Abstract: Various examples of the disclosure relate to aspects associated with training a machine-learned algorithm configured to count cells in a microscopy image or to determine a degree of confluence of the cells.

Abstract: Various examples of the disclosure relate to techniques to count cells in a microscopy image and/or to determine a degree of confluence of the cells in the microscopy image. To that end, machine-learned algorithms are used.

Abstract: Two types of operational parameters are used in a particle beam microscope. First parameters influence the image quality, and have settings that are alterable by a user in view of obtaining a better image quality. Second parameters characterize the mode of operation, and the image quality becomes poorer when these change. A mode of operation of the particle beam microscope includes: registering of settings of the first parameters and the second parameters, which the user undertakes in a period of time; analysing a plurality of recorded settings of the first parameters and of the second parameters; determining settings of the first parameters which are advantageous in view of the image quality on the basis of the current settings of the second parameters; and setting the determined advantageous settings of the first parameters.

Abstract: The invention relates to a method for processing an object using a material processing device that has a particle beam apparatus.

Abstract: An illumination module (101) for an optical apparatus comprises a light source unit (102), which is configured to selectively emit light along a multiplicity of beam paths (112) in each case. The illumination module (101) also comprises a multiplicity of optical elements (201-203) arranged with lateral offset from one another, wherein each optical element (201-203) of the multiplicity of optical elements (201-203) is configured to transform at least one corresponding beam path (112) of the multiplicity of beam paths.

Abstract: Method for calibrating a phase mask in a beam path of an optical device with the steps: the phase mask is actuated successively with different patterns of grey levels, wherein a first grey level of a first quantity of segments remains constant and a second grey level of a second quantity of segments is varied from one pattern to the next, light of the optical device impinges on the phase mask, at least one part of the total intensity of the light in the beam path is measured downstream of the phase mask for the different patterns, and a characteristic of the measured intensity is obtained in dependence on the second grey level, a relationship between the second grey level and a phase shift, being imprinted by the phase mask, is obtained from the characteristic and an actuation of the phase mask is calibrated based on the obtained relationship.

Abstract: A method for evaluating measurement data from a light field microscope, and an apparatus for light field microscopy wherein the following steps are carried out: a) at least one sample position to be analyzed is selected in a sample; b) images of the sample, which each contain a set of partial images, are recorded at a sequence of recording times using a light field microscope; c) the positions corresponding to the selected sample positions are determined in the partial images of the images recorded in step b); d) the image signals are extracted from at least some of the partial images at the positions determined in partial step c); e) an integrated signal is obtained for a certain recording time by virtue of the image signals extracted for a certain position from partial images of this recording time in step d) being integrated to form the integrated signal; and f) a time profile of the integrated signal is obtained by virtue of step e) being carried out for a plurality of recording times.

Abstract: An apparatus and method for light field microscopy. The apparatus has a light source for emitting excitation light, an excitation beam path for guiding the excitation light onto and into a sample, a two-dimensionally spatially resolving detector for detecting emission light emitted by the sample as a consequence of the irradiation by the excitation light, and a detection beam path having a microscope objective and a multi-lens array for guiding the emission light onto the two-dimensionally spatially resolving detector.

Abstract: A method for operating a light microscope with structured illumination includes: providing illumination patterns by means of a structuring device which splits impinging light into at least three coherent beam parts which correspond to a ?1., 0., and +1. diffraction orders of light; generating different phases of the illumination patterns by setting different phase values for the beam parts with phase shifters; and recording at least one microscope image for each of the illumination patterns and calculating a high resolution image from the microscope images. Phase shifters are provided not only for the beam parts of the ?1. and +1. diffraction orders but also at least one phase shifter for the beam part of the 0. diffraction order. At least two different phase values ?0 are set with the at least one phase shifter for the 0. diffraction order to provide a plurality of illumination patterns with different phases.

Abstract: An adapter is useful with a sample holder of a microscope. The adapter has at least one support region for reproducibly orienting the adapter in a mounted state in a sample holder support. The adapter also has a first coupling point for detachable connection to a coupling structure of a sample holder on one side, and a second coupling point for detachable connection to a coupling structure of a sample manipulator on a side of the adapter opposite to the first coupling point. The adapter is useful with the sample holder, a sample chamber, a microscope and a method for arranging a sample in a detection beam path of a microscope.

Abstract: A computer-implemented method comprises the following steps. In one step an image is acquired which is captured in the context of a microscopy measurement and images a sample to be examined. In one step the microscopy measurement is monitored in an automated manner. On the basis of the automated monitoring of the microscopy measurement, one or more labels are created, wherein said one or more labels comprise semantic context information of the microscopy measurement. On the basis of the image as input and said one or more labels as ground truth, a machine-learned algorithm is trained which provides semantic context information on the basis of images captured in the context of microscopy measurements. In a further step a further image is acquired, which is captured in the context of the microscopy measurement or a further microscopy measurement by the microscope and images the sample or a further sample.

