Patents Assigned to Measurement Technology Ltd.
  • Patent number: 12352617
    Abstract: Methods and systems for eccentric load error correction are disclosed. A plurality of weighing data sets for a weight having a mass value are obtained, where the weight is loaded at different positions on a weighing platform of a weighing device. Differences between each of the weighing data sets and the average value of the plurality of weighing data sets or the mass value of the weight are calculated. Sensor correction coefficients are calculated and updated when the maximum absolute value of the differences exceeds a pre-set threshold. The weighing data sets are updated. The above steps are repeated until the absolute values of all the differences are less than the pre-set threshold.
    Type: Grant
    Filed: July 8, 2021
    Date of Patent: July 8, 2025
    Assignees: Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.
    Inventors: Shenhui Wang, Yujuan Zha, Song Zhang, Genjun Ji, Qiang Fu, Jinkang Han, Jinli Li
  • Patent number: 12332109
    Abstract: A method for configuring a calibration mechanism in a force sensor (100) has the steps of: coupling an end of the calibration lever (1071) to a loading end (102) of the force sensor; adjusting, in a no-load condition, the center of gravity (G0) of the unloaded calibration lever (1071), so that the center of gravity (G0) lies on a horizontal line (H) through the center of a calibration lever fulcrum (1031) at a fixed end (103) thereof; and adjusting, in a full-load condition, the center of gravity (G1) of the calibration lever (1071) loaded with the calibration weight (106), so that the center of gravity (G1) lies on the horizontal line (H) through the center of the calibration lever fulcrum. The calibration error caused by inclination in the force sensor is reduced by practice of this method.
    Type: Grant
    Filed: June 23, 2021
    Date of Patent: June 17, 2025
    Assignees: Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler Toledo International Trading (Shanghai) Co., Ltd
    Inventors: Lei Xu, Jean Christophe Emery, Li Yang
  • Patent number: 12313443
    Abstract: A method of weighing using a scale (10) comprises the steps of: recognizing at least one of a plurality of objects placed within an object recognition area (A) of a platform (20) of the scale (10), and weighing the plurality of objects placed on the platform (20) of the scale (10) to determine a total weight of the plurality of objects. A weighing device (10) comprises the platform (20) configured as a plane, and utilizes the aforementioned weighing method. The method of weighing is advantageous in that it reduces the difficulty of object recognition using an algorithm by increasing the degree to which the object on the weighing platform fits the algorithm, reduces the complexity of the operation flow and the time required, and effectively increases the precision and accuracy of object recognition.
    Type: Grant
    Filed: July 29, 2020
    Date of Patent: May 27, 2025
    Assignees: Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.
    Inventors: Song Zhang, Kan Liu, Shenhui Wang, Zhiqiang Wang, Kai Yin
  • Patent number: 12292324
    Abstract: These disclosures provide a weight stability control method for a deadweight force standard machine. For each weight in a sequence until all weights are loaded: weight platform is relatively rapidly moved downwards from an initial position, lifting a first-stage weight by a weight disk, and starting to load the first-stage weight starts; the first-stage weight is displaced relatively slowly when the first-stage weight communicates with a second-stage weight via corresponding lifting components for the first time; after the first-stage weight is completely separated from the second-stage weight, relatively rapidly displacing the weight platform downwards again until a gap between the first-stage weight and the second-stage weight reaches half of a pre-set gap value. The method provides control over the stability of the weights, effectively solving the weight shaking problem and improving testing efficiency.
    Type: Grant
    Filed: March 7, 2022
    Date of Patent: May 6, 2025
    Assignees: Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo (Changzhon) Precision Instruments Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.
