Patents Assigned to Hexagon Metrology, Inc.
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Patent number: 12209857Abstract: A method measures an object having a feature. The feature has a plurality of profiles each having a surface. The method provides a coordinate measuring machine (CMM) having a wrist coupled with a measuring prob. The probe has a tolerance angle with respect to a surface normal of a surface to be measured. The wrist has a first given orientation that is adjustable to a second given orientation. The method determines an ideal vector that can be used to measure a given segment within the tolerance. The method also determines the wrist orientation in a CMM coordinate space. The method determines the ideal vector in the CMM coordinate space to define a part vector. A probe vector is determined from the wrist and probe characteristics. The probe vector is aligned with the part vector. The feature is measured.Type: GrantFiled: May 25, 2022Date of Patent: January 28, 2025Assignee: Hexagon Metrology, Inc.Inventor: Paul Racine
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Patent number: 12085380Abstract: A method measures an object using a CMM having a CMM accuracy. To that end, the method provides a jogbox with a 3D scanner having a scanner accuracy, positions the object on the CMM, and scans, using the 3D scanner, the object to produce scan data of the object. The method also measures a first portion of the object using the scan data, and a second portion of the object using the CMM. The CMM accuracy is more accurate than the scanner accuracy.Type: GrantFiled: September 27, 2023Date of Patent: September 10, 2024Assignee: Hexagon Metrology, Inc.Inventor: Milan Kocic
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Patent number: 12066808Abstract: A system for inspecting each workpiece of a plurality of non-identical workpieces includes a controller in control communication with the instruments of the system, and a ruleset corresponding to one or more such non-identical workpieces, the system reconfiguring the inspection instruments to customize part tending operations for each such non-identical workpiece. A method for inspecting each workpiece of a plurality of non-identical workpiece includes providing a controller in control communication with the instruments of the system, and a ruleset corresponding to each such non-identical workpiece, the controller causing reconfiguration of the inspection instruments to customize part tending operations for each such non-identical workpiece.Type: GrantFiled: November 24, 2021Date of Patent: August 20, 2024Assignee: Hexagon Metrology, Inc.Inventors: Jonathan J. O'Hare, Jonathan Dove
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Patent number: 12055376Abstract: Various embodiments enable automation of non-production activities of a coordinate measuring machine by ascertaining, prior to executing such activities, that such activities could be safely executed in the machine's environment. Although making such a determination can be fully automated, some embodiments include a human decision-maker In the loop.Type: GrantFiled: November 3, 2021Date of Patent: August 6, 2024Assignee: Hexagon Metrology, Inc.Inventor: Milan Kocic
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Patent number: 11965736Abstract: A method measures a given object using a coordinate measuring machine (CMM) having a measurement space. As such, the method determines one or more portions of the given object to be measured and then forms a virtual 3D movement model representing CMM movement required to measure the one or more portions. The method then uses the 3D movement model to virtually position and orient the given object within the CMM measurement space.Type: GrantFiled: August 28, 2020Date of Patent: April 23, 2024Assignee: Hexagon Metrology, Inc.Inventors: Michael Mariani, Milan Kocic
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Publication number: 20240027181Abstract: A method measures an object using a CMM having a CMM accuracy. To that end, the method provides a jogbox with a 3D scanner having a scanner accuracy, positions the object on the CMM, and scans, using the 3D scanner, the object to produce scan data of the object. The method also measures a first portion of the object using the scan data, and a second portion of the object using the CMM. The CMM accuracy is more accurate than the scanner accuracy.Type: ApplicationFiled: September 27, 2023Publication date: January 25, 2024Applicant: Hexagon Metrology, Inc.Inventor: Milan Kocic
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Patent number: 11802760Abstract: A method measures an object using a CMM having a CMM accuracy. To that end, the method provides a jogbox with a 3D scanner having a scanner accuracy, positions the object on the CMM, and scans, using the 3D scanner, the object to produce scan data of the object. The method also measures a first portion of the object using the scan data, and a second portion of the object using the CMM. The CMM accuracy is more accurate than the scanner accuracy.Type: GrantFiled: December 6, 2019Date of Patent: October 31, 2023Assignee: Hexagon Metrology, Inc.Inventor: Milan Kocic
