Patents Assigned to Fujitsu Semiconductor Limited
  • Publication number: 20200035273
    Abstract: A first pre-sense amplifier connected to reference cells that hold data of logical value “1” via a first bit line outputs a signal that is obtained by delaying a first amplified signal that is obtained by amplifying a voltage of the first bit line when a memory cell is read. A second pre-sense amplifier connected to memory cells via a second bit line generates a second amplified signal by amplifying a voltage of the second bit line when a memory cell is read. The second pre-sense amplifier receives a signal. When a voltage of the signal reaches a threshold or more, the second pre-sense amplifier drops the voltage of the second bit line to a ground potential.
    Type: Application
    Filed: July 12, 2019
    Publication date: January 30, 2020
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventor: Keizo Morita
  • Patent number: 10546773
    Abstract: A multilayer wiring in a semiconductor device includes a first lower wiring formed in a first insulating layer, a via which is formed in a second insulating layer over the first insulating layer and which is connected to the first lower wiring, and an upper wiring connected to the via. The upper wiring has an outer edge at which a nick portion is formed beside a portion of the upper wiring to which the via is connected. The formation of the nick portion at the outer edge of the upper wiring prevents the via from enlarging.
    Type: Grant
    Filed: March 13, 2018
    Date of Patent: January 28, 2020
    Assignee: FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Yasunori Uchino, Kenichi Watanabe
  • Publication number: 20190385905
    Abstract: A multilayer wiring in a semiconductor device includes a first lower wiring formed in a first insulating layer, a via which is formed in a second insulating layer over the first insulating layer and which is connected to the first lower wiring, and an upper wiring connected to the via. The upper wiring has an outer edge at which a nick portion is formed beside a portion of the upper wiring to which the via is connected. The formation of the nick portion at the outer edge of the upper wiring prevents the via from enlarging.
    Type: Application
    Filed: August 27, 2019
    Publication date: December 19, 2019
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Yasunori Uchino, Kenichi Watanabe
  • Patent number: 10510824
    Abstract: A semiconductor device includes as a resistance element a first polycrystalline silicon and a second polycrystalline silicon containing impurities, such as boron, of the same kind and having different widths. The first polycrystalline silicon contains the impurities at a concentration CX. The second polycrystalline silicon has a width larger than a width of the first polycrystalline silicon and contains the impurities of the same kind at a concentration CY lower than the concentration CX. A sign of a temperature coefficient of resistance (TCR) of the first polycrystalline silicon changes at the concentration CX. A sign of a TCR of the second polycrystalline silicon changes at the concentration CY.
    Type: Grant
    Filed: May 30, 2018
    Date of Patent: December 17, 2019
    Assignee: Mie Fujitsu Semiconductor Limited
    Inventors: Taiji Ema, Nobuhiro Misawa, Kazuyuki Kumeno, Makoto Yasuda
  • Publication number: 20190371419
    Abstract: A control circuit controls a column decoder and a row decoder to perform reprogramming where, before the count of reprogramming operations involving erasures, each targeting one of a plurality of memory cells included in a memory cell array, reaches a predetermined number, a first extent (e.g. a sub-block) including the targeted memory cell and being smaller than the entire extent of the memory cell array is used as the unit of reprogramming, and when the count of reprogramming operations reaches the predetermined number, a second extent (e.g. the memory cell array corresponding to one sector) including the targeted memory cell and being larger than the first extent is used as the unit of reprogramming, and resets the count of reprogramming operations each time it reaches the predetermined number.
    Type: Application
    Filed: May 2, 2019
    Publication date: December 5, 2019
    Applicant: MIE FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Taiji Ema, Makoto Yasuda
  • Publication number: 20190363195
    Abstract: A semiconductor device includes a gate insulator layer above a semiconductor substrate, a gate electrode above the gate insulating layer, a sidewall insulator layer on sidewalls of the gate electrode and above the substrate, source and drain regions within the substrate on both sides of the gate electrode, a first region within the substrate below a part of the sidewall insulator layer closer to the source region and having an impurity concentration lower than the source region, a second region provided within the substrate below a part of the sidewall insulator layer closer to the drain region and having an impurity concentration lower than the drain region, a channel region provided within the substrate between the first and second regions, and a third region within the substrate below the channel region and including impurities of a different type and having an impurity concentration higher than the channel region.
    Type: Application
    Filed: February 12, 2019
    Publication date: November 28, 2019
    Applicant: MIE FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Taiji Ema, Makoto Yasuda
  • Publication number: 20190333580
    Abstract: A nonvolatile semiconductor memory device includes a selection transistor and a memory transistor that are formed on a well for each of a plurality of memory cells. At a time of a data read from the memory transistor, a first voltage is applied to the well and a source of the memory transistor, and a second voltage is applied to a gate of the selection transistor included in a non-selected memory cell among the plurality of memory cells. The first voltage is smaller than an absolute value of the second voltage.
