Patents Assigned to Fluke Corporation
  • Patent number: 11815410
    Abstract: A temperature sensor includes a main body having a peripheral surface that extends along an axis between ends of the main body. A plurality of support structures are arranged along the main body and project from the peripheral surface of the main body transversely to the axis. A sleeve has a cavity defined by one or more sidewalls extending between first and second ends. The main body of the temperature sensor is positioned within the cavity. A platinum member having a length that extends along the main body is supported by a set of support structures of the plurality of support structures. In some cases, a seal member extends between the one or more sidewalls at the first end of the sleeve and seals the main body and the platinum member within the cavity. Measurement terminals may extend from the platinum member to an exterior of the temperature sensor.
    Type: Grant
    Filed: May 26, 2022
    Date of Patent: November 14, 2023
    Assignee: Fluke Corporation
    Inventors: Timothy B. Brown, Rong Ding, Donald D. Leach, David W. Farley
  • Patent number: 11768242
    Abstract: A test device for testing an electrical circuit includes input terminals connectable by test leads to different test points of the electrical circuit; at least first and second measurement circuits; switches; a processor; and a storage medium storing instructions that, when executed by the processor, cause the test device to perform a first test of the electrical circuit while one or more of the switches electrically couples at least first and second ones of the input terminals to the first measurement circuit, and perform a second test of the electrical circuit while one or more of the switches electrically couples at least third and fourth ones of the input terminals the second measurement circuit, where the first and second tests are performed without changing connections of the input terminals of the test device to the different test points of the electrical circuit.
    Type: Grant
    Filed: November 30, 2022
    Date of Patent: September 26, 2023
    Assignee: Fluke Corporation
    Inventor: Ulrich Boecherer
  • Patent number: 11762089
    Abstract: Acoustic imaging systems can include an acoustic sensing array, an electromagnetic imaging tool, a display, and an audio device. A processor can receive data from the acoustic sensor array and the electromagnetic imaging tool to generate a display image combining acoustic image data and electromagnetic image data. Systems can include an audio device that receives an audio output from the processor and outputs audio feedback signals to a user. The audio feedback signals can represent acoustic signals from an acoustic scene. Systems can provide a display image to a user including acoustic image data, and a user can select an acoustic signal for which to provide a corresponding audio output to an audio device. Audio outputs and display images can change dynamically in response to a change in pointing of the acoustic sensing array, such as by changing a stereo audio output.
    Type: Grant
    Filed: July 24, 2019
    Date of Patent: September 19, 2023
    Assignee: Fluke Corporation
    Inventors: Michael D. Stuart, Henk Koppelmans, Dileepa Prabhakar, Scott M. Tsukamaki, Darwin C. Witt
  • Patent number: 11735015
    Abstract: Systems, devices, and operating methods thereof provide for operation of a display based on detection of defined electrical conditions. Measurement devices may include a housing sized and shaped to be held in a hand, a set of sensor devices for sensing a set of electrical characteristics, processing circuitry, and a display supported by the housing. The measurement devices receive measurements obtained from the sensor devices and determine whether the measurements satisfy criteria for detecting defined electrical conditions in an element under test. Operating modes of the display having different corresponding illumination characteristics are controlled as a result of determining the presence of defined electrical conditions in the element under test.
    Type: Grant
    Filed: April 15, 2021
    Date of Patent: August 22, 2023
    Assignee: Fluke Corporation
    Inventors: Luis R. Silva, Brian Douglas Painting
  • Patent number: 11693033
    Abstract: One or more implementations of the present disclosure are directed to sensor probes of measurement systems for measuring a plurality of electrical parameters, (e.g., voltage, current) of a conductor and methods for measuring same. In at least one implementation, the sensor probe integrates a Rogowski coil and a non-contact voltage sensor that are arranged relative to each other such that when positioned to measure a conductor, such as a wire, the Rogowski coil and the non-contact voltage sensor are held in proper position for measurement.
    Type: Grant
    Filed: September 2, 2021
    Date of Patent: July 4, 2023
    Assignee: Fluke Corporation
    Inventors: Ronald Steuer, Ginger M. Woo, Gloria M. Chun, Simon J. Page
  • Patent number: 11662368
    Abstract: A sensor probe includes a body having first and second channels that are spaced apart and extend through the body approximately parallel to each other. A first end of a Rogowski coil is fixed within the first channel. The Rogowski coil passes through the second channel and loops back to the first channel where a second end of the Rogowski coil is selectively insertable into the first channel opposite the first end of the Rogowski coil. A non-contact sensor coupled to the body is positioned between the first and second channels to measure a parameter of an insulated conductor situated within the loop formed by the Rogowski coil. The size of an interior region within the loop is selectively adjustable by sliding movement of the Rogowski coil within the second channel.
