Patents Assigned to Mitutoyo Mfg., Co., Ltd.
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Patent number: 5191717Abstract: A coordinate measuring instrument, wherein a measuring element support member (1) having a measuring element (2) is movably supported on a mount plate (3), this measuring element (2) is abutted against the surface and the like of a work to be measured, which is mounted on the mount plate (3), and relative movement values between this measuring element (2) and the work are detected to measure a configuration and the like of the work. In this measuring instrument, vertical surfaces (3A, 3B, 50A and 50B) are formed on the mount plate (3) and air bearings (47, 52 and 53) opposed to these vertical surfaces are provided on legs (8 and 9) of the measuring element support member (1), so that the measuring element support member (1) can be regulated in its position in a direction of X-axis.Type: GrantFiled: September 8, 1987Date of Patent: March 9, 1993Assignee: Mitutoyo Mfg. Co., Ltd.Inventors: Matusiro Fujitani, Hideo Takaku, Yukiji Yoda
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Patent number: 4912322Abstract: An optical type displacement detecting device including a main scale and an index scale, wherein a pitch of a first optical grating formed on the main scale is set at P and a pitch of a second optical grating formed on the index scale is set at P/n, thereby producing divided detection signal having pitch P/n. Furthermore, the pitch of the second optical grating is set at (u+v) P/u or (u+v) P/(2u) (u is a gap between a diffusive light source and the first optical grating and v is a gap between the first and second optical gratings), so that a collimator lens can be dispensed with. Further, higher harmonic components of the first optical grating are utilized, whereby the pitch of the second optical grating is set at substantially (u+v) Q/u or (u+v) Q/(2u) (Q=P/m, and m is a whole number of 2 or more), thereby preventing the pitch of the second optical grating from being divided into small ones.Type: GrantFiled: August 7, 1987Date of Patent: March 27, 1990Assignee: Mitutoyo Mfg. Co., Ltd.Inventor: Souji Ichikawa
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Patent number: 4879552Abstract: Disclosed is a variable capacitance type encoder for measuring the length of an object to be measured on the basis of the amount of a probe which is brought into contact with the object. The amount of the movement of the probe is detected by the variation of electrostatic capacity between a rotary disc which is secured to the shaft, e.g., threaded shaft of the probe, and fixed plates which are secured to a baseplate so as to be opposed to the rotary disc. Two fixed plates are opposed to the rotary disc, and at least one fixed plate is provided with first and second transmitting electrodes composed of a pluarlity of electrode elements to which voltages of different phases are applied and which are annularly arranged at regular intervals in the circumferential direction of the fixed plate. The phase difference between the voltages which are applied to both transmitting electrodes is 180.degree..Type: GrantFiled: April 20, 1988Date of Patent: November 7, 1989Assignee: Mitutoyo Mfg. Co., Ltd.Inventors: Yoshihiro Arai, Kouji Sasaki, Takanori Ohsaki
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Patent number: 4843387Abstract: A variable capacitance type encoder for measuring the length of an object to be measured on the basis of detecting the amount of movement of a probe as a function of the variation of electrostatic capacity between a rotary disk which is secured to a shaft and a pair of fixed disks which are secured to a frame body so as to be opposed to the rotary disk. On at least one fixed disk is provided first and second transmitting electrodes composed of a plurality of electrode elements to which voltages of different phases are applied. The rotary disk is provided with first and second receiving electrodes for receiving signals of a common phase by electrostatic coupling with both transmitting electrodes. Each fixed disk is further provided with an output electrode which is electrostatically coupled with the respective receiving electrode.Type: GrantFiled: April 20, 1988Date of Patent: June 27, 1989Assignee: Mitutoyo Mfg. Co., Ltd.Inventors: Yoshihiro Arai, Kouji Sasaki, Takanori Ohsaki
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Patent number: 4840488Abstract: A photoelectric type displacement detecting instrument comprising: a main optical lattice formed on a first member; an auxiliary optical lattice formed on a second member; a light emitter for emitting detecting light to the both optical lattices in a direction from the outer side of the second member to the first member; a light receiver opposed to the light emitter, interposing therebetween the both optical lattices, for receiving the detecting light transmitted through the both optical lattices, transducing changes in the value of the received light through the repeat of overlappings due to relative movements between the both optical lattices into electric signals; and an electronic circuit for calculating a relative moving distance between the main optical lattice and the auxiliary optical lattice on the basis of the electric signals.Type: GrantFiled: July 24, 1987Date of Patent: June 20, 1989Assignee: Mitutoyo Mfg. Co., Ltd.Inventors: Yoshihiko Kabaya, Naofumi Yasuda, Toshihiro Omi
