Abstract: A packaged power transistor device includes a Direct-Bonded Copper (“DBC”) substrate. Contact pads of a first lead are attached with solderless welds to a metal layer of the DBC substrate. In a first example, the solderless welds are ultrasonic welds. In a second example, the solderless welds are laser welds. A single power transistor realized on a single semiconductor die is attached to the DBC substrate. In one example, a first bond pad of the die is wire bonded to a second lead, and a second bond pad of the die is wire bonded to a third lead. The die, the wire bonds, and the metal layer of the DBC substrate are covered with an amount of plastic encapsulant. Lead trimming is performed to separate the first, second and third leads from the remainder of a leadframe, the result being the packaged power transistor device.

Abstract: An inverse diode die has a high reverse breakdown voltage, a short reverse recovery time Trr, and is rugged in terms of reverse breakdown voltage stability over long term use in hard commutation applications. The die has an unusually lightly doped bottomside P type anode region and also has an N? type drift region above it. Both regions are of bulk wafer material. An N+ type contact region extends down into the drift region. A topside metal electrode is on the contact region. A P type silicon peripheral sidewall region laterally rings around the drift region. A topside passivation layer rings around the topside electrode. A bottomside metal electrode is on the bottom of the die. The die has a deep layer of hydrogen ions that extends through the N? drift region. The die also has a shallow layer of ions. Both ion layers are implanted from the bottomside.

Abstract: A packaged semiconductor device has a thin profile, two face-to-face mounted power semiconductor device dice, and no internal bond wires. A first semiconductor device die is mounted so that a gate pad is bonded to the bottom of a first lead, and so that a source pad is bonded to the bottom of a second lead. A second semiconductor device die identical to the first is mounted so that a gate pad is bonded to the top of the first lead, and so that a source pad is bonded to the top of the second lead. The backside drain electrodes of both dice are electrically coupled to a third lead. The third lead in one example has a forked-shape, and the two dice are disposed entirely between the two tines of the fork. After encapsulation, the three leads extend parallel to each other from a body portion of the package.

Abstract: A novel four-terminal packaged semiconductor device is particularly useful in a 400 volt DC output PFC boost converter circuit. Within the body of the package an NFET die and a fast inverse diode die are mounted such that a bottomside drain electrode of the NFET is electrically coupled via a die attach tab to a bottomside P type anode region of the inverse diode. First terminal T1 is coupled the die attach tab. Second terminal T2 is coupled to the gate of the NFET die. Third terminal T3 is coupled to the source of the NFET die. Fourth terminal T4 is coupled to a topside cathode electrode of the fast inverse diode die. Due to a novel P+ type charge carrier extraction region of the inverse diode die, the packaged device is fast and has a low reverse leakage current in the PFC boost converter circuit application.

Abstract: In a first embodiment, an ultra-fast breakover diode has a turn on time TON that is less than 0.3 microseconds, where the forward breakover voltage is greater than +400 volts and varies less than one percent per ten degrees Celsius change. In a second embodiment, a breakover diode has a reverse breakdown voltage that is greater, in absolute magnitude, than the forward breakover voltage, where the forward breakover voltage is greater than +400 volts. In a third embodiment, a string of series-connected breakover diode dice is provided, along with a resistor string, in a packaged circuit. The packaged circuit acts like a single breakover diode having a large forward breakover voltage and a comparably large reverse breakdown voltage, even though the packaged circuit includes no discrete high voltage reverse breakdown diode. The packaged circuit is usable to supply a triggering current to a thyristor in a voltage protection circuit.

Abstract: A power semiconductor device module includes, among other parts, a DMB structure. The DMB structure includes a ceramic sheet, a top metal plate that is directly bonded to the top of the ceramic, and a bottom metal plate that is directly bonded to the bottom of the ceramic. A power semiconductor device die is attached to the top metal plate. The bottom surface of the bottom metal plate has a plurality small cavities. When the bottom metal plate is attached to another metal member, a material between the plate and the member (for example, thermal grease or a PCM or solder) is forced into the cavities. This results in an improvement in thermal transfer between the plate and the member. Such cavities can alternatively, or in addition, be included on a metal surface other than a DMB, such as the bottom surface of a baseplate of the module.

Abstract: An inverse diode die has a high reverse breakdown voltage, a short reverse recovery time Trr, and is rugged in terms of reverse breakdown voltage stability over long term use in hard commutation applications. The die has an unusually lightly doped bottomside P type anode region and also has an N? type drift region above it. Both regions are of bulk wafer material. An N+ type contact region extends down into the drift region. A topside metal electrode is on the contact region. A P type silicon peripheral sidewall region laterally rings around the drift region. A topside passivation layer rings around the topside electrode. A bottomside metal electrode is on the bottom of the die. The die has a deep layer of hydrogen ions that extends through the N? drift region. The die also has a shallow layer of ions. Both ion layers are implanted from the bottomside.

