Stress:strain materials testing instrument

- Instron Corporation
Description

FIG. 1 is a front elevation view of a stress:strain material testing instrument showing our new design;

FIGS. 2 and 3 are side elevation views thereof;

FIG. 4 is a sectional view, taken at 4--4 of FIG. 1 and enlarged;

FIG. 5 is a perspective view, slightly enlarged;

FIG. 6 is a bottom plan view;

FIG. 7 is a top plan view, slightly enlarged; and,

FIG. 8 is a back elevation view.

Referenced Cited
U.S. Patent Documents
D163929 July 1951 Baum
D201342 June 1965 Adams
D250514 December 12, 1978 Etchison
3982572 September 28, 1976 Kortendick
4196635 April 8, 1980 Zuber et al.
4478086 October 23, 1984 Gram
Patent History
Patent number: D351804
Type: Grant
Filed: Mar 18, 1993
Date of Patent: Oct 25, 1994
Assignee: Instron Corporation (Canton, MA)
Inventors: Charles W. Kellstedt, Jr. (Sudbury, MA), Joel Lieblein (Sudbury, MA), Richard J. Mahoney, III (Mansfield, MA), Paulo A. Martin (Fall River, MA), Graham E. Mead (Buckinghamshire), Ronald K. Pulsifer (Pembroke, MA), David W. Scanlon (Rehoboth, MA)
Primary Examiner: Alan P. Douglas
Assistant Examiner: Antoine D. Davis
Application Number: 0/6,028