Abstract: A method of forming an apparatus for probing die electricity, which determines a reinforcement structure according to features of a converting plate, and combines the converting plate, reinforcement structure and a substrate for forming the apparatus for probing die electricity. In an embodiment, the apparatus for probing die electricity further comprises a substrate, a converting plate, a needle module and a reinforcement structure. The converting plate comprises two opposite surfaces respectively having a plurality of first and second conductive elements. The needle module comprises a plurality of needles respectively and electrically connected to the plurality second conductive elements. The reinforcement structure is disposed between the converting plate and the substrate.

Abstract: An apparatus for performing pick-and-place operations is disclosed, which comprises: a power source; a transmission set, driven by the power source; a mobile seat, capable of being moved by the transmission set; and a retrieval head, coupled to the mobile seat; wherein the transmission set is configured with a driving shaft and a driven shaft as the two shafts are parallel-disposed while enabling the driving shaft to be driven by the power source; and the driving shaft has an active eccentric axle extruding from an end opposite to the power source, and the driven shaft has an passive eccentric axle extruding from an end opposite to the power source; and the active eccentric axle and the passive eccentric axle is coupled to the mobile seat for forming a four-bar linkage mechanism for maintaining the verticality and levelness of the mobile seat while being driven to move in an arc path.

Abstract: The present invention relates to a multi-directional gripping apparatus, adapted for fetching and positioning workpieces, which is primary comprised of a grabber and a driving mechanism. The grabber is further comprised of a rotation shaft and a plurality of gripping arms; wherein the plural gripping arms are positioned centering around the rotation shaft while extending toward different directions in respective. The driving mechanism includes a vertical driver, a horizontal driver and a rotation driver, by which the grabber can be driven to rotate and perform a vertical movement and a linear horizontal movement. By orientating the plural gripping arms to extend toward different directions in respective, more than one workpieces can be fetched and positioned to be processed simultaneously, such that the operation efficiency of the mechanical platform as well as the gripping apparatus are optimized, thereby the manufacturing process is shortened and the throughput is increased.

Abstract: A cantilever-type probe card includes a circuit board having a first surface on which a plurality of signal contact pads and grounding contact pads are formed, a locating ring mounted on the first surface of the circuit board, and a plurality of probe pins, each of which is partially supported by the locating ring. Each of the probe pins has an electrically conducting core having an exposed first end electrically connected to one of the signal contact pads of the circuit board, and an exposed second end suspending outside the locating ring for probing a test contact, and a metal film insulatively spaced from the electrically conducting core and electrically connected to one of the grounding contact pads of the circuit board.

Abstract: A multi-function probe card (40) includes a PCB (41), a plurality of probe needles (47), a counter (71) to acquire a “piece sequence parameter”, a signal-measuring device (72) via the probe needles (71) to acquire a current, and a voltage parameters etc. as well as a parametric processing system (74). The parametric processing system (74) includes an I/O unit (51)/(59), a processing unit (52), a time providing unit (55), a real time display unit (56), and a storing unit (57). Moreover, the piece sequence parameter, current parameter, and voltage parameter can be input into the processing unit (52) through the I/O unit (51)/(59). Thereafter, a parametric data structure can be set up to record and calculate in accordance with the datum and parameters, and finally to display service processes and conditions of the probe card (40) through the real time display unit (56).