Abstract: The invention relates to a particle beam device (100) for imaging, analyzing and/or processing an object (114).

Abstract: A material processing system includes a particle beam column for directing a particle beam at a first processing region and a laser scanner for directing a laser beam at a second processing region. A method for operating the material processing system includes: scanning a first mark placed on an object with the particle beam; scanning the first mark with the laser beam for a first time and producing a second mark on the object with the laser beam; scanning the second mark with the particle beam; and scanning the first mark with the laser beam for a second time and removing material of the object with the laser beam based on the scanning of the second mark with the particle beam.

Abstract: A gas reservoir that receives a precursor has a gas-receiving unit which is arranged in a first receiving unit of a basic body and a sliding unit which is arranged movably in a second receiving unit of the basic body. The gas-receiving unit has a movable closure unit for opening or closing a gas outlet opening of the gas-receiving unit. In a first position of the sliding unit, a first opening of a sliding-unit line device is fluidically connected to a first basic body opening and a second opening of the sliding-unit line device is fluidically connected to a second basic body opening. In the second position of the sliding unit, the first opening is arranged at an inner wall of the second receiving unit and the second opening is arranged at the movable closure unit.

Abstract: An image is broken down into multiple tiles pairs of the tiles include an overlap region. The tiles can be processed by a instance segmentation algorithm. Techniques of overlap handling of multiple instance boundaries at least partly arranged in the overlap region are disclosed.

Abstract: Corrected images are produced with an apparatus that includes a detector and a control unit. In a first operating mode, a plurality of image tiles of an object are captured as a plurality of image pixels. The control unit generates commands to capture each image, such that it partially overlaps with at least one other image tile in an image tile overlap region having a minimum size. Each captured image tile and/or a resultant image is combined pixel-wise by calculation in a brightness correction image. In a second operating mode, the brightness correction image is produced by capturing a plurality of correction image tiles of the object as a plurality of image pixels, and control commands are generated, so the object is moved relative to a detection beam path and a size of a correction image overlap region is greater than the minimum size of the image tile overlap region.

Abstract: A sample chamber encloses a sample space for positioning a sample and includes a wall that delimits the sample space and has an outer side facing away from the sample space. An illumination beam path is directed through the outer side into the sample space. Detection radiation is detected along a detection axis extending from the sample chamber through the wall of the sample chamber. The sample chamber has an outer surface with a shape of a spherical section with a circular disc as the base surface. The sample chamber and the detection axis are rotated and/or pivoted relative to one another about the center point of the circular disc so that different angular positions of the sample chamber relative to the detection axis are adjusted and image data is recorded at different angular positions of the sample chamber relative to the detection axis.

Abstract: A prediction algorithm determines synthetic fluorescence images on the basis of measurement images. A validation of the synthetic fluorescence images can be effected on the basis of reference images which are captured after the measurement images or are captured for a separate sample. Alternatively or additionally, a training of the prediction algorithm can be effected on the basis of training images which are captured after the measurement images or are captured for a separate sample.

Abstract: Various examples relate to determining a number and/or a confluency of cells in a microscopy image. To that end, the microscopy image is firstly rescaled and then processed.

Abstract: A method for generating an image of a sample includes radiating a first grid-shaped light sheet of a first wavelength range onto the sample in such a way that the sample is inhomogeneously illuminated by the first light sheet, capturing the light emitted by the sample due to the radiating of the first light sheet of the first wavelength range onto the sample; and reconstructing first areas of the sample, which are not illuminated or are more weakly illuminated using the first light sheet of the first wavelength range, on the basis of the captured light of the second areas of the sample, which are more strongly illuminated using the light sheet of the first wavelength range, by means of a machine learning system.

Abstract: An apparatus and method for structured illumination microscopy, having an illumination beam path for irradiating a sample with excitation light with a two-dimensional illumination pattern at angles greater than the angle for total internal reflection. The illumination beam path has an illumination objective used to irradiate the sample. A first separation device for separating the excitation light in a first linear coordinate direction in a pupil plane and a displacement device for laterally displacing the illumination pattern in a sample plane, having a detection beam path containing at least one microscope objective for guiding emission light to a camera. The emission light is emitted by the sample as a consequence of the irradiation by the excitation light. A camera for recording images of the sample, has a control unit for calculating microscopic images of the sample using partial images of the sample recorded for different positions of the illumination pattern in the sample plane.

