Abstract: Leveraging stochastic physical characteristics of resistive switching devices to generate data having very low cross correlation among bits of that data is disclosed. Data generated from stochastic physical characteristics can also be referred to as physical unclonable feature—or function—(PUF) data. Additionally, error correction functions for PUF data generated from resistive switching memory cells are provided. The error correction functions facilitate additional redundancy and longevity of PUF data, among other benefits. Different embodiments include addressing arrangements to incorporate ECC parity bits among generated PUF data bits, even for differential PUF bits respectively defined by multiple memory cells in different portions of a resistive memory array.

Abstract: An electronic device can be validated at a circuit-level or device-level to provide supply chain verification of an integrated circuit (IC) product. A modern integrated circuit package can comprise multiple dies, systems and circuitry built from a variety of device-level structures. Device-level verification disclosed herein can confirm that a device-level (sub-) component of an integrated circuit product is sourced by a known or otherwise valid manufacturer. This serves to mitigate or avoid a hacking attempt involving illicit replacement of a component of an IC product by an intermediate handler of the IC product within a supply chain.

Abstract: A secure microcontroller for a secure data storage device can utilize two-terminal non-volatile memory for enhanced security and component density. The secure microcontroller can operate portions of the two-terminal memory in different modes, such as OTP, rewritable or MTP, physical unclonable function PUF and so forth, and discriminate among data access requests according to data characterizations defined for data parameters stored at the secure storage device. A link table maintained by the secure microcontroller can correlate these characterizations with distinct data parameters. In some embodiments of the present disclosure, the secure microcontroller can also maintain predefined characterizations that are common to many data sets. In these embodiments, the link table can simply correlate many of the data sets to one of the predefined characterizations and significantly reduce the overhead involved in characterizing many distinct data parameters.

Abstract: A secure microcontroller for a secure data storage device can utilize two-terminal non-volatile memory for enhanced security and component density. The secure microcontroller can operate portions of the two-terminal memory in different modes, such as OTP, rewritable or MTP, physical unclonable function PUF and so forth, and discriminate among data access requests according to data characterizations defined for data parameters stored at the secure storage device. A link table maintained by the secure microcontroller can correlate these characterizations with distinct data parameters. In some embodiments of the present disclosure, the secure microcontroller can also maintain predefined characterizations that are common to many data sets. In these embodiments, the link table can simply correlate many of the data sets to one of the predefined characterizations and significantly reduce the overhead involved in characterizing many distinct data parameters.

Abstract: A monotonic counter implemented at least in part in non-volatile memory hardware is described herein. Compared with software counting algorithms, the disclosed embodiments significantly enhance security of disclosed monotonic counters. In some aspects of the disclosed embodiments, a non-binary coded decimal (BCD) counting algorithm can be utilized in whole or in part to enhance longevity of non-volatile memory cells storing monotonic counter values. Various aspects of the present specification disclose both a monotonic increase counter, and a monotonic decrease counter.

Abstract: Improved erase techniques and apparatuses can improve performance and longevity of non-volatile memory. Various disclosed techniques include performing an erase operation(s) on a group of such memory cells, followed by a weak program operation. One or more subsequent erase-verify operations can be implemented until no erase disturb states are detected for the memory cells, or until a maximum erase-verify cycle count is reached. In one or more embodiments, additional weak program and erase-verify cycles can be implemented to enhance cycle longevity and reduce erase disturb states for the group of non-volatile memory.

Abstract: An electronic hardware wallet for conducting cryptocurrency transactions, blockchain transactions, or other secure communications is embodied on a monolithic integrated circuit (IC) die supported on a single substrate. The monolithic semiconductor device can include a non-volatile data store for storing application software executable by the multi-core processor, and the secure element can include a secure data store for storing secret data (e.g., a private key) for use in a secure electronic transaction. In some embodiments, the secure element can include hardware logic embodying a cryptocurrency algorithm associated with executing the secure electronic transaction and can have a limited and selective communication bus between the secure element and the multi-core processor.

Abstract: Improved bit error correction for non-volatile memory can be implemented in multiple stages achieving improved correction capacity. As an example, bit error correction for a set of data can utilize a logic or a differential algorithm applied to one or more copies (N) of the set of data to produce a logic (or differential) output. An error correction code (ECC) can be applied to the logic (or differential) output to produce corrected data that corrects bit errors of the set of data, if any, up to a maximum for the ECC selected. An algorithm can be selected to address measured bit error rates or variations in bit error rates among binary bit states of a non-volatile memory.

Abstract: Differential programming of multiple resistive switching memory cells defining a bit is disclosed. The differential programming can mitigate invalid data values for the defined bit, referred to herein as an identifier bit. Embodiments of the present disclosure provide for detection of a program event(s) for a portion of resistive switching memory cells defining an identifier bit, and disconnecting a remainder of the memory cells from program supply voltage, prior to a duration of a program cycle. Additionally, the program cycle can be continued for the programmed memory cell(s) to facilitate a robust programming and enhance data longevity. The detection and subsequent disconnection can facilitate proper differential programming and mitigate unwanted program events that lead to invalid identifier bit results, as well as reducing power consumption for a program cycle of resistive switching memory.

Abstract: A secure integrated circuit comprises a lower logic layer, and one or more memory layers disposed above the lower logic layer. A security key is provided in one or more of the memory layers for unlocking the logic layer. A plurality of connectors are provided between the one or more memory layers and the lower logic layer to electrically couple the memory layer(s) and lower logic layer.

