Patents Assigned to Fluke Corporation
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Patent number: 10605832Abstract: Systems and methods for measuring alternating current (AC) voltage of an insulated conductor are provided, without requiring a galvanic connection between the conductor and a test electrode. A non-galvanic contact voltage measurement device includes a conductive sensor, an internal ground guard, and a reference shield. A reference voltage source is electrically coupleable between the guard and the reference shield to generate an AC reference voltage which causes a reference current to pass through the conductive sensor. Sensor subsystems may be arranged in layers (e.g., stacked layers, nested layers, or components) of conductors and insulators. The sensor subsystems may be packaged as formed sheets, flexible circuits, integrated circuit (IC) chips, nested components, printed circuit boards (PCBs), etc. The sensor subsystems may be electrically coupled to suitable processing or control circuitry of a non-contact voltage measurement device to allow for measurement of voltages in insulated conductors.Type: GrantFiled: September 5, 2017Date of Patent: March 31, 2020Assignee: Fluke CorporationInventors: David L. Epperson, Ronald Steuer, Jeffrey Worones, Patrick Scott Hunter, Ricardo Rodriguez
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Patent number: 10602082Abstract: Systems can include a test and measurement tool configured to generate measurement data, and imaging tool configured to generate image data, and a processor in communication with the imaging tool and the test and measurement tool. The processor can be configured to receive image data from the imaging tool and, if the image data satisfies one or more predetermined conditions, trigger the test and measurement tool to perform one or more corresponding operations. Similarly, the processor can receive measurement data from the test and measurement tool and, if the measurement data satisfies one or more predetermined conditions trigger the imaging tool to perform one or more corresponding operations.Type: GrantFiled: September 16, 2015Date of Patent: March 24, 2020Assignee: Fluke CorporationInventors: Michael D. Stuart, Paul H. Heydron, Joseph V. Ferrante, Michael A. Schoch, Hilton G. Hammond
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Patent number: 10591366Abstract: Generally described, embodiments are directed to a temperature calibration system that includes a closed fluidic system and a cooling assembly configured to remove heat from the closed fluidic system. The cooling assembly is configured to move between a coupled position, in which the cooling assembly is thermally coupled to (e.g., abutting) a condenser of the closed fluidic system, and a decoupled position, in which the cooling assembly is thermally decoupled (e.g., spaced apart) from the condenser of the closed fluidic system. In at least one embodiment, while in the decoupled position, components of the cooling assembly may be protected from damage that may occur at elevated temperatures.Type: GrantFiled: August 3, 2017Date of Patent: March 17, 2020Assignee: Fluke CorporationInventor: David W. Farley
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Patent number: 10591515Abstract: Systems and methods provide a non-contact current measurement system which operates to measure alternating current flowing through an insulated wire without requiring galvanic contact with the insulated wire. The measurement system may include a magnetic field sensor that is selectively positionable proximate an insulated wire under test. In operation the magnetic field sensor detects a magnetic field generated by the current flowing in the insulated wire. Using an adjustable clamp assembly, the measurement system provides control over the mechanical positioning of the insulated wire relative to the magnetic field sensor to ensure consistent measurements. The non-contact current measurement system may determine information relating to the physical dimensions (e.g., diameter) of the insulated wire.Type: GrantFiled: May 24, 2017Date of Patent: March 17, 2020Assignee: Fluke CorporationInventors: Ricardo Rodriguez, David L. Epperson, Ronald Steuer, Jeffrey Worones
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Patent number: 10585203Abstract: A radio frequency (RF) imaging device comprises a position sensor, an optical sensor, a processor, and an output. The position sensor determines a position of the RF imaging device relative to a surface. The optical sensor captures optical image data representing an optical image of an area of the surface. The optical image data is associated with position data representing a position relative to the surface derived from the determined position of the RF imaging device. The derived position data corresponds to the area of the surface imaged by the optical sensor. The processor produces a composite image in which one or more portions of the optical image data are simultaneously viewable with RF image data representing an RF image of a space behind the surface at the same position as the optical image data. The output displays the composite image. The output may be a projector.Type: GrantFiled: April 28, 2016Date of Patent: March 10, 2020Assignee: Fluke CorporationInventors: Jamie Rhead, Paul H. Heydron, Christopher D. Corrigan, Luis R. Silva, Matthew D. Rabdau
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Patent number: 10586319Abstract: Systems and methods can be used for analyzing image data to determine an amount of vibration and/or misalignment in an object under analysis. In some instances, as operating equipment heats up during operation, temperature changes of various portions of the operating equipment leads to changes in dimensions of such portions, leading to misalignment. Multiple sets of data representative of the operating equipment in multiple operating conditions can be used to determine an amount of misalignment due to thermal offsets. Hot and cold temperatures of the equipment can be used to calculate thermal growth of various portions of the equipment, which can be used to determine an amount a misalignment due to thermal offsets. Additionally or alternatively, image data representing the equipment can be used to observe changes in alignment between states.Type: GrantFiled: October 24, 2016Date of Patent: March 10, 2020Assignee: Fluke CorporationInventors: Michael D. Stuart, John C. Bernet
