Patents Assigned to Epsilon
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Patent number: 7808314Abstract: The invention relates to a circuit for adjusting an impedance between two terminals, said impendance including the input impedance of the circuit. The aim of the invention is to enlarge the adjustment range and to stabilize—the operating behavior of such a circuit. For this purpose, the circuit comprises amplifiers, adjusting means with which amplification of at least one amplifier and/or the circuit can be changed in general and the impedance between the two terminals can be modified by influencing the one or more adjusting means.Type: GrantFiled: January 10, 2007Date of Patent: October 5, 2010Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventor: Franz Hrubes
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Patent number: 7752086Abstract: A method of distributing products, including computer processing content of the orders including regrouping the orders into groups of orders, and ungrouping the content of each order group into a order subgroups; regrouping the products, including performing a collection of the products, reading the identifier of each collected product and arranging each to obtain a concordance between the product groups and the order groups, ungrouping the products, including for each product group performing a collection of the products, reading the identifier of each collected product and arranging each in a compartment associated with a product subgroup to obtain a concordance between the product subgroups and the order subgroups, and a step of final separation including for each product subgroup performing a collection of each of the products, reading the identifier and arranging each in a compartment associated with a physical order.Type: GrantFiled: June 2, 2004Date of Patent: July 6, 2010Assignee: L4 EpsilonInventors: Alain Wiesenbach De Lamaziere, Sebastien Valoggia
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Publication number: 20100090688Abstract: A method for determining the position and/or change of position of a measured object relative to a sensor, where the sensor preferably has a sensor coil to which an alternating current is applied, is characterized in that a magnet associated with the measured object, in a soft magnetic foil, whose permeability changes under the influence of a magnetic field on the basis of the magnetic field's field strength and which is arranged in the area of influence of the sensor, brings about a change in the permeability of the foil and in that the change in the permeability of the foil is determined from the latter's reaction to the sensor, and this is used to determine the position and/or change of position of the measured object relative to the sensor. A sensor arrangement is designed accordingly.Type: ApplicationFiled: December 21, 2007Publication date: April 15, 2010Applicant: Micro-Epsilon Messtechnik GmbH & Co., KGInventor: Vladislav Mednikov
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Patent number: 7602175Abstract: A non-contacting position measuring system comprising a sensor that includes a measuring coil which can be energized with alternating current, where the measuring coil comprises at least two voltage taps, an electrically or magnetically conductive object to be measured which is assigned to the sensor, and an evaluation circuit, where the sensor and the object to be measured can be displaced relative to one another in a longitudinal direction of the measuring coil. The position-measuring system presented is formed in such a manner that the object to be measured comprises at least one marking affecting the impedance of the measuring coil between two voltage taps so that the evaluation circuit provides an output signal correlating with the position of the object to be measured in relation to the voltage taps.Type: GrantFiled: May 18, 2006Date of Patent: October 13, 2009Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Felix Mednikov, Martin Sellen, Eduard Huber
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Patent number: 7592804Abstract: The invention relates to a contactlessly working eddy current sensor, particularly for detecting essentially flat test objects, comprising at least one sensor coil, eddy currents being able to be induced in the test object. The invention is characterized in that the coil, when passing by the test object, is aligned in such a manner that the coil axis is oriented essentially parallel to a line normal to a surface to the test object, and that the test object can be moved past the sensor coil essentially parallel to the coil axis or the sensor coil can be moved past the test object. A corresponding method is carried out so that an eddy current can occur only once when the test object or coil is passed by.Type: GrantFiled: October 26, 2007Date of Patent: September 22, 2009Assignee: Micro-Epsilon Messtechnick GmbH & Co. KGInventors: Franz Hrubes, Günter Schallmoser
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Patent number: 7576849Abstract: Method and apparatus for optically testing the quality of objects such as silicon wafers which have a circular peripheral edge, wherein light is directed onto the edge region of the object, and the light radiating from the object due to reflection, refraction and/or diffraction is detected by means of a measuring unit which produces an image from the received light. Defects on and/or in the object are identified from the produced image.Type: GrantFiled: November 16, 2005Date of Patent: August 18, 2009Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventor: Robert Wagner