    Type: Grant
    Filed: February 5, 2021
    Date of Patent: May 30, 2023
    Assignee: Fluke Corporation
    Inventors: Ginger M. Woo, Gloria M. Chun, Ricardo Rodriguez, Ronald Steuer
  • Patent number: 11641441
    Abstract: Thermal imaging systems can include an infrared camera module (200), a user interface (208), a processor (222), and a memory. The memory can include instructions to cause the processor (222) to perform a method upon a detected actuation from the user interface (208). The method can include performing a non-uniformity correction (1702) to reduce or eliminate fixed pattern noise from infrared image data from the infrared camera module (200). The method can include capturing infrared images (1704) at a plurality of times and register the captured images via a stabilization process (1706). The registered, non-uniformity corrected images can be used to perform a gas imaging process (1700). A processor (222) can be configured to compare an apparent background temperature in each of a plurality of regions of infrared image data to a target gas temperature. The processor (222) can determine if such regions lack sufficient contrast to reliably observe the target gas.
    Type: Grant
    Filed: May 23, 2019
    Date of Patent: May 2, 2023
    Assignee: Fluke Corporation
    Inventors: Matthew F. Schmidt, Kirk R. Johnson
  • Patent number: 11641536
    Abstract: A method and system for capturing and annotating measurement data includes communicatively connecting a mobile computing device to one or more measurement devices, and receiving measurement data from the one or more measurement devices. The mobile computing device stores the received measurement data and annotates the stored measurement data with metadata. The metadata includes group identifying information that associates the stored measurement data with other data having similar group identifying information. In at least one embodiment, measurement data is automatically associated with the group identifying information based on the measurement data being captured within a predetermined amount of time of each other or within a predetermined distance of each other as determined by a positioning system.
    Type: Grant
    Filed: March 14, 2014
    Date of Patent: May 2, 2023
    Assignee: Fluke Corporation
    Inventors: John Neeley, Bradey Honsinger, Tyler Bennett Evans, Joseph V. Ferrante
  • Patent number: 11638345
    Abstract: Feed forward compensation of parasitic capacitance in a device frontend is provided. A feed forward element is positioned along at least a portion of a length of a first input resistance and a distance away from the first input resistance. In some implementations, the feed forward element has a width that is increasing along the at least a portion of the length of the first input resistance. The feed forward element is operative to introduce an element capacitance that offsets a parasitic capacitance in a volume surrounding the first input resistance.
    Type: Grant
    Filed: April 5, 2021
    Date of Patent: April 25, 2023
    Assignee: Fluke Corporation
    Inventor: Jeffrey D. Graw
  • Patent number: 11635509
    Abstract: A radio frequency (RF) imaging device comprising a display receives a three-dimensional (3D) image that is a superposition of two or more images having different image types, which may include at least a 3D RF image of a space disposed behind a surface. A plurality of input control devices receive a user input for manipulating the display of the 3D image. Alternatively or additionally, the radio frequency (RF) imaging device may receive a three-dimensional (3D) image that is a weighted combination of a plurality of images, which may include a 3D RF image of a space disposed behind a surface, an infrared (IR) image of the surface, and a visible light image of the surface. A user input may specify changes to the weighted combination. In another embodiment, the RF imaging device may include an output device that produces a physical output indicating a detected type of material of an object in the space.
    Type: Grant
    Filed: October 26, 2020
    Date of Patent: April 25, 2023
    Assignee: Fluke Corporation
    Inventors: Mabood Ghazanfarpour, Brian Knight
  • Patent number: 11575409
    Abstract: A time-domain reflectometer and a distance measurement method for devices sharing a common bus are provided. The time-domain reflectometer determines a time when to transmit a first ranging signal over a cable based at least in part on when a device presents a first impedance on the cable that is lower than a second impedance of the cable. The time-domain reflectometer transmits the first ranging signal over the cable and in response to transmitting the first ranging signal, receives, over the cable, a first response signal having a peak associated with an impedance mismatch present on the cable resulting from the device presenting the first impedance on the cable. The time-domain reflectometer determines, based on the first response signal, a distance between the time-domain reflectometer and the device.
