Positest thickness gage

- DeFelsko Corporation
Description

FIG. 1 is a front elevational view of a thickness tester showing my new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a bottom plan view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a left side elevational view thereof.

Referenced Cited
U.S. Patent Documents
D186549 November 1959 Kennedy
D254778 April 22, 1980 Kitada
D256338 August 12, 1980 Kester
D264444 May 18, 1982 Muchenberger
3423837 January 1969 Euverard
Patent History
Patent number: D273465
Type: Grant
Filed: Oct 23, 1981
Date of Patent: Apr 17, 1984
Assignee: DeFelsko Corporation (Ogdensburg, NY)
Inventor: Frank Koch (Ogdensburg, NY)
Primary Examiner: Nelson C. Holtje
Law Firm: Burns, Doane, Swecker & Mathis
Application Number: 6/314,384