Abstract: A two-terminal electronic fuse device involves two switches, four diodes, switch control circuitry, and a storage capacitor, connected in a particular topology. When AC current flows through the fuse, a charging current charges the storage capacitor. Energy stored in the storage capacitor is then used to power the switch control circuitry. If the voltage on the storage capacitor drops, then the switches are opened briefly and at the correct time. Opening the switches allows the charging current to flow. By opening the switches and charging the storage capacitor only at times of low current flow through the fuse, the disturbance of load current flowing through the fuse is minimized. If an overload current condition is detected, then the fuse has tripped and first and second switches are opened. If the capacitor does not need charging and there is no overload condition, then the switches remain closed.

Abstract: A combination switch includes an Insulated Gate Bipolar Transistor (IGBT), an anti-parallel diode, and a saturable inductor. The diode and inductor are coupled in series between a collector and an emitter of the IGBT. The inductor is fashioned so that it will come out of saturation when a forward bias current flow through the diode falls below a saturation current level. When the diode current falls (for example, due to another combination switch of a phase leg turning on), the diode current initially falls at a high rate until the inductor current drops to the saturation current level. Thereafter, the diode current falls at a lower rate. The lower rate allows the diode current to have a soft landing to zero current, thereby eliminating or reducing voltage and/or current spikes that would otherwise occur. Multiple methods of implementing and manufacturing the saturable inductor are disclosed.

Abstract: A packaged power transistor device includes a Direct-Bonded Copper (“DBC”) substrate. Contact pads of a first lead are attached with solderless welds to a metal layer of the DBC substrate. In a first example, the solderless welds are ultrasonic welds. In a second example, the solderless welds are laser welds. A single power transistor realized on a single semiconductor die is attached to the DBC substrate. In one example, a first bond pad of the die is wire bonded to a second lead, and a second bond pad of the die is wire bonded to a third lead. The die, the wire bonds, and the metal layer of the DBC substrate are covered with an amount of plastic encapsulant. Lead trimming is performed to separate the first, second and third leads from the remainder of a leadframe, the result being the packaged power transistor device.

Abstract: An inverse diode die is “fast” (i.e., has a small peak reverse recovery current) due to the presence of a novel topside P+ type charge carrier extraction region and a lightly-doped bottomside transparent anode. During forward conduction, the number of charge carriers in the N-type drift region is reduced due to holes being continuously extracted by an electric field set up by the P+ type charge carrier extraction region. Electrons are extracted by the transparent anode. When the voltage across the device is then reversed, the magnitude of the peak reverse recovery current is reduced due to there being a smaller number of charge carriers that need to be removed before the diode can begin reverse blocking mode operation. Advantageously, the diode is fast without having to include lifetime killers or otherwise introduce recombination centers. The inverse diode therefore has a desirably small reverse leakage current.

Abstract: A field-effect transistor involves a drain electrode, a drift region, a body region, a source region, a gate insulator layer, and a gate electrode. The drift region is disposed above the drain electrode. The body region extends down into the drift region from a first upper semiconductor surface. The source region is ladder-shaped and extends down in the body region from a second upper semiconductor surface. The first and second upper semiconductor surfaces are substantially planar and are not coplanar. A first portion of the body region is surrounded laterally by a second portion of the body region. The second portion of the body region and the drift region meet at a body-to-drift boundary. The body-to-drift boundary has a central portion that is non-planar. A gate insulator layer is disposed over the source region and a gate electrode is disposed over the gate insulator.

Abstract: A current driver integrated circuit (IC) is coupled to control current flow through a diode. In one example, the diode is a Light Emitting Diode (LED) having an anode coupled to a supply node supplied by a battery and a cathode coupled to a drive terminal of the current driver IC. During operation the current driver IC is enabled and sinks an output current from the supply node, through the LED, through the drive terminal, and onto a ground node. As current flows through the LED, the battery is discharged. Changes in battery voltage cause an output voltage between the cathode of the LED and the ground node to change. Despite variations in output voltage, the current driver IC maintains a current level of the output current to be within five percent of a desired output current level across an output voltage range of at least 2V.

