Patents Assigned to Insight, Inc.
  • Patent number: 7580557
    Abstract: The present invention involves a computationally efficient method of determining the locations of standard cells in an image of an IC layout. The initial step extracts and characterizes points of interest of the image. A coarse localization of possible standard cell locations is performed and is based on a comparison of the points of interest of an instance of an extracted standard cell and the remaining points of interest in the image. A more rigid comparison is made on the list of possible locations comprising a coarse match and a fine match. The coarse match results in a shortlist of possible locations. The fine match performs comparisons between the template and the shortlist. Further filtering is done to remove the effects of noise and texture variations and statistics on the results are generated to achieve the locations of the standard cells on the IC layout.
    Type: Grant
    Filed: August 29, 2008
    Date of Patent: August 25, 2009
    Assignee: Semiconductor Insights Inc.
    Inventors: Vyacheslav L. Zavadsky, Val Gont, Edward Keyes, Jason Abt, Stephen Begg
  • Patent number: 7547650
    Abstract: The present invention is directed to flame retardant multicomponent articles. The multicomponent articles include a reactive, migratory agent which is present in at least a first component of the article. The reactive migratory agent is capable of migrating from the first component of the article into a different component of the article under flame conditions to react with an element of that second component to produce a flame retardant effect. Applications include fibers, yarns, nonwovens, carpets, other fibrous materials, films, coating and composites.
    Type: Grant
    Filed: March 7, 2006
    Date of Patent: June 16, 2009
    Assignee: Missing Octave Insights, Inc.
    Inventor: Gerald Timothy Keep
  • Publication number: 20090092285
    Abstract: A schematic diagram detailing a circuit that was reverse engineered from a plurality of images taken of the circuit is provided. The schematic diagram includes at least one circuit element that was represented as an object in at least one of the plurality of images, such that signal continuity information was determined through local tracing of connectivity between a first image and a second image of the plurality of images. A method of tracing the connectivity within the plurality of images to produce the schematic diagram is also disclosed.
    Type: Application
    Filed: February 11, 2008
    Publication date: April 9, 2009
    Applicant: Semiconductor Insights, Inc.
    Inventors: Edward Keyes, Vyacheslav L. Zavadsky
  • Publication number: 20090077066
    Abstract: A method of normalizing a bibliographic field of a structured field relational database is disclosed. The method includes weighting potential candidate records according to the value in the corresponding field in the records, together with other related fields in the candidate record and other related records in the database. Each of the candidate records is successively evaluated and compared against an acceptable threshold. If the weight exceeds the threshold, the candidate record is returned from the query. Otherwise, a new entry in the database is created. Optionally, before creating such a new entry, the highest weighted candidate record may be compared against a minimally acceptable threshold and if the weight exceeds such a lower threshold, the candidate is returned from the query.
    Type: Application
    Filed: January 7, 2008
    Publication date: March 19, 2009
    Applicant: Semiconductor Insights Inc.
    Inventor: Jason M. White
  • Publication number: 20080059920
    Abstract: A method and apparatus to reduce occurrences of electrically non-functional elements, known as dummy features, from a source data structure is described. The source data structure may be image data, a vector based data structure or some other data format. Dummy features in the source data structure are detected and then deleted. Dummy features may be detected by selecting a representative dummy feature, using it as a reference pattern or polygon and comparing it to features in the source data structure. The step of comparing the selected reference to the comprises selecting a cut-off correlation threshold value, and computing the correlation coefficients between the reference and the feature. Features are selectively removed based on a comparison between their correlation coefficients and the selected cut-off correlation threshold value. This threshold value may require updating to remove all dummy features in the source data structure.
    Type: Application
    Filed: October 24, 2007
    Publication date: March 6, 2008
    Applicant: Semiconductor Insights Inc.
    Inventors: Mohammed Ouali, Jason Abt, Edward Keyes, Vyacheslav Zavadsky
  • Patent number: 7278121
    Abstract: The method and apparatus in accordance with the present invention reduces the data size of a layout data structure by reducing the amount of electrically redundant interconnects within a bank of interconnects. Electrically redundant interconnects are the repetitive interconnects within a bank of interconnects which do not contribute to the understanding of the IC. Therefore, a number of these interconnects may be deleted from the banks in the layout data structure, provided that enough interconnects remain to maintain the electrical connectivity and the visual representation of the bank.
