Abstract: A light guide includes a translucent member. The translucent member includes: a light incident surface where light is incident; a light emitting surface provided on a side of the translucent member opposite to the light incident surface and emitting light; a parabolic first mirror surface facing the light incident surface and reflecting the light incident from the light incident surface as parallel light; and a parabolic second mirror surface facing the first mirror surface and the light emitting surface and reflecting the parallel light reflected by the first mirror surface so as to be condensed toward the light emitting surface.

Abstract: A defibrillator is an apparatus for defibrillation, and includes an oxygen saturation (TOI) measurement unit for acquiring a numerical value related to an oxygen saturation of a patient, an electrocardiogram (ECG) measurement unit for measuring an electrocardiogram of the patient in order to determine whether an electrical shock is required for the patient, and a control unit for starting measurement of the electrocardiogram of the patient in the electrocardiogram measurement unit on the condition that the numerical value acquired in the oxygen saturation measurement unit exceeds a threshold value.

Abstract: A sample support is a sample support for sample ionization, including: a substrate formed with a plurality of through holes opening to a first surface and a second surface on a side opposite to the first surface; a conductive layer provided not to block the through hole in the first surface; and a frame body provided in a peripheral portion of the substrate to surround an ionization region in which a sample is ionized when viewed in a thickness direction of the substrate, in which a marker for recognizing a position in the ionization region is provided in the frame body.

Abstract: A radiation detection device includes a circuit board, a light receiving sensor having a light receiving region and a plurality of circuit regions, an FOP, a scintillator layer, and a plurality of wires. The FOP includes a first portion facing the light receiving region and fixed to the light receiving sensor, a second portion facing the circuit region while separated from the light receiving sensor, and a second portion facing the circuit region while separated from the light receiving sensor. The second portions are integrally formed with the first portion. One end of the wire is connected to the circuit region in a region between the light receiving sensor and the second portion, and one end of the wire is connected to the circuit region in a region between the light receiving sensor and the second portion.

Abstract: In an optical device, when viewed from a first direction, first, second, third, and fourth movable comb electrodes are respectively disposed between a first support portion and a first end of a movable unit, between a second support portion and a second end of the movable unit, between a third support portion and the first end, and between a fourth support portion and the second end of the movable unit. The first and second support portions respectively include first and second rib portions formed so that the thickness of each of the first and second support portions becomes greater than the thickness of the first torsion bar. The third and fourth support portions respectively include third and fourth rib portions formed so that the thickness of each of the third and fourth support portions becomes greater than the thickness of the second torsion bar.

Abstract: A scintillator attachment structure includes an opening formed in a first side wall portion of a housing and a scintillator holder that holds the scintillator and includes a holder portion fitted in the opening. The scintillator holder can be attached to and detached from the housing. While the scintillator holder is attached to the housing, a predetermined angle is formed between the scintillator held by the holder portion protruding from the first side wall portion into the housing and the front surface mirror in the housing.

Abstract: An inspection apparatus is an inspection apparatus includes an excitation light source that generates excitation light to irradiate the object, a dichroic mirror that separates fluorescence from the sample by transmitting or reflecting the fluorescence according to a wavelength, a camera that images fluorescence reflected by the dichroic mirror, a camera that images fluorescence transmitted through the dichroic mirror, and a control apparatus that derives color irregularity information of a light-emitting element based on a first fluorescence image acquired by the camera and a second fluorescence image acquired by the camera, and an edge shift width corresponding to a width of a wavelength band in which transmittance and reflectance change according to a change in wavelength in the dichroic mirror is wider than a full width at half maximum of a normal fluorescence spectrum of the light-emitting element.

Abstract: A semiconductor inspecting method according to an embodiment includes a step of scanning a semiconductor device with laser light to acquire characteristic information indicative of characteristics of an electrical signal of the semiconductor device in response to irradiation with the laser light for each of irradiation positions of the laser light and to generate a first pattern image of the semiconductor device based on characteristic information for each of irradiation positions, a step of generating a second pattern image of the semiconductor device based on a layout image of the semiconductor device and current path information indicative of a current path in the semiconductor device, and a step of acquiring matching information indicative of a relative relationship between the first pattern image and the layout image based on a result of positional alignment between the first pattern image and the second pattern image.

Abstract: A surface-assisted laser desorption/ionization method according to an aspect includes: a first process of preparing a sample support (2) having a substrate (21) in which a plurality of through-holes (S) passing from one surface (21a) thereof to the other surface (21b) thereof are provided and a conductive layer (23) that covers at least the one surface (21a); a second process of placing a sample (10) on a sample stage (1) and arranging the sample support (2) on the sample (10) such that the other surface (21b) faces the sample (10); and a third process of applying a laser beam (L) to the one surface (21a) and ionizing the sample (10) moved from the other surface (21b) side to the one surface (21a) side via the through-holes (S) due to a capillary phenomenon.

Abstract: The present embodiment relates to a light-emitting device that enables reduction in attenuation or diffraction effect caused by a semiconductor light-emitting device with respect to modulated light outputted from a spatial light modulator, and the light-emitting device includes the semiconductor light-emitting device that outputs light from a light output surface and the reflection type spatial light modulator that modulates the light. The spatial light modulator includes a light input/output surface having the area larger than the area of a light input surface of the semiconductor light-emitting device, modulates light taken through a region facing the light output surface of the semiconductor light-emitting device in the light input/output surface, and outputs the modulated light from another region of the light input/output surface to a space other than the light input surface of the semiconductor light-emitting device.

