Patents Assigned to Hexagon Metrology, Inc.
  • Patent number: 11965736
    Abstract: A method measures a given object using a coordinate measuring machine (CMM) having a measurement space. As such, the method determines one or more portions of the given object to be measured and then forms a virtual 3D movement model representing CMM movement required to measure the one or more portions. The method then uses the 3D movement model to virtually position and orient the given object within the CMM measurement space.
    Type: Grant
    Filed: August 28, 2020
    Date of Patent: April 23, 2024
    Assignee: Hexagon Metrology, Inc.
    Inventors: Michael Mariani, Milan Kocic
  • Publication number: 20240027181
    Abstract: A method measures an object using a CMM having a CMM accuracy. To that end, the method provides a jogbox with a 3D scanner having a scanner accuracy, positions the object on the CMM, and scans, using the 3D scanner, the object to produce scan data of the object. The method also measures a first portion of the object using the scan data, and a second portion of the object using the CMM. The CMM accuracy is more accurate than the scanner accuracy.
    Type: Application
    Filed: September 27, 2023
    Publication date: January 25, 2024
    Applicant: Hexagon Metrology, Inc.
    Inventor: Milan Kocic
  • Patent number: 11802760
    Abstract: A method measures an object using a CMM having a CMM accuracy. To that end, the method provides a jogbox with a 3D scanner having a scanner accuracy, positions the object on the CMM, and scans, using the 3D scanner, the object to produce scan data of the object. The method also measures a first portion of the object using the scan data, and a second portion of the object using the CMM. The CMM accuracy is more accurate than the scanner accuracy.
    Type: Grant
    Filed: December 6, 2019
    Date of Patent: October 31, 2023
    Assignee: Hexagon Metrology, Inc.
    Inventor: Milan Kocic
  • Patent number: 11774226
    Abstract: A method efficiently measures an object having a feature. The feature has a plurality of cross-sections that each have a surface. The method provides a coordinate measuring machine having a discretely indexable wrist coupled with a measuring probe. The wrist has a given wrist orientation, relative to an arm of the coordinate measuring machine, that is adjustable between a plurality of different orientations. The probe is able to measure different surfaces as a function of the different wrist orientations. The method segments an object to be measured into a plurality of segments that are each measurable with a given wrist orientation.
    Type: Grant
    Filed: May 25, 2022
    Date of Patent: October 3, 2023
    Assignee: Hexagon Metrology, Inc.
    Inventor: Sean Taylor
  • Patent number: 11768574
    Abstract: Various embodiments enable batch inspection of a plurality of workpieces by and inspection instrument such as a coordinate measuring machine. Some embodiments present user interfaces, including graphical user interfaces, to enable an operator to configure a batch inspection system and a batch inspection job, and to monitor and control execution of a batch inspection job.
    Type: Grant
    Filed: May 7, 2020
    Date of Patent: September 26, 2023
    Assignee: Hexagon Metrology, Inc.
    Inventors: Jonathan J. O'Hare, Jonathan Dove
  • Patent number: 11754383
    Abstract: A method efficiently measures an object having a feature. The feature has a plurality of profiles each having a surface. The method provides a coordinate measuring machine having a wrist coupled with a measuring probe. The probe has a tolerance angle with respect to a surface normal of a surface to be measured. The wrist has a first given orientation that is adjustable to a second given orientation. The method segments an object to be measured into a plurality of segments as a function of an ideal vector that can be used to measure a given segment within the tolerance. A first group of segments that can be measured within the probe tolerance for a first ideal vector is determined. A second group of segments that can be measured within the probe tolerance for a second ideal vector is determined.
    Type: Grant
    Filed: May 25, 2022
    Date of Patent: September 12, 2023
    Assignee: Hexagon Metrology, Inc.
    Inventor: Sean Taylor
  • Patent number: 11740063
    Abstract: A method efficiently measures an object having a feature with a plurality of profiles each having a surface. The method provides a CMM having a wrist coupled with a measuring probe. The probe has an optical probe with an angle of incidence with respect to a surface normal of a plurality of points to be measured. The wrist has a first given orientation that is adjustable to a second given orientation. The method measures the feature to be measured by segment groups to obtain a 3D data set for each group. The method removes data points from at least one 3D data set that are outlier data points. The method interpolates the surface formed by the data points. The method calculates a surface normal vector for the data points set. The method removes data points from the interpolated 3D data set whose surface normal are outside the angle of incidence.