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Patent number: 10578516Abstract: One or more embodiments are directed to optical test instruments, such as fiber optic inspection scopes and optical power meters, for testing optical communication links, such as fiber optic connectors. The optical test instruments include a single test port that is able to operate in two modes of operation. In a first mode of operation, the optical test instrument is configured to provide an image of the endface of a fiber optic connector under test. In a second mode of operation, the optical test instrument is configured to measure power or power loss in an optical fiber under test. In that regard, the fiber optic connector only has to be coupled to a single port of an optical test instrument for a visual inspection of an endface of a fiber optic connector and a power test of the optical fiber under test.Type: GrantFiled: April 2, 2018Date of Patent: March 3, 2020Assignee: Fluke CorporationInventors: J. David Schell, Richard G. Tyler
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Patent number: 10578479Abstract: Systems and methods that provide measurement of liquid levels in a container, such as a calibration bath container, may utilize an acoustic transducer subsystem that includes one or more acoustic transducers that are controlled by a controller. The acoustic transducer subsystem emits acoustic signals toward a surface of a liquid in a container, and detects reflected acoustic signals that are reflected from the surface of the liquid. The liquid level sensor utilizes an acoustic waveguide subsystem to allow the acoustic transducer subsystem to be spaced apart from the liquid, which protects the acoustic transducer system another other components from damage due to heat, liquid, and vapor. The acoustic waveguide subsystem also channels the emitted and reflected acoustic signals to prevent substantial scattering of the signals within the container, which greatly improves the accuracy of the liquid level sensor.Type: GrantFiled: August 9, 2017Date of Patent: March 3, 2020Assignee: Fluke CorporationInventor: Richard W. Walker
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Patent number: 10571591Abstract: A radio frequency (RF) imaging device comprises an optical position sensor, an RF sensor assembly, a processor, and a memory. The optical position sensor captures an optical image of a field of view and outputs data representing the optical image. The RF sensor assembly is disposed at a first position and receives an RF signal for capturing an RF image of a portion of a space disposed behind a surface at the first position and outputs data representing the RF signal. The processor receives the data representing the optical image and the RF signal, and determines that an optical signature of a reference marker is present in the optical image. If the optical signature is present in the optical image, the processor defines the first position of the RF assembly as a reference position. The memory stores the data representing the RF signal in association with the reference position.Type: GrantFiled: April 28, 2016Date of Patent: February 25, 2020Assignee: Fluke CorporationInventors: Jamie Rhead, Paul H. Heydron, Christopher D. Corrigan, Nikola Mrvaljevic, Matthew F. Schmidt
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Patent number: 10564116Abstract: A radio frequency (RF) imaging device comprises a position sensor, an RF sensor assembly, an optical sensor, a processor, and a memory. The position sensor determines a position of the RF imaging device relative to a surface. The RF sensor assembly captures RF image data representing an RF image of a portion of a space behind the surface at the determined position. The optical sensor captures optical image data representing an optical image of the surface at the determined position. The processor produces a composite image in which at least one or more portions of the RF image and one or more portions of the optical image that correspond to the same position relative to the surface are simultaneously viewable. The RF image data and the optical image data are stored in the memory in association with position data derived from the determined position of the RF imaging device.Type: GrantFiled: April 28, 2016Date of Patent: February 18, 2020Assignee: Fluke CorporationInventors: Jamie Rhead, Paul H. Heydron, Christopher D. Corrigan, Brian Knight, Nikola Mrvaljevic, Luis R. Silva, Matthew F. Schmidt
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Patent number: 10557869Abstract: A clamp meter includes a meter body and a clamp jaw assembly mounted to the meter body. The clamp jaw assembly includes a first clamp jaw and a second clamp jaw that are movable in relation to each other between a closed position and an open position. In the closed position, distal ends of the first and second clamp jaws meet to define an enclosed area between the first and second clamp jaws, and in the open position, the distal ends of the first and second clamp jaws separate from each other to define a gap allowing a wire under test to pass therethrough. The clamp meter further includes a locking slider positioned within a slot inside the meter body. A switch assembly moves the locking slider longitudinally within the slot between locked and unlocked positions. In the locked position, the locking slider blocks the first clamp jaw from movement.Type: GrantFiled: October 29, 2018Date of Patent: February 11, 2020Assignee: Fluke CorporationInventors: Fang Li, Jinbo He, Chris Lagerberg
