Patents Assigned to NDT, Inc.
  • Publication number: 20210033565
    Abstract: There is described an Eddy current probe for non-destructive testing, comprising: a first leg extending along a first longitudinal axis between a first proximal end and a first distal end; a second leg extending along a second longitudinal axis between a second proximal end and a second distal end; a high magnetic permeability body extending at least partially between the first and second longitudinal axes, the high magnetic permeability body being spaced apart from the first and second legs by a gap and the high magnetic permeability body and the first and second legs being each made of a high magnetic permeability material; and at least one excitation coil each secured to at least one of the first leg and the second leg.
    Type: Application
    Filed: February 8, 2019
    Publication date: February 4, 2021
    Applicant: EDDYFI NDT INC.
    Inventors: Vincent Demers-Carpentier, Marco Michèle Sisto
  • Patent number: 10794864
    Abstract: There is described an eddy current array probe for detection and depth sizing of a surface-breaking defect in a metallic material, said eddy current array probe comprising: a probe body comprising a plurality of probe elements arranged in a linear configuration, the probe elements each comprising at least one coil, the probe body being adapted to be displaced along a surface of the metallic material so that a longitudinal axis of the coil be parallel to the surface of the metallic material, the coil, when in use, being adapted to induce an eddy current within the metallic material detect the eddy current; and a set of active elements of the plurality of probe elements being adapted to be selectively operated at a plurality of time-spaced instances.
    Type: Grant
    Filed: April 14, 2015
    Date of Patent: October 6, 2020
    Assignee: EDDYFI NDT INC.
    Inventors: Michäel Sirois, Stèfan Parmentier, Marc Grenier, Nathan Decourcelle
  • Publication number: 20200049662
    Abstract: A form-fitting eddy current array probe for inspecting helical gears is provided, the probe comprising: a leg which includes a sensor zone with a plurality of eddy current arrays; an arm attached to and normal with the leg to provide an L-shaped probe, the arm including a sensor zone with a plurality of eddy current arrays; a resilient layer underlying the sensor zones; a gel layer attached to an upper surface of the sensor zones, the gel layer including a fluid gel and an outer covering encasing the fluid gel; and an encoder distally located on the leg. A method of inspecting a girth gear set including a helical gear and a girth gear using the form-fitting eddy current array probe is also provided.
    Type: Application
    Filed: January 15, 2018
    Publication date: February 13, 2020
    Applicant: GLOBAL INSPECTIONS NDT, INC.
    Inventors: Thomas SHUMKA, Jason SHUMKA
  • Publication number: 20190041361
    Abstract: A Pulsed Eddy Current (PEC) probe for PEC testing of a ferromagnetic object covered with a ferromagnetic protective jacket, the PEC probe comprising: at least one coil for at least one of generating an inspection magnetic field and detecting an induced magnetic field; at least one permanent magnet for magnetically saturating the ferromagnetic protective jacket; and means for selectively reducing an attraction between the at least one magnet and the ferromagnetic protective jacket.
    Type: Application
    Filed: August 2, 2018
    Publication date: February 7, 2019
    Applicant: EDDYFI NDT INC.
    Inventors: Marco Michele SISTO, Maxime ROCHETTE, Florian HARDY, Louis-Philippe DION
  • Patent number: 9880130
    Abstract: A Pulsed Eddy Current device for inspecting an object made of an electrically conductive material comprising: at least one dual-purpose coil serving a dual purpose of producing a supplied magnetic field in the object and measuring a produced magnetic field emitted by the object, a transmitter circuit driving the dual-purpose coil(s) with an electrical signal, a shut-off current circuit for the transmitter circuit for cutting-off a current in the dual-purpose coil(s) during a cut-off phase of the electrical signal, the shut-off current circuit applying a voltage inversion on the dual-purpose coil(s) and a receiver circuit for reading the produced magnetic field from the dual-purpose coil(s). A method for inspecting an object comprising supplying a voltage on at least one dual-purpose coil, cutting-off a current in the dual-purpose coil(s) by applying a voltage inversion on the dual-purpose coil(s) and receiving, at the dual-purpose coil(s), a produced magnetic field.
    Type: Grant
    Filed: December 14, 2016
    Date of Patent: January 30, 2018
    Assignee: EDDYFI NDT INC.
    Inventors: Florian Hardy, Maxime Rochette, Marc Grenier, Vincent Demers-Carpentier
  • Publication number: 20170030862
    Abstract: There is described an eddy current array probe for detection and depth sizing of a surface- breaking defect in a metallic material, said eddy current array probe comprising: a probe body comprising a plurality of probe elements arranged in a linear configuration, the probe elements each comprising at least one coil, the probe body being adapted to be displaced along a surface of the metallic material so that a longitudinal axis of the coil be parallel to the surface of the metallic material, the coil, when in use, being adapted to induce an eddy current within the metallic material detect the eddy current; and a set of active elements of the plurality of probe elements being adapted to be selectively operated at a plurality of time-spaced instances.
