Patents Assigned to Carl Zeiss Microscopy GmbH
  • Publication number: 20240086364
    Abstract: The application relates to a computer-implemented method for providing data to a client. The method comprises monitoring read access operations on a file by the client. The file is provided as a network data stream by a network node. The client is configured to receive files only via a searchable file-based data stream. The method further comprises transmitting a network data stream containing the file to the client, the network data stream not being searchable, and translating the network data stream into a searchable file-based data stream on the basis of the read access operations.
    Type: Application
    Filed: August 25, 2023
    Publication date: March 14, 2024
    Applicant: Carl Zeiss Microscopy GmbH
    Inventor: Christian Andritzky
  • Patent number: 11921274
    Abstract: Detecting emission light, in a laser scanning microscope, wherein the emission light emanating from a sample is guided onto a two-dimensional matrix sensor having a plurality of pixels and being located on an image plane, and a detection point distribution function is detected by the matrix sensor in a spatially oversam pled manner. The emission light emanating from the sample is spectrally separated in a dispersion device; the spectrally separated emission light is detected by the matrix sensor in a spectrally resolved manner; and during the analysis of the intensities measured by the pixels of a pixel region, the spectral separation is cancelled at least for some of said pixels. Additional aspects relate to a detection device for the spectrally resolved detection of emission light in a laser scanning microscope and to a laser scanning microscope.
    Type: Grant
    Filed: July 29, 2021
    Date of Patent: March 5, 2024
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Daniel Schwedt, Tiemo Anhut, Peter Schacht
  • Patent number: 11915907
    Abstract: A method for operating a particle beam microscopy system includes recording a first particle-microscopic image at a given first focus and varying the excitations of the first deflection device within a given first range. The method also includes changing the focus to a second focus, and determining a second range of excitations of the first deflection device on the basis of the first range, the first excitation, the second excitation and a machine parameter determined in advance. The method further includes recording a second particle-microscopic image at the second focus and varying the excitations of the first deflection device within the determined second range. The second range of excitations is determined so that a region of the object represented in the second particle-microscopic image was also represented in the first particle-microscopic image.
    Type: Grant
    Filed: February 1, 2022
    Date of Patent: February 27, 2024
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Dirk Preikszas, Simon Diemer
  • Publication number: 20240060898
    Abstract: A method can be used for correcting background signals in captured measurement values of analog detectors, wherein measurement values of an object captured over a reference time period are analyzed and characteristic values of captured background signals are determined. What is characteristic of this is that a threshold value is determined on the basis of at least one characteristic value and by applying a calculation specification; the threshold value is applied to captured measurement values of an analog detector, and only those measurement values which are greater than the threshold value are used for a subsequent signal evaluation. A microscope for carrying out the method according to the invention is also provided.
    Type: Application
    Filed: August 18, 2023
    Publication date: February 22, 2024
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Stanislav Kalinin, Dieter Huhse
  • Publication number: 20240061227
    Abstract: A microscopy method involves directing a focused beam of excitation radiation at an examination location of an object to be examined, to create an excitation volume in the object. An overview image is used to identify at least one structure of the object and define at least one of the identified structures as a reference structure. A spatial relationship is defined between the positions of the examination location and the reference structure. Detection radiation coming from the excitation volume is acquired as measurement values over an overall measurement duration, the overall measurement duration being subdivided into a plurality of measurement intervals. At least every second measurement interval is preceded by a comparison of the current position of the focused beam with a current position of the examination location. The positioning of the focused beam is corrected in the case of an inadmissible deviation of the current positions.
