Probe pin

- LUKEN Technologies

Latest LUKEN Technologies Patents:

Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a perspective view of a probe pin, showing my new design;

FIG. 2 is a front view of the probe pin;

FIG. 3 is a rear view of the probe pin;

FIG. 4 is a left side view of the probe pin;

FIG. 5 is a right side view of the probe pin;

FIG. 6 is a top view of the probe pin;

FIG. 7 is a bottom view of the probe pin; and,

FIG. 8 is an exploded view of the probe pin.

Claims

The ornamental design for a probe pin, as shown and described.

Referenced Cited
U.S. Patent Documents
D769748 October 25, 2016 Teranishi
D769749 October 25, 2016 Teranishi
D775984 January 10, 2017 Teranishi
D776551 January 17, 2017 Teranishi
D776552 January 17, 2017 Teranishi
11387587 July 12, 2022 Ramsey
D1051865 November 19, 2024 Ahn
20140225638 August 14, 2014 Sakai
20160252547 September 1, 2016 Soerensen
20240044939 February 8, 2024 Wu
20240426871 December 26, 2024 Ahn
20250219307 July 3, 2025 Baek
20250283913 September 11, 2025 Shoji
Foreign Patent Documents
3020210015831M001 April 2021 KR
30-1164482 May 2022 KR
30-1164483 May 2022 KR
30-1164484 May 2022 KR
30-1164485 May 2022 KR
30-1164486 May 2022 KR
30-1164489 May 2022 KR
30-1164490 May 2022 KR
30-1164491 May 2022 KR
30-1164492 May 2022 KR
30-1164493 May 2022 KR
30-1164499 May 2022 KR
30-1164500 May 2022 KR
30-1170375 June 2022 KR
30-1170376 June 2022 KR
3020220022320M001 June 2022 KR
3020220022321M001 June 2022 KR
3020220022326M001 June 2022 KR
30-1204479 February 2023 KR
30-1204482 February 2023 KR
30-1204485 February 2023 KR
30-1204488 February 2023 KR
30-1213669 April 2023 KR
30-1213685 April 2023 KR
Other references
  • EPP Europe Electronics Production and Test,Miniaturisation and performance in probe pins,Date first available Oct. 27, 2016, retrieved Jan. 26, 2026, available from https://epp-europe-news.com/technology/applications/miniaturisation-and-performance-in-probe-pins/#slider-intro-2 (Year: 2016).
  • Yamaichi Electronics,What Materials and Technologies Are Used to Make Burn-in Test Sockets for Semiconductor,Date first availableJul. 2, 2024 , retrieved Jan. 26, 2026,available from https://www.yamaichi.co.jp/en/column/ (Year: 2024).
  • Theelec,Qualmax, a company specialized in probe pins for semiconductor testing, increasedproduction by 50%,Date first available Jan. 8, 2019, retrieved Jan. 26, 2026,available from https://thelec.net/news/articleView.html?idxno=108 (Year: 2019).
Patent History
Patent number: D1123663
Type: Grant
Filed: Jul 26, 2023
Date of Patent: Apr 28, 2026
Assignee: LUKEN Technologies (Gyeonggi-do)
Inventor: Yun Tae An (Gyeonggi-do)
Primary Examiner: Justin M Jonaitis
Assistant Examiner: Sara S Sahneh
Application Number: 29/898,317