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Patent number: 4799170Abstract: The present invention relates to a method of measuring by a coordinate measuring instrument. A detecting element is manually moved along a sample of work to be measured in accordance with a predetermined sequence of measuring steps. A moving path of the detecting element is detected by displacement detectors which produce output signals which are inputted to a command unit incorporated in a robot mechanism for storage. Subsequently, a data processing unit gives a command to carry out an automatic measuring sequence, and the robot mechanism is moved along the stored moving path by its drive system, whereby measurement results for dimensions are calculated on the basis of data acquired during the automatic measuring due to the contact between the detecting element and the work and data stored during the manual set-up phase. The detecting element is uncoupled from the drive system of the robot mechanism during the manual set-up phase.Type: GrantFiled: March 18, 1986Date of Patent: January 17, 1989Assignees: Mitutoyo Mfg. Co. Ltd., Shimizu Kiden Co., Ltd.Inventors: Tadao Nakaya, Shinji Ide
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Patent number: 4788546Abstract: An electrostatic capacity type encoder which includes a rotary disk rotatingly provided on an encoder body, and a first stationary disk and a second stationary disk fixed to the encoder body to face each other with the rotary disk arranged therebetween. A plurality of transmitting electrodes are provided on the first stationary disk. On the rotary disk is provided not only a plurality of receiving electrodes facing the transmitting electrodes on the first stationary disk but also a coupling electrode connected to the receiving electrodes and facing the second stationary disk. An output electrode is provided on the second stationary disk to face the coupling electrode on the rotary disk. To the respective transmitting electrodes are applied alternating currents with respective different phases, and the amount of rotating displacement in the rotary disk is detected in accordance with the output signal from the output electrode which changes with the rotation of the rotary disk.Type: GrantFiled: October 9, 1987Date of Patent: November 29, 1988Assignee: Mitutoyo Mfg. Co., Ltd.Inventor: Kouji Sasaki
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Patent number: 4778271Abstract: In a photoelectric type measuring method and device wherein a workpiece to be measured is scanned by parallel scanning ray beams for scanning in one direction, aforesaid ray beams after the scanning are received by light receiving elements and a time length of a dark portion or a bright portion generated due to the obstruction of a portion of the ray beams by workpiece to be measured in response to output signals from the light receiving elements is detected so as to obtain the dimension in the scanning direction of the workpiece to be measured, the aforesaid ray beams are split into ray beams polarized in directions different from each other, the workpiece to be measured is scanned in such a condition that the two ray beams are relatively shifted so that the two ray beam may be partially overlapped in the scanning directions thereof and light receiving signals corresponding to the two ray beams after the scanning are processed to detect and edge of the workpiece to be measured.Type: GrantFiled: March 13, 1987Date of Patent: October 18, 1988Assignee: Mitutoyo Mfg. Co., Ltd.Inventors: Yoshiharu Kuwabara, Hiroyoshi Hamada, Masayuki Kuwata
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Patent number: 4772147Abstract: A printer apparatus suitable for use in measuring systems and control systems. The printer apparatus has a casing accommodating a roll of a recording paper sheet and a cover means for covering and protecting the recording paper sheet after the printing. The cover means is shaped such as to follow the curvature of the upper portion of the roll of the recording paper sheet, and the recording paper sheet after the printing is guided along the curvature of the roll and is stored in the cover means in the form of a scroll.Type: GrantFiled: November 4, 1986Date of Patent: September 20, 1988Assignee: Mitutoyo Mfg. Co., Ltd.Inventor: Shigeru Ohtani
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Patent number: 4763286Abstract: A measured data pass-fail discriminating apparatus comprising a digital display type measuring instrument (1) and a data discriminating device (2) for discriminating pass or fail of measured data inputted from the measuring instrument (2). In the data discriminating device (2), the upper limit value (HH) and the lower limit value (LL) are set, and the upper limit preview value (H) and the lower limit preview value (L) are set closer to reference values than the upper limit value (HH) and lower limit value (LL). An alarm signal is given when the measured data having the same number as the preset judging frequency (Jl) continuously lies in ranges between the upper limit preview value (H) and the upper limit value (HH) and between the lower preview value (L) and the lower limit value (LL), or when the measured data exceed the upper limit value (H) and the lower limit value (L).Type: GrantFiled: March 8, 1985Date of Patent: August 9, 1988Assignee: Mitutoyo Mfg. Co., Ltd.Inventors: Takeji Nishimura, Hiroshi Koizumi
