Patents Assigned to Etec Systems, Inc.
  • Patent number: 5835198
    Abstract: An articulated platform mechanism includes a base, a mounting frame including a platform, the frame having multiple attach portions; a mounting attached to each of the attach portions; a series of cams each having at least one cam surface; a series of cam followers; a series of drive motors; one of each of the cams or one of each of the followers being attached to each one of the mountings, the other of the cams and the followers being in rolling association with respective ones of each cam or cam follower; and wherein each motor drives a respective cam or follower not attached to the mountings, to actuate the platform in vertical lift, tilt front-to-back and tilt left-to-right.
    Type: Grant
    Filed: January 6, 1997
    Date of Patent: November 10, 1998
    Assignee: Etec Systems, Inc.
    Inventors: James A. Covello, David R. Hill
  • Patent number: 5815245
    Abstract: A small field scanning photolithography system uses opposing motion of a reticle and a blank to compensate for image reversal by a projection system such as a conventional Wynne-Dyson optical system which forms a reverted image on a blank. The reticle has a reverted pattern. During scanning, the reticle moves along a reverted axis in a direction opposite the direction in which the blank moves. The opposing motions can either expose a stripe on the blank or index the reticle and blank for exposure of a next stripe. In one embodiment of the invention, the reticle and blank are on independently movable precision air bearing stages. Typically, the blank and reticle move together perpendicular the reverted axis and in opposite direction along the reverted axis. The stages can move the reticle and blank different amounts to correct for shrinkage and temperature changes which cause the size of the reticle and blank to differ.
    Type: Grant
    Filed: March 22, 1995
    Date of Patent: September 29, 1998
    Assignee: Etec Systems, Inc.
    Inventors: Timothy N. Thomas, Paul C. Allen
  • Patent number: 5784925
    Abstract: A vacuum compatible linear motion device having a fluid bearing is contained within a vacuum chamber having a working pressure of significantly less than one atmosphere. The fluid bearing is contained within a vacuum enclosure within the vacuum chamber and is maintained at a pressure higher than that of the vacuum chamber but less than one atmosphere, thus essentially isolating the fluid bearing. A moveable payload is coupled to the linear motion device such that linear motion in the direction of the long axis of the device is provided to the moveable payload.
    Type: Grant
    Filed: December 13, 1996
    Date of Patent: July 28, 1998
    Assignee: Etec Systems, Inc.
    Inventors: David Trost, Lee Veneklasen
  • Patent number: 5781346
    Abstract: Magnification correction for small field scanning of large blanks is provided by adding magnification adjusting elements (lenses) to a double pass Wynne-Dyson lens or other type of one-to-one projection lens. The magnification adjusting optical elements includes two pairs of low power lenses, one associated with each of the input and output prisms of a Wynne-Dyson lens. Movement of the magnification adjusting optics provides positive or negative magnification as needed to correct for any expansion or compaction of the blank relative to the reticle (mask) and hence maintain alignment. Further magnification correction is provided by a small velocity relative movement between the reticle and the blank by means of a secondary stage in the scan direction. This corrects for any alignment error in the scan direction and may be used independently of the optical correction technique with any type of projection lens.
    Type: Grant
    Filed: August 2, 1996
    Date of Patent: July 14, 1998
    Assignee: Etec System, Inc.
    Inventors: Paul C. Allen, Ronald D. Voisin
  • Patent number: 5757469
    Abstract: A small field scanning photolithography system has a double pass Wynne-Dyson optical system which provides an erect, non-reverted, unmagnified image. An optical path through the system passes from an object, reflects off an input reflector, passes through a first quadrant of a lens, reflects off a concave mirror, passes through a second quadrant of the lens into folding optics where an intermediate image forms, passes from the folding optics through a third quadrant of the lens, reflects off the concave mirror a second time, passes through a fourth quadrant of the lens, and finally reflects off an output reflector to a plane where a final image forms. Typically, the input and output reflectors and the folding optics are prisms. A field stop may be provided in the folding optics where the intermediate image forms. Magnification adjusting optics can be added to the input and output prisms or to the folding optics.
