Patents Assigned to Insight, Inc.
  • Publication number: 20080059920
    Abstract: A method and apparatus to reduce occurrences of electrically non-functional elements, known as dummy features, from a source data structure is described. The source data structure may be image data, a vector based data structure or some other data format. Dummy features in the source data structure are detected and then deleted. Dummy features may be detected by selecting a representative dummy feature, using it as a reference pattern or polygon and comparing it to features in the source data structure. The step of comparing the selected reference to the comprises selecting a cut-off correlation threshold value, and computing the correlation coefficients between the reference and the feature. Features are selectively removed based on a comparison between their correlation coefficients and the selected cut-off correlation threshold value. This threshold value may require updating to remove all dummy features in the source data structure.
    Type: Application
    Filed: October 24, 2007
    Publication date: March 6, 2008
    Applicant: Semiconductor Insights Inc.
    Inventors: Mohammed Ouali, Jason Abt, Edward Keyes, Vyacheslav Zavadsky
  • Patent number: 7278121
    Abstract: The method and apparatus in accordance with the present invention reduces the data size of a layout data structure by reducing the amount of electrically redundant interconnects within a bank of interconnects. Electrically redundant interconnects are the repetitive interconnects within a bank of interconnects which do not contribute to the understanding of the IC. Therefore, a number of these interconnects may be deleted from the banks in the layout data structure, provided that enough interconnects remain to maintain the electrical connectivity and the visual representation of the bank.
    Type: Grant
    Filed: August 23, 2004
    Date of Patent: October 2, 2007
    Assignee: Semiconductor Insights Inc.
    Inventors: Elmehdi Aitnouri, Edward Keyes, Stephen Begg, Val Gont, Dale McIntyre, Mohammed Ouali, Vyacheslav Zavadsky
  • Patent number: 7207018
    Abstract: The method and apparatus in accordance with the present invention determines the locations of incorrectly connected polygons in a polygon representation of an integrated circuit layout. These incorrectly connected polygons result in short circuits, which often occur for major signal busses such as power and ground. It can be time-consuming to determine the exact location of the short. The invention includes the step of tessellating the polygon representation, including each conductive layer, into predetermined shapes such as triangles or trapezoids. Each of the triangles or trapezoids is then translated into a node for the development of a nodal network where nodes are connected directly to one another to represent shapes having edges adjacent to other shape edges. The current capacity of each connection between adjacent nodes is then specified. Two nodes that are electrically connected to the incorrectly connected polygons are selected and used as parameters for a network flow analysis algorithm.
    Type: Grant
    Filed: August 4, 2004
    Date of Patent: April 17, 2007
    Assignee: Semiconductor Insights Inc.
    Inventors: Vyacheslav L. Zavadsky, Elmehdi Aitnouri, Edward Keyes, Jason Abt, Val Gont, Stephen Begg
  • Publication number: 20070011628
    Abstract: A method and apparatus to reduce occurrences of electrically non-functional elements, known as dummy features, from a source data structure is described. The source data structure may be image data, a vector based data structure or some other data format. Dummy features in the source data structure are detected and then deleted. Dummy features may be detected by selecting a representative dummy feature, using it as a reference pattern or polygon and comparing it to features in the source data structure. The step of comparing the selected reference to the comprises selecting a cut-off correlation threshold value, and computing the correlation coefficients between the reference and the feature. Features are selectively removed based on a comparison between their correlation coefficients and the selected cut-off correlation threshold value. This threshold value may require updating to remove all dummy features in the source data structure.
    Type: Application
    Filed: July 6, 2005
    Publication date: January 11, 2007
    Applicant: Semiconductor Insights Inc.
    Inventors: Mohammed Ouali, Jason Abt, Edward Keyes, Vyacheslav Zavadsky
  • Patent number: 7013028
    Abstract: An editor in a computer system for editing an schematic having a number of pages. The editor may cut a selected portion of the schematic from any one of the schematic pages, paste the cut portion of the schematic onto any one of the schematic pages, and connect nets located on the same schematic page. The editor may search for objects such as signal labels and cells within the schematic netlist as well as other editing functions. Further a navigator is provided for interactively viewing netlist data from a high level schematic where the data includes schematic page numbers, cell names, nets, signal labels and segments. The project viewer software and project schematic netlist data may be contained in a computer-readable medium. The project viewer software controls output schematic images and enables a user to view, trace and search objects throughout the project netlist data.
