Patents Assigned to Carl Zeiss Microscopy GmbH
  • Publication number: 20200201010
    Abstract: A microscope system having a plurality of microscope modules connected to one another for data transfer purposes. The microscope system includes a central clock generator, the clock signal of which is provided to all microscope modules. The microscope modules are configured to use the clock signal or a clock derived therefrom as an internal clock. Moreover, a corresponding method for operating such a microscope system is described.
    Type: Application
    Filed: April 30, 2018
    Publication date: June 25, 2020
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Mirko LIEDTKE, Andreas KÜHM, Burkhard ROSCHER, Nico PRESSER
  • Patent number: 10684221
    Abstract: With the method of the invention a wavelength-dependent refractive index of a specimen medium, which is examined with a light microscope, is determined. With the light microscope, a specimen measurement at the specimen medium which has an unknown refractive index is performed, wherein illumination light is radiated to the specimen medium and detection light coming from the specimen medium is measured. With the specimen measurement, a specimen measurement focus position of the illumination and/or detection light is measured. Using a mathematical model, in which a focus position of illumination and/or detection light is defined in dependence of a refractive index of a medium, the refractive index of the specimen medium is derived from the specimen measurement focus position. Furthermore, a light microscope for carrying out the method is described.
    Type: Grant
    Filed: October 11, 2016
    Date of Patent: June 16, 2020
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Annette Bergter, Helmut Lippert
  • Publication number: 20200183136
    Abstract: A method for the microscopy scanning of a specimen. An immersion medium is used between a slide and a microscope objective, said immersion medium wetting a surface of the slide, and the microscope objective being relatively displaced over the surface of the slide for imaging. The surface is provided with a coating which repels the immersion medium.
    Type: Application
    Filed: August 8, 2018
    Publication date: June 11, 2020
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Thomas OHRT, Michael GOEGLER, Thorsten KUES
  • Publication number: 20200183139
    Abstract: An optical assembly for scanning excitation radiation and/or manipulation radiation in a laser scanning microscope. The assembly an optical scanning unit as a first focusing device for providing a first pupil plane, a first beam deflecting device, which is made of a first scanner arranged in the first pupil plane, for scanning the excitation radiation and/or manipulation radiation in a first coordinate direction, and a second focusing device for generating a second pupil plane, which is optically conjugated to the first pupil plane. A second beam deflecting device is provided for deflecting the excitation radiation and/or manipulation radiation, said second deflecting device being arranged in the second pupil plane. A third focusing device is provided in order to generate a third pupil plane, optically conjugated to the first pupil plane.
    Type: Application
    Filed: August 23, 2018
    Publication date: June 11, 2020
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Tiemo ANHUT, Matthias WALD, Daniel SCHWEDT, Beate BÖHME
  • Patent number: 10670387
    Abstract: To determine a position of an object (100) parallel to the optical axis (120) of an optical device (1), the object (100) is illumined from a first illumination direction (210-1) and from a second illumination direction (210-2) and an image (230-1, 230-2) is acquired in each case. The position of the object (100) is determined based on a distance (250) between imaging locations of the object (220-1, 220-2) in the images (230-1, 230-2).
    Type: Grant
    Filed: July 10, 2015
    Date of Patent: June 2, 2020
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Lars Stoppe, Christoph Husemann, Markus Sticker
  • Patent number: 10665423
    Abstract: An analysis device, possibly having an electrostatic and/or magnetic lens, analyzes the energy of charged particles and has an opposing field grid device to which a voltage is applied in such a way that a portion of the charged particles is reflected by the opposing field grid device. Another portion of the charged particles passes through the opposing field grid device and is detected by a detector. The opposing field grid device has a curvature. A center of curvature is an intersection point of an optical axis with the opposing field grid device. The curvature has a radius of curvature which is given by the section between the center of curvature and a starting point on the optical axis. The opposing field grid device is curved in the direction of the starting point as viewed from the center of curvature and/or is arranged to be displaceable along the optical axis.
    Type: Grant
    Filed: June 15, 2016
    Date of Patent: May 26, 2020
    Assignee: Carl Zeiss Microscopy GmbH
    Inventor: Dirk Preikszas
  • Patent number: 10663749
    Abstract: An optical assembly that is designed for positioning in a beam path of a light microscope having means for providing structured illuminating light in a sample plane of the light microscope, so that structured illuminating light can be generated in different orientations. The optical assembly has an adjustable deflector in order to deflect an incident light bundle onto one of several beam paths in a selectable manner. Beam splitting devices are located in the beam paths in order to split the light bundle of the respective beam paths into partial light bundles, which are spatially separated from each other. Beam guides are provided for each of the partial light bundles, and guide the partial light bundles to a pupil plane. The beam guides are arranged in such a way that the partial light bundles that belong to the same beam path form a light spot pattern in the pupil plane; and that the light spot patterns of different beam paths in the pupil plane are different from each other.