    Type: Grant
    Filed: August 23, 2004
    Date of Patent: October 2, 2007
    Assignee: Semiconductor Insights Inc.
    Inventors: Elmehdi Aitnouri, Edward Keyes, Stephen Begg, Val Gont, Dale McIntyre, Mohammed Ouali, Vyacheslav Zavadsky
  • Patent number: 7207018
    Abstract: The method and apparatus in accordance with the present invention determines the locations of incorrectly connected polygons in a polygon representation of an integrated circuit layout. These incorrectly connected polygons result in short circuits, which often occur for major signal busses such as power and ground. It can be time-consuming to determine the exact location of the short. The invention includes the step of tessellating the polygon representation, including each conductive layer, into predetermined shapes such as triangles or trapezoids. Each of the triangles or trapezoids is then translated into a node for the development of a nodal network where nodes are connected directly to one another to represent shapes having edges adjacent to other shape edges. The current capacity of each connection between adjacent nodes is then specified. Two nodes that are electrically connected to the incorrectly connected polygons are selected and used as parameters for a network flow analysis algorithm.
    Type: Grant
    Filed: August 4, 2004
    Date of Patent: April 17, 2007
    Assignee: Semiconductor Insights Inc.
    Inventors: Vyacheslav L. Zavadsky, Elmehdi Aitnouri, Edward Keyes, Jason Abt, Val Gont, Stephen Begg
  • Publication number: 20070011628
    Abstract: A method and apparatus to reduce occurrences of electrically non-functional elements, known as dummy features, from a source data structure is described. The source data structure may be image data, a vector based data structure or some other data format. Dummy features in the source data structure are detected and then deleted. Dummy features may be detected by selecting a representative dummy feature, using it as a reference pattern or polygon and comparing it to features in the source data structure. The step of comparing the selected reference to the comprises selecting a cut-off correlation threshold value, and computing the correlation coefficients between the reference and the feature. Features are selectively removed based on a comparison between their correlation coefficients and the selected cut-off correlation threshold value. This threshold value may require updating to remove all dummy features in the source data structure.
    Type: Application
    Filed: July 6, 2005
    Publication date: January 11, 2007
    Applicant: Semiconductor Insights Inc.
    Inventors: Mohammed Ouali, Jason Abt, Edward Keyes, Vyacheslav Zavadsky
  • Patent number: 7013028
    Abstract: An editor in a computer system for editing an schematic having a number of pages. The editor may cut a selected portion of the schematic from any one of the schematic pages, paste the cut portion of the schematic onto any one of the schematic pages, and connect nets located on the same schematic page. The editor may search for objects such as signal labels and cells within the schematic netlist as well as other editing functions. Further a navigator is provided for interactively viewing netlist data from a high level schematic where the data includes schematic page numbers, cell names, nets, signal labels and segments. The project viewer software and project schematic netlist data may be contained in a computer-readable medium. The project viewer software controls output schematic images and enables a user to view, trace and search objects throughout the project netlist data.
    Type: Grant
    Filed: August 3, 2001
    Date of Patent: March 14, 2006
    Assignee: Semiconductor Insights Inc.
    Inventors: Val Gont, Jason Abt, Larry Lam
  • Publication number: 20060041849
    Abstract: The method and apparatus in accordance with the present invention reduces the data size of a layout data structure by reducing the amount of electrically redundant interconnects within a bank of interconnects. Electrically redundant interconnects are the repetitive interconnects within a bank of interconnects which do not contribute to the understanding of the IC. Therefore, a number of these interconnects may be deleted from the banks in the layout data structure, provided that enough interconnects remain to maintain the electrical connectivity and the visual representation of the bank.
    Type: Application
    Filed: August 23, 2004
    Publication date: February 23, 2006
    Applicant: Semiconductor Insights Inc.
