Patents Assigned to Instron Corporation
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Patent number: 7004017Abstract: A latching coupling device for material testers is provided. The coupling can be connected and disconnected without the use of tools and includes a housing and interfacer. A spring within the latching coupling device serves to center the interfacer while snapping the interfacer shoulder and end face into compressive contact. The invention is preferably used in conjunction with penetration hardness testers and includes a penetration interfacer with an angled surface.Type: GrantFiled: April 12, 2004Date of Patent: February 28, 2006Assignee: Instron CorporationInventor: Stephen Michael McMahon
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Patent number: 6508132Abstract: A load cell for use in dynamic testing apparatus for mechanically testing samples includes an accelerometer mounted in the load cell on the same axis as the line of action of the mechanical force applied to the specimen under test. The resultant signal from the combination of the normal output from the load cell and the output from the accelerometer compensates for errors introduced by the mass of the moving grip used to grip the specimen in the apparatus.Type: GrantFiled: February 17, 1999Date of Patent: January 21, 2003Assignee: Instron CorporationInventors: Raymond David Lohr, Paul Derek Hayford, Chanchal Singh Bahra
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Patent number: 6247356Abstract: A hardness tester having a frame and a rotatable turret movably supported on the frame is provided. A plurality of load cells are fixedly mountable on the turret, and a plurality of indenters are fixedly attachable to the load cells, respectively. A user interface selectively provides signals to a motor to move the turret into contact with a test specimen via one of the indenters to thereby apply a load on the test specimen. The indenters are fixed with respect to the turret and do not move in relation to the turret when the turret is brought down to bear on the test specimen. The load cells measure the load applied to the test specimen. A closed loop control system receives load measurement signals from the load cells and controls movement of the turret, preventing the motor from applying load in excess of a predetermined selectable load amount input by a user via the user interface. The invention preferably includes a plurality of indenter adapters, each attached to respective undersides of the load cells.Type: GrantFiled: March 30, 1999Date of Patent: June 19, 2001Assignee: Instron CorporationInventors: John J. Merck, Jr., Richard Conti, Joerg Meissner, Patrick Micozzi
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Patent number: 6142010Abstract: A hardness tester is disclosed which conducts its hardness test through a penetrator impinging upon the surface of a test specimen. Enhanced accuracy and repeatability is achieved through the use of a closed loop system and directly mounting a load cell to the indentor, connecting a linear displacement transducer directly to the load cell and eliminating an elevating screw in initially positioning and applying load to the specimen to be tested.Type: GrantFiled: March 21, 1997Date of Patent: November 7, 2000Assignee: Instron CorporationInventors: John J. Merck, Jr., Jon Wyman, Richard Conti
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Patent number: 6099223Abstract: The subject invention relates to an adjustable wedge washer to be used in connection with various material testing machines which are used to mechanically test the strength of bolts, screws and other types of fasteners. The subject adjustable wedge washer includes two wedge washers being joined together mechanically with a snap ring so that they are not separable. The wedge washers then rotate relative to each other to form a variable testing angle relative to the fastener.Type: GrantFiled: December 21, 1998Date of Patent: August 8, 2000Assignee: Instron CorporationInventors: Erik J. Galis, Robert S. Whitelaw, III, Scott L. Maxwell
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Patent number: 5616857Abstract: A hardness tester is disclosed which conducts its hardness test through a penetrator impinging upon the surface of a test specimen. Enhanced accuracy and repeatability is achieved through the use of a closed loop system and directly mounting a load cell to the indentor, connecting a linear displacement transducer directly to the load cell and eliminating an elevating screw in initially positioning and applying load to the specimen to be tested.Type: GrantFiled: January 25, 1996Date of Patent: April 1, 1997Assignee: Instron CorporationInventors: John J. Merck, Jr., Jon Wyman, Richard Conti
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Patent number: 5606515Abstract: Circuitry that is used to determine the strain of a component and includes a waveform random access memory that stores excitation digital data that represent values of an excitation waveform, a digital-to-analog converter to convert the digital data to an analog excitation signal, a strain sensing transducer that receives the excitation signal and generates an analog response signal, an analog-to-digital converter that digitizes the transducer response signal, a demodulator that multiplies the digital response signal times phase adjusted values of the excitation digital data stored in the waveform memory and low-pass filters the digital response signal, and a resistance-to-voltage converter connected to present a voltage indicating the resistance of an identifying resistor to the analog-to-digital converter.Type: GrantFiled: February 3, 1993Date of Patent: February 25, 1997Assignee: Instron CorporationInventors: Robert F. Mockapetris, Fred L. Lehman
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Patent number: 5567866Abstract: A side load device for testing, for example, shock absorbers, in which an air actuator selectively moves an element to impose a side force on a product under test.Type: GrantFiled: October 18, 1994Date of Patent: October 22, 1996Assignee: Instron CorporationInventor: Victor A. Popp
