Patents Assigned to NDT, Inc.
  • Patent number: 8519702
    Abstract: An orthogonal eddy current probe with at least three coils, each of the coils is wound across the two facing sides of an at least six-sided right polygonal [b1] prism. At each time interval, two of the three coils are used as driver coils, being charged simultaneously with electric current driven in coherent directions to induce a combined eddy current and one of the coils is used as a receiver coil to sense the eddy current, with the combined eddy current to be orthogonal to the receiver coil. Each coil alternates to be one of the driver coils or the receiver coil at a predetermined switching sequence and a predetermined switching frequency during consecutive time intervals. The eddy current probe provides advantages of inspecting a test surface for flaws of any flaw orientation with one pass of scan, providing sufficient sensitivity and desirable noise cancellation in all directions.
    Type: Grant
    Filed: July 30, 2010
    Date of Patent: August 27, 2013
    Assignee: Olympus NDT Inc.
    Inventor: Benoit Lepage
  • Publication number: 20130197841
    Abstract: Disclosed is a method and a phased array inspection device enabling calibration of the device with an optimized pulse rate, the pulse rate is derived based on the true adaptive value of the impedance of the specific phased array probe circuit or the pulser circuit and the circuit energy consumption limitations. The energy consumption limitations include the total energy made available by the power supply to the pulser and probe circuit and the pulser energy consumption with limitation due to pulser circuit's physical limit such as thermal limitation.
    Type: Application
    Filed: January 27, 2012
    Publication date: August 1, 2013
    Applicant: Olympus NDT, Inc.
    Inventors: Christian SIMARD, Denys Laquerre
  • Publication number: 20130060488
    Abstract: A system and method suitable for producing user designated views of non-destructive inspection target with adjustable color, opacity and/or fill-patterns in coordination of the display of inspection scan images. The geometric definition of the inspection target and the inspection scan area are both prepared by independent processes under which vertices and respective primitives are established. The inspection target primitives are given an alpha texture that includes color, opacity and/or fill-pattern designated by the user. The scan area primitives are mapped by a color and/or opacity texture representing inspection signal information such as amplitude. An efficient commercially available graphics accelerator is used to render both of the images of inspection target's chosen view and that of scanned area. The method allows implementation in real-time and on hand-held devices.
    Type: Application
    Filed: September 2, 2011
    Publication date: March 7, 2013
    Applicant: OLYMPUS NDT INC.
    Inventors: Ehab Ghabour, Daniel Stephen Kass
  • Patent number: 8365602
    Abstract: A weld seam tracking device for tracking weld seams on pipes or the like uses NDT/NDI sensor(s) in conjunction with an NDT/NDI operation, such as an ultrasonic phased array (PA) inspection. Processing of the weld seam tracking data is integrated or combined with the existing data processing element of the existing NDT/NDI inspection devices. Wide scanning areas of phased array probes allow weld seam tracking and inspection to be performed using a single set of probe and data processing elements to achieve both fault scanning and seam tracking with a single run of the PA scan.
    Type: Grant
    Filed: October 9, 2009
    Date of Patent: February 5, 2013
    Assignee: Olympus NDT, Inc.
    Inventors: Christophe Claude Imbert, Jinchi Zhang
  • Publication number: 20130030726
    Abstract: Disclosed are a method and an NDT/NDI inspection device deploying digital circuitry to conduct detection and compensation of phase and amplitude shift in responding signals. A digital waveform generator, such as a direct digital synthesizer (DDS) is used to generate a digital sine-wave of a specific frequency and amplitude, mimicking the pulser frequency and amplitude. The sine-wave is converted to analog signal through a DAC and transmitted to the transducer. The received analog sine-wave from the transducer is converted back to a digital signal through an ADC. The transmitted and received digital signals are then compared for phase and amplitude differences. A null circuit involving another waveform generating component is employed to compensate the detected phase and amplitude differences. As a result the phase and amplitude differences are effectively eliminated before being further processed and analyzed for defects information.
    Type: Application
    Filed: July 29, 2011
    Publication date: January 31, 2013
    Applicant: OLYMPUS NDT INC.
    Inventors: Andrew THOMAS, Marc DULAC
  • Patent number: 8336365
    Abstract: Disclosed is a method and an NDT/NDI calibration process that automatically detects erroneous TOF readings by providing a predetermined time acceptance window. During the calibration process, TOF readings acquired by a UT device are validated to determine whether the TOF reading for the thin test block falls within the range of the predetermined time acceptance window. If the TOF reading for the thin block (T2) falls out of the predetermined time acceptance window, the operator is alerted of an error and to repeat the TOF test for the thin block.
    Type: Grant
    Filed: March 22, 2011
    Date of Patent: December 25, 2012
    Assignee: Olympus NDT Inc.
