Patents Assigned to Netzsch-Gerätebau GmbH
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Patent number: 11860132Abstract: A material analysis device for analysing a material sample. The material analysis device is equipped with a—generally temperature-controllable—sample chamber and a sample holder, which, supported by at least one pillar, protrudes into the sample chamber, and a loading shaft, to one end of which force is applied by an exciter, and the other end of which bears a connecting member, with which it transmits force to the sample in a defined manner and loads same thereby.Type: GrantFiled: May 5, 2022Date of Patent: January 2, 2024Assignee: NETZSCH-Gerätebau GmbHInventors: Georg Neumann, Marco Zier, Patrick Biermann, Jürgen Tschöpel, Reinhard Gschwendtner, Wiebold Wurpts, Markus Hilmer, Leonhard Faulhammer, Stephan Lauer, Kai Dinges, Claas Luhmann, Michel Bellmann, Georg Storch
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Patent number: 11747176Abstract: A measuring device that includes a housing and at least one vibration damper attached to the housing.Type: GrantFiled: November 11, 2021Date of Patent: September 5, 2023Assignee: NETZSCH-Gerätebau GmbHInventors: Jürgen Blumm, Martin Brunner, Reinhard Gschwendtner, Georg Krist, Fabian Wohlfahrt
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Patent number: 11353415Abstract: A thermal analysis device, a sample holder assembly and a thermal analysis method, capable of DSC measurement and TG measurement while simplifying replacement of a temperature sensor or the like upon damages. The thermal analysis device includes a sample holder assembly that is detachably mounted, a first sample stage and a second sample stage that are detachably mounted, a heater (heating furnace) that heats the sample holder assembly and the like, a temperature controller, a temperature measuring section for detecting a temperature difference between the sample and a reference substance, and a weight measuring section (balance) for measuring a weight difference between the sample and the reference substance.Type: GrantFiled: September 23, 2020Date of Patent: June 7, 2022Assignee: NETZSCH-Gerätebau GmbHInventors: Hiroki Takaishi, Daisuke Ito, Kenta Sato
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Patent number: 11320408Abstract: A gas analysis device and a gas analysis method for performing measurement in a direct mode and a trap mode without carrying out a complicated control. The gas analysis device includes a branching section that branches a target gas, a mass spectrometer performing mass spectrometry of one branched target gas, a trap section holding the other branched target gas, a gas chromatograph analyzing the other branched target gas, and a controller controlling the flow path of the one branched target gas and the other branched target gas. The branching section is controlled so that, while a thermal analysis is performed by a thermal analysis device, the branching section continuously branches the supplied target gas and discharges the one branched target gas and the other branched target gas, and when the thermal analysis is completed, the other branched target gas held by the trap section is supplied to the gas chromatograph.Type: GrantFiled: September 16, 2020Date of Patent: May 3, 2022Assignee: NETZSCH-Gerätebau GmbHInventors: Ryoichi Kinoshita, Hiroki Takaishi, Daisuke Ito, Kenta Sato
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Patent number: 11237123Abstract: A measuring arrangement for a thermal analysis of a sample, having a crucible for storing a sample in the crucible, as well as a sensor for measuring a sample temperature of the sample when the crucible is arranged on the sensor. To reduce the risk of damages to or even the destruction of used components as a result of chemical or physical reactions, it is provided according to the invention that the measuring arrangement further has a washer arrangement, which is inserted between the crucible and the sensor and which has a first layer, which contacts the crucible, of a first material and a second layer, which contacts the sensor, of a second material, which differs from the first material. The invention further includes a method for the thermal analysis of a sample, which is performed by using such a measuring arrangement.Type: GrantFiled: May 21, 2019Date of Patent: February 1, 2022Assignee: NETZSCH-Gerätebau GmbHInventor: Alexander Schindler