    Inventors: Hanqing Xu, Leiyue Zhang
  • Patent number: 12276539
    Abstract: A method and device are provided for diagnosing a weighing system. In the method, the weighing system acquires an intrinsic parameter, a status parameter, and an operating parameter of various components of the weighing system, environmental parameters of the weighing system application, and communication data and interaction data among all the components. A first-level prompt is sent when the status of any of the components is abnormal, such that the system stops operating. A second-level prompt is sent when the status of each of the components is normal and the service life status of at least one of the components reaches a preset threshold. A third-level prompt is sent when the status of each of the components is normal and a system performance abnormality event is identified for the performance status of the system. A fourth-level prompt is sent when the status of each of the components is normal.
    Type: Grant
    Filed: June 2, 2021
    Date of Patent: April 15, 2025
    Assignees: Mettler-Toledo (Changzhou) Precision Instruments Ltd, Mettler Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.
    Inventors: Jianqiang Yang, Lifeng Cai, Jianwei Wu
  • Patent number: 12228244
    Abstract: A mechanical apparatus levelling mechanism has a base (10), an adjusting screw rod (20), an adjusting plate (30) and a support plate (40). The adjusting screw rod penetrates into the adjusting plate in an axial direction and is connected to the base. The adjusting plate is located on the base; the support plate is mounted at a top end of the adjusting screw rod and is located above the adjusting plate; and the adjusting plate rotates to drive the adjusting screw rod to rotate, such that the support plate is adjusted vertically. This simplifies the operation procedure, improving the assembly accuracy and improving the working efficiency. The method is simple to operate. These adjusting mechanisms are convenient to move and simple to adjust, are time-saving and labour-saving, and have adjustment dimensions that can be quantified. Moreover, the installation is simple, and the adjusting mechanisms themselves can be reused.
    Type: Grant
    Filed: March 24, 2021
    Date of Patent: February 18, 2025
    Assignees: Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler Toledo International Trading (Shanghai) Co., Ltd.
    Inventors: Shaowen Zheng, Dengyou Chen, Huaqiang Hui, Gang Wu, Qingsong Zhao, Long Qian, Pengbo Hao
  • Patent number: 12197599
    Abstract: A method and apparatus for managing information about a measurement device, which is applied to a network system including a plurality of blockchains that includes a first blockchain and a second blockchain, data sender node devices and data manager node devices, the method can comprise receiving a cross-chain request from a data manager node device for device state information associated with a measurement device stored in the first blockchain, wherein the data manager node device is a node device for a second blockchain, verifying, in response to the cross-chain request, that a data manager associated with the data manager node is authorized to manage the device state information, obtaining a target depository transaction corresponding to the device state information, wherein the target depository transaction is stored on the first blockchain and was previously saved to the first blockchain by a data sender node device, wherein the data sender node device is a node device for the first blockchain, and perfo
    Type: Grant
    Filed: January 12, 2021
    Date of Patent: January 14, 2025
    Assignees: Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd. Ltd.
    Inventors: QianNi Duan, GuoJun Xie, Jean-Christophe Emery, Feng Dai
  • Patent number: 12056761
    Abstract: A method for operating a measurement device using a blockchain. A blockchain system comprises a lease platform node or lease platform node device, a lessor client, and a lessee client. Existing state information about the measurement device is stored in the blockchain. The method can include receiving a lease order for the measurement device that is sent by a lessee client, sending a lease notification based on the measurement device to the lessor client to notify the lessor to send the measurement device to the lessee, receiving, after the lessee receives the measurement device sent by the lessor, a device state detection request sent by the lessee client or the measurement device, wherein the device state detection request comprises first current state information about the measurement device, and detecting whether the first current state information matches the existing state information, and if yes, creating a lease contract for the measurement device.
    Type: Grant
    Filed: February 11, 2021
    Date of Patent: August 6, 2024
    Assignees: Mettler-Toledo (Chagzhou) Precision Instruments Ltd., Mettler-Toledo Measurement Technology Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.