Abstract: Provision is made for a method of monitoring an immersion fluid in a microscope having a lens which images a sample located on a sample carrier. In a step a), a camera is positioned which has an image field which is oriented in such a way that it captures the sample carrier and a space between the sample carrier and the lens and adjoining the sample carrier towards the lens, which space is used to receive the immersion fluid. In a step b), the immersion fluid is applied into the space between the sample carrier and the lens. In step c), an image with the immersion fluid being in the space between the sample carrier and the lens is recorded, and in a step d), the position, the area and/or the contour of the immersion fluid on the sample carrier from the image recorded in step d) are/is determined.

Abstract: A method is useful for scanning partial regions of a sample by a scanning microscope, such as a laser scanning microscope or a scanning electron microscope, and for reconstructing an overall image of the sample from data of the scanned partial regions of the sample. The method includes: 1) determining partial regions of the sample, which are scanned by the scanning microscope, by a machine learning system which is trained by supervised learning, unsupervised learning, and/or reinforcement learning for improved determination of the partial regions of the sample which are scanned by the scanning microscope; 2) scanning the determined partial regions of the sample by the scanning microscope; and 3) reconstructing the overall image of the sample from the data of the scanned partial regions of the sample, wherein non-scanned partial regions of the sample are estimated by the data of the scanned partial regions of the sample.

Abstract: The invention relates to a device for incorporation into a microscope comprising a stator for connecting to a static component of a microscope and a rotor arranged rotatably relative to the stator. The rotor has mounting locations for receiving microscope components. An electrical rotary feedthrough is present comprising a first part, which is connected to the stator, and a second part, which is connected to the rotor. At least one electrical connection is formed via the electrical rotary feedthrough between the stator and the rotor and an electrical connection is formed on the rotor from the second part of the rotary feedthrough to at least one of the mounting locations for the purpose of electrically contacting a microscope component. The invention also relates to a microscope and a method for contacting microscope components on a rotor of a microscope.

Abstract: In a computer-implemented method for modifying microscope images, a generative model is trained using a training dataset which comprises a plurality of microscope images. After the training, the generative model is configured to compute a generated microscope image from a feature vector derived from a feature space. It is established which image properties are affected by which feature variables in the feature space. A microscope image to be modified is received and projected into the feature space in order to obtain an associated feature vector. One or more feature variables of the feature vector are modified in order to change one or more image properties, whereby a modified feature vector is generated. The modified feature vector is projected back into an image space by inputting the modified feature vector into the generative model, thereby generating a modified microscope image.

Abstract: An optical element comprises a planoconvex basic shape along an optical axis of the optical element; a third portion arranged between a first portion and a second portion. The first portion includes a plane side face for facing an object to be imaged. The second portion includes a convexly shaped side face for facing an image plane. The plane side face of the first portion is designed to collect and steer a radiation to be captured into the optical element, the optical element being designed to guide rays of the captured radiation in a beam path. The first, the second and the third portions are arranged directly adjacent to one another. A refractive index of the third portion is greater than a refractive index of the second portion, and the refractive index of the second portion is greater than a refractive index of the first portion.

Abstract: A light microscope has a light source for illuminating a specimen, a sensor array comprised of photon-counting detector elements for measuring detection light coming from the specimen, and a control device for controlling the sensor array. The control device is configured for flexibly binning the photon-counting detector elements into one or more super-pixels.

Abstract: A method prepares a microsample from a volume sample using multiple particle beams. The method includes providing a volume sample in the microscope system, wherein the interior of the volume sample has a sample region of interest, and producing a macrolamella comprising the sample region of interest by removing sample material of the volume sample using one of the particle beams. The method also includes orienting the macrolamella relative to one of the particle beams, and removing sample material of the macrolamella via a beam so that the region of interest is exposed.

Abstract: A sample holder system for holding a microscopic sample in a microscope system comprises a first and a second rotation element, which are rotatably connected to one another. The side surfaces of the two rotation elements in each case enclose an angle ?, with the result that the rotation elements have a wedge-shaped cross section. The second rotation element is configured to receive a sample, while the first rotation element can be rotatably connected to a holder receiving surface. The rotation elements are each rotatable by an angle ? about a rotation axis. The inclination of the third side surface on which the sample can be received is settable by combining all of the involved angles ? and ?.