    Type: Grant
    Filed: March 22, 1995
    Date of Patent: May 26, 1998
    Assignee: Etec Systems, Inc.
    Inventor: Paul C. Allen
  • Patent number: 5739964
    Abstract: Magnification correction for small field scanning of large blanks is provided by adding magnification adjusting elements (lenses) to a double pass Wynne-Dyson lens or other type of one-to-one projection lens. The magnification adjusting optical elements includes two pairs of low power lenses, one associated with each of the input and output prisms of a Wynne-Dyson lens. Movement of the magnification adjusting optics provides positive or negative magnification as needed to correct for any expansion or compaction of the blank relative to the reticle (mask) and hence maintain alignment. Further magnification correction is provided by a small velocity relative movement between the reticle and the blank by means of a secondary stage in the scan direction. This corrects for any alignment error in the scan direction and may be used independently of the optical correction technique with any type of projection lens.
    Type: Grant
    Filed: March 22, 1995
    Date of Patent: April 14, 1998
    Assignee: Etec Systems, Inc.
    Inventor: Paul C. Allen
  • Patent number: 5729022
    Abstract: A composite magnetic lens and deflector for particle beam optical systems has a concentric gap and concentric conical lower pole pieces arranged to allow more accurate magnetic deflection. The flux generated by a solenoidal lens coil is shared by magnetically soft inner and higher saturation flux outer pole pieces to minimize saturation effects, while the flux generated by internal deflection coils is confined to magnetically soft inner pole pieces that minimize flux leakage and associated eddy current settling effects. Shielding rings further contain leakage flux. The inner magnetic circuit is mounted and adhesively bonded to radial flexures to minimize thermal expansion drifts.
    Type: Grant
    Filed: September 26, 1996
    Date of Patent: March 17, 1998
    Assignee: Etec Systems, Inc.
    Inventors: Lee H. Veneklasen, William J. DeVore
  • Patent number: 5533170
    Abstract: A rasterizer for generating pixel values for a pattern generation apparatus. The pixel values drive the printing mechanism of the pattern generation apparatus. The rasterizer receives a file defining the pattern to be printed, fractures the pattern into sub frames, rasterizes each sub frame and then coordinates the provision of the shaded pixel values to the pattern generation apparatus. The rasterizer of the present invention is comprised primarily of a host processing means for fracturing and translating the file into one or more sub frames of pixels; geometry engines for rasterizing each sub frame; beam boards for providing the pixel shading values to a pattern generation system; a serial bus for coupling the host processor means to the geometry engines and beam boards and a pixel bus for coupling each of the geometry engines to each of the beam boards.
    Type: Grant
    Filed: November 22, 1994
    Date of Patent: July 2, 1996
    Assignee: ETEC Systems, Inc.
    Inventors: Robin L. Teitzel, Matthew J. Jolley, James B. Campbell, Richard K. George, John Wipfli
  • Patent number: 5412218
    Abstract: Spurious electrodynamic effects are reduced or eliminated by the use of a mechanically compact, low capacitance, geometrically symmetric, differentially-driven blanker assembly. This eliminates the need for internal cables or SMA-type launchers and has a solid metal electromechanical contact to system ground.
    Type: Grant
    Filed: February 26, 1993
    Date of Patent: May 2, 1995
    Assignee: ETEC Systems, Inc.
    Inventors: Mark A. Gesley, David H. Colby
  • Patent number: 5393987
    Abstract: A raster scan lithography system is modified so that the duration of illumination (dose modulation) for particular pixels is varied to lie between the full on and full off normally used. For instance, three levels of pixel intensity are provided, 100%, 70% and 30% (in addition to off which is 0%). The 30% and 70% pixels are used along the edge of a feature so as to locate the edge when written in between the lines of the cartesian raster scan grid. Thus the edges of the feature are moved off the grid, without the need for multiple passes. This pixel dose modulation uses three preset delay lines determining dwell times for each pixel on a pixel-by-pixel basis, as defined by a two (or more) bit deep memory file associated with the pattern to be written. Additionally, the pixel center locations are directly moved off the grid by deflecting the beam as it scans certain pixels located along feature edges. The amount of deflection is controllably variable to achieve various edge locations.