    Inventors: Elmehdi Aitnouri, Edward Keyes, Stephen Begg, Val Gont, Dale Mclntyre, Mohammed Ouali, Vyacheslav Zavadsky
  • Publication number: 20060034540
    Abstract: The present invention provides a method and apparatus for reducing uneven brightness in an image from a particle based image system. This uneven brightness is most often seen as regions of shadow, but may also be seen as regions of over brightness. In cases where the uneven brightness is in the form of shadowing, the method corrects for the shadowy regions by first identifying the area of shadow, obtaining brightness information from a region near the shadow, where the brightness is optimal, applying statistical methods to determine the measured brightness as a regression function of the optimal brightness, and number and proximity of shadowy objects, then correcting the shadow area brightness by calculating the inverse of the function of the shadow brightness. With this method, the brightness within the shadowy or over brightness regions are corrected to appear at a substantially similar level of brightness as the region of optimal brightness in the image.
    Type: Application
    Filed: August 12, 2004
    Publication date: February 16, 2006
    Applicant: Semiconductor Insights Inc.
    Inventors: Vyacheslav Zavadsky, Jason Abt
  • Publication number: 20060031792
    Abstract: The method and apparatus in accordance with the present invention determines the locations of incorrectly connected polygons in a polygon representation of an integrated circuit layout. These incorrectly connected polygons result in short circuits, which often occur for major signal busses such as power and ground. It can be time-consuming to determine the exact location of the short. The invention includes the step of tessellating the polygon representation, including each conductive layer, into predetermined shapes such as triangles or trapezoids. Each of the triangles or trapezoids is then translated into a node for the development of a nodal network where nodes are connected directly to one another to represent shapes having edges adjacent to other shape edges. The current capacity of each connection between adjacent nodes is then specified. Two nodes that are electrically connected to the incorrectly connected polygons are selected and used as parameters for a network flow analysis algorithm.
    Type: Application
    Filed: August 4, 2004
    Publication date: February 9, 2006
    Applicant: Semiconductor Insights Inc.
    Inventors: Vyacheslav Zavadsky, Elmehdi Aitnouri, Edward Keyes, Jason Abt, Val Gont, Stephen Begg
  • Patent number: 6907583
    Abstract: A method and apparatus for extracting circuit design information from a pre-existing semiconductor integrated circuit (IC) or at least a portion thereof is described. It includes imaging at least a portion of two or more physical layers of the pre-existing IC to obtain stored electronic images of the physical IC layers, converting the stored electronic images of the physical IC layers to a vector format data, horizontally and vertically aligning the vector format data of the electronic stored images of the physical IC layers, and providing a multi-layer display of the aligned vector format data. A net-list or schematic is generated from the multi-layer display of the vector format data. The net-list and/or schematic may be generated as a number of individual pages by providing a template of circuit elements and placing a circuit element over a portion of the display corresponding to the circuit element. The template of circuit elements may include transistors, logic gates or complex circuit blocks.
    Type: Grant
    Filed: October 10, 2002
    Date of Patent: June 14, 2005
    Assignee: Semiconductor Insights, Inc.
    Inventors: Jason Abt, Thomas Kapler, Stephen Begg
  • Patent number: 6738957
    Abstract: A process in a computer system for generating a high level schematic from a project schematic of basic components which comprises scanning the project schematic for a predetermined cell, wherein the cell is made up of a select group of components and their interconnections, and replacing the select group of components on every occurrence that it is found in the project schematic by a cell symbol having input and outputs to generate the high level schematic. The process may also be repeated for other predetermined cells which may be selected from a library or created by the user.
    Type: Grant
    Filed: August 3, 2001
    Date of Patent: May 18, 2004
    Assignee: Semiconductor Insights Inc.
    Inventors: Val Gont, Jason Abt, Larry Lam, Alexei Ioudovski
  • Publication number: 20030084409
    Abstract: A method and apparatus for extracting circuit design information from a pre-existing semiconductor integrated circuit (IC) or at least a portion thereof is described. It includes imaging at least a portion of two or more physical layers of the pre-existing IC to obtain stored electronic images of the physical IC layers, converting the stored electronic images of the physical IC layers to a vector format, horizontally and vertically aligning the vector format data of the electronic images of the physical IC layers, and providing a multi-layer display of the aligned vector data. A net-list or schematic is generated from the multi-layer display of the vector data. The netlist and/or schematic may be generated as a number of individual pages by providing a template of circuit elements and placing a circuit element over a portion of the display corresponding to the circuit element. The template of circuit elements may include transistors, logic gates or complex circuit blocks.
