Patents Assigned to NDT, Inc.
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Publication number: 20210033565Abstract: There is described an Eddy current probe for non-destructive testing, comprising: a first leg extending along a first longitudinal axis between a first proximal end and a first distal end; a second leg extending along a second longitudinal axis between a second proximal end and a second distal end; a high magnetic permeability body extending at least partially between the first and second longitudinal axes, the high magnetic permeability body being spaced apart from the first and second legs by a gap and the high magnetic permeability body and the first and second legs being each made of a high magnetic permeability material; and at least one excitation coil each secured to at least one of the first leg and the second leg.Type: ApplicationFiled: February 8, 2019Publication date: February 4, 2021Applicant: EDDYFI NDT INC.Inventors: Vincent Demers-Carpentier, Marco Michèle Sisto
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Patent number: 10794864Abstract: There is described an eddy current array probe for detection and depth sizing of a surface-breaking defect in a metallic material, said eddy current array probe comprising: a probe body comprising a plurality of probe elements arranged in a linear configuration, the probe elements each comprising at least one coil, the probe body being adapted to be displaced along a surface of the metallic material so that a longitudinal axis of the coil be parallel to the surface of the metallic material, the coil, when in use, being adapted to induce an eddy current within the metallic material detect the eddy current; and a set of active elements of the plurality of probe elements being adapted to be selectively operated at a plurality of time-spaced instances.Type: GrantFiled: April 14, 2015Date of Patent: October 6, 2020Assignee: EDDYFI NDT INC.Inventors: Michäel Sirois, Stèfan Parmentier, Marc Grenier, Nathan Decourcelle
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Publication number: 20200049662Abstract: A form-fitting eddy current array probe for inspecting helical gears is provided, the probe comprising: a leg which includes a sensor zone with a plurality of eddy current arrays; an arm attached to and normal with the leg to provide an L-shaped probe, the arm including a sensor zone with a plurality of eddy current arrays; a resilient layer underlying the sensor zones; a gel layer attached to an upper surface of the sensor zones, the gel layer including a fluid gel and an outer covering encasing the fluid gel; and an encoder distally located on the leg. A method of inspecting a girth gear set including a helical gear and a girth gear using the form-fitting eddy current array probe is also provided.Type: ApplicationFiled: January 15, 2018Publication date: February 13, 2020Applicant: GLOBAL INSPECTIONS NDT, INC.Inventors: Thomas SHUMKA, Jason SHUMKA
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Publication number: 20190041361Abstract: A Pulsed Eddy Current (PEC) probe for PEC testing of a ferromagnetic object covered with a ferromagnetic protective jacket, the PEC probe comprising: at least one coil for at least one of generating an inspection magnetic field and detecting an induced magnetic field; at least one permanent magnet for magnetically saturating the ferromagnetic protective jacket; and means for selectively reducing an attraction between the at least one magnet and the ferromagnetic protective jacket.Type: ApplicationFiled: August 2, 2018Publication date: February 7, 2019Applicant: EDDYFI NDT INC.Inventors: Marco Michele SISTO, Maxime ROCHETTE, Florian HARDY, Louis-Philippe DION
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Patent number: 9880130Abstract: A Pulsed Eddy Current device for inspecting an object made of an electrically conductive material comprising: at least one dual-purpose coil serving a dual purpose of producing a supplied magnetic field in the object and measuring a produced magnetic field emitted by the object, a transmitter circuit driving the dual-purpose coil(s) with an electrical signal, a shut-off current circuit for the transmitter circuit for cutting-off a current in the dual-purpose coil(s) during a cut-off phase of the electrical signal, the shut-off current circuit applying a voltage inversion on the dual-purpose coil(s) and a receiver circuit for reading the produced magnetic field from the dual-purpose coil(s). A method for inspecting an object comprising supplying a voltage on at least one dual-purpose coil, cutting-off a current in the dual-purpose coil(s) by applying a voltage inversion on the dual-purpose coil(s) and receiving, at the dual-purpose coil(s), a produced magnetic field.Type: GrantFiled: December 14, 2016Date of Patent: January 30, 2018Assignee: EDDYFI NDT INC.Inventors: Florian Hardy, Maxime Rochette, Marc Grenier, Vincent Demers-Carpentier
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Publication number: 20170030862Abstract: There is described an eddy current array probe for detection and depth sizing of a surface- breaking defect in a metallic material, said eddy current array probe comprising: a probe body comprising a plurality of probe elements arranged in a linear configuration, the probe elements each comprising at least one coil, the probe body being adapted to be displaced along a surface of the metallic material so that a longitudinal axis of the coil be parallel to the surface of the metallic material, the coil, when in use, being adapted to induce an eddy current within the metallic material detect the eddy current; and a set of active elements of the plurality of probe elements being adapted to be selectively operated at a plurality of time-spaced instances.Type: ApplicationFiled: April 14, 2015Publication date: February 2, 2017Applicant: EDDYFI NDT INC.Inventors: Michäel SIROIS, Stèfan PARMENTIER, Marc GRENIER, Nathan DECOURCELLE