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Patent number: 11143609Abstract: A measuring arrangement for a thermal analysis of a sample, having a crucible for storing a sample in the crucible, as well as a sensor for measuring a sample temperature of the sample when the crucible is arranged on the sensor. To reduce the risk of damages to or even the destruction of used components as a result of chemical or physical reactions, it is provided according to the invention that the measuring arrangement further has an outer crucible for storing the crucible in the outer crucible, wherein the crucible is made of a crucible material and the outer crucible of an outer crucible material, which differs from the crucible material. The invention further proses a method for the thermal analysis of a sample, which is performed by using such a measuring arrangement.Type: GrantFiled: June 6, 2019Date of Patent: October 12, 2021Assignee: NETZSCH-Gerätebau GmbHInventor: Alexander Schindler
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Patent number: 11143608Abstract: A measuring arrangement and method for a thermal analysis of a sample, having a crucible for storing a sample in the crucible, as well as a sensor for measuring a sample temperature of the sample when the crucible is arranged on the sensor. To provide for a high level of reproducibility of measurements in the case of such a measuring arrangement and a method for the thermal analysis performed with the measuring arrangement, the measuring arrangement has an anti-rotation protection for the crucible, in order to provide a predetermined rotational position of the crucible with respect to the sensor when the crucible is arranged on the sensor. The invention includes a method for the thermal analysis of a sample, which is performed using such a measuring arrangement.Type: GrantFiled: June 3, 2019Date of Patent: October 12, 2021Assignee: NETZSCH-Gerätebau GmbHInventor: Alexander Schindler
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Patent number: 10758874Abstract: A method for generating a continuous carrier gas/vapour mixture stream containing a carrier gas, and a vapour of a liquid. The method includes provision of a first metered carrier gas stream, provision of a second metered carrier gas stream, provision of a metered, vapour-saturated carrier gas/vapour mixture stream, mixing of the second stream and the metered stream to provide a first gaseous mixture stream; and provision of a metered liquid stream fed to an evaporation/mixing device for evaporating the liquid and mixing with the first gaseous mixture stream to provide a second gaseous mixture stream.Type: GrantFiled: September 8, 2017Date of Patent: September 1, 2020Assignee: Netzsch-Gerätebau GmbHInventors: Thomas Denner, Georg Storch, Alexander Zuber, Christoph Schmidt, Jan Hanss, Thilo Hilpert
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Patent number: 10605677Abstract: A method for calibrating thermal analysis device includes: photothermal measurements on a sample consecutively held in the plurality of sample holders, or on a plurality of similar samples, which are in each case held in one of the plurality of sample holders, wherein a first side of the respective sample is irradiated with an electromagnetic excitation pulse and a thermal radiation emitted by a second side of this sample is captured; comparing results of the photothermal measurements for the plurality of sample holders; in each case determining at least one correction parameter for each sample holder based on a result of the comparison; and calibrating the temperature measuring system of the device and/or the temperature control systems of the device based on the determined correction parameters.Type: GrantFiled: August 23, 2017Date of Patent: March 31, 2020Assignee: Netzsch-Gerätebau GmbHInventors: Martin Brunner, André Lindemann
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Patent number: 10302497Abstract: A method and a device for the thermal analysis of a sample, as well as a method and a device for the calibration of a temperature measuring device used in a device for the thermal analysis.Type: GrantFiled: December 14, 2016Date of Patent: May 28, 2019Assignee: Netzsch-Gerätebau GmbHInventors: Martin Brunner, Alexander Schindler, André Lindemann
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Patent number: 10180358Abstract: A method for photothermal investigation of a sample (P), including: irradiating a first side of the sample (P) with an electromagnetic excitation pulse; detecting a result of the excitation pulse of one of the first side opposite second side of the sample (P) emitted thermal radiation (26); evaluating the detected thermal radiation based on a range defined by the following equations model: ?2T/?x2=1/?×?T/?t for 0<x<L, t>0 k×?T/?x?h×T=E(t)+??×(T(0,t)?T(L,t)) for x=0, t>0 k×?T/?x+h×d=???×(T(0,t)?T(L,t)) for x=L, t>0 T(x,0)=0 for t=0.Type: GrantFiled: November 4, 2016Date of Patent: January 15, 2019Assignee: Netzsch-Gerätebau GmbHInventors: Martin Brunner, Marc-Antoine Thermitus
