Abstract: A device (1) for examining an eye, in particular a slit lamp, comprises an image recording unit (220) with at least one first sensor (241.1) in a first beam path and a second sensor (241.2) in a second beam path, the device also comprising in the first beam path a first objective with a first optical axis, which has a fixed magnification and is arranged as fixed in the first beam path.

Abstract: In a method for calibrating an interferometer (100) having a beam path for a measuring beam (112), wherein at least one plane (320) that at least partially reflects the measuring beam (112) has been introduced into the beam path, and wherein a normal to a first plane (320) is inclined at a first angle to a measuring beam (112) incident on the first plane (320), the following steps are carried out: interferometric measurement of a first axial spacing of a first point on the first plane (320) with the measuring beam (112), and interferometric measurement of a second axial spacing of a second point on one of the at least one plane (320) with the measuring beam (112), wherein the second point is spaced apart from the first point.

Abstract: In a method for interferometrically capturing measurement points of a region of an eye, a plurality of measurement points are captured by a measurement beam along a trajectory, wherein the same trajectory is passed over by the measurement beam in the region during at least a first iteration and a second iteration. The trajectory of the first iteration is rotated through an angle and/or displaced by a distance in relation to the trajectory of the second iteration in order to obtain a more homogeneous measurement point distribution.

Abstract: In a method for interferometrically capturing measurement points of a region of an eye, a plurality of measurement points are captured by a measurement beam along a trajectory, wherein the same trajectory is passed over by the measurement beam in the region during at least a first iteration and a second iteration. The trajectory of the first iteration is rotated through an angle and/or displaced by a distance in relation to the trajectory of the second iteration in order to obtain a more homogeneous measurement point distribution.

Abstract: In a method for calibrating an interferometer (100) having a beam path for a measuring beam (112), wherein at least one plane (320) that at least partially reflects the measuring beam (112) has been introduced into the beam path, and wherein a normal to a first plane (320) is inclined at a first angle to a measuring beam (112) incident on the first plane (320), the following steps are carried out: interferometric measurement of a first axial spacing of a first point on the first plane (320) with the measuring beam (112), and interferometric measurement of a second axial spacing of a second point on one of the at least one plane (320) with the measuring beam (112), wherein the second point is spaced apart from the first point.

Abstract: An adapter (60) for an apparatus (50) for measuring a first property of an eye is attachable to the apparatus (50), wherein, when the adapter (60) is attached to the apparatus (50), a second additional property of the eye is measurable.

Abstract: In a method for registering measurement points on a body, in particular on an eye, measurement points are registered along a trajectory on a surface of the body, in particular a curved surface of the body, for determining an axial length profile, by way of a measurement beam. Here, a minimum radius of curvature of the trajectory is at least 1/7, preferably at least ?, particularly preferably at least ? of a radius of a circumference of the surface.

Abstract: A device for stereoscopic examination of an eye, in particular a slit-lamp microscope, comprises, according to a first aspect of the invention, a lens for generating two images of the eye, wherein the device comprises at least one image sensor for electronic recording of the two images. According to a second aspect of the invention, the device for examination of an eye, in particular the slit-lamp microscope, comprises a lens for generating one image, wherein it comprises an image sensor for electronic recording of one image, and a viewing unit with an image-reproducing unit for presenting the image, and an eyepiece for viewing the image.

Abstract: An eye examining instrument comprises a projection device and a concave screen. The eye examining instrument furthermore comprises a convex reflector, wherein an image can be projected by the projection device onto the convex reflector and reflected by the convex reflector onto the concave screen.

Abstract: An adapter (60) for an apparatus (50) for measuring a first property of an eye is attachable to the apparatus (50), wherein, when the adapter (60) is attached to the apparatus (50), a second additional property of the eye is measurable,

Abstract: An eye examining instrument comprises a projection device and a concave screen. The eye examining instrument furthermore comprises a convex reflector, wherein an image can be projected by the projection device onto the convex reflector and reflected by the convex reflector onto the concave screen.

Abstract: A device for stereoscopic examination of an eye, in particular a slit-lamp microscope, comprises, according to a first aspect of the invention, a lens for generating two images of the eye, wherein the device comprises at least one image sensor for electronic recording of the two images. According to a second aspect of the invention, the device for examination of an eye, in particular the slit-lamp microscope, comprises a lens for generating one image, wherein it comprises an image sensor for electronic recording of one image, and a viewing unit with an image-reproducing unit for presenting the image, and an eyepiece for viewing the image.