    Type: Grant
    Filed: May 28, 1993
    Date of Patent: February 28, 1995
    Assignee: ETEC Systems, Inc.
    Inventors: Frank E. Abboud, Andrew J. Muray, C. Neil Berglund
  • Patent number: 5386221
    Abstract: An improved laser pattern generation apparatus. The improved pattern generation apparatus of the present invention uses a laser beam to expose a radiant sensitive film on the workpiece to print circuit patterns on a substrate. The laser beam is aligned using a beam steering means. The laser beam is split into 32 beams to create a brush. The brush scans the workpiece through use of a rotating polygonal mirror. Each beam of the brush may have one of seventeen intensity values. The beams are modulated by an Acousto-Optical Modulator. Signals provided to the Acousto-Optical Modulator define the pattern to be generated. These signals are created by a rasterizer. Increased print speed is accomplished through the use of a wider brush and a print strategy that eliminates physical stage passes.
    Type: Grant
    Filed: November 2, 1992
    Date of Patent: January 31, 1995
    Assignee: Etec Systems, Inc.
    Inventors: Paul C. Allen, Matthew J. Jolley, Robin L. Teitzel, Michael Rieger, Michael Bohan, Timothy Thomas
  • Patent number: 5345085
    Abstract: A method of electronically measuring parameters of an beam in a raster scan system includes the steps of: choosing a predetermined pixel to be calibrated, moving a grid adjacent this pixel, strobing the beam, incrementally moving the beam toward an axis of the grid, and integrating the signal resulting from the beam as the beam moves toward the axis. The steps of strobing the beam, incrementally moving the beam, and integrating the signal are repeated until the beam crosses the axis. The value of the accumulated signals, provided for example by a charge amplifier, is used to determine the relative position of the axis of the grid. The value of the accumulated signals associated with another axis is also determined. The relative positions of the two axes determine the relative location of the grid. If the grid location is known, the location of an associated substrate which is typically adjacent the grid is also known.
    Type: Grant
    Filed: March 26, 1993
    Date of Patent: September 6, 1994
    Assignee: ETEC Systems, Inc.
    Inventor: Richard W. Prior
  • Patent number: 5327338
    Abstract: A direct-write lithography tool having improved alignment characteristics. The present invention discloses use of an optical alignment apparatus in a multi-beam lithography system. The optical alignment apparatus provides for alignment through a reduction lens utilized by the multi-beam lithography system for writing to semiconductor wafers and the like through use of optics for correction of distortion and curvature caused by viewing with a radiant energy beam of a different wavelength than the beams used for writing. Further, the alignment optics provide for multiple paths in a single optics system through use of liquid crystal retarders and beam splitters to direct the radiant energy beam through a selected optical path. In the present invention, a first optical path may provide for high magnification and a second for low magnification. Further, other optical paths may provide for bright or dark field illumination and viewing.
    Type: Grant
    Filed: November 9, 1992
    Date of Patent: July 5, 1994
    Assignee: ETEC Systems, Inc.
    Inventors: Paul Allen, Mike Bohan, Tim Thomas, Robin Teitzel
  • Patent number: 5304888
    Abstract: An improved electron or ion gun support structure includes a hollow cylinder for rigidly connecting the source assembly to the source-motion ring, with the source cathode and associated lens extending into the hollow portion of the cylinder. The gun is thus made very stable and less susceptible to outside vibrations.
    Type: Grant
    Filed: January 24, 1992
    Date of Patent: April 19, 1994
    Assignee: ETEC Systems, Inc.
    Inventors: Mark A. Gesley, Daniel B. DeBra
  • Patent number: 5276330
    Abstract: The accuracy of a double-deflection beam blanker is dramatically improved for all blanker voltages by using provided, closed-form, trajectory equations to determine the blanker geometric parameters and compensating for fringe-field effects in order to precisely determine the delay line length for control of an electron or ion beam. This delay line length is maintained by placing alignment apertures above and below the blanker.