    Inventors: JianQiang Yang, GuoJun Xie
  • Patent number: 12055431
    Abstract: A hysteresis compensation method, in which a hysteresis error is calculated for an obtained weighing value by means of an ideal hysteresis error model, and an ideal compensation value is further calculated by means of an ideal hysteresis compensation model, wherein by using a proportional relationship between a system hysteresis error model established in hysteresis calibration and the ideal hysteresis error model, the ideal compensation value is corrected to a final compensation value. The method establishes a mapping relationship between the system's own hysteresis compensation and the ideal state hysteresis compensation, and realizes the transformation of a complicated hysteresis error compensation situation into an ideal hysteresis error compensation situation. The method not only has a good compensation effect for the hysteresis error compensation under ideal situations, but also can obtain an excellent hysteresis compensation effect under complicated hysteresis situations.
    Type: Grant
    Filed: July 29, 2020
    Date of Patent: August 6, 2024
    Assignees: Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.
    Inventors: Song Zhang, Shenhui Wang, Shenjian Qian, Qin Sun
  • Patent number: 11879770
    Abstract: A weighing method has an automatic micro-calibration function. In the method, an automatic adjustment is performed by a self-calibration weighing module. When the result of the adjustment does not meet a requirement, an automatic calibration is performed by the self-calibration weighing module, followed by weighing fine formulation materials. In the weighing method, the self-calibration module is used to perform the automatic calibration function to weigh the fine formulation materials. This provides a high degree of automation, and greatly reduced cost in equipment and labor for a formulating process, saving on time and labor, and with no risk of cross-contamination.
    Type: Grant
    Filed: March 12, 2021
    Date of Patent: January 23, 2024
    Assignees: Mettler-Toledo (Changzhou) Precision Instruments Ltd, Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd
    Inventors: Zhengwei Ji, Chunhui Li, ZhiHe Chao
  • Patent number: 11846539
    Abstract: A method and a system measure interfering influences on a checkweighing device. In the method, external interference data are obtained, as are interference data from the checkweighing device itself and interference data from an object being weighed, by calculating or mapping the weighing error data in the stationary state, in the operating state, and in the weighing state. The system for measuring the interference uses a meter and a processing apparatus. The meter and the processing apparatus perform an interference measurement and a compensation method. The amount of interference in the checkweighing device in each state and the amount of influence of the interference on the weighing performance is obtained, thereby facilitating the production, debugging, maintenance, and use of a checkweighing device.
    Type: Grant
    Filed: April 23, 2021
    Date of Patent: December 19, 2023
    Assignees: Mettler-Toledo (Changzhou) Precision Instruments Ltd, Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.
    Inventors: Shenhui Wang, Huifang Wu, Ming Cai, Qi Han, Dongjie Qiu, Wenjun Jiang, Jindong Cui, Bin Zhu
  • Patent number: 11762480
    Abstract: A key determination method for a metal key. The method comprises a step of determining whether values output by an electrical parameter converter on a metal key satisfy multiple levels of thresholds, and, a step of setting a press flag of the metal key according to multiple levels of thresholds; and after the metal key is released, determining whether a release flag is valid according to a press model, and if so, clearing the press flag that was previously set. Different press models and different thresholds are selected and configured by means of software, so that personalized choices are provided for respective metal keys, which effectively facilitates different operators in configuring a metal keyboard according to usage habits, thereby improving the operating efficiency. In addition, the setting of different thresholds effectively protects the operational details mean for the exclusive use of operators, thereby achieving the required confidentiality.
    Type: Grant
    Filed: December 29, 2020
    Date of Patent: September 19, 2023
    Assignees: Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.
    Inventors: Jingke Wang, Shujun Wang, Shenjian Qian, Yong Yang
  • Patent number: 11733084
    Abstract: An integrated high-precision weighing module has a shell, an electromagnetic force sensor, a printed circuit board (PCB), a weighing pan component, a support ring, and an air baffle ring. The electromagnetic force sensor and the PCB are mounted in the shell. A bearing head of the electromagnetic force sensor extends upward from an upper end portion of the shell. The support ring sheathes the bearing head. The weighing pan component is mounted on the bearing head, with the support ring located between the weighing pan component and the shell. The air baffle ring is disposed around the weighing pan component and located on the support ring. A first airflow channel is formed among the shell, the support ring, and the air baffle ring. At least part of airflow in the shell flows to the outside through the first airflow channel.