Abstract: A reference sample for calibrating and/or adjusting a microscope and to uses of the reference sample. The latter has at least one carrier structure made of a carrier material which, at least in regions of its extent, is excitable to emit luminescence light, and at least one two-dimensional and/or three-dimensional structure consisting of a number of substructures. The carrier material is diamond or silicon carbide and is doped in or around the regions of the two-dimensional and/or three-dimensional structure in order to be excitable to emit the luminescence light.

Abstract: A method for the microscopy scanning of a specimen. An immersion medium is used between a slide and a microscope objective, said immersion medium wetting a surface of the slide, and the microscope objective being relatively displaced over the surface of the slide for imaging. The surface is provided with a coating which repels the immersion medium.

Abstract: In a method for processing microscope images, at least one microscope image is provided as input image for an image processing algorithm. An output image is created from the input image by means of the image processing algorithm. The creation of the output image comprises adding low-frequency components for representing solidity of image structures of the input image to the input image, wherein the low-frequency components at least depend on high-frequency components of these image structures and wherein high-frequency components are defined by a higher spatial frequency than low-frequency components. A corresponding computer program and microscope system are likewise described.

Abstract: In high-resolution scanning microscopy, a sample is excited by illumination radiation to emit fluorescence radiation in such a way that the illumination radiation is focused at a point in or on the sample to form a diffraction-limited illumination spot. The point is imaged in a diffraction-limited manner into a diffraction image on a spatially resolving surface detector, wherein the surface detector has a spatial resolution that resolves a structure of the diffraction image. The sample is scanned by means of different scanning positions with an increment of less than half the diameter of the illumination spot. An image of the sample is generated from the data of the surface detector and from the scanning positions assigned to said data, said image having a resolution that is increased beyond a resolution limit for imaging.

Abstract: A method for illuminating samples in microscopic imaging methods, wherein a number m of different wavelengths ?i, with m>I and i=I, . . . , m, is selected for the illumination. For each of the wavelengths ?i a target phase function ??i(x, y, ?i) is predefined, wherein x and y denote spatial coordinates in a plane perpendicular to an optical axis z and each target phase function ??i(x, y, ?i) is effective only for the corresponding wavelength ?i. The target phase functions ??i are predefined depending on the structure of the sample and/or the beam shape and/or illumination light structure to be impressed on the light used for illumination. A total phase mask is then produced which realises all target phase functions ??i(x, y, ?i). This total phase mask is then illuminated simultaneously or successively with coherent light of wavelengths ?i such that the predefined structure of the illumination light is generated in the region of the sample.

Abstract: An optical arrangement for light beam shaping in a light microscope has a first and a second liquid crystal region, each of which has a plurality of independently switchable liquid crystal elements with which a phase of incident light is changeable in a settable manner. A first polarization beam splitter is arranged in such a way that incident light is split in a polarization-dependent manner into reflection light, which is reflected in the direction of the first liquid crystal region, and transmission light, which is transmitted in the direction of the second liquid crystal region. The first or a second polarization beam splitter is arranged such that the reflection light and transmission light are combined onto a common beam path after phase modulation by means of the liquid crystal regions.

Abstract: A microscope objective for imaging a specimen using a microscope, the microscope objective having a front lens enclosed by a surround and being designed for microscopy with an immersion liquid. In the microscope objective, the front lens and/or the surround thereof is provided with a coating which can be switched between a state which repels the immersion liquid and a state which does not repel the immersion liquid.

Abstract: The present invention initially relates to a method for generating an image of a sample, said image being pieced together from a plurality of individual microscope images. A microscope is provided, for which a measurement value of a twist angle (?) present between an image recording unit of the microscope and an object stage of the microscope and a measurement accuracy of this measurement value are known. There is a recording of a first individual microscope image of the sample using the microscope and a displacement of the image recording unit and the sample-supporting object stage relative to one another, whereupon a second individual microscope image (02) of the sample is recorded using the microscope. A search region is determined in the second or first individual microscope image, an overlap region between the individual microscope images being expected in said search region.

Abstract: The invention relates to an optical arrangement, particularly for the detection beam path of a multi-spot scanning microscope, comprising a detection plane, in which a detector is positionable, comprising a dispersive device for spectrally splitting detection light. According to the invention, the optical arrangement is characterized in that a distorting optical unit is present for guiding the detection light into the detection plane, said distorting optical unit being arranged downstream of the dispersive device and upstream of a detection plane, and in that a rotating device is present for the relative rotation of a luminous field of the spectrally separated detection light and the distorting optical unit. The invention additionally relates to a multi-spot scanning microscope and a method for operating a microscope.