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Patent number: 11774226Abstract: A method efficiently measures an object having a feature. The feature has a plurality of cross-sections that each have a surface. The method provides a coordinate measuring machine having a discretely indexable wrist coupled with a measuring probe. The wrist has a given wrist orientation, relative to an arm of the coordinate measuring machine, that is adjustable between a plurality of different orientations. The probe is able to measure different surfaces as a function of the different wrist orientations. The method segments an object to be measured into a plurality of segments that are each measurable with a given wrist orientation.Type: GrantFiled: May 25, 2022Date of Patent: October 3, 2023Assignee: Hexagon Metrology, Inc.Inventor: Sean Taylor
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Patent number: 11768574Abstract: Various embodiments enable batch inspection of a plurality of workpieces by and inspection instrument such as a coordinate measuring machine. Some embodiments present user interfaces, including graphical user interfaces, to enable an operator to configure a batch inspection system and a batch inspection job, and to monitor and control execution of a batch inspection job.Type: GrantFiled: May 7, 2020Date of Patent: September 26, 2023Assignee: Hexagon Metrology, Inc.Inventors: Jonathan J. O'Hare, Jonathan Dove
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Patent number: 11754383Abstract: A method efficiently measures an object having a feature. The feature has a plurality of profiles each having a surface. The method provides a coordinate measuring machine having a wrist coupled with a measuring probe. The probe has a tolerance angle with respect to a surface normal of a surface to be measured. The wrist has a first given orientation that is adjustable to a second given orientation. The method segments an object to be measured into a plurality of segments as a function of an ideal vector that can be used to measure a given segment within the tolerance. A first group of segments that can be measured within the probe tolerance for a first ideal vector is determined. A second group of segments that can be measured within the probe tolerance for a second ideal vector is determined.Type: GrantFiled: May 25, 2022Date of Patent: September 12, 2023Assignee: Hexagon Metrology, Inc.Inventor: Sean Taylor
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Patent number: 11740063Abstract: A method efficiently measures an object having a feature with a plurality of profiles each having a surface. The method provides a CMM having a wrist coupled with a measuring probe. The probe has an optical probe with an angle of incidence with respect to a surface normal of a plurality of points to be measured. The wrist has a first given orientation that is adjustable to a second given orientation. The method measures the feature to be measured by segment groups to obtain a 3D data set for each group. The method removes data points from at least one 3D data set that are outlier data points. The method interpolates the surface formed by the data points. The method calculates a surface normal vector for the data points set. The method removes data points from the interpolated 3D data set whose surface normal are outside the angle of incidence.Type: GrantFiled: May 25, 2022Date of Patent: August 29, 2023Assignee: Hexagon Metrology, Inc.Inventor: Sean Taylor
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Patent number: 11703311Abstract: A system for assembling a fixture to hold a workpiece for measurement by a CMM includes a plurality of fixture components. The fixture components are used to assemble the fixture. The system also includes a fixture plate having a plurality of fixture component securing portions that are configured to couple with the fixture components to define the fixture. The fixture is configured to couple with the workpiece to hold the workpiece in a predefined orientation. A fixture identifier is configured to identify the fixture components, and a securing portion identifier is configured to identify the securing portions that couple with the fixture components. A visual emphasizing unit is configured to visually emphasize one or more of the fixture components and/or one or more of the securing portions to provide an indication of a fixture component that is to be coupled with a corresponding securing portion.Type: GrantFiled: January 27, 2022Date of Patent: July 18, 2023Assignee: Hexagon Metrology, Inc.Inventor: Milan Kocic
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Patent number: 11524410Abstract: Embodiments provide measurement systems having a coordinate measuring machine, a workpiece storage apparatus, and a robot for delivering workpieces from the workpiece storage apparatus to the coordinate measuring machine, and methods for orienting and operating such systems. Illustrative embodiments employ a reference geometry tool on the robotic arm, and kinematic locators on the coordinate measuring machine and/or on the workpiece storage apparatus to define a coordinate system common to the coordinate measuring machine, the workpiece storage apparatus, and the robot.Type: GrantFiled: June 12, 2020Date of Patent: December 13, 2022Assignee: Hexagon Metrology, Inc.Inventors: Jonathan J. O'Hare, Jonathan Dove