    Type: Application
    Filed: October 10, 2002
    Publication date: May 1, 2003
    Applicant: Semiconductor Insights, Inc.
    Inventors: Jason Abt, Thomas Kapler, Stephen Begg
  • Patent number: 6549295
    Abstract: A method for making display products that generate special visual effects with autostereographic, dynamic, alternating, animated, and morphed images used in conjunction with lenticulated arrays for marketing and informational purposes. The special imaging effects, which can be integrated with discrete lenticulated container structures for data storage media and other contents, are achieved by digitally sampling and formatting source images with resampling procedures and then generating a merged image file that serves as the digital input for color printers or digital printing presses. The sampled images are printed on substrates along with registration lines or on preperforated stock preformatted for use with a corresponding lenticulated component. Afterwards, the images are separated from the substrate by either cutting them from the substrate using the printed registration lines as guides or breaking them out along the preperforated lines.
    Type: Grant
    Filed: December 14, 1998
    Date of Patent: April 15, 2003
    Assignee: Insight, Inc.
    Inventors: Stephen D. Fantone, Daniel J. Braunstein
  • Patent number: 6400366
    Abstract: A method and system for the interactive visualization and examination of data displays a set of data with graphics primitives, corresponding to attributes of the data set, in a rendered visualization. The set of data is arranged in the rendering with data items grouped in a set of ranges of data values, referred to as buckets. A user can interactively select a sub-set of the set of data and the visualization is re-rendered with the ranges of data values re-sized to display the selected sub-set with finer granularity.
    Type: Grant
    Filed: September 14, 1998
    Date of Patent: June 4, 2002
    Assignee: Visual Insights, Inc.
    Inventors: Paul T. Davies, Sandra L. Loop
  • Publication number: 20020023107
    Abstract: A process in a computer system for generating a high level schematic from a project schematic of basic components which comprises scanning the project schematic for a predetermined cell, wherein the cell is made up of a select group of components and their interconnections, and replacing the select group of components on every occurrence that it is found in the project schematic by a cell symbol having input and outputs to generate the high level schematic. The process may also be repeated for other predetermined cells which may be selected from a library or created by the user.
    Type: Application
    Filed: August 3, 2001
    Publication date: February 21, 2002
    Applicant: Semiconductor Insights Inc.
    Inventors: Val Gont, Jason Abt, Larry Lam, Alexei Ioudovski
  • Publication number: 20020018583
    Abstract: An editor in a computer system for editing an schematic having a number of pages. The editor may cut a selected portion of the schematic from any one of the schematic pages, paste the cut portion of the schematic onto any one of the schematic pages, and connect nets located on the same schematic page. The editor may search for objects such as signal labels and cells within the schematic netlist as well as other editing functions. Further a navigator is provided for interactively viewing netlist data from a high level schematic where the data includes schematic page numbers, cell names, nets, signal labels and segments. The project viewer software and project schematic netlist data may be contained in a computer-readable medium. The project viewer software controls output schematic images and enables a user to view, trace and search objects throughout the project netlist data.
    Type: Application
    Filed: August 3, 2001
    Publication date: February 14, 2002
    Applicant: Semiconductor Insights Inc.
    Inventors: Val Gont, Jason Abt, Larry Lam
  • Patent number: 6289116
    Abstract: A method for extracting design information from a semiconductor integrated circuit (IC) or at least a portion thereof comprising the steps of: (a) imaging at least a portion of one or more IC layers to obtain stored images of said portions of the IC; (b) using manual or automatic registration techniques to mosaic images; (c) using an IC layout package possessing a feature of allowing images to be displayed and moved and polygons to be created to allow the recreation of the IC layout in the form of polygons; (d) exporting or storing of a polygon database in a standard IC layout format; (e) creating a table of transistor connections (netlist); (f) organizing circuit netlist into functional blocks of increasing complexity; and (g) generating a schematic diagram.
    Type: Grant
    Filed: September 26, 1997
    Date of Patent: September 11, 2001
    Assignee: Semiconductor Insights, Inc.
    Inventors: George Chamberlain, Larry Lam