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Patent number: 10168291Abstract: A method for the thermomechanical analysis of a sample (P) of a material including (a) controlling the temperature of the sample (P), (b) recording data representative for a length variation (dL) of the sample (P), (c) evaluating the data in order to determine a reversible component (dLrev), (d) calculating a corrected reversible component (dLrev-corr; ?rev-corr) and/or of the coefficient of thermal expansion (?).Type: GrantFiled: July 5, 2016Date of Patent: January 1, 2019Assignee: Netzsch-Gerätebau GmbHInventors: Elena Moukhina, Doreen Rapp, Markus Meyer, Thilo Hilpert, Martin Hager, Fabian Wohlfahrt
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Patent number: 10088441Abstract: Method and thermal analysis device including a sample holder and at least one temperature detector which is assigned to the holder. The invention further relates to a production method for a temperature detector. A heat flow to be detected is conveyed to the temperature detector between a support surface and the sample holder, wherein the support surface and/or the sample holder include elevations or depressions forming contact points, which define a relevant heat flow zone assigned to the support surface. A thermocouple, which includes at least two elements made of different metals, a first metallic element A, with a higher expansion coefficient compared to a second metallic element B, is introduced in a precisely fitting manner into second metallic element B constituted as a hollow profile and the two elements A, B are heated in a first operational step and then cooled again in a second operational step.Type: GrantFiled: August 28, 2015Date of Patent: October 2, 2018Assignee: Netzsch-Gerätebau GmbHInventors: Thomas Denner, Juergen Blumm, Otto Max Schaefer, Markus Hollering, Matthias Gradl, Gunther Herr, Andre Nijmeh, Thilo Hilpert, Alexander Frenzl, Stefan Lauterbach, Andreas Strobel, Gabriele Kaiser, Stefan Schmoelzer, Markus Meyer, Stephan Knappe, Rolf Preuss, Michael Gebhardt, Elena Moukhina, Alexander Schindler
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Patent number: 9939396Abstract: A system for measuring the thermal diffusivity of a material includes a housing having an upper portion and a lower portion, a plate holding the material in a fixed position between the upper portion and lower portion of the housing, and a source at the lower portion of the housing projecting heat onto the material along a first axis that is perpendicular to the plate. A sensor at the lower portion of the housing is movable in relation to the plate and senses the heat radiating through the material along a second axis that is perpendicular to the plate and offset from the first axis. A controller receives data from the sensor and calculates the thermal diffusivity of the material.Type: GrantFiled: January 30, 2015Date of Patent: April 10, 2018Assignee: Netzsch-Gerätebau GmbHInventors: Marc-Antoine Thermitus, Martin Brunner, Juergen Blumm, Robert Campbell, Thomas Denner, Michael Gebhardt, Andreas Hartinger, Thilo Hilpert, Stefan Lauterbach, André Lindemann, Matthias Schödel, Andreas Strobel, Jürgen Tschöpel
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Patent number: 9939329Abstract: A device for thermal analysis including: a pair of sample container assembly sets, having a sample container and a heat sink connected using a predetermined thermal resistance; a heating unit for equally heating the pair of sample container assembly sets; a temperature control for the heating unit; a weight measurement unit measuring difference between a sample and a reference material; while the heating unit is changed.Type: GrantFiled: July 31, 2015Date of Patent: April 10, 2018Assignee: Netzsch-Gerätebau GmbHInventors: Yoshio Shinoda, Ryoichi Kinoshita