    Type: Grant
    Filed: May 25, 2022
    Date of Patent: August 29, 2023
    Assignee: Hexagon Metrology, Inc.
    Inventor: Sean Taylor
  • Patent number: 11703311
    Abstract: A system for assembling a fixture to hold a workpiece for measurement by a CMM includes a plurality of fixture components. The fixture components are used to assemble the fixture. The system also includes a fixture plate having a plurality of fixture component securing portions that are configured to couple with the fixture components to define the fixture. The fixture is configured to couple with the workpiece to hold the workpiece in a predefined orientation. A fixture identifier is configured to identify the fixture components, and a securing portion identifier is configured to identify the securing portions that couple with the fixture components. A visual emphasizing unit is configured to visually emphasize one or more of the fixture components and/or one or more of the securing portions to provide an indication of a fixture component that is to be coupled with a corresponding securing portion.
    Type: Grant
    Filed: January 27, 2022
    Date of Patent: July 18, 2023
    Assignee: Hexagon Metrology, Inc.
    Inventor: Milan Kocic
  • Patent number: 11524410
    Abstract: Embodiments provide measurement systems having a coordinate measuring machine, a workpiece storage apparatus, and a robot for delivering workpieces from the workpiece storage apparatus to the coordinate measuring machine, and methods for orienting and operating such systems. Illustrative embodiments employ a reference geometry tool on the robotic arm, and kinematic locators on the coordinate measuring machine and/or on the workpiece storage apparatus to define a coordinate system common to the coordinate measuring machine, the workpiece storage apparatus, and the robot.
    Type: Grant
    Filed: June 12, 2020
    Date of Patent: December 13, 2022
    Assignee: Hexagon Metrology, Inc.
    Inventors: Jonathan J. O'Hare, Jonathan Dove
  • Patent number: 11498133
    Abstract: A workholding apparatus for components having complex geometries or surfaces, which components are difficult constrain for the purpose of inspection, addresses the problem of adequately constraining such components in a convenient and cost-effective manner so that they do not move during inspection, while also making all or most critical features accessible to the inspection instruments being used. A method teaches how to eliminate setup changes between different components through the use of inexpensive modular attachments. These attachments are in the form of a single piece thermoplastic part which is affixed to each component having also reference features that can be interlocked into a common base fixture for more efficient inspection operations.
    Type: Grant
    Filed: September 6, 2019
    Date of Patent: November 15, 2022
    Assignee: Hexagon Metrology, Inc.
    Inventors: Jonathan J. O'Hare, Jonathan Dove
  • Patent number: 11347368
    Abstract: Various embodiments enable batch inspection of a plurality of workpieces by and inspection instrument such as a coordinate measuring machine. Some embodiments present user interfaces, including graphical user interfaces, to enable an operator to configure a batch inspection system and a batch inspection job, and to monitor and control execution of a batch inspection job.
    Type: Grant
    Filed: May 7, 2020
    Date of Patent: May 31, 2022
    Assignee: Hexagon Metrology, Inc.
    Inventors: Jonathan J. O'Hare, Jonathan Dove, Joseph VanPelt
  • Patent number: 11231262
    Abstract: A coordinate measuring machine revises its original measurement trajectory, prior to completing its measurement of a work piece, upon detecting misalignment between its original measurement trajectory and the orientation of the work piece.
    Type: Grant
    Filed: April 16, 2018
    Date of Patent: January 25, 2022
    Assignee: Hexagon Metrology, Inc.
    Inventors: Gurpreet Singh, Jürgen Schneider
  • Patent number: 11215442
    Abstract: A multi-mode coordinate measuring machine system can be configured to measure coordinates in a variety of ways with a certain set of components. For example, an articulated arm coordinate measuring machine can measure coordinates on an object using a contact probe or a non-contact measuring device mounted on the articulated arm. Then, a user can remove the non-contact measuring device from the articulated arm coordinate measuring machine, and take additional measurements of the object that can be aligned with measurements taken by the articulated arm and devices attached thereto.
    Type: Grant
    Filed: May 20, 2020
    Date of Patent: January 4, 2022
    Assignee: Hexagon Metrology, Inc.