    Type: Application
    Filed: April 14, 2015
    Publication date: February 2, 2017
    Applicant: EDDYFI NDT INC.
    Inventors: Michäel SIROIS, Stèfan PARMENTIER, Marc GRENIER, Nathan DECOURCELLE
  • Patent number: 9476859
    Abstract: A calibration method for calibrating a phased array probe that is used for testing girth welds for defects. The method utilizes a calibration device on which is defined a series of reflectors that correspond to a series of target zones. The phased array probe is placed via a wedge relative to the calibration device and the phased array probe is configured with an initial set of acoustic parameters which define at least a transmitting aperture, a receiving aperture and a beam steering angle. Using a Full Matrix Capture (FMC) acquisition process and a ray-tracing module, the values of the initial set of acoustic parameters are optimized to evolve a final set of acoustic parameters which the phased array probe utilizes for testing actual devices for weld defects.
    Type: Grant
    Filed: December 16, 2013
    Date of Patent: October 25, 2016
    Assignee: OLYMPUS NDT, INC.
    Inventors: Jason Habermehl, Benoit LePage, Guillaume Painchaud-April
  • Patent number: 9389201
    Abstract: An electromagnetic probe for non-destructive inspection of a twisted tube of a twisted tube heat exchanger comprising a probe body having a sensing section being configured to allow circulation of the probe body within the length of circular tube and the length of helical oval tube and to allow displacement of the electromagnetic sensor(s) from a radially inward contracted position to a radially outward expanded position in close proximity to an interior surface of a crest of the oval tube; a conduit attached to a proximal end of the probe body, the at least one conductor extending within the conduit to a remote end of the electromagnetic probe.
    Type: Grant
    Filed: June 10, 2014
    Date of Patent: July 12, 2016
    Assignee: EddyFi NDT inc.
    Inventors: Olivier Lavoie, Martin Bourgault, Marc Grenier, François Dion
  • Patent number: 9350985
    Abstract: Disclosed is a method and an apparatus for removing circling drifts on the display of the measured eddy current or other continuous waves. The circling dot which is supposed to be a static dot can obscure information required by the operator to judge if a small defect is present. Embodiments of presently disclosed harmonic rejection filters are tunable and employed to effectively abate or eliminate signals with frequencies that are multiples of operating frequencies, resulting in the removal of the circling effects on the display.
    Type: Grant
    Filed: September 25, 2013
    Date of Patent: May 24, 2016
    Assignee: OLYMPUS NDT, INC.
    Inventor: Andrew Thomas
  • Patent number: 9316618
    Abstract: An eddy current object testing system includes an EC probe and an acquisition channel which is configured to receive an EC signal from the EC probe and to generate a visual output, namely an impedance plane representation, of the output. A display is coupled to the acquisition channel to display the visual output. The at least one probe is provided with a test loop substantially surrounding it and has a series switch which can be selectively closed or opened to thereby cause the image plane to assume a state that is indicative of a fault, if any, in the EC probe.
    Type: Grant
    Filed: March 26, 2014
    Date of Patent: April 19, 2016
    Assignee: OLYMPUS NDT, INC.
    Inventor: Benoit LePage
  • Patent number: 9243883
    Abstract: A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe.
    Type: Grant
    Filed: March 27, 2014
    Date of Patent: January 26, 2016
    Assignee: OLYMPUS NDT, INC.
    Inventors: Xiangdeng Xu, Paul DeAngelo
  • Patent number: 9182363
    Abstract: An instrument and a method of detecting a target element in a multi-layer thin coating. L?, L? and L? x-rays are caused to be emitted from the target element (preferably lead paint) with excitation radiation. Upon detecting the emitted x-rays, an areal concentration of the target element is calculated using L? and L? intensities once, and then using the L? and L? intensities once, by reference to a single layer model; By combining the two concentrations calculated using single layer model, a more accurate concentration can be calculated for the target element in the multi-layered surface coating.
    Type: Grant
    Filed: November 14, 2013
    Date of Patent: November 10, 2015
    Assignee: OLYMPUS NDT, INC.
    Inventor: Xunming Chen
  • Patent number: 9182212
    Abstract: Disclosed is a Hall sensor probe that configured to be coupled with one of a plurality of magnetic targets for measuring the thickness of a non-ferromagnetic wall. The probe comprises a magnetic field source, a Hall sensor, a concentrator and a main housing. The novel aspects of the probe include a wear tip that is exchangeably affixed onto the main-housing, leaving a permanent gap from and disjoined from the concentrator in a manner that transfers stress from the tip directly onto the main-housing. To serve every aspects of the primary objective, being it mechanical, thermal and operational, the material of the tip preferably has a fracture toughness higher than 20 MPa·m1/2, wear coefficient higher than 100, and a magnetic susceptibility lower than 0.001.
    Type: Grant
    Filed: November 7, 2012
    Date of Patent: November 10, 2015
    Assignee: OLYMPUS NDT, INC.
