Patents Assigned to Jentek Sensors, Inc.
  • Publication number: 20050146324
    Abstract: Fabrication of samples having material conditions or damage representative of actual components inspected by nondestructive testing involves sensors placed near or mounted on the material surface, such as flexible eddy current sensors or sensor arrays, to monitor the material condition while the sample is being processed. These sample typically have real cracks in or around holes, on curved surfaces, in and under coatings, and on shot peened or otherwise preconditioned surfaces. Processing, such as mechanical or thermal loading to introduce fatigue damage, is stopped once the material condition reaches a predetermined level.
    Type: Application
    Filed: November 15, 2004
    Publication date: July 7, 2005
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, Vladimir Zilberstein, David Grundy, Volker Weiss, Andrew Washabaugh
  • Publication number: 20050127908
    Abstract: Methods and apparatus are described for absolute electrical property measurement of materials. This is accomplished with magnetic and electric field based sensors and sensor array geometries that can be modeled accurately and with impedance instrumentation that permits accurate measurements of the in-phase and quadrature phase signal components. A dithering calibration method is also described which allows the measurement to account for background material noise variations. Methods are also described for accounting for noise factors in sensor design and selection of the optimal operating conditions which can minimize the error bounds for material property estimates. Example application of these methods to automated engine disk slot inspection and assessment of the mechanical condition of dielectric materials are presented.
    Type: Application
    Filed: October 12, 2004
    Publication date: June 16, 2005
    Applicant: JENTEK Sensors, Inc.
    Inventors: Darrell Schlicker, Neil Goldfine, David Grundy, Robert Lyons, Vladimir Zilberstein, Andrew Washabaugh, Vladimir Tsukernik, Mark Windoloski, Ian Shay
  • Publication number: 20050088172
    Abstract: Quasistatic sensor responses may be converted into multiple model parameters to characterize hidden properties of a material. Methods of conversion use databases of responses and, in some cases, databases that include derivatives of the responses, to estimate at least three unknown model parameters, such as the electrical conductivity, magnetic permeability, dielectric permittivity, thermal conductivity, and/or layer thickness. These parameter responses are then used to obtain a quantitative estimate of a property of a hidden feature, such as corrosion loss layer thicknesses, inclusion size and depth, or stress variation. The sensors can be single element sensors or sensor arrays and impose an interrogation electric, magnetic, or thermal field.
    Type: Application
    Filed: September 3, 2004
    Publication date: April 28, 2005
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, Vladimir Zilberstein, Darrell Schlicker, David Grundy, Ian Shay, Robert Lyons, Andrew Washabaugh
  • Publication number: 20050083032
    Abstract: Observability of damage precursor, damage and usage states, or event occurrence may be enhanced by modifying component materials to include self-monitoring materials or by processing test material to alter the surface properties. The properties of the self monitoring materials, such as magnetic permeability or electrical conductivity, are monitored with electromagnetic sensors and provide greater property variations with component condition than the original component material. Processing includes shot peening or laser welding.
    Type: Application
    Filed: September 8, 2004
    Publication date: April 21, 2005
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, Vladimir Zilberstein, David Grundy, Andrew Washabaugh, Darrell Schlicker, Ian Shay, Robert Lyons, Christopher Craven, Christopher Root, Mark Windoloski, Volker Weiss
  • Publication number: 20050083050
    Abstract: Pressurized elastic support structures or balloons are used to press flexible sensors against the surface a material under test. Rigid support elements can also be incorporated into the inspection devices to maintain the basic shape of the inspection structure and to facilitate positioning of the sensors near the test material surface. The rigid supports can have the approximate shape of the test material surface or the pressurization of one or more balloons can be used to conform the sensor to the shape of the test material surface.
    Type: Application
    Filed: September 7, 2004
    Publication date: April 21, 2005
    Applicant: JENTEK Sensors, Inc.
    Inventors: Vladimir Tsukernik, Neil Goldfine, Andrew Washabaugh, Darrell Schlicker, Karen Walrath, Eric Hill, Vladimir Zilberstein
  • Publication number: 20050017713
    Abstract: Eddy current sensors and sensor arrays are used to characterize welds and the welding process schedule or parameters. A sensor or sensor array is placed in proximity to the test material, such as a lap joint or a butt weld, and translated over the weld region. Effective properties associated with the test material and sensor, such as an electrical conductivity or lift-off, are obtained for the weld region and the base material at a distant location from the weld region. The effective properties or features obtained from the effective property variation with position across the weld are used to assess the welding process parameters.