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Patent number: 9476859Abstract: A calibration method for calibrating a phased array probe that is used for testing girth welds for defects. The method utilizes a calibration device on which is defined a series of reflectors that correspond to a series of target zones. The phased array probe is placed via a wedge relative to the calibration device and the phased array probe is configured with an initial set of acoustic parameters which define at least a transmitting aperture, a receiving aperture and a beam steering angle. Using a Full Matrix Capture (FMC) acquisition process and a ray-tracing module, the values of the initial set of acoustic parameters are optimized to evolve a final set of acoustic parameters which the phased array probe utilizes for testing actual devices for weld defects.Type: GrantFiled: December 16, 2013Date of Patent: October 25, 2016Assignee: OLYMPUS NDT, INC.Inventors: Jason Habermehl, Benoit LePage, Guillaume Painchaud-April
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Patent number: 9389201Abstract: An electromagnetic probe for non-destructive inspection of a twisted tube of a twisted tube heat exchanger comprising a probe body having a sensing section being configured to allow circulation of the probe body within the length of circular tube and the length of helical oval tube and to allow displacement of the electromagnetic sensor(s) from a radially inward contracted position to a radially outward expanded position in close proximity to an interior surface of a crest of the oval tube; a conduit attached to a proximal end of the probe body, the at least one conductor extending within the conduit to a remote end of the electromagnetic probe.Type: GrantFiled: June 10, 2014Date of Patent: July 12, 2016Assignee: EddyFi NDT inc.Inventors: Olivier Lavoie, Martin Bourgault, Marc Grenier, François Dion
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Patent number: 9350985Abstract: Disclosed is a method and an apparatus for removing circling drifts on the display of the measured eddy current or other continuous waves. The circling dot which is supposed to be a static dot can obscure information required by the operator to judge if a small defect is present. Embodiments of presently disclosed harmonic rejection filters are tunable and employed to effectively abate or eliminate signals with frequencies that are multiples of operating frequencies, resulting in the removal of the circling effects on the display.Type: GrantFiled: September 25, 2013Date of Patent: May 24, 2016Assignee: OLYMPUS NDT, INC.Inventor: Andrew Thomas
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Patent number: 9316618Abstract: An eddy current object testing system includes an EC probe and an acquisition channel which is configured to receive an EC signal from the EC probe and to generate a visual output, namely an impedance plane representation, of the output. A display is coupled to the acquisition channel to display the visual output. The at least one probe is provided with a test loop substantially surrounding it and has a series switch which can be selectively closed or opened to thereby cause the image plane to assume a state that is indicative of a fault, if any, in the EC probe.Type: GrantFiled: March 26, 2014Date of Patent: April 19, 2016Assignee: OLYMPUS NDT, INC.Inventor: Benoit LePage
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Patent number: 9243883Abstract: A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe.Type: GrantFiled: March 27, 2014Date of Patent: January 26, 2016Assignee: OLYMPUS NDT, INC.Inventors: Xiangdeng Xu, Paul DeAngelo
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Patent number: 9182363Abstract: An instrument and a method of detecting a target element in a multi-layer thin coating. L?, L? and L? x-rays are caused to be emitted from the target element (preferably lead paint) with excitation radiation. Upon detecting the emitted x-rays, an areal concentration of the target element is calculated using L? and L? intensities once, and then using the L? and L? intensities once, by reference to a single layer model; By combining the two concentrations calculated using single layer model, a more accurate concentration can be calculated for the target element in the multi-layered surface coating.Type: GrantFiled: November 14, 2013Date of Patent: November 10, 2015Assignee: OLYMPUS NDT, INC.Inventor: Xunming Chen
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Patent number: 9182212Abstract: Disclosed is a Hall sensor probe that configured to be coupled with one of a plurality of magnetic targets for measuring the thickness of a non-ferromagnetic wall. The probe comprises a magnetic field source, a Hall sensor, a concentrator and a main housing. The novel aspects of the probe include a wear tip that is exchangeably affixed onto the main-housing, leaving a permanent gap from and disjoined from the concentrator in a manner that transfers stress from the tip directly onto the main-housing. To serve every aspects of the primary objective, being it mechanical, thermal and operational, the material of the tip preferably has a fracture toughness higher than 20 MPa·m1/2, wear coefficient higher than 100, and a magnetic susceptibility lower than 0.001.Type: GrantFiled: November 7, 2012Date of Patent: November 10, 2015Assignee: OLYMPUS NDT, INC.Inventors: Matthew Edward Stanton, Steven Abe LaBreck
