Patents Assigned to Mitel Semiconductor
  • Current control circuit and method for programmable read write preamplifier
    Patent number: 5790331
    Abstract: Write and read bias current control circuits are programmable through a control port. Both the read head bias DAC and the write DAC are controlled through a control port and both DACs use current as an input reference. The write and the read bias currents have constant reference current components which are set externally. The write and the read bias currents additionally have components which are a product of the reference current and a digital word loaded into an associated one of the DACs.
    Type: Grant
    Filed: August 11, 1995
    Date of Patent: August 4, 1998
    Assignee: Mitel Semiconductor Americas Inc.
    Inventor: Anatoly Aranovsky
  • Bare die testing
    Patent number: 5786701
    Abstract: A testing apparatus for testing integrated circuits at the bare die stage includes a testing station at which microbumps of conductive material are located on interconnection trace terminations of a multilayer interconnection structure, these terminations being distributed in a pattern corresponding to the pattern of contact pads on the die to be tested. To facilitate testing of the die before separation from a wafer using the microbumps, the other connections provided to and from the interconnection structure have a low profile.
    Type: Grant
    Filed: April 1, 1996
    Date of Patent: July 28, 1998
    Assignee: Mitel Semiconductor Limited
    Inventor: David John Pedder