Patents Assigned to Netzsch-Gerätebau GmbH
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Patent number: 12222304Abstract: A method for the analysis, in particular for analysis by dynamic difference calorimetry (DSC), of biological material, in particular blood, urine, sweat or skin tissue, with the steps of: introduction of a sample with a patient's biological material onto a sensor of a measuring device; acquisition of measured values by means of the measuring device; sending the measured values to an evaluation device, which communicates with the measuring device; assessment of the patient's state of health with the aid of data structures characterizing the state of health on the basis of the measured values by means of the evaluation device, on which a first application software instance is performed; and visualization or audio-visualization of the state of health on a display. The present invention further creates a system for the analysis of biological material and a use of such a system.Type: GrantFiled: April 15, 2021Date of Patent: February 11, 2025Assignee: NETZSCH-Gerätebau GmbHInventor: Rebekka Taubmann
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Patent number: 11860132Abstract: A material analysis device for analysing a material sample. The material analysis device is equipped with a—generally temperature-controllable—sample chamber and a sample holder, which, supported by at least one pillar, protrudes into the sample chamber, and a loading shaft, to one end of which force is applied by an exciter, and the other end of which bears a connecting member, with which it transmits force to the sample in a defined manner and loads same thereby.Type: GrantFiled: May 5, 2022Date of Patent: January 2, 2024Assignee: NETZSCH-Gerätebau GmbHInventors: Georg Neumann, Marco Zier, Patrick Biermann, Jürgen Tschöpel, Reinhard Gschwendtner, Wiebold Wurpts, Markus Hilmer, Leonhard Faulhammer, Stephan Lauer, Kai Dinges, Claas Luhmann, Michel Bellmann, Georg Storch
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Patent number: 11747176Abstract: A measuring device that includes a housing and at least one vibration damper attached to the housing.Type: GrantFiled: November 11, 2021Date of Patent: September 5, 2023Assignee: NETZSCH-Gerätebau GmbHInventors: Jürgen Blumm, Martin Brunner, Reinhard Gschwendtner, Georg Krist, Fabian Wohlfahrt
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Patent number: 11353415Abstract: A thermal analysis device, a sample holder assembly and a thermal analysis method, capable of DSC measurement and TG measurement while simplifying replacement of a temperature sensor or the like upon damages. The thermal analysis device includes a sample holder assembly that is detachably mounted, a first sample stage and a second sample stage that are detachably mounted, a heater (heating furnace) that heats the sample holder assembly and the like, a temperature controller, a temperature measuring section for detecting a temperature difference between the sample and a reference substance, and a weight measuring section (balance) for measuring a weight difference between the sample and the reference substance.Type: GrantFiled: September 23, 2020Date of Patent: June 7, 2022Assignee: NETZSCH-Gerätebau GmbHInventors: Hiroki Takaishi, Daisuke Ito, Kenta Sato
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Patent number: 11320408Abstract: A gas analysis device and a gas analysis method for performing measurement in a direct mode and a trap mode without carrying out a complicated control. The gas analysis device includes a branching section that branches a target gas, a mass spectrometer performing mass spectrometry of one branched target gas, a trap section holding the other branched target gas, a gas chromatograph analyzing the other branched target gas, and a controller controlling the flow path of the one branched target gas and the other branched target gas. The branching section is controlled so that, while a thermal analysis is performed by a thermal analysis device, the branching section continuously branches the supplied target gas and discharges the one branched target gas and the other branched target gas, and when the thermal analysis is completed, the other branched target gas held by the trap section is supplied to the gas chromatograph.Type: GrantFiled: September 16, 2020Date of Patent: May 3, 2022Assignee: NETZSCH-Gerätebau GmbHInventors: Ryoichi Kinoshita, Hiroki Takaishi, Daisuke Ito, Kenta Sato
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Patent number: 11237123Abstract: A measuring arrangement for a thermal analysis of a sample, having a crucible for storing a sample in the crucible, as well as a sensor for measuring a sample temperature of the sample when the crucible is arranged on the sensor. To reduce the risk of damages to or even the destruction of used components as a result of chemical or physical reactions, it is provided according to the invention that the measuring arrangement further has a washer arrangement, which is inserted between the crucible and the sensor and which has a first layer, which contacts the crucible, of a first material and a second layer, which contacts the sensor, of a second material, which differs from the first material. The invention further includes a method for the thermal analysis of a sample, which is performed by using such a measuring arrangement.Type: GrantFiled: May 21, 2019Date of Patent: February 1, 2022Assignee: NETZSCH-Gerätebau GmbHInventor: Alexander Schindler