    Type: Grant
    Filed: May 29, 1991
    Date of Patent: January 4, 1994
    Assignee: Etec Systems, Inc.
    Inventor: Mark Gesley
  • Patent number: 5255051
    Abstract: A method and apparatus for printing arbitrarily large circuit patterns using small field optics. The use of small field imaging optics allows the use of high NA lens designs capable of printing smaller geometries than otherwise would be possible. The field size in a first axis is extended by scanning an object and image past the lens; the field size in a second axis is extended by stitching the scans together in an overlapped fashion. This overlapped printing technique averages many random and systematic errors and allows the placement of field adjacencies within die boundaries. The effective field size of such a system is limited only by reticle size and stage mechanics. The apparatus further includes error correction loops for enhancing stage synchronization accuracy and for reducing field adjacency errors.
    Type: Grant
    Filed: January 5, 1993
    Date of Patent: October 19, 1993
    Assignee: Etec Systems, Inc.
    Inventor: Paul C. Allen
  • Patent number: 5246800
    Abstract: A method and apparatus for photolithographically fabricating features on a very large scale integrated circuit wafer by use of a phase shift mask defining discrete regions. This overcomes the problems of intensity nulls at the junction of regions formed by portions of the mask having opposite phase. The mask includes a transition region defining three phases which are assigned to pixels in the transition region, such that the phase assignment of the pixels is synthesized from an algorithm taking into account optical resolution and depth of focus. Each pixel is assigned one of three discrete phases, which thereby creates a transition region simulating a ramp between the two regions of opposite phases, such that intensity variation of the optical image corresponding to the transition region is minimized.
    Type: Grant
    Filed: September 12, 1991
    Date of Patent: September 21, 1993
    Assignee: Etec Systems, Inc.
    Inventor: Andrew J. Muray
  • Patent number: 5227839
    Abstract: A method and apparatus for printing arbitrarily large circuit patterns using small field optics. The use of small field imaging optics allows the use of high NA lens designs capable of printing smaller geometries than otherwise would be possible. The field size in a first axis is extended by scanning an object and image past the lens; the field size in a second axis is extended by stitching the scans together in an overlapped fashion. This overlapped printing technique averages many random and systematic errors and allows the placement of field adjacencies within die boundaries. The effective field size of such a system is limited only be reticle size and stage mechanics. The apparatus further includes error correction loops for enhancing stage synchronization accuracy and for reducing field adjacency errors.
    Type: Grant
    Filed: June 24, 1991
    Date of Patent: July 13, 1993
    Assignee: Etec Systems, Inc.
    Inventor: Paul C. Allen
  • Patent number: 5209402
    Abstract: A laminar flow diffuser has a plurality of round, thin, stacked plates. A central bore penetrates all the plates with the exception of the bottom plate. The diffuser is secured to the vacuum chamber port. When gas enters the port, it enters the central bore and then flows radially outward through the interplate spaces to the outer circumference of the plates and subsequently into the periphery of the chamber. The diffuser thereby provides a controlled laminar flow which prevents turbulence in the chamber and hence, reduces the possibility of contamination to the workpiece in the chamber. The laminar flow diffuser is easily cleaned, both during its initial assembly and later after use, because it chiefly has flat surfaces which do not harbor dirt or gas.
    Type: Grant
    Filed: May 24, 1991
    Date of Patent: May 11, 1993
    Assignee: Etec System, Inc.
    Inventors: Daniel B. DeBra, William A. Eckes
  • Patent number: 5196707
    Abstract: A field emission source is used in conjunction with a three element asymmetric lens system to provide an electron gun having greater magnitude beam currents focused on a smaller spot size than has been previously possible for intermediate energy beams. The three element asymmetric lens system has a lower spherical aberration than prior art electrostatic guns and a very low chromatic aberration coefficient, enabling precise focusing of beams with large currents and energy spreads. The electron gun produces high current densities in beam focused on small spot areas, despite the relatively large acceptance angle and energy spread of the source beams.
    Type: Grant
    Filed: March 4, 1991
    Date of Patent: March 23, 1993
    Assignee: Etec Systems, Inc.
    Inventor: Mark A. Gesley