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Patent number: 7561273Abstract: The invention relates to a device for measuring surfaces and to a method, which uses, preferably, the device. The device comprises a light source which is used to produce a multi-colored light beam. The light beam can be focused by an imaging optical system on a plurality of points which are arranged at different distances from the imaging optical system, using the chromatic aberration of the optics. The focused light beam can be deviated to a point of the surface. A sensor device is provided in order to detect the reflected light beam. The aim of the invention is to maintain the largest distance possible between the measuring head and the object. The imaging optical system comprises an optical system for the targeted circulation of a chromatic aberration and an additional optical system which is used to form the focused light beam emerging from the imaging optical system.Type: GrantFiled: November 13, 2007Date of Patent: July 14, 2009Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Torsten Stautmeister, Bernhard Messerschmidt, Karl Wisspeinter
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Patent number: 7545154Abstract: The invention relates to a sensor which uses the capacitive measuring principle which is used to detect the proximity of a dielectric medium, preferably for detecting a human body part, which is used in an anti-pinching system. The sensor includes a capacitor and an evaluation electronic system. The variation of the capacity of the capacitor, which is caused by the medium, can be measured. The capacitor, which can establish a distinction between a human body part or a solid and water and/or humidity, is characterized in that the capacitor can be operated in a successive manner by at least two different frequencies and/or at least two different pulse duty factors by using the different ratio of said elements in a variable electric field. The invention also relates to a corresponding method.Type: GrantFiled: June 20, 2007Date of Patent: June 9, 2009Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Manfred Wagner, Norbert Reindl
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Patent number: 7533472Abstract: A cable length sensor, in particular, a bowden cable displacement sensor, comprising a cable drum, a measuring cable wound on the cable drum and a return device at least lightly pre-tensioned in the start position, wherein the measuring cable may be withdrawn by rotating the cable drum against the force of the return device and by withdrawing the measuring cable the return device may be further tensioned. The return device is arranged in a housing, and coupling means for releasably coupling the return device to the rotating movement of the cable drum are provided so as to permit ready removal and replacement of the return device. Also, the housing may be provided with a sensor element operated from outside the housing for determining the current position of the return device, in particular the at least lightly tensioned starting position of the return device.Type: GrantFiled: February 6, 2008Date of Patent: May 19, 2009Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Thomas Birchinger, Jaroslav Hruby
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Patent number: 7529769Abstract: Method and associated system for partitioning a collection of databases, by indexing folders within each database, files within each folder, documents within each file, and features (characters, words, phrases, symbols, expressions and image components) with each document so that content and context searching can proceed at any level. Databases need not be mutually exclusive, and a document, file or folder may be referenced in more than one database. One or more documents or files or folders or databases can be added to, or deleted from, the collection without changing the indexing scheme or interpretation assigned to a concatenated index.Type: GrantFiled: November 15, 2006Date of Patent: May 5, 2009Assignee: Cap Epsilon, Inc.Inventor: David A. Maluf
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Publication number: 20090009245Abstract: The invention relates to a circuit for adjusting an impedance between two terminals, said impendance including the input impedance of the circuit. The aim of the invention is to enlarge the adjustment range and to stabilize—the operating behavior of such a circuit. For this purpose, the circuit comprises amplifiers, adjusting means with which amplification of at least one amplifier and/or the circuit can be changed in general and the impedance between the two terminals can be modified by influencing the one or more adjusting means.Type: ApplicationFiled: January 10, 2007Publication date: January 8, 2009Applicant: Micro-Epsilon Messtechnik GmbH & Co. KGInventor: Franz Hrubes
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Patent number: 7369225Abstract: A device and method for checking surfaces in the interior of holes, depressions, or the like. The device and method are developed in such a manner that a multicolor light beam can be produced with a light source, wherein a light beam, due to the chromatic aberration of the imaging optics, can be focused onto several points at different distances from the imaging optics, such that the distance to the surface can be determined from the spectrum of the detected light beam.Type: GrantFiled: December 8, 2006Date of Patent: May 6, 2008Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Bernhard Messerschmidt, Karl Wisspeintner
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Patent number: 7345471Abstract: A device and method for detecting the position and velocity of a test object relative to a sensor, the sensor and the test object being arranged such that they can be displaced relative to one another. In one embodiment, the sensor has a measuring coil with one or more voltage tap(s) and has a target that is placed on the test object while being electromagnetically coupled to the measuring coil. An electronic component for adding the voltages tapped on the sensor is assigned to the sensor.Type: GrantFiled: March 21, 2007Date of Patent: March 18, 2008Assignee: Micro-Epsilon Messtechnik GmbH & Co.Inventors: Martin Sellen, Felix Mednikov, Mark Nechaewskij