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Patent number: 10557875Abstract: Systems and methods for measuring AC voltage of an insulated conductor are provided, without requiring a galvanic connection between the conductor and a test electrode. A non-galvanic contact voltage measurement system includes a sensor subsystem, an internal ground guard and a reference shield. A common mode reference voltage source is electrically coupled between the internal ground guard and the reference shield to generate an AC reference voltage which causes a reference current to pass through the conductive sensor. Control circuitry receives a signal indicative of current flowing through the sensor subsystem due to the AC reference voltage and the AC voltage in the insulated conductor, and determines the AC voltage in the insulated conductor based at least in part on the received signal. The sensor subsystem includes a plurality of sensors that are polled to compensate for conductor position while allowing for measurement of physical characteristics of the conductor.Type: GrantFiled: May 9, 2018Date of Patent: February 11, 2020Assignee: Fluke CorporationInventors: Ronald Steuer, Ricardo Rodriguez
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Patent number: 10551416Abstract: Systems and methods for measuring AC voltage of an insulated conductor are provided, without requiring a galvanic connection between the conductor and a test electrode or probe. A non-galvanic contact (or “non-contact”) voltage measurement system includes a sensor subsystem, an internal ground guard and a reference shield. A common mode reference voltage source is electrically coupled between the internal ground guard and the reference shield to generate an AC reference voltage which causes a reference current to pass through the conductive sensor. Control circuitry receives a signal indicative of current flowing through the sensor subsystem due to the AC reference voltage and the AC voltage in the insulated conductor, and determines the AC voltage in the insulated conductor based at least in part on the received signal. The sensor subsystem includes at least two independent sensors that are used to compensate for conductor position while improving accuracy and dynamic range.Type: GrantFiled: May 9, 2018Date of Patent: February 4, 2020Assignee: Fluke CorporationInventors: Ronald Steuer, Ricardo Rodriguez
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Patent number: 10541747Abstract: An integrating sphere-equipped optical measurement device and optical connector polarity and type identification and loss measurement are provided. The optical measurement device receives one or more optical signals that respectively emanate from one or more optical fibers of a plurality of optical fibers of an optical fiber cable. The optical measurement device determines one or more respective positions where the one or more optical signals impinged on a sensor. The optical measurement device determines based on the one or more positions, one or more receiving positions of the one or more optical signals, respectively. The optical measurement device determines a polarity of the optical fiber cable based on both the one or more receiving positions and one or more or transmitting positions of the one or more optical signals, respectively.Type: GrantFiled: June 18, 2019Date of Patent: January 21, 2020Assignee: Fluke CorporationInventors: J. David Schell, Seymour Goldstein, Piotr Anatolij Levin
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Patent number: 10539643Abstract: Systems and methods that provide a portable, verified voltage source that allows safe testing of separate contact and non-contact voltage measurement devices. A proving unit of the present disclosure selectively provides a known or specified direct current (DC) voltage, a contact alternating current (AC) voltage, and a non-contact AC voltage, which voltages may be fixed or may be user-selectable. The proving unit may include a visual indicator and/or an audible indicator that provides the user with an indication confirming that the proving unit is supplying the selected output voltage within the specifications of the proving unit, so the user will know that the proving unit is operating normally and is ready for testing the operation of a contact or non-contact voltage measurement device. If the proving unit cannot provide the specified voltage output, the indicator(s) provides a signal to the user that the proving unit is currently non-functional.Type: GrantFiled: September 1, 2017Date of Patent: January 21, 2020Assignee: FLUKE CORPORATIONInventor: Clark N. Huber
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Patent number: 10534026Abstract: Systems and methods that measure electrical parameters of a multi-phase electrical system may utilize a multi-phase measurement device that includes a sensor subsystem that has a voltage sensor and a current sensor. Each of the voltage sensor and the current sensor may be a contact-type sensor or a “non-contact” sensor that does not require galvanic contact. In operation, a multi-phase measurement device may utilize the voltage sensor and the current sensor to sequentially obtain single phase measurements for each phase of a multi-phase electrical system. The measurements may be synchronized to obtain various multi-phase power parameters, such as various parameters relating to power, phase, voltage, current, etc. The multi-phase measurement device may be operative to automatically detect when an operator has positioned a sensor of the sensor subsystem proximate a conductor under test so the multi-phase measurement device can initiate detection of one or more electrical parameters in the conductor.Type: GrantFiled: September 6, 2017Date of Patent: January 14, 2020Assignee: FLUKE CORPORATIONInventors: Ronald Steuer, Peter Radda
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Patent number: D874544Type: GrantFiled: May 4, 2018Date of Patent: February 4, 2020Assignee: Fluke CorporationInventors: Charles E. Marzette, Jr., Timothy J. Kesti
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Patent number: D875157Type: GrantFiled: March 29, 2018Date of Patent: February 11, 2020Assignee: Fluke CorporationInventors: Ferdinand Y. Laurino, Aaron Laho
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Patent number: D875580Type: GrantFiled: April 12, 2019Date of Patent: February 18, 2020Assignee: Fluke CorporationInventor: Wei Huang
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Patent number: D877634Type: GrantFiled: April 12, 2019Date of Patent: March 10, 2020Assignee: Fluke CorporationInventors: Paul A. Richer, Brian S. Aikins, Ferdinand Y. Laurino