Abstract: An approach is described for determining waiver applicability conditions and applying the conditions to multiple errors or warnings in physical verification tools. According to some embodiments, the approach includes identification of a waiver of an error or warning, registration of one or more condition sets for waiver of an error or warning, waiver of multiple errors or warnings that match the registered one or more condition sets, and further comprise any or all of the following: receiving or retrieving a circuit design, analyzing the circuit design to identify errors and warnings, and displaying identified errors and warnings where errors and warnings matching a registered condition set are waived. This approach provides for a 1-to-many relationship between identification of a waiver and application of waivers.

Abstract: Embodiments include herein are directed towards a method for electronic circuit design and more specifically towards determining return path quality in an electrical circuit. Embodiments may include providing, using a processor, an electronic circuit design and identifying at least one net associated with the electronic circuit design. Embodiments may further include extracting an ideal loop inductance for the at least one net and extracting a real loop inductance for the at least one net. Embodiments may also include calculating a return path quality factor based upon, at least in part, the ideal loop inductance and the real loop inductance.

Abstract: Devices, methods, computer readable media, and other embodiments are described for design and verification of safety critical electronic systems. Some embodiments integrate functional safety (FS) data with circuit design data for use in electronic design automation (EDA) operations. One embodiment involves a device accessing FS and circuit design data; automatically analyzing register transfer level (RTL) design data using the FS data to perform one or more FS quality checks; and placing and routing the circuit design using the RTL design data and the set of FS data to perform FS-aware placement and routing. In some embodiments, failure modes and associated safety mechanisms to improve safety metrics associated with failure modes are automatically added to the circuit design during EDA operations. In other embodiments, additional FS-aware operations are performed. In some embodiments, the FS data is structured as a single Unified Safety Format (USF) file.

Abstract: Embodiments included herein are directed towards a system and method for implementing an IC package design with an IC package design estimator. Embodiments may include estimating a number of layers for an integrated circuit (IC) package design that includes a plurality of IC die designs. Embodiments may further include determining whether the estimated number of layers can accommodate routing demands for interconnections between the IC package design and each of the plurality of IC die designs. Embodiments may also include identifying a number of layers required to perform routing between each of the plurality of IC die designs. Embodiments may further include determining a power layer or ground layer based upon, at least in part, one or more factors and generating an output for the IC package design based upon, at least in part, the estimated number of layers and the power layer or ground layer.

Abstract: Electronic design automation systems, methods, and media are presented for view pruning to increase the efficiency of computing operations for analyzing and updating a circuit design for an integrated circuit. One embodiment involves accessing a circuit design stored in memory that is associated with a plurality of views, selecting a first view of the plurality of view for view pruning analysis, and identifying a plurality of input values for the first view of the plurality of views. Random nets are generated based on the views, view inputs, and pruning thresholds. Certain views are then selected as dominant based on a comparison of the output slews different nets and views. Subsequent analysis is then performed and used to update the design without using the pruned views (e.g., using the selected dominant views).

Abstract: Various embodiments described herein provide for grouping read-modify-writes (RMWs) such that multiple RMW command sequences can be executed (or rearranged in the command queue) in an interleaved manner rather than being executed in order. In particular, various embodiments described herein split the read and write components (commands) of multiple RMW command sequences, group the read components in the command queue to execute consecutively, and group the write components in the command queue to execute consecutively.

Abstract: Systems, methods, media, and other such embodiments described herein relate to generation of routing trees. One embodiment involves accessing a circuit design comprising an irregular sink arrangement. Different grid templates may be identified for assisting with balanced routings at different levels of a routing tree to connect the sinks of the circuit design. As part of such operations, costs for different routings using the different grid templates are calculated and compared. A lowest cost routing for each grid template are identified. These costs are normalized across different grid templates, and a lowest cost routing across all grid templates is selected. In various embodiments, various costs values based on sink pairing, isolated sinks, and node position for a next level of a routing tree are considered.

Abstract: The present disclosure relates to a computer-implemented method for electronic circuit design awareness. Embodiments may include providing, using a processor, an electronic design having a package layout and a die layout associated therewith. Embodiments may also include displaying at a graphical user interface, the package layout and allowing, at the graphical user interface, a user to edit the package layout. Embodiments may further include determining, using the processor, an impact of the edit on the die layout and in response to the edit, mirroring the edit at the die layout.

Abstract: Various embodiments provide for a multi-channel memory interface capable of supporting a multi-channel memory module (e.g., DIMM) that combines different memory types, such as DDR4/DDR5, DDR5/LPDDR5, or LPDDR4/LPDDR5, through a single physical layer (PHY) interface.

Abstract: The present disclosure relates to a method for electronic design. Embodiments may include receiving, using a processor, an electronic design and performing formal verification upon at least a portion of the electronic design for a specific problem statement. Embodiments may further include generating a plurality of traces associated with the formal verification satisfying the specific problem statement and displaying, at a graphical user interface, an option to select at least one of the plurality of traces for display at the graphical user interface while the formal verification is performed.