    Type: Grant
    Filed: October 9, 2013
    Date of Patent: May 26, 2020
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Daniel Schwedt, Tiemo Anhut, Ralf Netz
  • Publication number: 20200162696
    Abstract: A microscope system includes a microscope with at least one microscope sensor. Each microscope sensor has a measurement device for recording sample signals; an analog-to-digital converter for converting recorded sample signals to digital data; a data compression device which produces a compressed data stream from the digital data; and a data output interface, which outputs the compressed data stream and a raw data stream that comprises digital data that were not compressed. The microscope system additionally includes a user computer to which the compressed data stream is transmitted and also a data memory to which the raw data stream is transmitted. The user computer calculates real-time images from the compressed data stream and reads and processes the raw data stream from the data memory for subsequent data analysis. In addition, a method for operating such a microscope system is described.
    Type: Application
    Filed: March 29, 2018
    Publication date: May 21, 2020
    Applicant: CARL ZEISS MICROSCOPY GMBH
    Inventors: Andreas KÜHM, Nico PRESSER
  • Patent number: 10658152
    Abstract: A method for controlling a particle beam device for imaging, analyzing and/or processing an object, and a particle beam device for carrying out the method. The particle beam device may be an electron beam device and/or or an ion beam device. The method may include identifying at least one control parameter of a unit of the particle beam device using an eye tracker by tracking at least one eye of a user of the particle beam device, and changing the at least one control parameter of the unit of the particle beam device.
    Type: Grant
    Filed: October 4, 2018
    Date of Patent: May 19, 2020
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Christian Hendrich, Josef Biberger
  • Publication number: 20200150043
    Abstract: Accelerated methods and apparatuses for three-dimensional microscopy with structured illumination, in which focal planes of the sample are focused and each focal plane is illuminated in a plurality of phases sequentially with structured illumination light and the sample light emitted by the sample is recorded in a respective individual image. A resulting image having a resolution that is increased with respect to the individual images is reconstructed from the individual images to produce a super-resolved image stack. By reconstructing a resulting image from individual images of two different focal planes by approximation methods, said resulting image represents a sample plane that is situated between said focal planes, an image stack can be produced in a shorter period with less stress on the sample.
    Type: Application
    Filed: November 7, 2019
    Publication date: May 14, 2020
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Ingo KLEPPE, Yauheni NOVIKAU
  • Patent number: 10649194
    Abstract: An arrangement and method for supplying immersion media and a method for setting optical parameters of a medium, includes a media supply unit for the controlled supply of a medium or of a mixture into a contact region between an optical lens and a specimen slide, on which a specimen may be arranged. An image capture unit is provided for capturing image data on the basis of detection radiation from the object space along a detection beam path extending through the contact region. An evaluation unit is provided to establish current image parameters on the basis of captured image data, to compare said current image parameters to intended image parameters and to establish a desired mixing ratio of at least two components of the medium depending on the comparison.
    Type: Grant
    Filed: September 26, 2018
    Date of Patent: May 12, 2020
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Thomas Kalkbrenner, Sebastian Borck, Jörg Siebenmorgen
  • Patent number: 10649188
    Abstract: In a high-resolution spectrally selective scanning microscopy of a sample, the sample is excited with illumination radiation in order to emit fluorescence radiation such that the illumination radiation is bundled into an illumination spot in or on the sample. The illumination spot is diffraction-limited in at least one spatial direction and has a minimum extension in said spatial direction. Fluorescence radiation emitted from the illumination spot is imaged into a diffraction image lying on an image plane in a diffraction-limited manner and is detected with a spatial resolution which resolves a structure of a diffraction image of the fluorescence radiation emitted from the illumination spot. The illumination spot is moved into different scanning positions. An individual image is generated for each scanning position, in a diffraction-limited manner onto a detector.
    Type: Grant
    Filed: July 19, 2016
    Date of Patent: May 12, 2020
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Ingo Kleppe, Ralf Wolleschensky, Ralf Netz, Yauheni Novikau
  • Publication number: 20200144024
    Abstract: The invention relates to a method for setting a position of a component (1003) in a particle beam apparatus, and to a particle beam apparatus for carrying out the method, wherein the component (1003) is embodied as a gas feed device, as a particle detector and/or as a beam detector, and wherein the method comprises the following steps: aligning the component (1003) with a coincidence point (2000) of a particle beam of the particle beam apparatus, determining a rotation angle (a) of a rotation of an object carrier about a rotation axis (603), loading a position of the component (1003) associated with the rotation angle (a) from a database into a control unit, transmitting a control signal from the control unit to a drive unit for moving the component (1003), and moving the component (1003) into the position loaded from the database by means of the drive unit, wherein the component (1003) arranged in the loaded position is at a predefinable distance (OAB) from the object.