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Patent number: 11498133Abstract: A workholding apparatus for components having complex geometries or surfaces, which components are difficult constrain for the purpose of inspection, addresses the problem of adequately constraining such components in a convenient and cost-effective manner so that they do not move during inspection, while also making all or most critical features accessible to the inspection instruments being used. A method teaches how to eliminate setup changes between different components through the use of inexpensive modular attachments. These attachments are in the form of a single piece thermoplastic part which is affixed to each component having also reference features that can be interlocked into a common base fixture for more efficient inspection operations.Type: GrantFiled: September 6, 2019Date of Patent: November 15, 2022Assignee: Hexagon Metrology, Inc.Inventors: Jonathan J. O'Hare, Jonathan Dove
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Patent number: 11347368Abstract: Various embodiments enable batch inspection of a plurality of workpieces by and inspection instrument such as a coordinate measuring machine. Some embodiments present user interfaces, including graphical user interfaces, to enable an operator to configure a batch inspection system and a batch inspection job, and to monitor and control execution of a batch inspection job.Type: GrantFiled: May 7, 2020Date of Patent: May 31, 2022Assignee: Hexagon Metrology, Inc.Inventors: Jonathan J. O'Hare, Jonathan Dove, Joseph VanPelt
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Patent number: 11231262Abstract: A coordinate measuring machine revises its original measurement trajectory, prior to completing its measurement of a work piece, upon detecting misalignment between its original measurement trajectory and the orientation of the work piece.Type: GrantFiled: April 16, 2018Date of Patent: January 25, 2022Assignee: Hexagon Metrology, Inc.Inventors: Gurpreet Singh, Jürgen Schneider
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Patent number: 11215442Abstract: A multi-mode coordinate measuring machine system can be configured to measure coordinates in a variety of ways with a certain set of components. For example, an articulated arm coordinate measuring machine can measure coordinates on an object using a contact probe or a non-contact measuring device mounted on the articulated arm. Then, a user can remove the non-contact measuring device from the articulated arm coordinate measuring machine, and take additional measurements of the object that can be aligned with measurements taken by the articulated arm and devices attached thereto.Type: GrantFiled: May 20, 2020Date of Patent: January 4, 2022Assignee: Hexagon Metrology, Inc.Inventors: Paul Ferrari, Hyun Kwon Jung
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Patent number: 11118890Abstract: A jogbox for a coordinate measuring machine with a movable arm has a body forming an interior, and control hardware at least partially within the interior. The control hardware is configured to control the movable arm of the coordinate measuring machine. The jogbox also has an energizing port for energizing or charging the jogbox, and an auxiliary port formed by the body and operatively coupled with the controlling hardware within the interior. The auxiliary port is configured to directly physically connect with at least one hardware accessory that has a hardware interface port. In addition, the auxiliary port is configured to rigidly, removably, and directly couple with the hardware interface port of the at least one hardware accessory. Some embodiments include a counterweight interface configured to receive and retain a counterweight to counterbalance the weight of an accessory.Type: GrantFiled: July 23, 2019Date of Patent: September 14, 2021Assignee: Hexagon Metrology, Inc.Inventor: Paul Witkos
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Patent number: 11085751Abstract: Embodiments described herein provide a mobile CMM jogbox that includes one or more ergonomic apparatuses configured and disposed to allow a CMM operator to hold and operate the jogbox, while avoiding or mitigating the fatigue of an operator using the jogbox.Type: GrantFiled: November 11, 2019Date of Patent: August 10, 2021Assignee: Hexagon Metrology, Inc.Inventor: Milan Kocic
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Patent number: 11029142Abstract: A coordinate measurement device comprises an articulated arm having a first end, a second end, and a plurality of jointed arm segments therebetween. Each arm segment defines at least one axis of rotation. A laser scanner assembly is coupled to the second end of the arm and is rotatable about a last axis of rotation of the articulated arm. The laser scanner assembly comprises a laser and an image sensor. The laser is positioned on an opposite side of the last axis of rotation from the image sensor.Type: GrantFiled: May 1, 2019Date of Patent: June 8, 2021Assignee: HEXAGON METROLOGY, INC.Inventor: Paul Ferrari