    Inventors: Paul Ferrari, Hyun Kwon Jung
  • Patent number: 11118890
    Abstract: A jogbox for a coordinate measuring machine with a movable arm has a body forming an interior, and control hardware at least partially within the interior. The control hardware is configured to control the movable arm of the coordinate measuring machine. The jogbox also has an energizing port for energizing or charging the jogbox, and an auxiliary port formed by the body and operatively coupled with the controlling hardware within the interior. The auxiliary port is configured to directly physically connect with at least one hardware accessory that has a hardware interface port. In addition, the auxiliary port is configured to rigidly, removably, and directly couple with the hardware interface port of the at least one hardware accessory. Some embodiments include a counterweight interface configured to receive and retain a counterweight to counterbalance the weight of an accessory.
    Type: Grant
    Filed: July 23, 2019
    Date of Patent: September 14, 2021
    Assignee: Hexagon Metrology, Inc.
    Inventor: Paul Witkos
  • Patent number: 11085751
    Abstract: Embodiments described herein provide a mobile CMM jogbox that includes one or more ergonomic apparatuses configured and disposed to allow a CMM operator to hold and operate the jogbox, while avoiding or mitigating the fatigue of an operator using the jogbox.
    Type: Grant
    Filed: November 11, 2019
    Date of Patent: August 10, 2021
    Assignee: Hexagon Metrology, Inc.
    Inventor: Milan Kocic
  • Patent number: 11029142
    Abstract: A coordinate measurement device comprises an articulated arm having a first end, a second end, and a plurality of jointed arm segments therebetween. Each arm segment defines at least one axis of rotation. A laser scanner assembly is coupled to the second end of the arm and is rotatable about a last axis of rotation of the articulated arm. The laser scanner assembly comprises a laser and an image sensor. The laser is positioned on an opposite side of the last axis of rotation from the image sensor.
    Type: Grant
    Filed: May 1, 2019
    Date of Patent: June 8, 2021
    Assignee: HEXAGON METROLOGY, INC.
    Inventor: Paul Ferrari
  • Patent number: 11022434
    Abstract: Thermal variations on an optical scanning device can affect measurements made by that device. Various ways are presented here to control the temperature of a device and compensate for temperature variations of the device.
    Type: Grant
    Filed: November 13, 2018
    Date of Patent: June 1, 2021
    Assignee: HEXAGON METROLOGY, INC.
    Inventors: Tom Bauer, Gerald Gerent, David Demiter
  • Patent number: 10907949
    Abstract: A coordinate measuring machine system has a base configured to support a workpiece, a movable portion configured to move relative to the base, and a control system configured to control movement of the base and/or the movable portion. The system also has a set of probes that each are configured to be removably couplable with the movable measurement portion. Each probe is configured to be removably couplable with the movable measurement portion, and has a shaft with a distal end and a proximal end. The proximal end has a region for coupling with the movable measurement portion, while the distal end has a region configured to interact with the workpiece. Each of the probes also has visual identifying indicia on the shaft. The visual identifying indicia are encoded to identify at least one characteristic of the probe. Specifically, the indicia are encoded as Base 3 or Base 4 indicia.
    Type: Grant
    Filed: October 2, 2018
    Date of Patent: February 2, 2021
    Assignee: Hexagon Metrology, Inc.
    Inventors: Gurpreet Singh, Milan Kocic, Michael Mariani
  • Patent number: 10663284
    Abstract: A multi-mode coordinate measuring machine system can be configured to measure coordinates in a variety of ways with a certain set of components. For example, an articulated arm coordinate measuring machine can measure coordinates on an object using a contact probe or a non-contact measuring device mounted on the articulated arm. Then, a user can remove the non-contact measuring device from the articulated arm coordinate measuring machine, and take additional measurements of the object that can be aligned with measurements taken by the articulated arm and devices attached thereto.
    Type: Grant
    Filed: July 5, 2018
    Date of Patent: May 26, 2020
    Assignee: Hexagon Metrology, Inc.
    Inventors: Paul Ferrari, Hyun Kwon Jung
  • Patent number: 10648791
    Abstract: A test artifact for a coordinate measuring machine includes a calibrated standard and a convex background illumination surface. The calibrated standard, the convex background illumination surface and a vision sensor are positionable relative to one another so as to create a silhouette of the calibrated sphere in the vision sensor's field of view. The test artifact may thus be used to calibrate the coordinate measuring machine, and/or to assess the associativity between the vision sensor and another measuring sensor.
    Type: Grant
    Filed: August 31, 2017
    Date of Patent: May 12, 2020
    Assignee: Hexagon Metrology, Inc.
    Inventor: Charles Salvatore Lamendola