    Type: Application
    Filed: August 18, 2023
    Publication date: February 22, 2024
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Dieter Huhse, Stanislav Kalinin
  • Publication number: 20240060894
    Abstract: The invention relates to an FCS method in which a sample that is to be measured and has fluorescent markers is illuminated with excitation radiation over a bleaching time in order to bleach selected fluorescent markers; and after bleaching has been carried out over at least one measurement period, FCS measurement data of the sample are acquired by illuminating the sample with excitation radiation and by detecting detection radiation brought about by the excitation radiation. The invention is characterized in that during the bleaching time, intensity values of fluorescence radiation that has been brought about by the excitation radiation which is directed at the sample for bleaching purposes are continuously or repeatedly acquired and compared with a threshold value, and the acquisition of the FCS measurement data is started when the threshold value has been reached.
    Type: Application
    Filed: August 14, 2023
    Publication date: February 22, 2024
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Dieter Huhse, Stanislav Kalinin
  • Patent number: 11900573
    Abstract: The invention relates to a method and device for generating an overview contrast image of a sample carrier in a microscope, which images a sample arranged on the sample carrier. The sample carrier on which the sample is located is illuminated in transmitted light from a two-dimensional illumination array, which has individually switchable single light sources and illuminates the sample volume in transmitted light, and a processing unit, which activates and reads out the camera in order to record multiple different raw overview images of the sample carrier.
    Type: Grant
    Filed: July 26, 2021
    Date of Patent: February 13, 2024
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Manuel Amthor, Daniel Haase
  • Patent number: 11892618
    Abstract: A light beam shaping arrangement for a light microscope has a first and a second liquid crystal region or lifting micromirror region, each of which has a plurality of independently switchable liquid crystal elements or mirrors with which a phase of incident light is changeable in a settable manner, an input-/output-coupling polarization beam splitter, a polarization beam splitter arranged between the input-/output-coupling polarization beam splitter and the liquid crystal regions or lifting micromirror regions such that the polarization beam splitter separates the light coming from the input-/output-coupling polarization beam splitter in a polarization-dependent manner into a first partial beam.
    Type: Grant
    Filed: April 11, 2019
    Date of Patent: February 6, 2024
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Jörg Siebenmorgen, Ingo Kleppe, Ralf Netz
  • Publication number: 20240038489
    Abstract: The invention relates to a method for fastening an object to a manipulator in a particle beam apparatus and for moving the object in the particle beam apparatus. The invention further relates to a computer program product and a particle beam apparatus, which are provided to carry out the method according to the invention. The method according to the invention includes the following steps: generating a first surface on the manipulator using a particle beam of the particle beam apparatus; generating a second surface on the object using the particle beam, in such a way that the second surface corresponds to the first surface; arranging the first surface at the second surface such that the manipulator is arranged at the object; fastening the object to the manipulator in a boundary region between the first surface and the second surface using the particle beam; and moving the object fastened to the manipulator using the manipulator and/or a mobile object stage, on which the object is arranged.
    Type: Application
    Filed: July 27, 2023
    Publication date: February 1, 2024
    Applicant: Carl Zeiss Microscopy GmbH
    Inventor: Endre Majorovits
  • Publication number: 20240038481
    Abstract: Imaging, processing and/or analyzing an object using a particle beam device includes guiding a first particle beam over the object, processing the object using the first particle beam or detecting first interaction particles and/or a first interaction radiation, where the first interaction particles and/or the first interaction radiation results/result from an interaction of the first particle beam with the object, controlling a second deflection device for guiding the second particle beam over the object even while the first particle beam is being guided over the object, and deflecting the first particle beam from the object. Only when the first particle beam has been deflected, the object is processed using the second particle beam or detecting second interaction particles and/or a second interaction radiation that results/result from an interaction of the second particle beam with the object.
    Type: Application
    Filed: June 1, 2023
    Publication date: February 1, 2024
    Applicant: Carl Zeiss Microscopy GmbH
    Inventor: Josef Biberger
  • Publication number: 20240038484
    Abstract: Fastening an object to a movable manipulator and/or an object holder in a particle beam apparatus and moving the object in the particle beam apparatus includes fastening a material unit, configured to hold an object, to the manipulator using a particle beam, fastening the object to the material unit using the particle beam, and, using the manipulator and/or an object stage, moving the object fastened to the material unit. A computer program product has program code which can be loaded into a processor and which, when executed, controls a particle beam apparatus to fasten a material unit, configured to hold an object, to the manipulator using a particle beam, fasten the object to the material unit using the particle beam, and, using the manipulator and/or an object stage, move the object fastened to the material unit.