    Inventors: Matthew Edward Stanton, Steven Abe LaBreck
  • Patent number: 9176080
    Abstract: An X-ray fluorescence (XRF) instrument comprises a hand-held device housing which holds a radiation emitter configured to emit radiation directed at a test object and a radiation detector housed inside a chamber closed by a sealing window and configured to detect radiation of the test object, caused by the test object being exposed to the emitted radiation. A protective cover mechanism is affixed to the testing device and is configured to have a closed position which covers or blocks access to the sealing window to protect it from being broken or damaged by debris or other obstructions, and an open position which exposes the sealing window to allow the un-obstructed passage of radiation therethrough. The cover mechanism can be implemented variously, including by a pivotally mounted cover plate, an iris mechanism, a fan-like cover and the like. Debris can be detected variously, including by strain sensors, optical detectors and proximity sensors.
    Type: Grant
    Filed: July 17, 2012
    Date of Patent: November 3, 2015
    Assignee: Olympus NDT, Inc.
    Inventor: Michael Drummy
  • Publication number: 20150276371
    Abstract: A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe.
    Type: Application
    Filed: March 27, 2014
    Publication date: October 1, 2015
    Applicant: Olympus NDT, Inc.
    Inventors: Xiangdeng XU, Paul DeANGELO
  • Patent number: 9110036
    Abstract: Disclosed is an ECA probes assembly capable of providing reliable and durable ECA inspections of dovetail slots without the use of an external guiding mechanism. The design combines a novel universal probe manipulator with a probe support suited for a wide range of probe supports which fit a rage of turbine disks. The probe support embodies a rigid yet expandable core, exerting a force pushing the array probe against the inner cavity of the dovetails. The pushing force is strategically located in critical areas of the dovetail leading to array probe to be self-guiding into the dovetail, and to provide optimum performance with consistent and stable lift-off.
    Type: Grant
    Filed: July 31, 2013
    Date of Patent: August 18, 2015
    Assignee: OLYMPUS NDT, INC.
    Inventor: Benoit Lepage
  • Publication number: 20150212184
    Abstract: Disclosed are a method of and an apparatus devising a packet based DDS circuitry for performing packet based a direct digital synthesizing (DDS) function within an electronic testing instrument. The circuitry comprising a DDS logic circuit configured to execute direct digital syntheses on a plurality of consecutive packets of sine-like waves, each packet having a length of a period precisely chosen such that the sine wave at the end of one packet matches up with the sine wave at the start of the immediate subsequent packet. Also disclosed is an eddy current testing circuitry using multiple outputs of the single packet based DDS, one of the output is used in a circuit producing reference signals approximating the response signals. With the usage of the packet based DDS, the reference signal can be highly effective in nulling the unchanging portion of the response signals.
    Type: Application
    Filed: January 24, 2014
    Publication date: July 30, 2015
    Applicant: OLYMPUS NDT, INC.
    Inventor: Andrew Thomas
  • Publication number: 20150143910
    Abstract: A transmitter circuit and method for an ultrasonic thickness measurement system having an ultrasonic transducer and a cable with known cable impedance, the cable connecting at least the transmitter circuit to the ultrasonic transducer, the transmitter circuit comprising: an electrical pulse voltage signal emitter for producing an electrical pulse voltage signal to be propagated over the cable to the ultrasonic transducer, the electrical pulse voltage signal having a pulse nominal voltage value; a matched impedance circuit for matching a cable impedance of the cable at the transmitter circuit for an electrical parasitic reflection signal of the electrical pulse voltage signal, the electrical parasitic reflection signal being caused by an impedance mismatch between the cable and the ultrasonic transducer, a parasitic nominal voltage value of the electrical parasitic reflection signal being at most the pulse nominal voltage value.
    Type: Application
    Filed: July 23, 2013
    Publication date: May 28, 2015
    Applicant: EDDYFI NDT INC.
    Inventors: Florian Hardy, Eric Morissette
  • Publication number: 20150085143
    Abstract: Disclosed is a method and an apparatus for removing circling drifts on the display of the measured eddy current or other continuous waves. The circling dot which is supposed to be a static dot can obscure information required by the operator to judge if a small defect is present. Embodiments of presently disclosed harmonic rejection filters are tunable and employed to effectively abate or eliminate signals with frequencies that are multiples of operating frequencies, resulting in the removal of the circling effects on the display.
    Type: Application
    Filed: September 25, 2013
    Publication date: March 26, 2015
    Applicant: OLYMPUS NDT, INC.
    Inventor: Andrew THOMAS
  • Publication number: 20150049108
    Abstract: Disclosed is a method and system to provide an improved signal representation of non-destructive test/inspection instruments by proper color display, in order to emulate as closely as possible, the visual rendering effect of those seen in the traditional non-electronic testing, including penetrant testing and magnetic particle testing. The foregoing object of the invention is preferably realized by providing an eddy current or phased array instrument with a color palette module that allows the deployment of an array of color representation system typically used in traditional non-electronic testing methods.
    Type: Application
    Filed: August 15, 2013
    Publication date: February 19, 2015
    Applicant: OLYMPUS NDT INC.
    Inventor: Tommy Bourgelas