Abstract: A device (2) for determining an intraocular pressure of an eye comprises a measurement arrangement with a measurement body (44), attached to a measurement arm (40), for applanation of the eye and a rotary knob (10) which is attached to a shaft (6). The measurement arm (40) is attached radially to a pivot axis (32) and the measurement arrangement comprises a mechanical coupling between the rotary knob (10) and the pivot axis (32), with a rotation of the rotary knob (10) being able to generate an applanation force required for applanation of the eye. The mechanical coupling comprises tension transmission means (12) attached to the pivot axis (32) via a first lever arm (34), and to the rotational axis (8) of the shaft (6) via a second lever arm (6).

Abstract: A changing device (60) for an optical examination device, for example a microscope, comprising two beam paths (61.1, 61.2) for a first optical image, and a changing optics (21) which is rotatably arranged in the changing device and is, for example, a Galilei magnification changer having at least two, here three pairs of beam paths (35.1, 35.2 and 45.1, 45.2 and 55.1, 55.2, respectively) which can optionally be switched into the beam paths (61.1, 61.2) of the changing device by rotating the changing optics. In accordance with the invention, the changing optics (21) comprises for each pair of beam paths at least one, here two additional beam paths (36.1, 36.2 and 46.2, 46.2 and 56.1, 56.2, respectively), assigned to the respective pair of beam paths, and the changing device (60) likewise comprises at least one, here likewise two additional beam paths (61.3, 61.4).

Abstract: A Michelson-interferometer which has two reference arms and a short coherence length is used for the method and apparatus for measurement of geometric values on transparent or diffuse objects (19). The basic optical delay times of the reference arms (11, 12) are chosen in such a manner that they result in an optical delay time difference corresponding to a layer thickness, as a geometric value. The at least two reference arm beams (33a, 35a) are passed to a single rotating path-length variation element (23), with a mutual spatial offset angle (dw). A delay-time change, which is dependent on the rotation angle, of the reference arm beams is produced as a function of a rotation angle caused by rotation, in order to allow a delay-time change caused by the path-length variation element (23) to be applied successively to the basic optical delay times in the reference arms (11, 12).

Abstract: A Michelson-interferometer which has two reference arms and a short coherence length is used for the method and apparatus for measurement of geometric values on transparent or diffuse objects (19). The basic optical delay times of the reference arms (11, 12) are chosen in such a manner that they result in an optical delay time difference corresponding to a layer thickness, as a geometric value. The at least two reference arm beams (33a, 35a) are passed to a single rotating path-length variation element (23), with a mutual spatial offset angle (dw). A delay-time change, which is dependent on the rotation angle, of the reference arm beams is produced as a function of a rotation angle caused by rotation, in order to allow a delay-time change caused by the path-length variation element (23) to be applied successively to the basic optical delay times in the reference arms (11, 12).

Abstract: A device (2) for determining an intraocular pressure of an eye comprises a measurement arrangement with a measurement body (44), attached to a measurement arm (40), for applanation of the eye and a rotary knob (10) which is attached to a shaft (6) and can rotate about a rotational axis (8) of the shaft (6). The measurement arm (40) is attached radially to a pivot axis (32) and the measurement arrangement comprises a mechanical coupling between the rotary knob (10) and the pivot axis (32), with a rotation of the rotary knob (10) around the rotational axis (8) being able to generate an applanation force required for applanation of the eye.

Abstract: A changing device (60) for an optical examination device, for example a microscope, comprising two beam paths (61.1, 61.2) for a first optical image, and a changing optics (21) which is rotatably arranged in the changing device and is, for example, a Galilei magnification changer having at least two, here three pairs of beam paths (35.1, 35.2 and 45.1, 45.2 and 55.1, 55.2, respectively) which can optionally be switched into the beam paths (61.1, 61.2) of the changing device by rotating the changing optics. In accordance with the invention, the changing optics (21) comprises for each pair of beam paths at least one, here two additional beam paths (36.1, 36.2 and 46.2, 46.2 and 56.1, 56.2, respectively), assigned to the respective pair of beam paths, and the changing device (60) likewise comprises at least one, here likewise two additional beam paths (61.3, 61.4).