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Publication number: 20080039867Abstract: The invention relates to a universal actuator platform for guiding end effectors, for example, cameras, surgical, or medical tools, or instruments etc. in minimally invasive interventions, in which each end effector is introduced into a body cavity at an entrance point with at least one interface, for connecting at least one kinematic device, with an end effector, to at least one drive mechanism for the kinematic device and to a drive controller.Type: ApplicationFiled: November 5, 2004Publication date: February 14, 2008Applicant: MICRO-EPSILON MESSTECHNIK GMBH & CO. KGInventors: Hubertus Feussner, Eduard Sammereier, Martin Sellen, Jürgen Michael Knapp, Robert Geiger, Ludwig Kirschenhofer
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Patent number: 7275015Abstract: A method and a device for determining motion parameters of a conductive, profiled surface (22) relative to a sensor (3), with the sensor (3) comprising at least one coil for generating an electromagnetic alternating field, which is subjected, because of the feedback resulting from position changes between the surface (22) and the sensor (3), to a variation, which is determined by means of the coil (16). The position change is derived from the coupling impedance (Zc) of the coil (16), and the real component (Rc) and the imaginary component (Xc) of the complex coupling impedance (Zc) of the coil (16) are determined, with a distance d between the sensor (3) and the surface (22) being computed based on the determined values while using an algorithm as a basis.Type: GrantFiled: October 25, 2005Date of Patent: September 25, 2007Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Stanislav Medinkov, Mark Netchaewskij, Felix Mednikov, Werner Grömmer, Martin Sellen
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Patent number: 7265542Abstract: A process and a device for contactless measurement of rotational speed with a proximity sensor operating according to the eddy current principle. The proximity sensor comprises an inductor and a capacitor connected in parallel that form an oscillating circuit which can be excited from outside, and where the resonant frequency of the oscillating circuit experiences a detectable change when an object to be measured approaches the proximity sensor. In various embodiments, the resonant frequency of the oscillating circuit or the excitation frequency of the oscillating circuit is controlled as a reaction to slow changes of the resonant frequency in such a manner that the oscillating circuit is always excited with its resonant frequency or with a frequency close to its resonant frequency and that rapid changes are detected as a measurement signal for the measurement of rotational speed.Type: GrantFiled: September 7, 2006Date of Patent: September 4, 2007Assignee: Micro-Epsilon Messtechnik GmbH & Co.Inventor: Franz Hrubes
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Patent number: 7257994Abstract: Measuring device and method for determining the position of an electrically conductive test object (1) with a noncontacting sensor, in particular an eddy current sensor (2), wherein the test object (1) is adapted for linear reciprocal movement in a predetermined direction. The test object (1) includes a marking (6), and the sensor is arranged transversely to the direction of movement of the test object (1) and at a constant distance from the test object in the region of the marking (6), so that a movement of the test object causes the sensor to produce an at least largely linear signal change over a predetermined measuring range.Type: GrantFiled: December 7, 2005Date of Patent: August 21, 2007Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventor: Franz Hrubes
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Patent number: 7157902Abstract: A sensor coil for a non-contacting inductive displacement sensor, having two inner substantially identically formed winding sections (1), with an unwound section (2) provided between the two inner winding sections. Also, the coil has two outer substantially identically formed winding sections (3), which are respectively arranged at the ends of the two inner winding sections (1) facing away from the unwound section (2). The two outer winding sections (3) have a larger number of windings than the two inner winding sections (1), thereby producing a measuring signal which is substantially linear along the measuring range.Type: GrantFiled: December 20, 2004Date of Patent: January 2, 2007Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventor: Markus Weber
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Patent number: 7150016Abstract: A method of controlling and visualizing processes, wherein data are produced by means of at least one task and/or thread, and consumed by means of at least one further task and/or thread, is designed with respect to a deterministic behavior without increased costs for software or hardware such that a decoupling of mutually blocking tasks and/or threads occurs in real time systems.Type: GrantFiled: May 21, 2001Date of Patent: December 12, 2006Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Andreas Bauhofer, Heidemarie Meyerhofer, Roland Mandl
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Patent number: 7092833Abstract: A method for linearizing a nonlinear curve with a linearization circuit (1), wherein the curve represents the relationship between input signals and output signals of a sensor. An output signal (100, 110, 120) of the sensor, which is respectively associated with an input signal, is displayed with respect to a simple and cost favorable linearization such that the adjustment of the linearization circuit (1) essentially occurs in an automated way utilizing sequence controller (2). A corresponding circuit is also described for practicing the method.Type: GrantFiled: October 9, 2003Date of Patent: August 15, 2006Assignee: Micro-Epsilon Messtechnik GmbH & Co. KGInventors: Franz Hrubes, Karl Wisspeintner