    Inventors: Paul Joseph Deangelo, Steven Abe Labreck
  • Publication number: 20120265491
    Abstract: A non-destructive inspection (NDI) instrument includes a sensor connection system configured to receive test signals from at least two different types of NDI sensors which are configured to obtain test signals from an object being tested. The sensor connection system has sensor-specific connection circuits and at least one common sensor connection circuit. A data acquisition circuitry is coupled to the sensor connection and has sensor-specific data acquisition circuits and at least one common data acquisition circuit. It is further coupled to a common digital data processor which executes sensor-specific processing modules and at least one common processing module. A common display screen and user interface is coupled to the data processor and enables programs including sensor-specific user interface modules and at least one common user interface module. The sensor types preferably include all of or any combination of an ultrasound sensor, an eddy current sensor and acoustic sensor.
    Type: Application
    Filed: April 18, 2011
    Publication date: October 18, 2012
    Applicant: OLYMPUS NDT INC.
    Inventor: Michael DRUMMY
  • Publication number: 20120206132
    Abstract: A shielded eddy current coil probe is formed on a printed circuit board and comprises a first coil component forming a test coil and a second coil component forming an active shielding coil. The test coil and the active shielding coil are concentrically arranged and the number of coil windings in the active shielding coil and the field direction thereof are configured to limit the induced field or the sensed field in the test object to the footprint area of the test coil on the test object. Multiple sets of test coils with active shielding coils can be provided on the same or different layers of the printed circuit board to realize different driver, receiver and combined driver/receiver coil configurations.
    Type: Application
    Filed: February 16, 2011
    Publication date: August 16, 2012
    Applicant: OLYMPUS NDT INC.
    Inventor: Benoit Lepage
  • Patent number: 8174407
    Abstract: Alerting a user of a material inspection device to a change in thickness of a material being inspected is disclosed. A thickness offset is determined from calibration information. The calibration information identifies a time of flight of a pulse through a reference sample similar in composition to a material to be inspected. The thickness offset indicates when a thickness of a material being inspected differs from a thickness of the reference sample. A calibration thickness alarm is set, the calibration thickness alarm corresponding to the thickness offset. A change in thickness of the material being inspected is detected. The calibration thickness alarm is engaged to alert the user of the inspection device of a detected change in thickness of the material being inspected.
    Type: Grant
    Filed: June 3, 2009
    Date of Patent: May 8, 2012
    Assignee: Olympus NDT Inc.
    Inventors: Steven Abe LaBreck, Paul Joseph DeAngelo, Michael Drummy
  • Patent number: 8156784
    Abstract: A system and method for carrying out non-destructive testing and inspection of test objects to assess their structural integrity uses a calibration module configured to provide V-Path time of flight (TOF) correction data over a plurality of object thickness points, obtained from an object or objects having known thicknesses using the same physical probe as is used for the inspection measurements. When a probe launches acoustical waves into a test object and an instrument and a control system compute a time of flight value of the acoustical waves launched by the probe, the pre-obtained V-Path TOF correction data is used to correct the measured time of flight computed by the instrument.
    Type: Grant
    Filed: December 4, 2009
    Date of Patent: April 17, 2012
    Assignee: Olympus NDT, Inc.
    Inventors: Paul Joseph DeAngelo, Steven Abe LaBreck
  • Patent number: 8156813
    Abstract: An apparatus for performing ultrasonic inspection of an object, during one measurement on the object, triggers a sequence of excitations of the probe system and receives a sequence of substantially identical echo signals reflected from the object, and further scales each echo signal to different degrees to increase and extend the dynamic range of the echo signals. An A/D converter is then used to digitize the scaled signal sequentially in a manner which dispenses the need for using numerous A/D converters and the associated filters. The digitized signal samples are then combined to produce a single digital output in a manner that is not over-flowed and with desirable resolution. A sequence of successive acquisitions of the scaled signal with the highest sensitivity are averaged to reduce system noise.
    Type: Grant
    Filed: December 3, 2009
    Date of Patent: April 17, 2012
    Assignee: Olympus NDT Inc.
    Inventor: Andrew Thomas
  • Publication number: 20120025816
    Abstract: Disclosed is an improved orthogonal eddy current probe with at least three coils, each of the coils is wound across the two facing sides of an at least six-sided right polygonal prism, such as a hexagonal core. At each time interval, two of the three coils are used as driver coils, being charged simultaneously with electric current driven in coherent directions to induce a combined eddy current and one of the coils is used as a receiver coil to sense the eddy current, with the combined eddy current to be orthogonal to the receiver coil. Each coil alternates to be one of the driver coils or the receiver coil at a predetermined switching sequence and a predetermined switching frequency during consecutive time intervals. The eddy current probe as disclosed provides the advantages of inspecting a test surface for flaws of any flaw orientation with one pass of scan, providing sufficient sensitivity and desirable noise cancellation in all directions.
    Type: Application
    Filed: July 30, 2010
    Publication date: February 2, 2012
    Applicant: OLYMPUS NDT INC.