    Type: Grant
    Filed: May 10, 2021
    Date of Patent: August 22, 2023
    Assignees: Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.
    Inventors: Dandan Huang, Xiang Li, Ping Zhang, JinJie Cai
  • Patent number: 11540706
    Abstract: Presented herein is a method of using a manually-operated light plane generating module to make accurate measurements of the dimensions of an object seen in an image taken by an endoscopic camera. The method comprises: providing the light plane generating module with distinctive features, introducing the light plane generating module until the distinctive features are visible in the image, aligning the light plane across the object, and providing a processor device and software configured to analyze the camera images. Also described are diagnostic or therapeutic endoscopic tools that comprise an attached light plane generating module to provide the tool with integrated light plane measurement capabilities, wherein the tool is configured to be used in the described method.
    Type: Grant
    Filed: April 11, 2018
    Date of Patent: January 3, 2023
    Assignee: V.T.M. (Virtual Tape Measure) Technologies Ltd.
    Inventor: Avishay Sidlesky
  • Publication number: 20210209094
    Abstract: A method and apparatus are disclosed for managing a measurement device based on a blockchain, which is applied to node devices in a blockchain network. The method can include obtaining device state data of the measurement device at various stages in the life cycle of the measurement device; constructing a target transaction based on the obtained device state data, and then sending the target transaction to other node devices in the blockchain network to perform consensus processing on the target transaction; and storing, when a consensus of the target transaction is reached, the target transaction into a distributed ledger of the blockchain network, wherein the target transaction stored in the distributed ledger of the blockchain network is used for life cycle management of the measurement device.
    Type: Application
    Filed: January 4, 2021
    Publication date: July 8, 2021
    Applicants: Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.
    Inventors: Jean-Christophe EMERY, Michael HEIDINGSFELDER, Eugen SCHIBLI, Feng DAI, Qing CHEN, GuoJun XIE
  • Patent number: 11022506
    Abstract: A force sensor has a first end portion (1), a second end portion (2), a parallel-guiding mechanism (3), a beam (4), and a strain gauge (5). The parallel-guiding mechanism (3) connects the first end portion (1) to the second end portion (2). A main beam (43) of the beam has a flexible wall (435) and a rigid wall (432). A first connecting part (41) connects the flexible wall to the first end portion, and a second connecting part (42) connects the rigid wall to the second end portion. The strain gauge (5) is fixed to the flexible wall (435). The force sensor can measure a relatively small force.
    Type: Grant
    Filed: November 28, 2017
    Date of Patent: June 1, 2021
    Assignees: Mettler-Toledo (Changzhou) Precision Instrument Ltd., Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.
    Inventors: Jianwen Wang, Yujun Xu, Wei Wang
  • Patent number: D980096
    Type: Grant
    Filed: April 13, 2021
    Date of Patent: March 7, 2023
    Assignees: Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.
    Inventors: Peng Jiang, Wanchuan Hu, Xu Sun, Dongsong Li, Liang Zhao, Jian Gong, Guangteng Zhu
  • Patent number: D1023806
    Type: Grant
    Filed: December 12, 2022
    Date of Patent: April 23, 2024
    Assignees: Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo Technologies (China) Co., Ltd
    Inventors: YinXiu Zhang, Elmar Merk, Jozsef Varga
  • Patent number: D1048172
    Type: Grant
    Filed: April 11, 2022
    Date of Patent: October 22, 2024
    Assignees: Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.
    Inventors: Yinxiu Zhang, Pengbo Hao
  • Patent number: D1061704
    Type: Grant
    Filed: November 27, 2023
    Date of Patent: February 11, 2025
    Assignees: Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.
    Inventors: Yinxiu Zhang, Pengbo Hao