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Patent number: 4748861Abstract: A measuring device provided with an electronic display for displaying a measured value has a main body composed of two members which are rotatable relative to each other. A plurality of switch elements which enable selection of a desired measuring factor are provided on portions of the main body through which the two members rotate relative to each other. The selection of a switch element is effected on the basis of the fact that the switch element stays in a connected state for a predetermined period of time, or by actuating a selector button. The result of measurement is displayed on the electronic display in digital and/or analog form.Type: GrantFiled: November 21, 1986Date of Patent: June 7, 1988Assignee: Mitutoyo Mfg. Co., Ltd.Inventors: Toshiyuki Matsumoto, Shigeru Ohtani
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Patent number: 4743838Abstract: In a capacitance type displacement measuring instrument, wherein a change in electric capacitance between electrodes due to a relative displacement between two members movable relative to each other is detected on the basis of a change in phase of a detection signal, and a relative displacement between the two members is measured from the change in phase, square waveform signals are applied in inversed phase to two transmitting electrodes provided on one of the members and signals induced on two wave pattern electrodes provided on the other of the members are received by receiving electrodes provided on the first of the members. Outputs from the receiving electrodes are successively taken in by a multiplexer, and then the amplitude-modulated square wave signals, outputted from the multiplexer, are demodulated. A phase detector measures the phase of the demodulated waveform, thereby measuring the relative displacement on the basis of change in phase.Type: GrantFiled: October 26, 1984Date of Patent: May 10, 1988Assignee: Mitutoyo Mfg. Co., Ltd.Inventor: Joseph S. Eckerle
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Patent number: 4743770Abstract: A profile-measuring light probe includes: an illuminator for irradiating a fine spot of light on a subject to be measured; an objective lens for forming an image of the fine spot on an image plane; and a relay lens for converting the light from the fine spot into a generally parallel ray. Further, the light probe includes a window plate constituted by an entrance prism for taking in the generally parallel ray emitted from the relay lens; a flat glass for subjecting the taken-in ray to multiple internal reflections and transmitting the same, and an exit prism for outputting the ray thus transmitted to the outside. The light probe measures the distribution of light quantity of the light emitted from the window plate to thereby measure a profile of the subject to be measured.Type: GrantFiled: September 22, 1986Date of Patent: May 10, 1988Assignee: Mitutoyo Mfg. Co., Ltd.Inventor: Chia S. Lee
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Patent number: 4736313Abstract: A digital indication type length measuring system includes a length measuring device having a spindle which can be brought into abutting contact with a work to be measured, an encoder for representing a displacement of the spindle as an electric signal, and an output circuit for outputting measured length information data obtained from the electric signal from the encoder to a cable. A data processing device includes an input circuit coupled to the cable for receiving data from the length measuring device, a processing circuit for processing data received by the input circuit in a predetermined manner to produce quality control data, and a printer for printing out the quality control data. The quality control data includes a histogram. When the length measuring and data processing devices are disconnected from each other, each measured length is displayed on a digital indicator which is provided on the length measuring device and which is repsonsive to the electric signal from the encoder.Type: GrantFiled: February 19, 1985Date of Patent: April 5, 1988Assignee: Mitutoyo Mfg. Co., Ltd.Inventors: Takeji Nishimura, Hiroshi Koizumi
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Patent number: 4730247Abstract: Measured data storage apparatus for digital indication type article measuring apparatus used to measure more than one type of article is connected to a main body of the measuring apparatus so as to be operatively transportable with the measuring apparatus for measuring the articles and removable from the measuring apparatus for reading of the stored contents of the storage apparatus by an external computer. The storage apparatus comprises data switch apparatus for controlling input of measured values to the storage apparatus, and data identifying apparatus operative with the data switch apparatus for storing in the storage apparatus identifying data associated with each inputted measured value signifying at least the article to which each measured value corresponds.Type: GrantFiled: September 4, 1984Date of Patent: March 8, 1988Assignee: Mitutoyo Mfg. Co., Ltd.Inventor: Noboru Takahara