    Type: Application
    Filed: July 27, 2023
    Publication date: February 1, 2024
    Applicant: Carl Zeiss Microscopy GmbH
    Inventor: Andreas Schertel
  • Patent number: 11880026
    Abstract: A microscope, which includes a color splitter that is reflective to excitation radiation, can switch between a first and a second operating mode. A first apparatus can introduce a first cylindrical optical element into the excitation beam path between a light source and the color splitter, when the microscope is in the first operating mode, and a second apparatus can introduce a second cylindrical optical element into the excitation beam path between the color splitter and a scanning apparatus.
    Type: Grant
    Filed: November 1, 2021
    Date of Patent: January 23, 2024
    Assignee: CARL ZEISS MICROSCOPY GMBH
    Inventors: Tiemo Anhut, Daniel Schwedt, Matthias Wald, Thomas Mehner
  • Patent number: 11860353
    Abstract: Disclosed is a changing device for optical components in a microscope. The changing device includes an optical component having a flat surface. The changing device further includes a carrier for inserting and/or holding the optical component. The changing device further includes a receptacle for holding the carrier in an optical path of the microscope. The carrier has bearing surfaces for the flat surface of the optical component and positioning surfaces located in the same plane, which are not covered by the optical component, when inserting the latter. The receptacle has bearing surfaces for contact with the positioning surfaces and first attachment means for attaching the carrier positioned on the receptacle in order for the positioning surfaces to act upon the bearing surfaces.
    Type: Grant
    Filed: June 3, 2021
    Date of Patent: January 2, 2024
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Daniel Stegmann, Peter Schnuell, Michael Fritzsche, Peter Linke
  • Patent number: 11862428
    Abstract: Processing an object using a material processing device with a particle beam apparatus includes determining a region of interest of the object on or in a first material region of the object, ablating material from a second material region adjoining the first material region using an ablation device, and recognizing a geometric shape of the first material region. The geometric shape has a center. Processing the object also includes ablating material from a second portion of the first material region adjoining a first portion using a particle beam, the first portion having a first subregion and a second subregion, the region of interest being arranged in the first subregion, recognizing a further geometric shape of the first material region, positioning the object such that the first position corresponds to a center of the further geometric shape, and ablating material from the second subregion using the particle beam.
    Type: Grant
    Filed: April 27, 2022
    Date of Patent: January 2, 2024
    Assignee: Carl Zeiss Microscopy GmbH
    Inventor: Fabian Perez Willard
  • Publication number: 20230420224
    Abstract: Operating a gas feed device for a particle beam apparatus includes predetermining a flow rate of a precursor through an outlet of a precursor reservoir containing the precursor to be fed onto an object, loading a temperature of the precursor reservoir, the temperature being associated with the predetermined flow rate, from a database into a control unit, setting a temperature of the precursor reservoir to the temperature loaded from the database using a temperature setting unit, and determining at least one functional parameter of the precursor reservoir depending on the flow rate and the temperature, loaded from the database, using the control unit and informing a user of the gas feed device about the determined functional parameter. Informing the user of the gas feed device about the functional parameter may include displaying the functional parameter on a display unit, outputting an optical signal, or outputting an acoustic signal.
