Detection system using x-rays
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Description
The broken lines in the drawings depict parts of the detection system using X-rays that form no part of the claim.
Claims
The ornamental design for a detection system using X-rays, as shown and described.
Referenced Cited
U.S. Patent Documents
11080891 | August 3, 2021 | Kim |
Patent History
Patent number: D980096
Type: Grant
Filed: Apr 13, 2021
Date of Patent: Mar 7, 2023
Assignees: Mettler-Toledo (Changzhou) Measurement Technology Ltd. (Changzhou), Mettler-Toledo (Changzhou) Precision Instruments Ltd. (Changzhou), Mettler-Toledo International Trading (Shanghai) Co., Ltd. (Shanghai)
Inventors: Peng Jiang (ChangZhou), Wanchuan Hu (Shanghai), Xu Sun (Changzhou), Dongsong Li (Suzhou), Liang Zhao (Shanghai), Jian Gong (Changzhou), Guangteng Zhu (Changzhou)
Primary Examiner: Antoine Duval Davis
Application Number: 29/778,374
Type: Grant
Filed: Apr 13, 2021
Date of Patent: Mar 7, 2023
Assignees: Mettler-Toledo (Changzhou) Measurement Technology Ltd. (Changzhou), Mettler-Toledo (Changzhou) Precision Instruments Ltd. (Changzhou), Mettler-Toledo International Trading (Shanghai) Co., Ltd. (Shanghai)
Inventors: Peng Jiang (ChangZhou), Wanchuan Hu (Shanghai), Xu Sun (Changzhou), Dongsong Li (Suzhou), Liang Zhao (Shanghai), Jian Gong (Changzhou), Guangteng Zhu (Changzhou)
Primary Examiner: Antoine Duval Davis
Application Number: 29/778,374
Classifications
Current U.S. Class:
Chemical (12) (D10/81)