    Type: Grant
    Filed: August 3, 2001
    Date of Patent: March 14, 2006
    Assignee: Semiconductor Insights Inc.
    Inventors: Val Gont, Jason Abt, Larry Lam
  • Publication number: 20060041849
    Abstract: The method and apparatus in accordance with the present invention reduces the data size of a layout data structure by reducing the amount of electrically redundant interconnects within a bank of interconnects. Electrically redundant interconnects are the repetitive interconnects within a bank of interconnects which do not contribute to the understanding of the IC. Therefore, a number of these interconnects may be deleted from the banks in the layout data structure, provided that enough interconnects remain to maintain the electrical connectivity and the visual representation of the bank.
    Type: Application
    Filed: August 23, 2004
    Publication date: February 23, 2006
    Applicant: Semiconductor Insights Inc.
    Inventors: Elmehdi Aitnouri, Edward Keyes, Stephen Begg, Val Gont, Dale Mclntyre, Mohammed Ouali, Vyacheslav Zavadsky
  • Publication number: 20060034540
    Abstract: The present invention provides a method and apparatus for reducing uneven brightness in an image from a particle based image system. This uneven brightness is most often seen as regions of shadow, but may also be seen as regions of over brightness. In cases where the uneven brightness is in the form of shadowing, the method corrects for the shadowy regions by first identifying the area of shadow, obtaining brightness information from a region near the shadow, where the brightness is optimal, applying statistical methods to determine the measured brightness as a regression function of the optimal brightness, and number and proximity of shadowy objects, then correcting the shadow area brightness by calculating the inverse of the function of the shadow brightness. With this method, the brightness within the shadowy or over brightness regions are corrected to appear at a substantially similar level of brightness as the region of optimal brightness in the image.
    Type: Application
    Filed: August 12, 2004
    Publication date: February 16, 2006
    Applicant: Semiconductor Insights Inc.
    Inventors: Vyacheslav Zavadsky, Jason Abt
  • Publication number: 20060031792
    Abstract: The method and apparatus in accordance with the present invention determines the locations of incorrectly connected polygons in a polygon representation of an integrated circuit layout. These incorrectly connected polygons result in short circuits, which often occur for major signal busses such as power and ground. It can be time-consuming to determine the exact location of the short. The invention includes the step of tessellating the polygon representation, including each conductive layer, into predetermined shapes such as triangles or trapezoids. Each of the triangles or trapezoids is then translated into a node for the development of a nodal network where nodes are connected directly to one another to represent shapes having edges adjacent to other shape edges. The current capacity of each connection between adjacent nodes is then specified. Two nodes that are electrically connected to the incorrectly connected polygons are selected and used as parameters for a network flow analysis algorithm.
    Type: Application
    Filed: August 4, 2004
    Publication date: February 9, 2006
    Applicant: Semiconductor Insights Inc.
    Inventors: Vyacheslav Zavadsky, Elmehdi Aitnouri, Edward Keyes, Jason Abt, Val Gont, Stephen Begg
  • Publication number: 20050228718
    Abstract: A point of purchase research device includes a housing having a user surface and a mounting surface adapted to cooperate with a store shelf. The housing further includes a display device affixed adjacent to the user surface and communicatively connected to a user input device and a control unit. The control unit having a processor communicatively connected to the display device and the user input device. The control unit executes a control routine on the processor and is configured to control the display device to gather consumer information from the user input device.
    Type: Application
    Filed: April 13, 2004
    Publication date: October 13, 2005
    Applicant: POP INSIGHTS INC.
    Inventor: Andrew Austin
  • Patent number: 6907583
    Abstract: A method and apparatus for extracting circuit design information from a pre-existing semiconductor integrated circuit (IC) or at least a portion thereof is described. It includes imaging at least a portion of two or more physical layers of the pre-existing IC to obtain stored electronic images of the physical IC layers, converting the stored electronic images of the physical IC layers to a vector format data, horizontally and vertically aligning the vector format data of the electronic stored images of the physical IC layers, and providing a multi-layer display of the aligned vector format data. A net-list or schematic is generated from the multi-layer display of the vector format data. The net-list and/or schematic may be generated as a number of individual pages by providing a template of circuit elements and placing a circuit element over a portion of the display corresponding to the circuit element. The template of circuit elements may include transistors, logic gates or complex circuit blocks.