Abstract: Providing for a resistive switching memory device is described herein. By way of example, the resistive switching memory device can comprise a bottom electrode, a conductive layer, a resistive switching layer, and a top electrode. Further, two or more layers can be selected to mitigate mechanical stress on the device. In various embodiments, the resistive switching layer and conductive layer can be formed of compatible metal nitride or metal oxide materials having different nitride/oxide concentrations and different electrical resistances. Further, similar materials can mitigate mechanical stress on the resistive switching layer and a conductive filament of the resistive switching memory device.

Abstract: Stochastic or near-stochastic physical characteristics of resistive switching devices are utilized for generating data distinct to those resistive switching devices. The distinct data can be utilized for applications related to electronic identification or random number generation. As one example, data generated from physical characteristics of resistive switching devices on a semiconductor chip can be utilized to form a distinct identifier sequence for that semiconductor chip, utilized for verification applications for communications with the semiconductor chip or utilized for generating cryptographic keys or the like for cryptographic applications.

Abstract: Improved differential programming of multiple two-terminal memory cells that define an identifier bit is provided. A differential circuit can be defined by a plurality of resistive memory cells connected to a single bitline of an array, with respective wordlines coupling second terminals of the memory cells to ground (or low voltage). Some disclosed circuits can provide very rapid intrinsic suppression of a non-programmed memory cell(s) defining an identifier bit in response to programming of another memory cell (or group of cells) defining the identifier bit. Differential programming can reduce power consumption and mitigate or avoid invalid data results for an identifier bit.

Abstract: A physical unclonable function (PUF) can be implemented on a transistor of an integrated circuit device to generate PUF data. A potential difference is supplied across a gate insulator to induce a conductive breakdown in the gate insulator material. Location of the conductive breakdown within the gate insulator and in relation to the source node and drain node can be highly unpredictable, randomly resulting in a higher gate-source current or higher gate-drain current, respectively. The gate-source or gate-drain current can be measured and digitized to generate the PUF data value from the transistor. Moreover, PUF data values generated from multiple transistors can be highly non-correlated and useful for a random data sequence for cryptographic applications and other security applications.

Abstract: Improved differential programming of multiple two-terminal memory cells that define an identifier bit is provided. Differential programming can apply a program cycle to multiple memory cells concurrently, detect a program event for one (or a first group) of the memory cells and disconnect all of the memory cells from a program supply voltage in response to detecting the program event. Moreover, disconnecting the memory cells can be accomplished prior to a duration of the program cycle, serving to mitigate an invalid data result for the identifier bit, as well as reduce power consumption associated with the differential programming. Circuits providing intrinsic suppression of a non-programmed memory cell(s) defining an identifier bit in response to programming of another memory cell (or group of cells) defining the identifier bit are included. Differential programming can reduce power consumption and mitigate or avoid invalid data results for an identifier bit.

Abstract: Leveraging stochastic physical characteristics of resistive switching devices to generate data having very low cross correlation among bits of that data is disclosed. Data generated from stochastic physical characteristics can also be referred to as physical unclonable feature—or function—(PUF) data. Additionally, error correction functions for PUF data generated from resistive switching memory cells are provided. The error correction functions facilitate additional redundancy and longevity of PUF data, among other benefits. Different embodiments include addressing arrangements to incorporate ECC parity bits among generated PUF data bits, even for differential PUF bits respectively defined by multiple memory cells in different portions of a resistive memory array.

Abstract: Embodiments of the present disclosure provide intrinsic program suppression of a non-programmed two-terminal resistive switching memory cell of a plurality of memory cells defining an identifier bit, such as a physical unclonable feature (PUF) bit. Differential programming applies a program signal to a plurality of resistive switching memory cells and derives a value for the identifier bit from which cell(s) becomes programmed. However, where more than an expected number of cells become programmed, an invalid value can occur. Disclosed intrinsic program suppression mitigates or avoids the invalid result by very rapidly reducing the program signal to a non-programmed cell(s) in response to another cell(s) becoming programmed. In an embodiment, intrinsic program suppression can be implemented by programming the plurality of memory cells electrically in parallel and shorting second terminals of the plurality of memory cells at a common node.

Abstract: An integrated circuit device can be configured to characterize portions of a resistive switching device array according to one or more operational characterizations. The memory device can store trim instructions defining signal processes for implementing the operational characterizations. Examples of resistive switching device characterizations can include: a physical unclonable feature (PUF) memory characterization, a one-time programmable (OTP) memory characterization, a many-time programmable (MTP) memory characterization, and a random number generation (RNG) memory characterization, among others. The integrated circuit device can characterize portions of the resistive switching device array in response to an instruction from an external host device, exposing control over the selective characterization of the portions of the resistive switching device array to the external host device.

Abstract: Differential programming of multiple resistive switching memory cells defining a bit is disclosed. The differential programming can mitigate invalid data values for the defined bit, referred to herein as an identifier bit. Embodiments of the present disclosure provide for detection of a program event(s) for a portion of resistive switching memory cells defining an identifier bit, and disconnecting a remainder of the memory cells from program supply voltage, prior to a duration of a program cycle. Additionally, the program cycle can be continued for the programmed memory cell(s) to facilitate a robust programming and enhance data longevity. The detection and subsequent disconnection can facilitate proper differential programming and mitigate unwanted program events that lead to invalid identifier bit results, as well as reducing power consumption for a program cycle of resistive switching memory.

Abstract: Fabrication of resistive switching memory devices is herein provided. By way of example, a method for a two-step etch for fabricating a non-volatile resistive memory device is disclosed. In another example, a method for a three-step etch for fabricating a non-volatile resistive memory device is provided. Still other embodiments disclose a method for fabricating a non-volatile metal nitrogen/metal oxygen resistive switching memory device. Further embodiments disclose a method for fabricating a volatile resistive switching selector device. Processes for forming protective spacers in conjunction with fabricating a disclosed resistive memory device are also provided.