Patents Assigned to Jentek Sensors, Inc.
  • Patent number: 7411390
    Abstract: For the inspection of materials and the detection and characterization of hidden objects, features, or flaws sensors and sensor arrays are used to image form two-dimensional images suitable for characterizing the hidden features. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and conducting materials, while capacitive sensors can be used for dielectric materials. Enhanced drive windings and electrode structures permit nulling or cancellation of local fields in the vicinity of the sense elements to increase sensor sensitivity. The addition of calibration windings, which are not energized during measurements, allows absolute impedance and material property measurements with nulled sensors. Sensors, sensor arrays, and support fixtures are described which permit relative motion between the drive and sense elements. This facilitates the volumetric reconstruction of hidden features and objects.
    Type: Grant
    Filed: June 3, 2003
    Date of Patent: August 12, 2008
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Ian C. Shay, Andrew P. Washabaugh
  • Patent number: 7385392
    Abstract: An apparatus that measures electrical impedance. The apparatus includes a signal generator controlled by a master microcontroller, a plurality of data acquisition channels, each channel containing a microcontroller, a host computer that processes and stores measured values, and a communication line between the host computer and the master microcontroller.
    Type: Grant
    Filed: May 23, 2002
    Date of Patent: June 10, 2008
    Assignee: JENTEK Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Eric L. Miller
  • Patent number: 7348771
    Abstract: Sensor condition verification may be performed on electromagnetic sensors and sensor arrays mounted to a material surface. The sensors typically have a periodic winding or electrode structure that creates a periodic sensing field when driven by an electrical signal. The sensors can be thin and flexible so that they conform to the surface of the test material. Monitoring the conductivity changes of a test material, with changes in temperature, may provide a mechanism for testing the integrity of the sensor. Changes in the conductivity, due to changes in temperature, without significant lift-off changes may verify the calibration of the sensor and that the sensor elements themselves are intact.
    Type: Grant
    Filed: September 18, 2006
    Date of Patent: March 25, 2008
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Andrew P. Washabaugh, Vladimir A. Zilberstein, Vladimir Tsukemik
  • Patent number: 7289913
    Abstract: Local features such as cracks in materials are nondestructively characterized by measuring a response with an electromagnetic sensor and converting this response into a selected property using a database. The database is generated prior to data acquisition by using a model to generate a baseline response or field distribution for the sensor and combining these results with another model, which may be simpler than the first model or provide a local representation of the field perturbations around a feature, which is evaluated multiple times over a range of values of the selected property. In addition, the presence of a feature may be detected by converting the sensor response into a reference parameter, such as a lift-off factor that reflects the sensor position relative to a material edge, and using this parameter to determine a reference response that can be compared to the measured response.
    Type: Grant
    Filed: October 11, 2005
    Date of Patent: October 30, 2007
    Assignee: JENTEK Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Yanko K. Sheiretov, Mark D. Windoloski
  • Patent number: 7280940
    Abstract: The condition of insulating and semiconducting dielectric materials is assessed by a sensor array that uses electric fields to interrogate the test material. The sensor has a linear array of parallel drive conductors interconnected to form a single drive electrode and sense conductors placed on each side of and parallel to a drive conductor. Subsets of the sense conductors are interconnected to form at least two sense elements sensitive to different material regions. The sense conductors may be at different distances to the drive conductors, enabling measurement sensitivity to different depths into the test material. The material condition is assessed directly from the sense element responses or after conversion to an effective material property, such as an electrical conductivity or dielectric permittivity.
    Type: Grant
    Filed: March 7, 2006
    Date of Patent: October 9, 2007
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Yanko K Sheiretov, Andrew P. Washabaugh, David C. Grundy, Vladimir A. Zilberstein
  • Patent number: 7230421
    Abstract: Reference standards or articles having prescribed levels of damage are fabricated by monitoring an electrical property of the article material, mechanically loading the article, and removing the load when a change in electrical properties indicates a prescribed level of damage. The electrical property is measured with an electromagnetic sensor, such as a flexible eddy current sensor, attached to a material surface, which may be between layers of the article material. The damage may be in the form of a fatigue crack or a change in the mechanical stress underneath the sensor. The shape of the article material may be adjusted to concentrate the stress so that the damage initiates under the sensor. Examples adjustments to the article shape include the use of dogbone geometries with thin center sections, reinforcement ribs on the edges of the article, and radius cut-outs in the vicinity of the thin section.
    Type: Grant
    Filed: March 2, 2005
    Date of Patent: June 12, 2007
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Volker Weiss, Andrew P. Washabaugh, Vladimir A. Zilberstein
  • Patent number: 7188532
    Abstract: Observability of damage precursor, damage and usage states, or event occurrence may be enhanced by modifying component materials to include self-monitoring materials or by processing test material to alter the surface properties. The properties of the self monitoring materials, such as magnetic permeability or electrical conductivity, are monitored with electromagnetic sensors and provide greater property variations with component condition than the original component material. Processing includes shot peening or laser welding.