    Type: Grant
    Filed: October 5, 2020
    Date of Patent: February 7, 2023
    Assignee: Fluke Corporation
    Inventor: John Paul Hittel
  • Patent number: 11552460
    Abstract: An electrical panel adapter for an enclosure that is formed of at least one panel includes a main unit having a front portion and a rear portion. The rear portion is positioned inside the enclosure and includes a first plurality of electrical connections adapted to connect to electrical wires and/or equipment located inside the enclosure. The front portion extends through an aperture in the at least one panel and includes a second plurality of electrical connections adapted to connect to one or more electrical devices located outside the enclosure for measurement of both voltage and current inside the enclosure. The second plurality of electrical connections are electrically coupled to the first plurality of electrical connections. The electrical panel adapter enables electrical devices outside the enclosure to be electrically coupled to the electrical wires and/or equipment inside the enclosure without requiring the enclosure to be opened.
    Type: Grant
    Filed: June 17, 2019
    Date of Patent: January 10, 2023
    Assignee: Fluke Corporation
    Inventors: Ferdinand Y. Laurino, Carley Nicole McCutchen, Hilton G. Hammond, Alois Sommer, Stefan Hidegh, Paul Kral
  • Patent number: 11525881
    Abstract: A method and apparatus for calibrating an impedance measurement device are provided. The impedance measurement device outputs a first AC signal to a phase-locked current generator. The phase-locked current generator generates a second AC signal having a phase that is locked to a phase of the first AC signal and having an amplitude that is representative of a presented impedance having a known impedance value. The phase-locked current generator outputs the second AC signal to the impedance measurement device. The impedance measurement device performs an impedance measurement based on the second AC signal to produce a measured impedance value associated with the presented impedance. The impedance measurement device is calibrated based on the measured impedance value and the known impedance value of the presented impedance.
    Type: Grant
    Filed: August 17, 2021
    Date of Patent: December 13, 2022
    Assignee: Fluke Corporation
    Inventors: Liangzhu Chen, Songnan Fan, Lianqun Wu, Milen Todorakev, Jeff Gust
  • Patent number: 11513140
    Abstract: A sensor probe includes a body, a sleeve that is moveable along the body between open and closed positions, a clamp having first and second jaws that contain an interior region within the clamp, and a non-contact sensor coupled to the sleeve and positioned at or near a perimeter of the interior region within the clamp. When the sleeve is in the open position, the first and second jaws create a gap that allows an insulated conductor to pass into the interior region within the clamp. When the sleeve is in the closed position, the first and second jaws close the gap and thereby close the interior region within the clamp. The size of the interior region is reduced when the sleeve is moved toward the closed position. The non-contact sensor is configured to detect an electrical parameter of the insulated conductor without requiring galvanic contact with the conductor.
    Type: Grant
    Filed: February 5, 2021
    Date of Patent: November 29, 2022
    Assignee: Fluke Corporation
    Inventors: Ginger M. Woo, Gloria M. Chun, Ricardo Rodriguez
  • Patent number: D966120
    Type: Grant
    Filed: September 15, 2020
    Date of Patent: October 11, 2022
    Assignee: Fluke Corporation
    Inventor: Jeffrey M. Elrod
  • Patent number: D973522
    Type: Grant
    Filed: February 23, 2021
    Date of Patent: December 27, 2022
    Assignee: Fluke Corporation
    Inventors: Charles E. Marzette, Jr., Tracy J. Kearsley
  • Patent number: D986079
    Type: Grant
    Filed: May 27, 2021
    Date of Patent: May 16, 2023
    Assignee: Fluke Corporation
    Inventor: Wei Liu
  • Patent number: D993054
    Type: Grant
    Filed: November 16, 2021
    Date of Patent: July 25, 2023
    Assignee: Fluke Corporation
    Inventors: Ginger M. Woo, Christopher D. Corrigan, Brian S. Aikins, Jeffrey E. Worones
  • Patent number: D995447
    Type: Grant
    Filed: March 23, 2021
    Date of Patent: August 15, 2023
    Assignee: Fluke Corporation
    Inventors: Ferdinand Y. Laurino, Carley Nicole McCutchen, Hilton G. Hammond
  • Patent number: D1000453
    Type: Grant
    Filed: April 6, 2021
    Date of Patent: October 3, 2023
    Assignee: Fluke Corporation
    Inventors: Wayne S. Hoofnagle, J. David Schell, Jamie M. Martin