    Type: Application
    Filed: September 30, 2019
    Publication date: May 7, 2020
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Andreas Schmaunz, Gero Walter, Bernd Stenke
  • Patent number: 10642015
    Abstract: A light sheet microscope which includes an illumination apparatus generating coherent illumination light for several illumination wavelengths, a beam-shaping module generating a light sheet from illumination light, an illumination objective illuminating a specimen with the light sheet and a detection objective for imaging light which is emitted by the specimen onto a laminar detector, wherein the optical axes of the detection objective and of the illumination objective are not parallel to each other. In such a light sheet microscope, the beam-shaping module includes a phase-selective element with several selection areas separated from each other spatially, wherein in each case one selection area is assigned to one specific illumination wavelength, and wherein a phase distribution predefined for the respective illumination wavelength is impressed on each selection area.
    Type: Grant
    Filed: March 11, 2016
    Date of Patent: May 5, 2020
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Helmut Lippert, Tobias Kaufhold, Thomas Kalkbrenner, Joerg Siebenmorgen
  • Patent number: 10645247
    Abstract: A microscope for raster-free, confocal imaging of a sample arranged in a sample space has an illumination arrangement comprising a light source group having light sources which can be switched on individually, a detector arrangement, a pinhole arrangement which comprises a pinhole array and which has a plurality of pinhole elements which are adjacent to one another, wherein there is one pinhole element provided for each light source, and optics which irradiate each pinhole element with radiation of an individual light source of the light source group and confocally illuminate an individual spot located in the sample space, wherein one of the individual spots is associated with each pinhole element, and the individual spots are adjacent to one another in the sample space with respect to an incidence direction of the radiation, and the optics image the individual spots through the pinhole arrangement confocally on the detector arrangement.
    Type: Grant
    Filed: May 28, 2018
    Date of Patent: May 5, 2020
    Assignee: Carl Zeiss Microscopy GmbH
    Inventor: Thomas Kalkbrenner
  • Patent number: 10634888
    Abstract: The invention relates to a light microscope for examining microscopic objects with high throughput. The microscope comprises a light source for illuminating a measuring zone, a sample vessel, in which the microscopic objects can be successively moved into the measuring zone, and a detection device for measuring detection light, which originates from a microscopic object located in the measuring zone. According to the invention, the microscope is characterized in that the imaging means comprise a detection lens having a stationary front optics and movable focusing optics, wherein the focusing optics is arranged behind the front optics and in front of an intermediate image plane, and can be adjusted for the height adjustment of a detection plane. The invention further relates to a corresponding microscopy method.
    Type: Grant
    Filed: August 28, 2019
    Date of Patent: April 28, 2020
    Assignees: Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e. V., Carl Zeiss Microscopy GmbH
    Inventors: Helmut Lippert, Jörg Siebenmorgen, Jan Huisken, Florian Fahrbach
  • Patent number: 10629404
    Abstract: A method of adjusting a particle beam microscope includes measures A, B, C and D.
    Type: Grant
    Filed: November 13, 2018
    Date of Patent: April 21, 2020
    Assignee: Carl Zeiss Microscopy GmbH
    Inventor: Dirk Preikszas
  • Publication number: 20200116987
    Abstract: In high-resolution scanning microscopy, a sample is excited by illumination radiation to emit fluorescence radiation in such a way that the illumination radiation is focused at a point in or on the sample to form a diffraction-limited illumination spot. The point is imaged in a diffraction-limited manner into a diffraction image on a spatially resolving surface detector, wherein the surface detector has a spatial resolution that resolves a structure of the diffraction image. The sample is scanned by means of different scanning positions with an increment of less than half the diameter of the illumination spot. An image of the sample is generated from the data of the surface detector and from the scanning positions assigned to said data, said image having a resolution that is increased beyond a resolution limit for imaging.
    Type: Application
    Filed: June 21, 2018
    Publication date: April 16, 2020
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Ingo KLEPPE, Ralf NETZ
  • Patent number: 10620417
    Abstract: The invention relates to a reflection-reduced contrast imaging method and to a device for generating a reflection-reduced contrast image, preferably from microscopic images, in particular in order to read height progression information of a condition of an object.
    Type: Grant
    Filed: April 27, 2016
    Date of Patent: April 14, 2020
    Assignee: Carl Zeiss Microscopy GMBH
    Inventors: Lars Stoppe, Thomas Milde, Johannes Winterot, Christoph Husemann
  • Patent number: 10620419
    Abstract: An arrangement for light sheet microscopy including: a sample vessel, for receiving a medium containing sample, having a covering and being oriented with respect to a planar reference surface; illumination optics with an illumination objective for illuminating the sample with a light sheet; and detection optics with a detection objective. The optical axis of the illumination objective and the light sheet lies in a plane that forms a nonzero illumination angle with the normal of the reference surface. The optical axis of the detection objective forms a nonzero detection angle with the normal of the reference surface. A bulge is formed at the covering for receiving the sample. The bulge has inner and outer interfaces. The optical axes of the illumination objective and detection objective form a minimal angle with the normals of the interfaces at least in the region where the optical axes pass through the interfaces.
    Type: Grant
    Filed: July 8, 2014
    Date of Patent: April 14, 2020
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Jörg Siebenmorgen, Thomas Kalkbrenner, Helmut Lippert