    Type: Grant
    Filed: October 10, 2002
    Date of Patent: June 14, 2005
    Assignee: Semiconductor Insights, Inc.
    Inventors: Jason Abt, Thomas Kapler, Stephen Begg
  • Patent number: 6738957
    Abstract: A process in a computer system for generating a high level schematic from a project schematic of basic components which comprises scanning the project schematic for a predetermined cell, wherein the cell is made up of a select group of components and their interconnections, and replacing the select group of components on every occurrence that it is found in the project schematic by a cell symbol having input and outputs to generate the high level schematic. The process may also be repeated for other predetermined cells which may be selected from a library or created by the user.
    Type: Grant
    Filed: August 3, 2001
    Date of Patent: May 18, 2004
    Assignee: Semiconductor Insights Inc.
    Inventors: Val Gont, Jason Abt, Larry Lam, Alexei Ioudovski
  • Publication number: 20030084409
    Abstract: A method and apparatus for extracting circuit design information from a pre-existing semiconductor integrated circuit (IC) or at least a portion thereof is described. It includes imaging at least a portion of two or more physical layers of the pre-existing IC to obtain stored electronic images of the physical IC layers, converting the stored electronic images of the physical IC layers to a vector format, horizontally and vertically aligning the vector format data of the electronic images of the physical IC layers, and providing a multi-layer display of the aligned vector data. A net-list or schematic is generated from the multi-layer display of the vector data. The netlist and/or schematic may be generated as a number of individual pages by providing a template of circuit elements and placing a circuit element over a portion of the display corresponding to the circuit element. The template of circuit elements may include transistors, logic gates or complex circuit blocks.
    Type: Application
    Filed: October 10, 2002
    Publication date: May 1, 2003
    Applicant: Semiconductor Insights, Inc.
    Inventors: Jason Abt, Thomas Kapler, Stephen Begg
  • Patent number: 6549295
    Abstract: A method for making display products that generate special visual effects with autostereographic, dynamic, alternating, animated, and morphed images used in conjunction with lenticulated arrays for marketing and informational purposes. The special imaging effects, which can be integrated with discrete lenticulated container structures for data storage media and other contents, are achieved by digitally sampling and formatting source images with resampling procedures and then generating a merged image file that serves as the digital input for color printers or digital printing presses. The sampled images are printed on substrates along with registration lines or on preperforated stock preformatted for use with a corresponding lenticulated component. Afterwards, the images are separated from the substrate by either cutting them from the substrate using the printed registration lines as guides or breaking them out along the preperforated lines.
    Type: Grant
    Filed: December 14, 1998
    Date of Patent: April 15, 2003
    Assignee: Insight, Inc.
    Inventors: Stephen D. Fantone, Daniel J. Braunstein
  • Patent number: 6400366
    Abstract: A method and system for the interactive visualization and examination of data displays a set of data with graphics primitives, corresponding to attributes of the data set, in a rendered visualization. The set of data is arranged in the rendering with data items grouped in a set of ranges of data values, referred to as buckets. A user can interactively select a sub-set of the set of data and the visualization is re-rendered with the ranges of data values re-sized to display the selected sub-set with finer granularity.
    Type: Grant
    Filed: September 14, 1998
    Date of Patent: June 4, 2002
    Assignee: Visual Insights, Inc.
    Inventors: Paul T. Davies, Sandra L. Loop
  • Publication number: 20020020746
    Abstract: A system and a method for optical coding are provided in which an identifier includes information about optically coded information that is stored in one or more dimensions in a logo and/or design. The identifier and the optically coded information are structured to blend in with or hide within the logo and/or design.
    Type: Application
    Filed: September 6, 2001
    Publication date: February 21, 2002
    Applicant: SEMICONDUCTOR INSIGHTS, INC.