    Type: Application
    Filed: June 9, 2004
    Publication date: January 27, 2005
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, David Grundy, Vladimir Zilberstein, Mark Windoloski, Darrell Schlicker, Andrew Washabaugh
  • Publication number: 20050007106
    Abstract: Combined wound and micro-fabricated winding constructs are described for the inspection of materials and the detection and characterization of hidden features or flaws. These constructs can be configured as sensors or sensor arrays that are surface mounted or scanned over conducting and/or magnetizable test materials. The well-defined geometry obtained micro-fabricated windings and from carefully wound coils with known winding positions permits the use of model based inversions of sensed responses into material properties. In a preferred embodiment, the primary winding is a wound coil and the sense elements are etched or printed. The drive or sense windings can also be mounted under fasteners to improve sensitivity to hidden flaws. Ferrites and other means may be used to guide the magnetic flux and enhance the magnetic field in the test material.
    Type: Application
    Filed: May 24, 2004
    Publication date: January 13, 2005
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, Darrell Schlicker, Andrew Washabaugh, Ian Shay, Mark Windoloski, Christopher Root, Vladimir Zilberstein, David Grundy, Vladimir Tsukernik
  • Publication number: 20040239317
    Abstract: A sensor that characterizes welds in materials. The sensor includes a meandering drive winding with at least three extended portions and at least one sensing element placed between an adjacent pair of extended portions. A time varying electric current is passed through the extended portions to form a magnetic field. The sensor is placed in proximity to the test material and translated over the weld region. An electrical property of the weld region is measured for each sensing element location. The weld quality is determined using a feature of the electrical property measurement and location.
    Type: Application
    Filed: February 27, 2004
    Publication date: December 2, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Darrell E. Schlicker, David C. Grundy, Ian Shay, Andrew P. Washabaugh
  • Publication number: 20040232911
    Abstract: An apparatus for the nondestructive measurements of materials. Eddy current sensing arrays are described which provide a capability for high resolution imaging of test materials and also a high probabilitity of detection for defects. These arrays incorporate layouts for the sensing elements which take advantage of microfabrication manufacturing capabilities for creating essentially identical sensor arrays, aligning sensing elements in proximity to the drive elements, and laying out conductive pathways that promote cancellation of undesired magnetic flux.
    Type: Application
    Filed: June 23, 2004
    Publication date: November 25, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Karen E. Walrath, Ian C. Shay, David C. Grundy, Mark Windoloski
  • Publication number: 20040225474
    Abstract: A model based framework utilizing a vector of multiple material states integrates nondestructive evaluation methods that provide observability of precursor and damage states with health control actions to reduce sustainment costs and extend component lifetimes. This evaluation includes usage monitoring and onboard diagnostics to ensure damage state observability. With an adaptive damage tolerance model, a set of precursor and damage states are assumed. Monitoring of precursor states, early damage detection, and observable health control actions, combined with onboard diagnostics, permit reduced costs and ensure readiness.
    Type: Application
    Filed: January 22, 2004
    Publication date: November 11, 2004
    Applicant: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, David C. Grundy, Andrew P. Washabaugh
  • Patent number: 6798198
    Abstract: Pressurized elastic support structures or balloons are used to press flexible sensors against the surface a material under test. Rigid support elements can also be incorporated into the inspection devices to maintain the basic shape of the inspection structure and to facilitate positioning of the sensors near the test material surface. The rigid supports can have the approximate shape of the test material surface or the pressurization of one or more balloons can be used to conform the sensor to the shape of the test material surface.
    Type: Grant
    Filed: January 21, 2003
    Date of Patent: September 28, 2004
    Assignee: JENTEK Sensors, Inc.
    Inventors: Vladimir Tsukernik, Neil J. Goldfine, Andrew P. Washabaugh, Darrell E. Schlicker, Karen E. Walrath, Eric Hill, Vladimir A. Zilberstein
  • Publication number: 20040174157
    Abstract: A process control method is described which uses measurements from magnetic field sensors to monitor the condition of material, such as from a heat treatment process. The sensors can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. The sensors can be exposed to the same process conditions as the material, such as elevated temperatures, or the shielding layers can be placed between the test material and the sensors to reduce sensor exposure to the processing conditions. Additional property measurements, such as sensor lift-off, can be used to ensure proper sensors operation.
    Type: Application
    Filed: January 21, 2004
    Publication date: September 9, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Vladimir A. Zilberstein
  • Patent number: 6784662
    Abstract: An apparatus for the nondestructive measurements of materials. Eddy current sensing arrays are described which provide a capability for high resolution imaging of test materials and also a high probabilitity of detection for defects. These arrays incorporate layouts for the sensing elements which take advantage of microfabrication manufacturing capabilities for creating essentially identical sensor arrays, aligning sensing elements in proximity to the drive elements, and laying out conductive pathways that promote cancellation of undesired magnetic flux.
