Patents Assigned to Capres
  • Publication number: 20040056674
    Abstract: An object of the present invention is to provide a novel testing probe allowing the testing of electronic circuits of a smaller dimension as compared to the prior art testing technique.
    Type: Application
    Filed: September 30, 2003
    Publication date: March 25, 2004
    Applicant: Capres APS
    Inventors: Christian Leth Petersen, Francois Grey, Peter Boggild