Patents Assigned to DeFelsko Corporation
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Patent number: 5723791Abstract: A gauge for determining a thickness of a coating on a substrate includes a transducer for emitting ultrasonic signals into the coating and for generating electrical signals proportional to the ultrasonic signals received by the transducer, the received signals include first signals reflected from a transducer/coating interface and second signals reflected from a coating/substrate interface; a pulser for sending pulses to the transducer to trigger the emission of the ultrasonic signals; a sampler for sampling the electrical transducer signals and generating sampled data; a timer for controlling the pulser and the sampler so as to perform an equivalent time sampling of the signals received by the sampler; and a controller for calculating a thickness of the coating based on the sampled data, the controller includes the ability to subject the sampled data to a deconvolution analysis so as to distinguish sampled data corresponding to the first signals from sampled data corresponding to the second signals when theType: GrantFiled: September 28, 1993Date of Patent: March 3, 1998Assignee: DeFelsko CorporationInventors: Frank J. Koch, Leon C. Vandervalk, David J. Beamish
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Patent number: 5686831Abstract: A gauge includes a probe for taking measurements, a microprocessor for processing the measurements taken by the probe; and a screen display for displaying the measurements processed by the microprocessor; wherein the screen display can be selectively operated in a first mode wherein the measurements are displayed on the screen display in a first orientation, and in a second mode wherein the measurements are displayed on the screen display in a second orientation.Type: GrantFiled: February 7, 1996Date of Patent: November 11, 1997Assignee: DeFelsko CorporationInventor: Leon C. Vandervalk
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Patent number: 5623427Abstract: A method and apparatus for measuring an anodic capacity of a thermally sprayed coating are described. Eddy current techniques are used to probe the coating and resulting RMS voltages are translated into anodic capacity indications which can be standardized or absolute. Recalibration can be achieved using single point measurement.Type: GrantFiled: September 2, 1994Date of Patent: April 22, 1997Assignee: DeFelsko CorporationInventors: Leon Vandervalk, Frank J. Koch
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Patent number: 5397027Abstract: A stopper for use in a metered dispensing unit including a conduit for carrying fluid from a container to a metering portion of the dispensing unit, the conduit having a flange at one end, a sealing member arranged on the conduit for sealing the conduit against an inside surface of the container, the sealing member having a tube through which the conduit extends, and a system for replaceably securing the sealing member on the conduit between the flange and an end of the conduit which is opposite the flange. For example, the securing system may include a releasable retaining clip.Type: GrantFiled: October 4, 1993Date of Patent: March 14, 1995Assignee: DeFelsko CorporationInventors: Frank J. Koch, Douglas Cleminshaw
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Patent number: 5293132Abstract: A coating thickness measurement gauge includes a measurement transducer and a particularly advantageous probe arrangement. The probe arrangement includes a probe assembly and a probe housing that encircles the probe assembly. The probe assembly may include an inductor that forms a part of an LC oscillator. The gauge is able to measure the thickness of coatings on magnetic and non-magnetic substrates through use of the same probe assembly. Alternatively, the probe assembly can include a capacitor forming a part of an LC or an RC oscillator. The bottom surface of the probe housing has two oppositely positioned V-shaped grooves formed therein for facilitating the measurement of coating thicknesses on convex surfaces. The outer peripheral surface of the probe housing includes two spaced apart flat surfaces connected together by two arcuate surfaces for stabilizing the gauge during measurement of coating thicknesses on concave surfaces.Type: GrantFiled: June 1, 1993Date of Patent: March 8, 1994Assignee: DeFelsko CorporationInventor: Frank J. Koch
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Patent number: 5241280Abstract: A coating thickness gauge includes a measurement transducer and a particularly advantageous probe arrangement. The probe arrangement includes a probe assembly and a probe housing that encircles the probe assembly. The probe assembly may include an inductor that forms a part of an LC oscillator. The gauge is able to measure the thickness of coatings on magnetic and non-magnetic substrates through use of the same probe assembly. Alternatively, the probe assembly can include a capacitor forming a part of an LC or an RC oscillator. The bottom surface of the probe housing has two oppositely positioned V-shaped grooves formed therein for facilitating the measurement of coating thicknesses on convex surfaces. The outer peripheral surface of the probe housing includes two spaced apart flat surfaces connected together by two arcuate surfaces for stabilizing the gauge during measurement of coating thicknesses on concave surfaces.Type: GrantFiled: June 1, 1990Date of Patent: August 31, 1993Assignee: DeFelsko CorporationInventors: Rashid K. Aidun, Frank J. Koch