    Inventor: Benoit LEPAGE
  • Publication number: 20120007595
    Abstract: The invention herein disclosed provides a 2D coil and a method of using the 2D wound EC sensor for reproducing the Eddy Current Testing (ECT) response of a prior art 3D orthogonal sensor. The 3D orthogonal sensor is conventionally wound onto a 3D core, with at least some of the surfaces being un-parallel to the surface be inspected. Using the herein disclosed 2D configuration allows the use of printed circuit board technologies for the manufacturing of these EC sensors. The herein disclosed method and the associated 2D EC sensors are particularly useful for reproducing the EC effect of conventional orthogonal probe arrays.
    Type: Application
    Filed: July 8, 2010
    Publication date: January 12, 2012
    Applicant: OLYMPUS NDT INC.
    Inventor: Benoit Lepage
  • Publication number: 20110257903
    Abstract: A device is disclosed for performing non-destructive inspection and testing (NDT/NDI) of an elongated test object, wherein the inspection system includes: a test object conveyor for conveying the test object along a longitudinal conveyance path; a probe assembly including phased-array probes, the probe assembly being configured to induce signals in the test object and sense echoes reflected from the test object; a probe assembly conveyor configured to movably support the probe assembly, to move the probe assembly on a circumferential path about the test object; and a control system coupled to the test object conveyor and to the probe assembly conveyor and configured to allow data acquisition by and from the phased-array probes while, simultaneously, the test object moves along the longitudinal path and the phased-array probes move on the circumferential path.
    Type: Application
    Filed: April 11, 2011
    Publication date: October 20, 2011
    Applicant: OLYMPUS NDT INC.
    Inventors: Christophe IMBERT, Michael DRUMMY
  • Publication number: 20110132092
    Abstract: An apparatus for performing ultrasonic inspection of an object, during one measurement on the object, triggers a sequence of excitations of the probe system and receives a sequence of substantially identical echo signals reflected from the object, and further scales each echo signal to different degrees to increase and extend the dynamic range of the echo signals. An A/D converter is then used to digitize the scaled signal sequentially in a manner which dispenses the need for using numerous A/D converters and the associated filters. The digitized signal samples are then combined to produce a single digital output in a manner that is not over-flowed and with desirable resolution. A sequence of successive acquisitions of the scaled signal with the highest sensitivity are averaged to reduce system noise.
    Type: Application
    Filed: December 3, 2009
    Publication date: June 9, 2011
    Applicant: Olympus NDT Inc.
    Inventor: Andrew Thomas
  • Publication number: 20110113883
    Abstract: Disclosed is an improved ultrasonic probe for Internal Rotating Inspection System (called IRIS) for inspecting tube-like structures from the inside of the tubes. The improved design deploys a rotor with rotor blades and a slotted stator located close to the emitting face of the transducer, to direct the flow of water such that air bubbles are carried away from a zone immediately in front of the transducer emitting face. Inspection accuracy and efficiency is significantly improved when air bubbles are effectively removed.
    Type: Application
    Filed: November 19, 2009
    Publication date: May 19, 2011
    Applicant: Olympus NDT Inc.
    Inventor: Tommy Bourgelas
  • Publication number: 20100100344
    Abstract: A user configured measurement display system and method for a non-destructive testing device and instrument (NDT/NDI) with high input data rate is disclosed. The system and the method provide the means for NDT/NDI instruments display measurement values that satisfies user designated measurement criterion occurring during any measurement time intervals (MTIs). The present disclosure overcomes the shortcomings of conventional ways of picking and displaying measurement values at fixed MTIs, by which the values truly satisfying the measurement criterion that occurs at random MTIs (other than scheduled MTIs) are often skipped.
    Type: Application
    Filed: October 20, 2008
    Publication date: April 22, 2010
    Applicant: OLYMPUS NDT, INC.
    Inventors: Jayesh Patel, Michael Drummy
  • Publication number: 20050134142
    Abstract: A transducer having a ceramic element in which the ceramic is elevated above a polymer and a method of manufacturing the transducer. The transducer comprises a piezo-composite element comprising a ceramic element embedded in epoxy. In an array, the ceramic elements may be in the form of posts. The plurality of ceramic elements is slightly elevated above the polymer and in staggered arrangement with the polymer. The element is manufactured by first grinding the face of the composite and removing damaged ceramic by acid etching the ceramic. The epoxy is removed by plasma etching so that the ceramic is above the epoxy. The composite is sputter plated so that a maximum temperature that could damage the plating is not exceeded. The ceramic is then poled so that a maximum temperature that could damage the plating is not exceeded. Contacts are then attached to the plating adjacent the ceramic.
    Type: Application
    Filed: December 18, 2003
    Publication date: June 23, 2005
    Applicant: Agfa NDT, Inc.
    Inventors: Kelley Yetter, Leslie Nye
  • Patent number: D640580
    Type: Grant
    Filed: May 21, 2010
    Date of Patent: June 28, 2011
    Assignee: Olympus NDT Inc.
    Inventors: Anthony Bibeau, Alain Poirier
  • Patent number: D668564
    Type: Grant
    Filed: October 20, 2010
    Date of Patent: October 9, 2012
    Assignee: Olympus NDT Inc.
    Inventor: Alain Poirier