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Publication number: 20180080837Abstract: A method for calibrating thermal analysis device includes: photothermal measurements on a sample consecutively held in the plurality of sample holders, or on a plurality of similar samples, which are in each case held in one of the plurality of sample holders, wherein a first side of the respective sample is irradiated with an electromagnetic excitation pulse and a thermal radiation emitted by a second side of this sample is captured; comparing results of the photothermal measurements for the plurality of sample holders; in each case determining at least one correction parameter for each sample holder based on a result of the comparison; and calibrating the temperature measuring system of the device and/or the temperature control systems of the device based on the determined correction parameters.Type: ApplicationFiled: August 23, 2017Publication date: March 22, 2018Applicant: Netzsch-Gerätebau GmbHInventors: Martin Brunner, André Lindemann
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Patent number: 9816869Abstract: A method for evaluating a measurement result of a thermal analysis. A program-controlled computer unit is used to calculate at least one probability of the agreement of the measurement result with at least one dataset previously stored in the computer unit, wherein this calculation is based on a comparison of effect data previously extracted from a measurement curve of the thermal analysis with corresponding stored effect data of the dataset. The evaluation can advantageously include, an automatic recognition and classification of measurement curves and can be carried out in particular more efficiently, more economically and more quickly than previously, with at the same time a high quality of evaluation.Type: GrantFiled: July 11, 2014Date of Patent: November 14, 2017Assignee: Netzsch-Gerätebau GmbHInventors: Thomas Denner, Juergen Blumm, Otto Max Schaefer, Markus Hollering, Thilo Hilpert, Alexander Frenzl, Stefan Lauterbach, Andreas Strobel, Gabriele Kaiser, Stephan Knappe, Rolf Preuss, Michael Gebhardt, Elena Moukhina, Alexander Schindler, Matthias Gradl, Gunther Herr, André Nijmeh, Stefan Schmoelzer, Markus Meyer
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Patent number: 9791330Abstract: A system for measuring change in length and/or deformation force on a sample in a longitudinal direction. The system is useful in thermomechanical analysis and/or dynamic-mechanical analysis, and comprises a pushrod extending in the longitudinal direction which exerts force on the sample, and a device measuring movement of the pushrod resulting from the change in length or deformation of the sample in the longitudinal direction. The measuring device includes: a pushrod base mounted on a stationary base with a guide so as to be movable in the longitudinal direction; a controllable drive for moving the pushrod; a detector measuring the force exerted by the pushrod on the sample; and a path sensor for measuring the movement of the pushrod.Type: GrantFiled: February 19, 2015Date of Patent: October 17, 2017Assignee: Netzsch-Gerätebau GmbHInventors: Fabian Wohlfahrt, Thomas Denner, Georg Storch
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Patent number: 9689818Abstract: A thermoanalysis device, including a controllable temperature regulating device for the controlled change in the temperature of a sample to be investigated, a detection device for the continuous detection of at least one signal characteristic of a property of the sample during the change in the temperature, and a gas analysis device for investigating gases which are liberated from the sample. In order to enable an improved time- and temperature-resolved investigation of volatile components and decomposition products, provision is made according to the invention such that, during the change in the temperature of the sample, the temperature regulating device is controlled according to a control algorithm taking account of the detected signal and/or the gas analysis device is constituted so as to be controllable and is controlled according to a control algorithm taking account of the detected signal.Type: GrantFiled: July 18, 2013Date of Patent: June 27, 2017Assignee: Netzsch-Gerätebau GmbHInventor: Juergen Blumm
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Patent number: 9429531Abstract: A device for thermal analysis. This device includes at least one thermoanalytical measurement device and at least one infrared spectrometer, wherein the infrared spectrometer is fully integrated into the thermoanalytical measurement device. The thermoanalytical measurement device and the at least one infrared spectrometer are connected to one another by a lift-swivel unit. The at least one infrared spectrometer is disposed above the thermoanalytical measurement device.Type: GrantFiled: June 13, 2013Date of Patent: August 30, 2016Assignee: Netzsch-Gerätebau GmbHInventors: Georg Neumann, Alexander Schindler, Juergen Blumm