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Patent number: 5094009Abstract: A gauge for measuring the thickness of a coating on a substrate includes a housing, an indicator rod movably positioned within the housing, a magnet mounted on the forward end of the indicator rod, and a spring connected to the rearward end of the indicator rod. The housing can have a slot extending along a portion thereof that communicates with the interior of the housing. According to one embodiment, a measurement scale can be positioned adjacent to and extending along the length of the slot and a plurality of indicating marks can be provided on the rod for permitting the thickness of the coating to be determined. The particular indicating mark that is used for determining the thickness of the coating is dependent upon the orientation of the gauge relative to the force of gravity. According to another aspect of the present invention, the magnet can be fabricated from a combination of at least one light rare earth element and at least one heavy rare earth element.Type: GrantFiled: October 17, 1990Date of Patent: March 10, 1992Assignee: DeFelsko CorporationInventors: Frank J. Koch, Marlin S. Walmer
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Patent number: 4741426Abstract: A coin acceptor includes first and second members initially spaced apart from one another and frictionally carrying a third member having a coin selectively positioned thereon. Moving the first and second members toward one another causes relative displacement between the third member and the first and second members. The relative displacement is compared with a reference position.Type: GrantFiled: December 4, 1986Date of Patent: May 3, 1988Assignee: DeFelsko CorporationInventor: Frank J. Koch
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Patent number: 4705153Abstract: A coin acceptor includes first and second members initially spaced apart from one another and frictionally carrying a third member. Moving the first and second members toward one another displaces the third member a distance corresponding to the weight of the coin selectively positioned on the third member. The distance which the third member is displaced is compared with a reference position.Type: GrantFiled: December 23, 1985Date of Patent: November 10, 1987Assignee: DeFelsko CorporationInventor: Frank J. Koch
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Patent number: 4599562Abstract: A method and apparatus are disclosed for magnetically measuring a coating on a magnetizable material. The apparatus includes a plurality of magnets flexibly connected to one another with the magnets preferably provided on a strap of flexible material. Each magnet has a coating with a predetermined thickness provided over only a first portion of the magnet and preferably over one pole of the magnet. The coating of each of the plurality of magnets differs in thickness from one to another. The magnets contact the coating to be measured at a second portion of the magnets and the coating of each magnet is then contacted sequentially with a member of a magnetizable material. If the magnet is lifted with the member, the coating to be measured is greater than the thickness of the coating of the magnet. If the magnet is not lifted with the member, the coating to be measured is less than the thickness of the coating of the magnet.Type: GrantFiled: October 10, 1984Date of Patent: July 8, 1986Assignee: DeFelsko CorporationInventor: Frank Koch
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Patent number: 4433290Abstract: A coating thickness and surface comparator for measuring the thickness of nonmagnetic coatings (28) or roughness on ferromagnetic base materials. A permanent rod magnet (6) and a ferromagnetic rod (16) are supported by nonmagnetic slides (12, 14) parallel to one another. When a standard base (24) is placed at one end (22) of the rod magnet (6) and a coated or roughened base (30) is placed at the other end, the slides (12, 14) are pushed together toward the middle of the rod magnet (6). The coincidence of the slides (12, 14) varies from the middle of the bar magnet (6) in proportion to coating thickness (28) or roughness.Type: GrantFiled: July 7, 1983Date of Patent: February 21, 1984Assignee: DeFelsko CorporationInventor: Frank Koch
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Patent number: D273465Type: GrantFiled: October 23, 1981Date of Patent: April 17, 1984Assignee: DeFelsko CorporationInventor: Frank Koch
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Patent number: D331201Type: GrantFiled: October 26, 1990Date of Patent: November 24, 1992Assignee: DeFelsko CorporationInventor: Frank J. Koch
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Patent number: RE35703Abstract: A gauge probe for a handheld combination coating thickness gauge allows the combination coating thickness gauge to measure both nonferrous coatings on ferrous substrate and nonconductive coatings on conductive nonferrous substrate. The gauge probe enables the combination coating thickness gauge to determine automatically, with a single probe, the substrate characteristics, and to effect a measurement of the coating thickness on that substrate. The technique used to measure coatings on a ferrous substrate utilizes a permanent magnet to provide a constant magnetic flux and a Hall sensor and thermistor arranged to measure the temperature-compensated magnetic flux density at one of the poles of the permanent magnet. The flux density at the magnet pole can be related to a nonferrous coating thickness on a ferrous substrate. The technique used to measure nonconductive coatings on a conductive nonferrous substrate utilizes eddy current effects.Type: GrantFiled: August 28, 1996Date of Patent: December 30, 1997Assignee: DeFelsko CorporationInventors: Frank J. Koch, Leon C. Vandervalk, David J. Beamish