    Type: Application
    Filed: August 7, 2023
    Publication date: December 28, 2023
    Applicant: Carl Zeiss Microscopy GmbH
    Inventor: Andreas Schmaunz
  • Patent number: 11852797
    Abstract: System for state monitoring of a microscope the system having at least one measuring sensor in each case for capturing at least one time-variable chemical and/or physical quantity, a camera for recording an image in a field of view and a processing unit. The at least one measuring sensor has a display area and displays thereon a measured value for the captured time-variable chemical and/or physical quantity. The camera is arranged so that the display areas of at least one measuring sensor are located in the field of view and the processing unit is configured to evaluate the image and to extract the display areas contained in the image therefrom. Also, a method for state monitoring of a microscope is disclosed, wherein at least one measuring sensor with a display area is provided in order to capture in each case at least one time-variable chemical and/or physical quantity, and an image is recorded. The image is recorded so that it contains the display areas of at least one measuring sensor.
    Type: Grant
    Filed: June 23, 2021
    Date of Patent: December 26, 2023
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Thomas Ohrt, Daniel Haase
  • Patent number: 11841490
    Abstract: An arrangement for light sheet microscopy contains an illumination objective for illuminating a sample located on a slide in a medium with a light sheet, a detection objective, a separation layer system, a first adaptive optical detection correction element, and a further adaptive optical detection correction element and/or a first adaptive optical illumination correction element, and optionally, a further adaptive optical illumination correction element. The arrangement contains an adjustment device for the controlled movement of the first detection correction element and of the further detection correction element and/or of the first illumination correction element and of the further illumination correction element; and a control unit, to generate control commands and to actuate the adjustment devices by means of the control commands such that aberrations are reduced. Corresponding objectives and a corresponding method for reducing aberrations can be used.
    Type: Grant
    Filed: September 1, 2021
    Date of Patent: December 12, 2023
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Marco Pretorius, Lars-Christian Wittig
  • Patent number: 11837434
    Abstract: A method for setting position of a component of a particle beam apparatus may be performed, for example, by the particle beam apparatus. The component may be embodied as a gas feed device, as a particle detector and/or as a beam detector. The method may include: aligning the component with a coincidence point of a particle beam of the particle beam apparatus, determining a rotation angle of a rotation of an object carrier about a rotation axis, loading a position of the component associated with the rotation angle from a database into a control unit, transmitting a control signal from the control unit to a drive unit for moving the component, and moving the component into the position loaded from the database by means of the drive unit, wherein the component arranged in the loaded position is at a pre-definable distance from the object.
    Type: Grant
    Filed: September 30, 2019
    Date of Patent: December 5, 2023
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Andreas Schmaunz, Gero Walter, Bernd Stenke
  • Publication number: 20230384575
    Abstract: A distance measuring device in microscopy contains a sample stage for arranging a sample carrier in a sample plane, and at least one, preferably at least two illumination sources for providing measurement radiation, which is reflected at least proportionally at a surface of the sample carrier. The device also contains a detection optical unit for capturing an overview image and occurring reflections at the sample carrier present in the sample plane; a detector disposed downstream of the detection optical unit and serving for the spatially resolved capture of image data of the sample carrier and of occurring reflections; and an evaluation device for ascertaining at least a distance of the surface at at least one location of the sample carrier. The illumination sources emit the measurement radiation in each case at a divergent emission angle. A corresponding method can be used for ascertaining a spatial orientation of a sample carrier.
    Type: Application
    Filed: May 30, 2023
    Publication date: November 30, 2023
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Christian Dietrich, Jakob Haarstrich
  • Patent number: 11829444
    Abstract: A microscopy system comprises a microscope which can record at least one microscope image and a computing device which comprises a trained image processing model set up to calculate an image processing result based on the at least one microscope image. A method for verifying a trained image processing model, which can be performed by the computing device, can include receiving a validation image and an associated target image; entering the validation image into the trained image processing model, which calculates an output image therefrom; entering image data based on at least the output image and the associated target image into a trained verification model which is trained to calculate an evaluation that indicates a quality that depends on the image data for entered image data; and calculating an evaluation by the trained verification model based on the entered image data.
    Type: Grant
    Filed: October 5, 2021
    Date of Patent: November 28, 2023
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Manuel Amthor, Daniel Haase