Abstract: A scanning electron microscope or other type of scanning electron device incorporating a light pen for automatically changing the field of view of a specimen on a CRT. The output of said light pen controls the center and/or width of the scanning area of the incident electron beam irradiating the specimen when said light pen is directed towards a certain point in the initial specimen field of view on the CRT, thereby displaying said point at the center of the changed field of view on the CRT.

Abstract: A scanning electron device having means for creating an electric field for directing secondary electrons to a detecting means comprising auxiliary electrodes and power supplies therefor so as to increase both the output signal intensity and contrast obtained by the electron detector. The field is created by two or more auxiliary electrodes, said specimen being located near the lowest potential electrode.

Abstract: A wideband beam exposure recording system including a recording beam directed along a path. An object mask having spaced apertures formed therein is positioned in the path of the beam to provide spaced and shaped beams along said path. Means is provided for selectively and independently controlling each of said beams as a function of the information to be recorded. A conductive plate lens having a single aperture formed therein is spaced from the object mask and the entrance of the aperture formed in said plate lens is positioned in the path of the spaced beams. A movable target, beam-sensitive surface is positioned adjacent the exit of the lens and voltage means is applied between the lens and the target for imaging the beams on the target in spaced relationship. The article provided by the recording system and method is also disclosed.

Abstract: A mass spectrometer employing superimposed electric and magnetic fields arranged substantially at right angles. The central orbit of the ion beam is located on an equipotential surface in the electric field at right angles to the magnetic field. The ions constituting the ion beam are separated in accordance with their mass to charge ratios by superimposed fields. The field strengths are adjusted to satisfy the two dimensional double focusing condition.

Abstract: A contacting pickup optical waveguide reproduction system and method for reproducing information carried on a recording medium. The recording medium is of the type having optically reflective pits formed in an information path. Information is stored as a function of pit modulation. The system includes an optical pickup adapted to slidably contact an information path along a recording medium and means for illuminating the pits. Optical waveguide means is provided for receiving illumination reflected by said pits and an optical-to-electrical energy transducer is coupled to said optical waveguide means. A particular embodiment includes a remote optical-to-electrical energy transducer.

Abstract: An analyzing apparatus which automatically and sequentially analyzes a large number and variety of chemical samples which are divided into a plurality of fractions, whereby each sample is simultaneously tested with different chemicals under suitable reaction conditions. The system operates under pressurized closed flow conditions, that is to say, the solution flow lines are compressed with an inert gas, whereby the formation of air bubbles in the flow system, oxidization of samples, reagents, the rise of noxious fumes, are prevented.

Abstract: A scanning electron microscope comprising a double gap lens in its electron beam irradiating system. The double gap lens is arranged between the electron gun and the final stage condenser lens, and is excited by a lens current such that a large change of electron beam diameter may be controlled by a small change of lens excitation current.

Abstract: An electron lens system comprising a plurality of quadrupole elements, a plurality of octupole elements for correcting the spherical aberrations of said plurality of quadrupole elements, and an axially symmetric lens, arranged at the inlet or outlet side of said quadrupole and octupole elements for varying the focal length of said lens system so that the excitation currents of said plurality of quadrupole elements remain fixed.

Abstract: A virtual image type double focusing mass spectrometer having a diverging electrostatic field and a converging magnetic field, wherein parameters related to the fringing effects in the boundaries of said fields and to the distribution of the electrostatic field reduces image aberrations of the second order.

Abstract: A scanning electron microscope for displaying a scanning image utilizing a time distributed pulsed video signal. The low frequency noises in the pulsed signal are deleted according to the occurrence of sudden pulse intensity variation between adjacent video pulse signals.

Abstract: The sum of the intensity changes of one polarity in the video signal is used as a signal indicative of the diameter of the electron beam irradiating a specimen. A storage counter which produces the signal indicative of the beam diameter is reset periodically in synchronism with the beam scan and two successive outputs of the counter are compared by a comparison circuit. The excitation current of the focusing lens is varied in synchronism with beam scan. The magnitude and polarity (increase or decrease) of the change in excitation current are controlled in response to the output of said comparison circuit to maximize the output of the storage counter.

Abstract: An electron gun comprising a changeover chamber and changeover circuit between the gun chamber and the insulated cable which connects the power supply circuits to the electrodes which enables adjustment of electrode potentials to accomplish electrode treatment without excessive gun currents.

Abstract: An improved field emission type electron gun is automatically controlled so as to generate a stable emission current. The preferred embodiment employs a detecting means for detecting the emission current fluctuation and a control means for controlling the electric field for field emission according to the output signal of said detecting means.

Abstract: An analyzing apparatus which automatically and sequentially analyzes a large number and variety of chemical samples which are divided into a plurality of fractions, whereby each sample is simultaneously tested with different chemicals under suitable reaction conditions. The system operates under pressurized closed flow conditions, that is to say, the solution flow lines are compressed with an inert gas, whereby the formation of air bubbles in the flow system, oxidization of samples, reagents, the rise of noxious fumes, are prevented.