    Type: Grant
    Filed: September 8, 2004
    Date of Patent: March 13, 2007
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, David C. Grundy, Andrew P. Washabaugh, Darrell E. Schlicker, Ian C. Shay, Robert J. Lyons, Christopher A. Craven, Christopher Root, Mark D. Windoloski, Volker Weiss
  • Patent number: 7183764
    Abstract: Described are methods for pressurizing elastic support structures or balloons in sensor probes used for the inspection of components having areas of limited access. When inflated, the balloons press flexible sensors against the surface of the material under test. When deflated, the balloons permit easier insertion of the probes into the component and reduce the mechanical stresses on the sensors, thereby extending the sensor lifetime. By sequentially partially inserting the sensor into a limited access area from either side of the limited access area and scanning in opposite directions, the entire surface of the test material can be inspected.
    Type: Grant
    Filed: August 28, 2003
    Date of Patent: February 27, 2007
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Vladimir Tsukernik, Ian C. Shay, David C. Grundy, Andrew P. Washabaugh
  • Patent number: 7161350
    Abstract: Material condition monitoring may be performed by electromagnetic sensors and sensor arrays mounted to the material surface. The sensors typically have a periodic winding or electrode structure that creates a periodic sensing field when driven by an electrical signal. The sensors can be thin and flexible so that they conform to the surface of the test material. They can also be mounted such that they do not significantly modify the environmental exposure conditions for the test material, such as by creating stand-off gaps between the sensor and material surface or by perforating the sensor substrate.
    Type: Grant
    Filed: August 4, 2003
    Date of Patent: January 9, 2007
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, David C. Clark, Karen E. Walrath, Volker Weiss, William M. Chepolis, Andrew P. Washabaugh, Vladimir A. Zilberstein, Vladimir Tsukernik
  • Patent number: 7161351
    Abstract: Quasistatic sensor responses may be converted into multiple model parameters to characterize hidden properties of a material. Methods of conversion use databases of responses and, in some cases, databases that include derivatives of the responses, to estimate at least three unknown model parameters, such as the electrical conductivity, magnetic permeability, dielectric permittivity, thermal conductivity, and/or layer thickness. These parameter responses are then used to obtain a quantitative estimate of a property of a hidden feature, such as corrosion loss layer thicknesses, inclusion size and depth, or stress variation. The sensors can be single element sensors or sensor arrays and impose an interrogation electric, magnetic, or thermal field.
    Type: Grant
    Filed: September 3, 2004
    Date of Patent: January 9, 2007
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Darrell E. Schlicker, David C. Grundy, Ian C. Shay, Robert J. Lyons, Andrew P. Washabaugh
  • Patent number: 7106055
    Abstract: Fabrication of samples having material conditions or damage representative of actual components inspected by nondestructive testing involves sensors placed near or mounted on the material surface, such as flexible eddy current sensors or sensor arrays, to monitor the material condition while the sample is being processed. These sample typically have real cracks in or around holes, on curved surfaces, in and under coatings, and on shot peened or otherwise preconditioned surfaces. Processing, such as mechanical or thermal loading to introduce fatigue damage, is stopped once the material condition reaches a predetermined level.
    Type: Grant
    Filed: November 15, 2004
    Date of Patent: September 12, 2006
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, David C. Grundy, Volker Weiss, Andrew P. Washabaugh
  • Patent number: 7095224
    Abstract: A process control method is described which uses measurements from magnetic field sensors to monitor the condition of material, such as from a heat treatment process. The sensors can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. The sensors can be exposed to the same process conditions as the material, such as elevated temperatures, or the shielding layers can be placed between the test material and the sensors to reduce sensor exposure to the processing conditions. Additional property measurements, such as sensor lift-off, can be used to ensure proper sensors operation.
    Type: Grant
    Filed: January 21, 2004
    Date of Patent: August 22, 2006
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Vladimir A. Zilberstein
  • Patent number: 7049811
    Abstract: A test circuit having a drive winding with parallel conducting segments and a plurality of sense elements used for the nondestructive measurement of materials. The drive winding segments have extended portions and are driven by a time varying electric current to impose a magnetic field in the test material. Sense elements are distributed in a direction parallel to the extended portions of these drive segments, with separate connections provided to each sense element. A second plurality of sense elements may also be distributed parallel to the extended portions of the drive windings, being either aligned or offset from a first plurality of sense elements.
    Type: Grant
    Filed: June 23, 2004
    Date of Patent: May 23, 2006
    Assignee: JENTEK Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Karen E. Walrath, Ian C. Shay, David C. Grundy, Mark Windoloski
  • Publication number: 20060082366
    Abstract: Inductive sensors measure the near surface properties of conducting and magnetic material. A sensor may have primary windings with parallel extended winding segments to impose a spatially periodic magnetic field in a test material. Those extended portions may be formed by adjacent portions of individual drive coils. Sensing elements provided every other half wavelength may be connected together in series while the sensing elements in adjacent half wavelengths are spatially offset. Certain sensors include circular segments which create a circularly symmetric magnetic field that is periodic in the radial direction. Such sensors are particularly adapted to surround fasteners to detect cracks and can be mounted beneath a fastener head. In another sensor, sensing windings are offset along the length of parallel winding segments to provide material measurements over different locations when the circuit is scanned over the test material.