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Patent number: 11143609Abstract: A measuring arrangement for a thermal analysis of a sample, having a crucible for storing a sample in the crucible, as well as a sensor for measuring a sample temperature of the sample when the crucible is arranged on the sensor. To reduce the risk of damages to or even the destruction of used components as a result of chemical or physical reactions, it is provided according to the invention that the measuring arrangement further has an outer crucible for storing the crucible in the outer crucible, wherein the crucible is made of a crucible material and the outer crucible of an outer crucible material, which differs from the crucible material. The invention further proses a method for the thermal analysis of a sample, which is performed by using such a measuring arrangement.Type: GrantFiled: June 6, 2019Date of Patent: October 12, 2021Assignee: NETZSCH-Gerätebau GmbHInventor: Alexander Schindler
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Patent number: 11143608Abstract: A measuring arrangement and method for a thermal analysis of a sample, having a crucible for storing a sample in the crucible, as well as a sensor for measuring a sample temperature of the sample when the crucible is arranged on the sensor. To provide for a high level of reproducibility of measurements in the case of such a measuring arrangement and a method for the thermal analysis performed with the measuring arrangement, the measuring arrangement has an anti-rotation protection for the crucible, in order to provide a predetermined rotational position of the crucible with respect to the sensor when the crucible is arranged on the sensor. The invention includes a method for the thermal analysis of a sample, which is performed using such a measuring arrangement.Type: GrantFiled: June 3, 2019Date of Patent: October 12, 2021Assignee: NETZSCH-Gerätebau GmbHInventor: Alexander Schindler
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Patent number: 10758874Abstract: A method for generating a continuous carrier gas/vapour mixture stream containing a carrier gas, and a vapour of a liquid. The method includes provision of a first metered carrier gas stream, provision of a second metered carrier gas stream, provision of a metered, vapour-saturated carrier gas/vapour mixture stream, mixing of the second stream and the metered stream to provide a first gaseous mixture stream; and provision of a metered liquid stream fed to an evaporation/mixing device for evaporating the liquid and mixing with the first gaseous mixture stream to provide a second gaseous mixture stream.Type: GrantFiled: September 8, 2017Date of Patent: September 1, 2020Assignee: Netzsch-Gerätebau GmbHInventors: Thomas Denner, Georg Storch, Alexander Zuber, Christoph Schmidt, Jan Hanss, Thilo Hilpert
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Patent number: 10605677Abstract: A method for calibrating thermal analysis device includes: photothermal measurements on a sample consecutively held in the plurality of sample holders, or on a plurality of similar samples, which are in each case held in one of the plurality of sample holders, wherein a first side of the respective sample is irradiated with an electromagnetic excitation pulse and a thermal radiation emitted by a second side of this sample is captured; comparing results of the photothermal measurements for the plurality of sample holders; in each case determining at least one correction parameter for each sample holder based on a result of the comparison; and calibrating the temperature measuring system of the device and/or the temperature control systems of the device based on the determined correction parameters.Type: GrantFiled: August 23, 2017Date of Patent: March 31, 2020Assignee: Netzsch-Gerätebau GmbHInventors: Martin Brunner, André Lindemann
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Patent number: 10302497Abstract: A method and a device for the thermal analysis of a sample, as well as a method and a device for the calibration of a temperature measuring device used in a device for the thermal analysis.Type: GrantFiled: December 14, 2016Date of Patent: May 28, 2019Assignee: Netzsch-Gerätebau GmbHInventors: Martin Brunner, Alexander Schindler, André Lindemann
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Patent number: 10180358Abstract: A method for photothermal investigation of a sample (P), including: irradiating a first side of the sample (P) with an electromagnetic excitation pulse; detecting a result of the excitation pulse of one of the first side opposite second side of the sample (P) emitted thermal radiation (26); evaluating the detected thermal radiation based on a range defined by the following equations model: ?2T/?x2=1/?×?T/?t for 0<x<L, t>0 k×?T/?x?h×T=E(t)+??×(T(0,t)?T(L,t)) for x=0, t>0 k×?T/?x+h×d=???×(T(0,t)?T(L,t)) for x=L, t>0 T(x,0)=0 for t=0.Type: GrantFiled: November 4, 2016Date of Patent: January 15, 2019Assignee: Netzsch-Gerätebau GmbHInventors: Martin Brunner, Marc-Antoine Thermitus
