Abstract: A method for calibrating thermal analysis device includes: photothermal measurements on a sample consecutively held in the plurality of sample holders, or on a plurality of similar samples, which are in each case held in one of the plurality of sample holders, wherein a first side of the respective sample is irradiated with an electromagnetic excitation pulse and a thermal radiation emitted by a second side of this sample is captured; comparing results of the photothermal measurements for the plurality of sample holders; in each case determining at least one correction parameter for each sample holder based on a result of the comparison; and calibrating the temperature measuring system of the device and/or the temperature control systems of the device based on the determined correction parameters.
Abstract: A method for evaluating a measurement result of a thermal analysis. A program-controlled computer unit is used to calculate at least one probability of the agreement of the measurement result with at least one dataset previously stored in the computer unit, wherein this calculation is based on a comparison of effect data previously extracted from a measurement curve of the thermal analysis with corresponding stored effect data of the dataset. The evaluation can advantageously include, an automatic recognition and classification of measurement curves and can be carried out in particular more efficiently, more economically and more quickly than previously, with at the same time a high quality of evaluation.
Type:
Grant
Filed:
July 11, 2014
Date of Patent:
November 14, 2017
Assignee:
Netzsch-Gerätebau GmbH
Inventors:
Thomas Denner, Juergen Blumm, Otto Max Schaefer, Markus Hollering, Thilo Hilpert, Alexander Frenzl, Stefan Lauterbach, Andreas Strobel, Gabriele Kaiser, Stephan Knappe, Rolf Preuss, Michael Gebhardt, Elena Moukhina, Alexander Schindler, Matthias Gradl, Gunther Herr, André Nijmeh, Stefan Schmoelzer, Markus Meyer
Abstract: A system for measuring change in length and/or deformation force on a sample in a longitudinal direction. The system is useful in thermomechanical analysis and/or dynamic-mechanical analysis, and comprises a pushrod extending in the longitudinal direction which exerts force on the sample, and a device measuring movement of the pushrod resulting from the change in length or deformation of the sample in the longitudinal direction. The measuring device includes: a pushrod base mounted on a stationary base with a guide so as to be movable in the longitudinal direction; a controllable drive for moving the pushrod; a detector measuring the force exerted by the pushrod on the sample; and a path sensor for measuring the movement of the pushrod.
Type:
Grant
Filed:
February 19, 2015
Date of Patent:
October 17, 2017
Assignee:
Netzsch-Gerätebau GmbH
Inventors:
Fabian Wohlfahrt, Thomas Denner, Georg Storch
Abstract: A thermoanalysis device, including a controllable temperature regulating device for the controlled change in the temperature of a sample to be investigated, a detection device for the continuous detection of at least one signal characteristic of a property of the sample during the change in the temperature, and a gas analysis device for investigating gases which are liberated from the sample. In order to enable an improved time- and temperature-resolved investigation of volatile components and decomposition products, provision is made according to the invention such that, during the change in the temperature of the sample, the temperature regulating device is controlled according to a control algorithm taking account of the detected signal and/or the gas analysis device is constituted so as to be controllable and is controlled according to a control algorithm taking account of the detected signal.
Abstract: A device for thermal analysis. This device includes at least one thermoanalytical measurement device and at least one infrared spectrometer, wherein the infrared spectrometer is fully integrated into the thermoanalytical measurement device. The thermoanalytical measurement device and the at least one infrared spectrometer are connected to one another by a lift-swivel unit. The at least one infrared spectrometer is disposed above the thermoanalytical measurement device.
Type:
Grant
Filed:
June 13, 2013
Date of Patent:
August 30, 2016
Assignee:
Netzsch-Gerätebau GmbH
Inventors:
Georg Neumann, Alexander Schindler, Juergen Blumm
Abstract: A method for conducting a differential thermal analysis, in which a sample disposed in a temperable sample space is tempered according to an essentially linear temperature program extending from a start temperature to an end temperature, such that, from the result of a measurement of the sample temperature conducted during tempering at a number of measurement time points, a DTA signal is calculated as the difference between a measured sample temperature and a reference temperature calculated according to a temperature curve model. According to the invention, for every measurement time point, the relevant reference temperature is calculated by the following steps: (a) establish a time interval containing the relevant measurement time point; (b) calculate a non-linear adjustment function for the measured sample temperature curve in the time interval; and (c) calculate the reference temperature as a value of the adjustment function for the measurement time point.
Type:
Grant
Filed:
January 24, 2014
Date of Patent:
April 12, 2016
Assignee:
Netzsch-Gerätebau GmbH
Inventors:
Thomas Denner, Juergen Blumm, Otto Max Schaefer, Markus Hollering, Thilo Hilpert, Alexander Frenzl, Stefan Lauterbach, Andreas Strobel, Rolf Preuss, Michael Gebhardt, Elena Moukhina, Alexander Schindler, Mathias Gradl, Gunter Herr, Stephan Knappe, Markus Meyer, Gabriele Kaiser, Andre Nijmeh
Abstract: A temperature-control device for thermoanalytical analyses, including a housing, one heating element, one protective sheath disposed in the housing, wherein the protective sheath is connectable to a gas supply. The heating element is partially arranged inside the protective sheath.
Abstract: A thermal analysis apparatus and method, including a sample space with a sample carrier, and heating devices, and an inert gas. Flow devices generate an inert gas flow to the sample carrier. Getter devices and/or oxygen traps disposed in the inert gas flow remove residual oxygen.