Abstract: A photocathode including a substrate, a photoelectric conversion layer provided on the substrate and generating photoelectrons in response to incidence of light, and an underlayer provided between the substrate and the photoelectric conversion layer and containing beryllium, in which the underlayer has a first underlayer containing a nitride of beryllium.

Abstract: An optical device of one embodiment outputs light in a short-wavelength range such as a visible range. The optical device includes a UC layer, first and second light-confinement layers, and a resonance mode forming layer. The UC layer contains an upconversion material receiving excitation light in a first wavelength range and outputting light in a second wavelength range. The first light-confinement layer has a characteristic of reflecting part of the second wavelength-range light. The second light-confinement layer has a characteristic of reflecting part of the second wavelength-range light and transmitting the remainder, and is disposed such that the UC layer locates between the first and second light-confinement layers. The resonance mode forming layer locates between the UC layer and the first or second light-confinement layer, includes a base layer and plural modified refractive index regions, and forms a resonance mode of the second wavelength-range light.

Abstract: In an optical device, a movable unit includes a main body portion, a frame portion that surrounds the main body portion with a predetermined interval from the main body portion, and a plurality of connection portions which connect the main body portion and the frame portion to each other. A width of each of the connection portions is larger than an interval between the main body portion and the frame portion, and is smaller than a distance from a connection position with each of the connection portions in the frame portion to any of a connection position with each of a pair of first torsion support portions and a connection position with each of a pair of second torsion support portions.

Abstract: A light emitting sealed body includes: a housing containing light-emitting gas in an internal space, on which laser light for maintaining a plasma generated in the light-emitting gas is incident; and a charging pipe including a first end portion and a second end portion and connected to the internal space at the first end portion. The second end portion of the charging pipe is sealed by being crushed. The second end portion of the charging pipe is covered with a covering member consists of an inorganic material. The covering member is covered with a cap member consists of a metal material.

Abstract: In a spectroscopic module, a light shielding member is disposed between a plurality of bandpass filters and a light detector. The light shielding member includes a plurality of wall portions. The plurality of wall portions are arranged along an X direction with a light passage opening interposed therebetween, each of a plurality of optical paths from the plurality of bandpass filters to a plurality of light receiving regions passing through the light passage opening. A first wall portion and a second wall portion adjacent to each other among the plurality of wall portions are in contact with the bandpass filter, the bandpass filter corresponding to the light passage opening between the first wall portion and the second wall portion. A width in a Y direction of the light passage opening is larger than a width in the Y direction of the bandpass filter.

Abstract: A laser processing apparatus includes a spatial light modulator for inputting laser light output from a laser light source and outputting laser light after phase modulation by a hologram, and a control unit for presenting, on the spatial light modulator, the hologram for focusing the laser light after the phase modulation output from the spatial light modulator on a plurality of irradiation points in a processing object by a focusing optical system. The control unit sets at least one of a shape and a size of a processing region defined by the irradiation points in a first plane intersecting an optical axis of the laser light and a processing region defined by the irradiation points in a second plane intersecting the optical axis and separated from the first plane in a direction of the optical axis to be different from each other.

Abstract: A semiconductor inspection device includes: a measuring device that supplies power to a semiconductor device and measures the electrical characteristics; an optical scanning device that scans the semiconductor device with light intensity-modulated with a plurality of frequencies; a lock-in amplifier that acquires a characteristic signal indicating the electrical characteristics of the plurality of frequency components; and an inspection device that calculates a frequency at which the characteristic signal reflecting the electrical characteristics of a first layer and the characteristic signal reflecting the electrical characteristics of a second layer have a predetermined phase difference, corrects a phase component of the characteristic signal at an arbitrary scanning position with a phase component at the scanning position reflecting the electrical characteristics of the first layer as a reference, and outputs an in-phase component and a quadrature component at the arbitrary scanning position at the calcula

Abstract: A semiconductor inspection device includes: a measuring device that supplies power to a semiconductor device and measures the electrical characteristics of the semiconductor device; an optical scanning device that scans the semiconductor device with light intensity-modulated with a plurality of frequencies; a lock-in amplifier that acquires a characteristic signal indicating the electrical characteristics of the plurality of frequency components; and an inspection device that corrects a phase component of the characteristic signal at an arbitrary scanning position with a phase component at a scanning position reflecting the electrical characteristics of a first layer in the semiconductor device as a reference, specifies a phase component of the characteristic signal at a scanning position reflecting the electrical characteristics of a second layer, normalizes the phase component of the characteristic signal at the arbitrary scanning position by using the phase component, and outputs a result based on the norm

Abstract: In this sample observation device, a reference table in which an optimum light amount of planar light at a measurement sensitivity represented by the product of a light amount of the planar light and a scanning speed is set according to the scanning speed is referred to, and the scanning speed of a scanning unit and the optimum light amount of the planar light that is applied to a sample are determined on the basis of the measurement sensitivity selected by a user.

Abstract: Provided is a scintillator panel including: a support; a scintillator layer provided on the support, the scintillator layer being composed of av columnar crystal; and a protective film covering at least the scintillator layer. The scintillator layer contains cesium iodide as a base material and cerium as an activator.