    Inventor: Alexander R. Roustaei
  • Publication number: 20020023107
    Abstract: A process in a computer system for generating a high level schematic from a project schematic of basic components which comprises scanning the project schematic for a predetermined cell, wherein the cell is made up of a select group of components and their interconnections, and replacing the select group of components on every occurrence that it is found in the project schematic by a cell symbol having input and outputs to generate the high level schematic. The process may also be repeated for other predetermined cells which may be selected from a library or created by the user.
    Type: Application
    Filed: August 3, 2001
    Publication date: February 21, 2002
    Applicant: Semiconductor Insights Inc.
    Inventors: Val Gont, Jason Abt, Larry Lam, Alexei Ioudovski
  • Publication number: 20020018583
    Abstract: An editor in a computer system for editing an schematic having a number of pages. The editor may cut a selected portion of the schematic from any one of the schematic pages, paste the cut portion of the schematic onto any one of the schematic pages, and connect nets located on the same schematic page. The editor may search for objects such as signal labels and cells within the schematic netlist as well as other editing functions. Further a navigator is provided for interactively viewing netlist data from a high level schematic where the data includes schematic page numbers, cell names, nets, signal labels and segments. The project viewer software and project schematic netlist data may be contained in a computer-readable medium. The project viewer software controls output schematic images and enables a user to view, trace and search objects throughout the project netlist data.
    Type: Application
    Filed: August 3, 2001
    Publication date: February 14, 2002
    Applicant: Semiconductor Insights Inc.
    Inventors: Val Gont, Jason Abt, Larry Lam
  • Patent number: 6289116
    Abstract: A method for extracting design information from a semiconductor integrated circuit (IC) or at least a portion thereof comprising the steps of: (a) imaging at least a portion of one or more IC layers to obtain stored images of said portions of the IC; (b) using manual or automatic registration techniques to mosaic images; (c) using an IC layout package possessing a feature of allowing images to be displayed and moved and polygons to be created to allow the recreation of the IC layout in the form of polygons; (d) exporting or storing of a polygon database in a standard IC layout format; (e) creating a table of transistor connections (netlist); (f) organizing circuit netlist into functional blocks of increasing complexity; and (g) generating a schematic diagram.
    Type: Grant
    Filed: September 26, 1997
    Date of Patent: September 11, 2001
    Assignee: Semiconductor Insights, Inc.
    Inventors: George Chamberlain, Larry Lam
  • Patent number: 6285902
    Abstract: An image guided surgery system to enable a surgeon to move a surgical tool into a desired position relative to a body part is provided. The system works by accurately superimposing representations of the tool being used in the surgical field over images of the body part such that real-time tool position feedback is provided to the surgeon. The system uses a fluoroscopic x-ray device to generate two-dimensional body part images, a localizing device to determine the poses of surgical tools and the x-ray device, mathematical modeling of the imaging chain of the x-ray device, and a means for displaying the images of the body part superimposed with representations of the surgical tools. A related feature is the use of a digital flat-panel x-ray imager that employs a regular array of sensors to convert incident x-ray energy to a computer readable image, thereby permitting the fluoroscopic x-ray device to be used in any orientation without being affected by distortions due to local magnetic fields.
    Type: Grant
    Filed: February 10, 1999
    Date of Patent: September 4, 2001
    Assignee: Surgical Insights, Inc.
    Inventors: Thomas C. Kienzle, III, Jon T. Lea
  • Patent number: 6236746
    Abstract: A method for analyzing an integrated circuit (IC). At least a portion of a layer of the IC is scanned using high magnification, to obtain images of the IC. The images are registered to create a mosaicked image. An IC layout database is created in the form of a set of polygons from the mosaicked image, where the step of creating the IC layout database is performed after, or pipelined with, the registering step. The process is repeated for plural IC layers, as necessary. Polygon sets from each layer are vertically registered into alignment with minimal distortion. A netlist or schematic diagram is generated to represent the scanned IC portion based on the registered set(s) of polygons.
    Type: Grant
    Filed: October 1, 1997
    Date of Patent: May 22, 2001
    Assignee: Semiconductor Insights, Inc.
    Inventors: George Chamberlain, Alexi Ioudovski, John-Scott Thomas, Ghassan Naim