Abstract: An inverse diode die has a high reverse breakdown voltage, a short reverse recovery time Trr, and is rugged in terms of reverse breakdown voltage stability over long term use in hard commutation applications. The die has an unusually lightly doped bottomside P type anode region and also has an N? type drift region above it. Both regions are of bulk wafer material. An N+ type contact region extends down into the drift region. A topside metal electrode is on the contact region. A P type silicon peripheral sidewall region laterally rings around the drift region. A topside passivation layer rings around the topside electrode. A bottomside metal electrode is on the bottom of the die. The die has a deep layer of hydrogen ions that extends through the N? drift region. The die also has a shallow layer of ions. Both ion layers are implanted from the bottomside.

Abstract: An inverse diode die has a high reverse breakdown voltage, a short reverse recovery time Trr, and is rugged in terms of reverse breakdown voltage stability over long term use in hard commutation applications. The die has an unusually lightly doped bottomside P type anode region and also has an N? type drift region above it. Both regions are of bulk wafer material. An N+ type contact region extends down into the drift region. A topside metal electrode is on the contact region. A P type silicon peripheral sidewall region laterally rings around the drift region. A topside passivation layer rings around the topside electrode. A bottomside metal electrode is on the bottom of the die. The die has a deep layer of hydrogen ions that extends through the N? drift region. The die also has a shallow layer of ions. Both ion layers are implanted from the bottomside.

Abstract: A microcontroller controls a BLDC motor with Hall sensors. In a calibration mode, the microcontroller operates the motor at substantially constant load and speed. A first current value across the motor is detected. A reference phase angle value is adjusted and a second current value is detected. If the second current value is less than the first current value, then the reference phase angle value is adjusted and a next current value is detected. The adjusting and detecting is repeated until the next current value is greater than the previous current value indicating that the adjustment increased current across the motor. The adjusted reference phase angle value before increased motor current is stored. In a normal operating mode, using the adjusted reference phase angle value results in desired motor operation where minimal current is consumed for a given load and speed despite asymmetries in motor windings and Hall sensor placement.

Abstract: In a switching converter having an inductive load, a current may flow through the body diode of a transistor even though the gate of the transistor is being controlled to keep the transistor off. Then when the other transistor of the switch leg is turned on, a reverse recovery current flows in the reverse direction through the body diode. To reduce switching losses associated with such current flows, a gate driver integrated circuit detects when current flow through the body diode rises above a threshold current. The gate driver integrated circuit then controls the transistor to turn on. Then when the other transistor of the switch leg is made to turn on, the gate driver first turns the transistor off. When the gate-to-source voltage of the turning off transistor drops below a threshold voltage, then the gate driver integrated circuit allows and controls the other transistor to turn on.

Abstract: A gate driver integrated circuit drives an output signal onto its output terminal and onto the gate of a power transistor. In a turn-on episode, a digital input signal transitions to a digital logic high level. In response, the gate driver integrated circuit couples the output terminal to a positive supply voltage terminal, thereby driving a positive voltage onto the gate of the power transistor. In response to a high-to-low transition of the digital input signal, the driver drives a negative voltage onto the output terminal and power transistor gate for a short self-timed period of time, and then couples the output terminal to a ground terminal, thereby driving the output terminal and power transistor gate up to ground potential. The output terminal and power transistor gate are then held at ground potential in anticipation of the next turn-on episode of the power transistor.

Abstract: A Reverse Bipolar Junction Transistor (RBJT) integrated circuit comprises a bipolar transistor and a parallel-connected distributed diode, where the base region is connected neither to the collector electrode nor to the emitter electrode. The bipolar transistor has unusually high emitter-to-base and emitter-to-collector reverse breakdown voltages. In the case of a PNP-type RBJT, an N base region extends into a P? epitaxial layer, and a plurality of P++ collector regions extend into the base region. Each collector region is annular, and rings a corresponding diode cathode region. Parts of the epitaxial layer serve as the emitter, and other parts serve as the diode anode. Insulation features separate metal of the collector electrode from the base region, and from P? type silicon of the epitaxial layer, so that the diode cathode is separated from the base region. This separation prevents base current leakage and reduces power dissipation during steady state on operation.

Abstract: A power semiconductor device module includes a metal baseplate and a plastic housing that together form a tray. Power electronics are disposed in the tray. A plastic cap covers the tray. Electrical press-fit terminals are disposed along the periphery of the tray. Each electrical terminal has a press-fit pin portion that sticks up through a hole in the cap. In addition, the module includes four mechanical corner press-fit anchors disposed outside the tray. One end of each anchor is embedded into the housing. The other end is an upwardly extending press-fit pin portion. The module is manufactured and sold with the press-fit pin portions of the electrical terminals and the mechanical corner anchors unattached to any printed circuit board (PCB). The mechanical anchors help to secure the module to a printed circuit board. Due to the anchors, screws or bolts are not needed to hold the module to the PCB.