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Patent number: 4727653Abstract: A coordinate measuring instrument, wherein a measuring element support member (1) having a measuring element (2) is movably supported on a mount plate (3), this measuring element (2) is abutted against the surface and the like of a work to be measured, which is mounted on the mount plate (3), and relative movement values between this measuring element (2) and the work are detected to measure a configuration and the like of the work. In this measuring instrument, vertical surfaces (3A, 3B, 50A and 50B) are formed on the mount plate (30) and air bearings (47, 52 and 53) opposed to these vertical surfaces are provided on legs (8 and 9) of the measuring element support member (1), so that the measuring element support member (1) can be regulated in its position in a direction of X-axis.Type: GrantFiled: September 19, 1986Date of Patent: March 1, 1988Assignee: Mitutoyo Mfg. Co., Ltd.Inventors: Matusiro Fujitani, Hideo Takaku, Yukiji Yoda
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Patent number: 4717824Abstract: A photoelectric displacement detecting apparatus for measuring a length from a repeated number of bright and dark portions of light formed by the repetitions of overlappings of slits in respective slit rows during a relative movement between a main scale and an index scale, the apparatus comprising reference marks provided on the main scale at suitable intervals, a mark detecting device provided on the index scale, identification marks provided in spaces between the reference marks for identifying these spaces, and an identification mark reading device actuated by the mark detecting device. An identification mark ascertaining device is provided for comparing the identification mark read by the identification mark reading device with the identification mark preset by a mark selecting-setting device and ascertaining whether both identification marks coincide with each other or not.Type: GrantFiled: July 25, 1985Date of Patent: January 5, 1988Assignee: Mitutoyo Mfg. Co., Ltd.Inventors: Hitoshi Sakamoto, Etsuo Nagashima, Ryou Nagai
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Patent number: 4711034Abstract: An electronic measuring device capable of indicating a measured value in both analog and digital forms. In this device, the displacement of a spindle is converted into a number of pulses and counted by a counter, and the number of pulses thereby obtained is thereafter indicated by an indicator. On the other hand, a pulse motor disposed in a pointer rotating unit is driven by a driving circuit in accordance with a counted value supplied from the counter so as to rotate a pointer by an angle corresponding to the counted value.Type: GrantFiled: November 12, 1986Date of Patent: December 8, 1987Assignee: Mitutoyo Mfg. Co., Ltd.Inventor: Hiroshi Koizumi
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Patent number: 4701704Abstract: A touch signal probe for electrically detecting the contact of a touch pin with a work to be measured in all three-axes directions. The apparatus can be attached to a three-dimensional coordinate measuring system to automatically detect electrical touch signals indicative of the contact with the work. The internal structure of the probe case is constructed such that a three dimensionally movable support can be attached thereto to provide a touch pin base which is movably supported on seats fixed on the probe case which carries the touch pin by means of a Z-axis movable support mechanism. The Z-axis support mechanism consists of a pair of diaphragms fixed on the upper and lower ends of the touch pin base at their peripheries respectively and a support shaft rigidly connected with the central portions of the diaphragms and holding the touch pin at its lower end.Type: GrantFiled: August 22, 1985Date of Patent: October 20, 1987Assignee: Mitutoyo Mfg. Co., Ltd.Inventors: Minoru Fukuyoshi, Takashi Furuto, Tetsuo Nakamura
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Patent number: 4692629Abstract: In an optical measuring device which comprises a polygonal rotary mirror for reflecting an incident light beam into a rotary scanning light beam, a collimator lens for converting the rotary scanning light beam into a parallel scanning light beam and a light receiving element for detecting bright and dark portions of the parallel scanning light beam, which has scanned a work to be measured, and a time duration of the dark portion or the bright portion is detected, which has been generated by the obstruction of a part of the parallel scanning light beam by the work, to thereby determine a dimension of the work, the collimator lens is made to be an f.theta. lens having such a spherical aberration that a light beam incident from the outlet side of the collimator lens toward the polygonal rotary mirror in parallel to the optical axis of the lens intersects the optical axis of the lens at a position shifted from a focal point on the inlet side to the outlet side by .DELTA.Type: GrantFiled: June 10, 1985Date of Patent: September 8, 1987Assignee: Mitutoyo Mfg., Co., Ltd.Inventor: Taizo Nakamura