    Type: Application
    Filed: January 31, 2019
    Publication date: October 31, 2019
    Applicant: MIE FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Satoshi Torii, Shu Ishihara
  • Publication number: 20190326385
    Abstract: A semiconductor device includes as a resistance element a first polycrystalline silicon and a second polycrystalline silicon containing impurities, such as boron, of the same kind and having different widths. The first polycrystalline silicon contains the impurities at a concentration CX. The second polycrystalline silicon has a width larger than a width of the first polycrystalline silicon and contains the impurities of the same kind at a concentration CY lower than the concentration CX. A sign of a temperature coefficient of resistance (TCR) of the first polycrystalline silicon changes at the concentration CX. A sign of a TCR of the second polycrystalline silicon changes at the concentration CY.
    Type: Application
    Filed: July 2, 2019
    Publication date: October 24, 2019
    Applicant: MIE FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Taiji Ema, Nobuhiro Misawa, Kazuyuki Kumeno, Makoto Yasudo
  • Publication number: 20190326386
    Abstract: A semiconductor device includes as a resistance element a first polycrystalline silicon and a second polycrystalline silicon containing impurities, such as boron, of the same kind and having different widths. The first polycrystalline silicon contains the impurities at a concentration CX. The second polycrystalline silicon has a width larger than a width of the first polycrystalline silicon and contains the impurities of the same kind at a concentration CY lower than the concentration CX. A sign of a temperature coefficient of resistance (TCR) of the first polycrystalline silicon changes at the concentration CX. A sign of a TCR of the second polycrystalline silicon changes at the concentration CY.
    Type: Application
    Filed: July 2, 2019
    Publication date: October 24, 2019
    Applicant: MIE FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Taiji Ema, Nobuhiro Misawa, Kazuyuki Kumeno, Makoto Yasudo
  • Patent number: 10432107
    Abstract: A rectifier circuit including a switch element, controls connection and disconnection of an AC input voltage using the switch element to generate an output voltage. The switch element includes an n-channel MOS transistor. The rectifier circuit further includes a booster circuit and a control signal generation unit, and establishes connection to the switch element at a peak portion of the input voltage. The booster circuit is configured to generate and apply a gate control signal including a voltage higher than a threshold voltage of the n-channel MOS transistor to a gate of the n-channel MOS transistor. The control signal generation unit is configured to generate and output a control signal for controlling connection and disconnection of the n-channel MOS transistor to the booster circuit.
    Type: Grant
    Filed: February 6, 2018
    Date of Patent: October 1, 2019
    Assignee: FUJITSU SEMICONDUCTOR LIMITED
    Inventor: Satoshi Yamada
  • Publication number: 20190267320
    Abstract: There is provided a semiconductor device including a memory region and a logic region. The memory region includes a transistor (memory transistor) that stores information by accumulating charge in a sidewall insulating film. The width of the sidewall insulating film of the memory transistor included in the memory region is made larger than the width of a sidewall insulating film of a transistor (logic transistor) included in the logic region.
    Type: Application
    Filed: May 10, 2019
    Publication date: August 29, 2019
    Applicant: MIE FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Taiji Ema, Makoto Yasuda, Kazuhiro Mizutani
  • Patent number: 10373952
    Abstract: A semiconductor device includes first and second transistors connected to the same power supply. Each of the first and second transistors includes, under a channel region of a low concentration provided between a source region and a drain region of a first conductivity type, an impurity region of a second conductivity type having a higher concentration. The thickness of the gate insulating film in one of the first and second transistors is made larger than the thickness of the gate insulating film in the other one.
    Type: Grant
    Filed: February 12, 2016
    Date of Patent: August 6, 2019
    Assignee: MIE FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Taiji Ema, Makoto Yasuda, Kazushi Fujita
  • Publication number: 20190237473
    Abstract: A semiconductor device is disclosed. A gate electrode is provided above a semiconductor substrate. A sidewall insulation film is provided to the gate electrode. Source and drain regions are provided in the substrate and contain first conductive impurities. A first semiconductor region is provided in the substrate, is on a source region side, and has a concentration of the first conductive impurities lower than the source region. A second semiconductor region is provided in the substrate, is on a drain region side, and has a concentration of the first conductive impurities lower than the drain and first semiconductor regions. A channel region is provided between the first and second semiconductor regions. A third semiconductor region is provided under the channel region, and includes second conductive impurities higher in concentration than the channel region. Information is stored by accumulating charges in the sidewall insulation film.