    Type: Application
    Filed: March 2, 2005
    Publication date: April 20, 2006
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, Darrell Schlicker, Karen Walrath, Volker Weiss, Andrew Washabaugh, Vladimir Zilberstein
  • Publication number: 20060076952
    Abstract: Apparatus and methods are described for assessing material condition through magnetic field measurements that provide material property information at multiple depths into the material. The measurements are obtained from sense elements located at different distances from an excitation drive winding, with the area of each sense element adjusted so that the flux of magnetic field through each sense element is approximately the same when over a reference material. These sense element responses can be combined, for example by subtraction, to enhance sensitivity to hidden features, such as cracks beneath fastener heads, while reducing the influence from variable effects, such as fastener material type and placement. Measurement responses can also be converted into effective material properties, using a model that accounts for known properties of the sensor and test material, which are then correlated with the size of the surface breaking or hidden features.
    Type: Application
    Filed: February 11, 2005
    Publication date: April 13, 2006
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, Darrell Schlicker, David Grundy, Mark Windoloski, Ian Shay, Andrew Washabaugh
  • Patent number: 6995557
    Abstract: A sensor that characterizes welds in materials. The sensor includes a meandering drive winding with at least three extended portions and at least one sensing element placed between an adjacent pair of extended portions. A time varying electric current is passed through the extended portions to form a magnetic field. The sensor is placed in proximity to the test material and translated over the weld region. An electrical property of the weld region is measured for each sensing element location. The weld quality is determined using a feature of the electrical property measurement and location.
    Type: Grant
    Filed: February 27, 2004
    Date of Patent: February 7, 2006
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Darrell E. Schlicker, David C. Grundy, Ian Shay, Andrew P. Washabaugh
  • Patent number: 6992482
    Abstract: Magnetic field sensor probes are disclosed which comprise primary or drive windings having a plurality of current carrying segments. The relative magnitude and direction of current in each segment are adjusted so that the resulting interrogating magnetic field follows a desired spatial distribution. By changing the current in each segment, more than one spatial distribution for the magnetic field can be imposed within the same sensor footprint. Example envelopes for the current distributions approximate a sinusoid in Cartesian coordinates or a first-order Bessel function in polar coordinates. One or more sensing elements are used to determine the response of a test material to the magnetic field. These sense elements can be configured into linear or circumferential arrays.
    Type: Grant
    Filed: November 8, 2001
    Date of Patent: January 31, 2006
    Assignee: Jentek Sensors, Inc.
    Inventors: Ian Shay, Neil J. Goldfine, Andrew P. Washabaugh, Darrell E. Schlicker
  • Publication number: 20060009865
    Abstract: The condition of internal or hidden material layers or interfaces is monitored and used for control of a process that changes a condition of a material system. The material system has multiple component materials, such as layers or embedded constituents, or can be represented with multiple layers to model spatial distributions in the material properties. The material condition changes as a result of a process performed on the material, such as by cold working, or from functional operation. Sensors placed proximate to the test material surface or embedded between material layers are used to monitor a material property using magnetic, electric, or thermal interrogation fields. The sensor responses are converted into states of the material condition, such as temperature or residual stress, typically with a precomputed database of sensor responses.
    Type: Application
    Filed: March 14, 2005
    Publication date: January 12, 2006
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, Vladimir Zilberstein, Ian Shay, Christopher Craven, David Grundy, Volker Weiss, Andrew Washabaugh
  • Publication number: 20050248339
    Abstract: Inductive sensors measure the near surface properties of conducting and magnetic material. A sensor may have primary windings with parallel extended winding segments to impose a spatially periodic magnetic field in a test material. Those extended portions may be formed by adjacent portions of individual drive coils. Sensing elements provided every other half wavelength may be connected together in series while the sensing elements in adjacent half wavelengths are spatially offset. Certain sensors include circular segments which create a circularly symmetric magnetic field that is periodic in the radial direction. Such sensors are particularly adapted to surround fasteners to detect cracks and can be mounted beneath a fastener head. In another sensor, sensing windings are offset along the length of parallel winding segments to provide material measurements over different locations when the circuit is scanned over the test material.
    Type: Application
    Filed: February 11, 2005
    Publication date: November 10, 2005
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, Darrell Schlicker, David Grundy, Mark Windoloski, Ian Shay, Andrew Washabaugh
  • Patent number: RE39206
    Abstract: An instrument and method for providing accurate and reproducible measurement of absolute properties of a material under test without using conductivity or crack calibration standards. The instrument has a sensor designed to minimize unmodeled parasitic effects. To accomplish this, the sensor has one or more of the following features: dummy secondary elements located at the ends of a primary winding meandering, setting back of the sensing element from a connecting portion of the primary winding, or various grouping of secondary elements. The sensing elements of the sensor can be connected individually or in differential mode to gather absolute or differential sensitivity measurements. In addition, the instrumentation is configured such that a significant portion of the instrumentation electronics is placed as close to the sensor head to provide independently controllable amplification of the measurement signals therein reducing noise and other non-modeled effects.
    Type: Grant
    Filed: February 13, 2003
    Date of Patent: July 25, 2006
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh