Positest thickness gage
Latest DeFelsko Corporation Patents:
Description
FIG. 1 is a front elevational view of a thickness tester showing my new design;
FIG. 2 is a top plan view thereof;
FIG. 3 is a bottom plan view thereof;
FIG. 4 is a rear elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a left side elevational view thereof.
Referenced Cited
Patent History
Patent number: D273465
Type: Grant
Filed: Oct 23, 1981
Date of Patent: Apr 17, 1984
Assignee: DeFelsko Corporation (Ogdensburg, NY)
Inventor: Frank Koch (Ogdensburg, NY)
Primary Examiner: Nelson C. Holtje
Law Firm: Burns, Doane, Swecker & Mathis
Application Number: 6/314,384
Type: Grant
Filed: Oct 23, 1981
Date of Patent: Apr 17, 1984
Assignee: DeFelsko Corporation (Ogdensburg, NY)
Inventor: Frank Koch (Ogdensburg, NY)
Primary Examiner: Nelson C. Holtje
Law Firm: Burns, Doane, Swecker & Mathis
Application Number: 6/314,384
Classifications
Current U.S. Class:
Measuring, Regulating Or Indicating Instrument, Or Casing (D10/46)