Abstract: The present disclosure relates to a computer-implemented method for parasitic extraction. The method may include providing, using one or more processors, an electronic design having IP and/or metal fill content associated therewith. The method may further include identifying at least one layer associated with the content to be modeled and identifying at least one layer associated with the content to be ignored. The method may also include discarding one or more shapes associated with the at least one layer associated with the content to be modeled and replacing each discarded shape with an alternative shape. The method may further include modeling the electronic design including the alternative shape, wherein modeling is electrically aware in a horizontal and a vertical direction.

Abstract: Various techniques implement an electronic design with hybrid analysis techniques. An activity map is identified or generated for an electronic design. The electronic design is reduced into a reduced electronic design at least by applying a plurality of reduction processes to different portions of the electronic design based in part or in whole upon the activity map. Transient behaviors of the electronic design may be determined or predicted at least by performing one or more transient analyses on a representation of the electronic design with a simulation start point based in part or in whole upon the activity map. The electronic design may then be implemented for manufacturing at least by modifying or correcting the electronic design based at least in part upon the transient behaviors.

Abstract: A method for determining a minimum width, a minimum distance and maximum curvature violations for an integrated circuit (IC) design is provided. The method includes creating a set of offset boundary curves based on inputs received for a given boundary set and a defined minimum width and a defined minimum distance. The method also includes determining all intersections between all pairs of offset boundary curves and assigning a node to each intersection point. The method also includes determining all sections between intersection points for each offset curve and determining successors of the sections. The method also includes determining all violation boundaries formed by the sections and forming a layout to manufacture a mask for fabricating the IC when no violations occur. A system and computer-readable media for performing the method are also provided.

Abstract: Disclosed are method(s), system(s), and article(s) of manufacture for implementing layouts for an electronic design using machine learning, where users re-use patterns of layouts that have been previously implemented, and those previous patterns are applied to create recommendations in new situations.

Abstract: Embodiments included herein may be used for characterizing and analyzing an electronic system design including a parallel interface. Embodiments may include identifying an electronic design including a design of a parallel interface. Embodiments may also include determining a single circuit representation including the design of the parallel interface from the electronic design. Embodiments may further include analyzing the single circuit representation at a channel analysis module stored at least partially in memory and functioning in tandem with a computing system to determine waveform responses of the parallel interface and a remainder of the single circuit representation by using channel analysis techniques. The channel analysis techniques may be based upon a data channel simulation and a strobe channel simulation.

Abstract: A method including receiving a parametrized curve indicative of a feature in an integrated circuit is provided. The method includes selecting a first parameter value associated with a first point in the parametrized curve, determining a pre-selected number of derivative values in a Taylor series for the parametrized curve at the first point, and determining a second parameter value for a second point in the parametrized curve based on the pre-selected number of derivative values.

Abstract: The present disclosure relates to a system and method for algorithmic modeling interface (“AMI”) model development. Embodiments may include enabling a selection from a plurality of templates associated with an advanced equalization algorithm at a graphical user interface. Embodiments may further include receiving a selection of at least one of the plurality of templates at the graphical user interface and displaying a selected template at the graphical user interface. Embodiments may also include allowing a user to edit one or more parameters associated with the selected template at the graphical user interface and generating an algorithmic modeling interface (“AMI”) model based upon, at least in part, the selected template and the one or more parameters.

Abstract: A method, a system and a non-transitory machine-readable storage medium are provided. In one or more aspects, a computer-implemented method for bias temperature instability (BTI) calculation of a device includes simulating the device, using an electronic design automation tool. The simulation includes determining a first degradation value after applying a first sequence of stress values to the device for a first plurality of time steps. The simulation further includes determining a first degradation recovery value after the first plurality of time steps. The simulation further includes determining a first recovered degradation value after the first plurality of time steps by combining the first degradation value and the first degradation recovery value. The first degradation value, the first degradation recovery value, and the first recovered degradation value are associated with one or more model parameters of the device.

Abstract: Aspects of the present disclosure address systems and methods for dynamically adjusting skew windows during clock tree synthesis (CTS). A method may include identifying a pin insertion delay (PID) assigned to a clock sink in a set of clock sinks of a buffer tree in an integrated circuit design. The method further includes determining a skew window for the clock sink based on a skew target and adjusting the skew window based on identifying the PID assigned to the clock sink. The skew window is adjusted based on a skew adjustment parameter. The method further includes building a clock tree based on the buffer tree and the adjusted skew window. The building of the clock tree comprises tuning a clock path delay of the clock sink according to the adjusted skew window. A layout instance may be generated for the IC design based in part on the clock tree.

Abstract: A method including receiving a first configuration of a device validated against a design constraint, is provided. A configuration includes stimuli controls and stimuli parameters used as inputs in a device model. The method includes determining a quality of the first configuration based on an estimation of an output parameter including a desired behavior of the device, simulating the device in the first configuration when the first configuration quality overcomes a threshold, and requesting a second configuration of the device when the quality of the first configuration is below the selected threshold. The method also includes obtaining a regression based on multiple, high quality configurations to determine, for the device, a distribution of output parameter values and comparing the distribution of output parameter values with a baseline of a random regression to adjust the machine learning engine according to a target range of output parameter values.