    Type: Application
    Filed: November 27, 2018
    Publication date: August 1, 2019
    Applicant: MIE FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Taiji Ema, Makoto Yasuda
  • Publication number: 20190237471
    Abstract: A semiconductor device includes a substrate; a transistor formed on a surface of the substrate; a first insulating film formed above the transistor; a second semiconductor film formed on the first semiconductor film; a third semiconductor film formed on the second semiconductor film; a fourth semiconductor film formed on the third semiconductor film; and a ferroelectric capacitor formed on the fourth insulating film, wherein a hydrogen permeability of the third insulating film is higher than a hydrogen permeability of the first insulating film, and a hydrogen permeability and an oxygen permeability of the second insulating film and of the fourth insulating film are higher than the hydrogen permeability and an oxygen permeability of the first insulating film and of the third insulating film.
    Type: Application
    Filed: January 3, 2019
    Publication date: August 1, 2019
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Kouichi Nagai, Ko Nakamura, Mitsuhiro Nakamura, Akio Ito
  • Patent number: 10360415
    Abstract: A radio communication processor receives data to which identification information is assigned and transmits a response signal indicative of whether or not application processing based on the data is normally performed. An application controller controls the application processing on the basis of the data and detects whether or not the application processing is normally performed. A controller detects on the basis of the identification information that the same data are received in succession due to retransmission, nullifies, when the application controller detects that the application processing based on the data received earlier is normally performed, control of the application processing based on the data received later to be performed by the application controller and instructs the radio communication processor to transmit the response signal which indicates that the application processing is normally performed.
    Type: Grant
    Filed: July 16, 2018
    Date of Patent: July 23, 2019
    Assignee: FUJITSU SEMICONDUCTOR LIMITED
    Inventor: Takahiko Sato
  • Patent number: 10354953
    Abstract: There is provided a semiconductor device including a memory region and a logic region. The memory region includes a transistor (memory transistor) that stores information by accumulating charge in a sidewall insulating film. The width of the sidewall insulating film of the memory transistor included in the memory region is made larger than the width of a sidewall insulating film of a transistor (logic transistor) included in the logic region.
    Type: Grant
    Filed: May 31, 2018
    Date of Patent: July 16, 2019
    Assignee: MIE FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Taiji Ema, Makoto Yasuda, Kazuhiro Mizutani
  • Patent number: 10331602
    Abstract: A semiconductor integrated circuit includes a bus signal line and a test signal line arranged adjacent to the bus signal line. The semiconductor integrated circuit has a system mode, which is an operation mode that uses the bus signal line, and a scan mode, which is an operation mode that uses the test signal line. The semiconductor integrated circuit fixes the logic level of the test signal line adjacent to the bus signal line in the system mode that uses the bus signal line. The semiconductor integrated circuit fixes the logic level of the bus signal line adjacent to the test signal line in the scan mode that uses the test signal line.
    Type: Grant
    Filed: March 3, 2017
    Date of Patent: June 25, 2019
    Assignee: MEI FUJITSU SEMICONDUCTOR LIMITED
    Inventor: Seiji Goto
  • Patent number: 10325986
    Abstract: An advanced transistor with punch through suppression includes a gate with length Lg, a well doped to have a first concentration of a dopant, and a screening region positioned under the gate and having a second concentration of dopant. The second concentration of dopant may be greater than 5×1018 dopant atoms per cm3. At least one punch through suppression region is disposed under the gate between the screening region and the well. The punch through suppression region has a third concentration of a dopant intermediate between the first concentration and the second concentration of dopant. A bias voltage may be applied to the well region to adjust a threshold voltage of the transistor.
    Type: Grant
    Filed: October 20, 2016
    Date of Patent: June 18, 2019
    Assignee: MIE FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Lucian Shifren, Pushkar Ranade, Paul E. Gregory, Sachin R. Sonkusale, Weimin Zhang, Scott E. Thompson
  • Patent number: 10269813
    Abstract: A method of manufacturing a semiconductor device includes: forming an insulating film above a semiconductor substrate; forming a conductive film on the insulating film; forming a dielectric film on the conductive film; forming a plurality of upper electrodes at intervals on the dielectric film; forming a first protective insulating film on the upper electrodes and the dielectric film by a sputtering method; forming a second protective insulating film on the first protective insulating film by an atomic layer deposition method, thereby filling gaps of a grain boundary of the dielectric film with the second protective insulating film; and patterning the conductive film after the second protective insulating film is formed to provide a lower electrode.
    Type: Grant
    Filed: February 1, 2018
    Date of Patent: April 23, 2019
    Assignee: FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Youichi Okita, Hideki Ito, Wensheng Wang
  • Patent number: 10268609
    Abstract: A resource management and task allocation controller for installation in a multicore processor having a plurality of interconnected processor elements providing resources for processing executable transactions, at least one of said elements being a master processing unit, the controller being adapted to communicate, when installed, with each of the processor elements including the master processing unit, and comprising control logic for allocating executable transactions within the multicore processor to particular processor elements in accordance with pre-defined allocation parameters.
    Type: Grant
    Filed: August 12, 2013
    Date of Patent: April 23, 2019
    Assignees: Synopsys, Inc., Fujitsu Semiconductor Limited
    Inventor: Mark David Lippett