    Type: Grant
    Filed: March 19, 2002
    Date of Patent: August 31, 2004
    Assignee: Jentek Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Karen E. Walrath, Ian C. Shay, David C. Grundy, Mark Windoloski
  • Patent number: 6781387
    Abstract: Described is an inspection method for detecting defects in dielectic test materials using a penetrant material and a dielectric sensor. The penetrant material provides differing dielectric properties from test material and improves the dielectric contrast between defects substantially filled by the penetrant and the test material. The penetrant can be a liquid, such as water, or a powder, as long as it provides a substantially different complex permittivity than the test material.
    Type: Grant
    Filed: August 20, 2002
    Date of Patent: August 24, 2004
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Markus Zahn, Wayne D. Ryan, Ian C. Shay, Andrew Washabaugh
  • Publication number: 20040124834
    Abstract: Described are methods for pressurizing elastic support structures or balloons in sensor probes used for the inspection of components having areas of limited access. When inflated, the balloons press flexible sensors against the surface of the material under test. When deflated, the balloons permit easier insertion of the probes into the component and reduce the mechanical stresses on the sensors, thereby extending the sensor lifetime. By sequentially partially inserting the sensor into a limited access area from either side of the limited access area and scanning in opposite directions, the entire surface of the test material can be inspected.
    Type: Application
    Filed: August 28, 2003
    Publication date: July 1, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Vladimir Tsukernik, Ian C. Shay, David C. Grundy, Andrew P. Washabaugh
  • Patent number: 6727691
    Abstract: A sensor that characterizes welds in materials. The sensor includes a meandering drive winding with at least three extended portions and at least one sensing element placed between an adjacent pair of extended portions. A time varying electric current is passed through the extended portions to form a magnetic field. The sensor is placed in proximity to the test material and translated over the weld region. An electrical property of the weld region is measured for each sensing element location. The weld quality is determined using a feature of the electrical property measurement and location.
    Type: Grant
    Filed: January 15, 2002
    Date of Patent: April 27, 2004
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Darrell E. Schlicker, David C. Grundy, Ian Shay, Andrew P. Washabaugh
  • Publication number: 20040066188
    Abstract: Inductive sensors measure the near surface properties of conducting magnetic materials. The sensors generally include parallel winding segments to induce a spatially periodic magnetic field in a material under test. The sensors may provide a directionally dependent measure with measurements made in varying orientations of the sensor with respect to the material property variation directions. The sensors may be thin, conformable sensors that can be mounted on a test material and, for example, monitor crack initiation under the sensor. A second sensor may be left in air to provide a reference measurement, or the temperature of the material under test can be varied to verify the response of the individual sensing elements. Sensors can be mounted to materials under test in order to not modify the environment that is causing the stress being monitored.
    Type: Application
    Filed: August 4, 2003
    Publication date: April 8, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Andrew P. Washabaugh, Vladimir A. Zilberstein, Vladimir Tsukernik
  • Publication number: 20040056654
    Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.
    Type: Application
    Filed: May 20, 2003
    Publication date: March 25, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein, Vladimir Tsukernik
  • Publication number: 20040021461
    Abstract: Methods and apparatus are described for the inspection of materials and the detection and characterization of hidden objects, features, or flaws. Sensors and sensor arrays are used to image form two-dimensional images suitable for characterizing the hidden features. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and conducting materials, while capacitive sensors can be used for dielectric materials. Enhanced drive windings and electrode structures permit nulling or cancellation of local fields in the vicinity of the sense elements to increase sensor sensitivity. The addition of calibration windings, which are not energized during measurements, allows absolute impedance and material property measurements with nulled sensors. Sensors, sensor arrays, and support fixtures are described which permit relative motion between the drive and sense elements. This facilitates the volumetric reconstruction of hidden features and objects.
    Type: Application
    Filed: June 3, 2003
    Publication date: February 5, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Ian C. Shay, Andrew P. Washabaugh
  • Publication number: 20040004475
    Abstract: Apparatus and methods are described for the improved throughput and increased reliability for inspection of critical surfaces on aircraft engine disks. Eddy current sensor arrays allow two-dimensional images to be generated for detection of cracks in regions with fretting damage. Background variations due to fretting damage and stress variations are also accommodated. These arrays are combined with instrumentation that permits parallel data acquisition for each sensing element and rapid inspection rates. Inflatable support structures behind the sensor array improve sensor durability and reduce fixturing requirements for the inspection.
    Type: Application
    Filed: April 18, 2003
    Publication date: January 8, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, J. Stephen Cargill, Darrell E. Schlicker, Ian C. Shay, Andrew P. Washabaugh, Vladimir Tsukernik, David C. Grundy, Mark D. Windoloski