critical set of timing pins. The criticality of each timing pin may then be normalized. By determining the criticalities of the timing pins in a circuit design, a circuit design system may be able to more easily identify portions of the circuit design that need modification for timing and other purposes.

Abstract: An approach is provided for selectively optimizing a circuit design to be physical implemented. The approach includes generating a circuit routing solution in accordance with a plurality of constraints for parametric resources of the circuit design, with the constraints being defined respectively by a plurality of corresponding constraint instances. Each constraint instance variably indicates an effective constraining limit and degree of consumption for at least one of the parametric resources. At least one of the constraints is selectively adjusted by a predetermined over-constraining amount, and the circuit routing solution is preliminarily modified by applying at least one routing action selected responsive to the constraint adjustment. An automatic evaluation is then made of the potential impact upon constraint compliance.

Abstract: An automated approach is provided for evaluating stress upon analog components embedded in a digital electronic circuit design. The approach includes establishing a computer readable circuit definition of the digital electronic circuit design. The circuit definition is then partitioned into a plurality of circuit portions, which are re-defined to form a plurality of analog topologies. The analog topologies are adapted for automatic analog simulation one independent of the other, with all digital components substituted by at least one subcircuit including instantiation of a corresponding input output (IO) buffer model. Automatic analog simulation is carried out upon the analog topologies to generate simulated results data, which are automatically postprocessed to generate worst-case stress measurement data for one or more critical components identified in the analog topologies.

Abstract: A method and apparatus for process optimization is provided. Process optimization improves parametric and functional yield post mask manufacturing.

Abstract: A apparatus and method for correcting a process critical layout includes characterizing the influence of individual ones of a set of worst case process variations on a simulated nano-circuit layout design and then correcting layout geometries in the simulated nano-circuit layout based on such characterizations.

Abstract: A method and mechanism is disclosed for identifying and tracking nets in an electrical design. A hierarchical design does not have to be flattened to perform the operation of identifying and tracking nets. To identify sets of connected shapes, instead of having to unfold the entire design hierarchy, only the specific instances of shapes falling within the geometric bounds of shapes identified as being part of a net needs to be unfolded to perform the search. When composing the list of nets for a hierarchical design, the unfolded shapes at other hierarchical levels of the design can be derived based upon virtual terminal structures that implicitly references nets and objects at other levels.

Abstract: Methods and systems for representing the limitations of a lithographic process using a pattern library instead of, or in addition to, using design rules. The pattern library includes “known good” patterns, which chip fabricators know from experience are successful, and “known bad” patterns, which chip fabricators know to be unsuccessful. The pattern library can be used to contain exceptions to specified design rules, or to replace the design rules completely. In some implementations, the pattern library contains statistical information that is used to contribute to an overall figure of merit for the design. In other implementations, a routing tool may generate a plurality of possible IC layouts, and select one IC layout based on information contained in the pattern library.

Abstract: Disclosed are a method, a system, and a computer program product for implementing compact manufacturing model during various stages of electronic circuit designs. In some embodiments, the method or the system receives or identifies physics based data. In some embodiments, the method or the system receives or identifies the physics based data for the corresponding manufacturing process by using the golden manufacturing process model. In some embodiments, the method or the system uses the physics based data to fine tune, modify, or adjust the golden manufacturing process model. In some embodiments, the method or the system invokes the just-right module. In some embodiments, the method or the system implements the compact manufacturing model and the correct-by-design module and provides guidelines for the various stages of the electronic circuit design.

Abstract: A system, method, computer program product for verification and equivalence checking. In one approach, the system, method, and computer program product analyzes the switching paths in a manner consistent with circuit functionality to provide a complete application which can verify the complex characteristics in the circuits to the accurate RTL model function, including FPGA, ROM Arrays, RAM circuits, and other custom integrated circuit designs.

Abstract: In one embodiment of the invention, a physical layout wire-load algorithm is used to generate a wire-load model based on physical data including aspect ratio and wire definitions defined in a physical library. The physical layout estimator is utilized to dynamically produce the physical layout wire-load model and to calculate net length and delay for each optimization iteration.

Abstract: An apparatus and method for modifying a mask data set includes calculating a derivative of a figure-of-merit, indicative of a data set defined by a plurality of polygon edges and then segmenting polygon edges in response to said step of calculating.

Abstract: The present invention allows for a robust design using manufacturability models. A method, system and/or computer usable medium may be provided in an integrated circuit design to track sensitivity to a variation of process from wafer to wafer and/or fab to fab in order to assist the designers to anticipate the variations to improve the final yield of the products.

Abstract: Aspects for optimized mapping of source elements to destination elements as interconnect routing assignments are described. The aspects include utilizing chosen rules to establish a priority for mapping, and generating mapping assignments based on the priority. The mapping assignments are recursively refined to converge on an optimized solution.

Abstract: Systems, methods, and computer readable media storing instructions for such methods relate to generating test vectors that can be used for exercising a particular area of interest in an integrated circuit. The test vectors generally include a non-overlapping repeating and/or predictable sequence of care bits (a care bit pattern) that can be used by a tester to cause the exercise of the area and collect emissions caused by exercising the area. Such emissions can be used for analysis and debugging of the circuit and/or a portion of it. Aspects can include providing a synchronization signal that can be used by a tester to allow sensor activation at appropriate times.

Abstract: Disclosed is an improved method, system, and mechanism for using and constructing a minimum spanning tree. In one approach, each iteration of the process for constructing a minimum spanning tree calculates at most two additional point-pairs for nearest neighbors of points previously added to the tree. These additional point-pairs are appended to a list of point pairs, and the point-pair having the shortest distance is selected and added to the minimum spanning tree. Any metric can be employed to determine nearest neighbors, including Euclidean or Manhattan metrics. An advantage is that not all point-pairs need to be examined, greatly increasing speed and efficiency. Since every point-pair does not have to be examined, a preprocessing step is not required to reduce the number of point-pairs being considered. The resultant minimum spanning tree can be used to facilitate the routing process for an integrated circuit.

Abstract: A mechanism to compress manufacturing awareness into a small representation and to enable the router to consult the representation without performing, or understanding, detailed process analysis, is disclosed.

Abstract: Some embodiments of the invention provide a method of routing. The method selects a net with a set of routable elements in a multi-layer layout region. In some embodiments, the method identifies a route for the net based on different congestion goals on different layers. In other embodiments, the method identifies a route for the net based on different congestion goals between different layer pairs. In some embodiments, the method identifies a route for the net based on both the different congestion goals on different layers and between different layer pairs.

Abstract: Method and system for detecting indeterminate dependencies in a distributed computing grid. A determination is made whether a deadlock situation exists within a workflow of the distributed computing grid and a user of the computing grid is notified of the deadlock situation, e.g., where in the workflow deadlock occurs. A deadlock situation can be determined based on direct and indirect dependencies, such as loops and dependencies involving a first work element and a lower level second work element. A deadlock situation can also be determined based on the relationships between a job and a task, which is executable by a processor in the distributed computing grid.