Abstract: A probe pin for testing a target object, comprises a body portion of which a lower end is connected to a substrate and extends in a vertical direction and an upper end is to be in contact with a target object; and a housing provided to surround at least a part of the body portion and configured to support the body portion, wherein the body portion includes: a tip portion to be in contact with the target object; a spring portion extending from the tip portion and supplying an elastic force to the body portion in the vertical direction; and a connection portion extending from the spring portion and connected to the substrate.