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Patent number: 10168291Abstract: A method for the thermomechanical analysis of a sample (P) of a material including (a) controlling the temperature of the sample (P), (b) recording data representative for a length variation (dL) of the sample (P), (c) evaluating the data in order to determine a reversible component (dLrev), (d) calculating a corrected reversible component (dLrev-corr; ?rev-corr) and/or of the coefficient of thermal expansion (?).Type: GrantFiled: July 5, 2016Date of Patent: January 1, 2019Assignee: Netzsch-Gerätebau GmbHInventors: Elena Moukhina, Doreen Rapp, Markus Meyer, Thilo Hilpert, Martin Hager, Fabian Wohlfahrt
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Patent number: 10088441Abstract: Method and thermal analysis device including a sample holder and at least one temperature detector which is assigned to the holder. The invention further relates to a production method for a temperature detector. A heat flow to be detected is conveyed to the temperature detector between a support surface and the sample holder, wherein the support surface and/or the sample holder include elevations or depressions forming contact points, which define a relevant heat flow zone assigned to the support surface. A thermocouple, which includes at least two elements made of different metals, a first metallic element A, with a higher expansion coefficient compared to a second metallic element B, is introduced in a precisely fitting manner into second metallic element B constituted as a hollow profile and the two elements A, B are heated in a first operational step and then cooled again in a second operational step.Type: GrantFiled: August 28, 2015Date of Patent: October 2, 2018Assignee: Netzsch-Gerätebau GmbHInventors: Thomas Denner, Juergen Blumm, Otto Max Schaefer, Markus Hollering, Matthias Gradl, Gunther Herr, Andre Nijmeh, Thilo Hilpert, Alexander Frenzl, Stefan Lauterbach, Andreas Strobel, Gabriele Kaiser, Stefan Schmoelzer, Markus Meyer, Stephan Knappe, Rolf Preuss, Michael Gebhardt, Elena Moukhina, Alexander Schindler
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Patent number: 9939396Abstract: A system for measuring the thermal diffusivity of a material includes a housing having an upper portion and a lower portion, a plate holding the material in a fixed position between the upper portion and lower portion of the housing, and a source at the lower portion of the housing projecting heat onto the material along a first axis that is perpendicular to the plate. A sensor at the lower portion of the housing is movable in relation to the plate and senses the heat radiating through the material along a second axis that is perpendicular to the plate and offset from the first axis. A controller receives data from the sensor and calculates the thermal diffusivity of the material.Type: GrantFiled: January 30, 2015Date of Patent: April 10, 2018Assignee: Netzsch-Gerätebau GmbHInventors: Marc-Antoine Thermitus, Martin Brunner, Juergen Blumm, Robert Campbell, Thomas Denner, Michael Gebhardt, Andreas Hartinger, Thilo Hilpert, Stefan Lauterbach, André Lindemann, Matthias Schödel, Andreas Strobel, Jürgen Tschöpel
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Patent number: 9939329Abstract: A device for thermal analysis including: a pair of sample container assembly sets, having a sample container and a heat sink connected using a predetermined thermal resistance; a heating unit for equally heating the pair of sample container assembly sets; a temperature control for the heating unit; a weight measurement unit measuring difference between a sample and a reference material; while the heating unit is changed.Type: GrantFiled: July 31, 2015Date of Patent: April 10, 2018Assignee: Netzsch-Gerätebau GmbHInventors: Yoshio Shinoda, Ryoichi Kinoshita
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Publication number: 20180080837Abstract: A method for calibrating thermal analysis device includes: photothermal measurements on a sample consecutively held in the plurality of sample holders, or on a plurality of similar samples, which are in each case held in one of the plurality of sample holders, wherein a first side of the respective sample is irradiated with an electromagnetic excitation pulse and a thermal radiation emitted by a second side of this sample is captured; comparing results of the photothermal measurements for the plurality of sample holders; in each case determining at least one correction parameter for each sample holder based on a result of the comparison; and calibrating the temperature measuring system of the device and/or the temperature control systems of the device based on the determined correction parameters.Type: ApplicationFiled: August 23, 2017Publication date: March 22, 2018Applicant: Netzsch-Gerätebau GmbHInventors: Martin Brunner, André Lindemann
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Patent number: D1035036Type: GrantFiled: October 11, 2022Date of Patent: July 9, 2024Assignee: NETZSCH-Gerätebau GmbHInventors: Oliver Saiz, Mareike Roth
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Patent number: D1035040Type: GrantFiled: October 11, 2022Date of Patent: July 9, 2024Assignee: NETZSCH-Gerätebau GmbHInventors: Oliver Saiz, Mareike Roth
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Patent number: D1035041Type: GrantFiled: October 11, 2022Date of Patent: July 9, 2024Assignee: NETZSCH-Gerätebau GmbHInventors: Oliver Saiz, Mareike Roth