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Patent number: 9176080Abstract: An X-ray fluorescence (XRF) instrument comprises a hand-held device housing which holds a radiation emitter configured to emit radiation directed at a test object and a radiation detector housed inside a chamber closed by a sealing window and configured to detect radiation of the test object, caused by the test object being exposed to the emitted radiation. A protective cover mechanism is affixed to the testing device and is configured to have a closed position which covers or blocks access to the sealing window to protect it from being broken or damaged by debris or other obstructions, and an open position which exposes the sealing window to allow the un-obstructed passage of radiation therethrough. The cover mechanism can be implemented variously, including by a pivotally mounted cover plate, an iris mechanism, a fan-like cover and the like. Debris can be detected variously, including by strain sensors, optical detectors and proximity sensors.Type: GrantFiled: July 17, 2012Date of Patent: November 3, 2015Assignee: Olympus NDT, Inc.Inventor: Michael Drummy
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Publication number: 20150276371Abstract: A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe.Type: ApplicationFiled: March 27, 2014Publication date: October 1, 2015Applicant: Olympus NDT, Inc.Inventors: Xiangdeng XU, Paul DeANGELO
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Patent number: 9110036Abstract: Disclosed is an ECA probes assembly capable of providing reliable and durable ECA inspections of dovetail slots without the use of an external guiding mechanism. The design combines a novel universal probe manipulator with a probe support suited for a wide range of probe supports which fit a rage of turbine disks. The probe support embodies a rigid yet expandable core, exerting a force pushing the array probe against the inner cavity of the dovetails. The pushing force is strategically located in critical areas of the dovetail leading to array probe to be self-guiding into the dovetail, and to provide optimum performance with consistent and stable lift-off.Type: GrantFiled: July 31, 2013Date of Patent: August 18, 2015Assignee: OLYMPUS NDT, INC.Inventor: Benoit Lepage
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Publication number: 20150212184Abstract: Disclosed are a method of and an apparatus devising a packet based DDS circuitry for performing packet based a direct digital synthesizing (DDS) function within an electronic testing instrument. The circuitry comprising a DDS logic circuit configured to execute direct digital syntheses on a plurality of consecutive packets of sine-like waves, each packet having a length of a period precisely chosen such that the sine wave at the end of one packet matches up with the sine wave at the start of the immediate subsequent packet. Also disclosed is an eddy current testing circuitry using multiple outputs of the single packet based DDS, one of the output is used in a circuit producing reference signals approximating the response signals. With the usage of the packet based DDS, the reference signal can be highly effective in nulling the unchanging portion of the response signals.Type: ApplicationFiled: January 24, 2014Publication date: July 30, 2015Applicant: OLYMPUS NDT, INC.Inventor: Andrew Thomas
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Publication number: 20150143910Abstract: A transmitter circuit and method for an ultrasonic thickness measurement system having an ultrasonic transducer and a cable with known cable impedance, the cable connecting at least the transmitter circuit to the ultrasonic transducer, the transmitter circuit comprising: an electrical pulse voltage signal emitter for producing an electrical pulse voltage signal to be propagated over the cable to the ultrasonic transducer, the electrical pulse voltage signal having a pulse nominal voltage value; a matched impedance circuit for matching a cable impedance of the cable at the transmitter circuit for an electrical parasitic reflection signal of the electrical pulse voltage signal, the electrical parasitic reflection signal being caused by an impedance mismatch between the cable and the ultrasonic transducer, a parasitic nominal voltage value of the electrical parasitic reflection signal being at most the pulse nominal voltage value.Type: ApplicationFiled: July 23, 2013Publication date: May 28, 2015Applicant: EDDYFI NDT INC.Inventors: Florian Hardy, Eric Morissette
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Publication number: 20150085143Abstract: Disclosed is a method and an apparatus for removing circling drifts on the display of the measured eddy current or other continuous waves. The circling dot which is supposed to be a static dot can obscure information required by the operator to judge if a small defect is present. Embodiments of presently disclosed harmonic rejection filters are tunable and employed to effectively abate or eliminate signals with frequencies that are multiples of operating frequencies, resulting in the removal of the circling effects on the display.Type: ApplicationFiled: September 25, 2013Publication date: March 26, 2015Applicant: OLYMPUS NDT, INC.Inventor: Andrew THOMAS
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Publication number: 20150049108Abstract: Disclosed is a method and system to provide an improved signal representation of non-destructive test/inspection instruments by proper color display, in order to emulate as closely as possible, the visual rendering effect of those seen in the traditional non-electronic testing, including penetrant testing and magnetic particle testing. The foregoing object of the invention is preferably realized by providing an eddy current or phased array instrument with a color palette module that allows the deployment of an array of color representation system typically used in traditional non-electronic testing methods.Type: ApplicationFiled: August 15, 2013Publication date: February 19, 2015Applicant: OLYMPUS NDT INC.Inventor: Tommy Bourgelas