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Patent number: 5440934Abstract: Limit switch control of crosshead materials testing machine movement in which a rod carrying slides selectively fixedly mounted thereon moves an actuator in a base, the actuator including camming surfaces and the base carrying limit switches actuatable by the camming surfaces, the actuator being slidable in the base between a neutral position to which it is biased and other positions to which the actuator is urged by the slides through the rod and slides pursuant to crosshead imposed forces.Type: GrantFiled: October 13, 1993Date of Patent: August 15, 1995Assignee: Instron CorporationInventor: Paulo A. Martin
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Patent number: 5413306Abstract: A testing machine frame is provided with facing extruded column covers extending between a base and a top housing, the columns continuous cross-sections providing a partially enclosed vertical zone with a vertical opening, the opening being closed above and below a crosshead with accordion blinds, and T-slots for carrying crosshead limit stops and accessories.Type: GrantFiled: March 5, 1993Date of Patent: May 9, 1995Assignee: Instron CorporationInventors: Richard J. Mahoney, III, Paulo A. Martin, Graham E. Mead, David W. Scanlon
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Patent number: 5329820Abstract: A materials testing grip for tensile testing of small fibers includes a pair of inwardlyconverging surfaces into which a fiber may be easily pressed, and which in fiber tension is characterized by increased gripping force.Type: GrantFiled: May 17, 1993Date of Patent: July 19, 1994Assignee: Instron CorporationInventor: Stephen M. McMahon
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Patent number: 4823473Abstract: An extensometer for measuring strain in a materials test speciment including a frame, a pair of arms each having one end for contacting a portion of the specimen and a remote end, and a noncontact sensor assembly mounted on the arms to measure change in distance between the contact ends, the arms being pivotally supported between the ends by the frame at the centers of gravity of the arms and attached components of the sensor, to permit the arms to be freely pivotal.Type: GrantFiled: February 13, 1987Date of Patent: April 25, 1989Assignee: Instron CorporationInventor: Stephen M. McMahon
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Patent number: 4721000Abstract: A grip for a material testing load frame including a grip plate for engaging the end of an elongated sample having a longitudinal axis and a grip body having one end for connecting to the grip plate and another end for connecting to a loading component of the frame, a mechanism for adjusting the concentricity of the plate with respect to the body, and a mechanism for adjusting the angle of the plate with respect to the body, so that when the sample end is engaged by the plate, and the grip body is connected to the loading component, the longitudinal axis and the axis of the loading component can be aligned with respect to the concentricity and angle.Type: GrantFiled: September 19, 1986Date of Patent: January 26, 1988Assignee: Instron CorporationInventor: David W. Scanlon
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Patent number: 4194402Abstract: A grip for a materials testing machine comprises a housing, first and second wedge members within the housing, the first wedge member having a gripping surface defining a test-specimen-receiving aperture and the second wedge member having an aperture for receiving the first wedge member, the wedge members being movable with respect to each other, and each of the wedge members having an inclined portion directed oppositely to the inclined portion of the other wedge member, and means for preloading the wedge members to cause them to move with respect to each other, whereby the wedge members interact to exert a gripping force on a test specimen through the first wedge member's gripping surface.Type: GrantFiled: August 31, 1978Date of Patent: March 25, 1980Assignee: Instron CorporationInventor: Joseph P. De Nicola
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Patent number: 4160325Abstract: An extensometer capable of simultaneous measurement of axial strain and torsional deflection of a specimen subjected to axial or torsional load. A pair of gauge members define reference plane surfaces, one extending parallel and another extending perpendicular to the test axis. For each reference plane surface there is a follower capable of sensing only the component of relative displacement that lies in the direction normal to the reference plane surface. The sensed values of these followers represent relative axial and torsional displacement of the gauge members. The followers of the embodiment comprise cantilevers extending from ends fixed on one gauge member to ends biased against and freely riding upon the respective reference plane surfaces on the other gauge member. A calibration stand is also shown, comprising a two-part dummy specimen, the parts aligned to define a test axis.Type: GrantFiled: November 4, 1977Date of Patent: July 10, 1979Assignee: Instron CorporationInventor: Joseph P. DeNicola
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Patent number: D351804Type: GrantFiled: March 18, 1993Date of Patent: October 25, 1994Assignee: Instron CorporationInventors: Charles W. Kellstedt, Jr., Joel Lieblein, Richard J. Mahoney, III, Paulo A. Martin, Graham E. Mead, Ronald K. Pulsifer, David W. Scanlon
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Patent number: D394015Type: GrantFiled: March 21, 1997Date of Patent: May 5, 1998Assignee: Instron CorporationInventors: Charles W. Kellstedt, Jr., Joel M. Lieblein
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Patent number: RE36392Abstract: A testing machine frame is provided with facing extruded column covers extending between a base and a top housing, the columns continuous cross-sections providing a partially enclosed vertical zone with a vertical opening, the opening being closed above and below a crosshead with accordion blinds, and T-slots for carrying crosshead limit stops and accessories.Type: GrantFiled: February 5, 1997Date of Patent: November 16, 1999Assignee: Instron CorporationInventors: Richard J. Mahoney, III, Paulo A. Martin, Graham E. Mead, David W. Scanlon